CN207752069U - Capacitor high temperature high resistant test device - Google Patents
Capacitor high temperature high resistant test device Download PDFInfo
- Publication number
- CN207752069U CN207752069U CN201721512360.5U CN201721512360U CN207752069U CN 207752069 U CN207752069 U CN 207752069U CN 201721512360 U CN201721512360 U CN 201721512360U CN 207752069 U CN207752069 U CN 207752069U
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- test
- control
- temperature
- capacitor
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- 238000012360 testing method Methods 0.000 title claims abstract description 189
- 239000003990 capacitor Substances 0.000 title claims abstract description 45
- 230000003993 interaction Effects 0.000 claims abstract description 14
- 230000003750 conditioning effect Effects 0.000 claims abstract description 9
- 230000005540 biological transmission Effects 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims abstract description 5
- 230000008054 signal transmission Effects 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims description 4
- 238000004891 communication Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims description 2
- 238000003032 molecular docking Methods 0.000 claims 1
- 238000005516 engineering process Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000002847 impedance measurement Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013016 damping Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Capacitor high temperature high resistant test device, include for providing the high-low temperature test chamber of hot environment, the test instrumentation for measuring capacitor resistance anti-performance, the test power supply for testing power supply and controller for controlling entire test process, high-low temperature test chamber includes babinet, test board, to connected components, control panel and temperature controller；The test board is mounted on the capacitor testing intracavitary of the babinet；Controller include power control unit for controlling the test cell of test instrumentation, for controlling test power supply, for control cabinet internal test temperature temperature conditioning unit, be used for transmission test acquisition signal data link, for handle test acquire the data processor of signal and for setting test parameter and showing the human-computer interaction interface of test result.The utility model advantageous effect is：Easy to operate, operating personnel only need operation and control device that can complete remaining operation, it can be seen that the partial data of capacitor testing includes working condition under high ambient temperatures.
Description
Technical field
The utility model is related to a kind of capacitor high temperature high resistant test devices.
Background technology
Domestic capacitor test at present is with room temperature and single test, and the mode of high temperature test is to be placed in test edge of table
Capacitor is placed on baking oven by baking oven, and test is taken to be tested on tester.Had to when capacitor high temperature high resistant is tested solve with
Lower problem：The data error of long lead test, and manual test is needed, not only data error is big, but also cumbersome, efficiency
It is low, it cannot achieve procedure operation.
Invention content
It is tested in a high temperauture environment to solve capacitor, overcomes the stream for thering is single manual test to become an equipment
Journey is tested, the capacitor high temperature high resistant that accurate, easy to operate, energy implementation processization that the utility model proposes a kind of tests operates
Test device.
Capacitor high temperature high resistant test device described in the utility model, it is characterised in that：Including being used to provide high temperature ring
The high-low temperature test chamber in border, the test instrumentation for measuring capacitor resistance anti-performance, for test power supply test power supply and
Controller for controlling entire test process, the high-low temperature test chamber include babinet, test board, to connected components, control panel
And temperature controller, the babinet are equipped with the test chamber for placing capacitor, control chamber and use for installing control panel
In the power supply placed cavity for placing test power supply, and the capacity measurement area is disposed side by side on babinet upper layer with the control chamber,
Therebetween be equipped with it is several for for connected components by through hole；The lower layer in babinet is arranged in the power supply rest area；Institute
It states temperature controller to be arranged in the test chamber, idler wheel is installed in the bottom of the babinet；
The test board is mounted on the capacitor testing intracavitary of the babinet, and the test board is equipped with several for installing
The capacitor testing station of capacitor, and each capacitor testing area is correspondingly arranged an electricity for being used for and being installed on it
The control port of the capacitor testing pin that container connecting pin is in contact, the test board passes through to connected components and the control panel
The connection of the first signal transmission port, realize the signal two-way communication between test board and control panel；The control panel is mounted on
In the control chamber of the babinet, the test signal input port of the control panel and the test signal output port of the controller
It is electrically connected；
The test signal input terminal of the test instrumentation is electrically connected with the test signal output end of the control panel, the test
The test signal output end and the signal input port of the controller of instrument are electrically connected, and realize between test instrumentation and controller
Signal transmission；
The controller includes controlling list for controlling the test cell of test instrumentation, for controlling the power supply of test power supply
Member, for control cabinet internal test temperature temperature conditioning unit, be used for transmission test acquisition signal data link, for handling
The data processor of test acquisition signal and for setting test parameter and showing the human-computer interaction interface of test result, it is described
The signal input part of test cell and the testability input terminal of the test instrumentation are electrically connected, the voltage electricity of the power control unit
The test power input of stream output end and the control panel is electrically connected；The signal output end of the temperature conditioning unit and the temperature controller
Control terminal be electrically connected；The signal input part of the signal input part and the data link of the data test unit is electrically connected；Institute
The signal input part for stating the signal output end and the data processor of data link is electrically connected, the voltage of the data processor
The voltage and current control terminal of current controling end and the power control unit is electrically connected, the temperature control end of the data processor with it is described
The control terminal of temperature conditioning unit is electrically connected, the signal transmission port electricity of the control terminal of the data processor and the human-computer interaction interface
Even, the signal transmitted in both directions between data processor and human-computer interaction interface is realized.
The test instrumentation is impedance instrument.
If evenly distributed dry condenser on the test board.
Capacitor testing requires to be high temperature testing impedance, and testing impedance tested with test instrumentation, and keeps its shell temperature to setting
Fixed temperature.
When experiment, the parameter that need to be tested, such as test temperature are set by human-computer interaction interface, testing impedance (includes
Test voltage, testing time, test speed etc.), wherein Impedance measurement parameter is sent to test instrumentation by controller, quilt when test
Examination capacitor by test board, connected components connected out with high-temperature test chamber be connected on test instrumentation by control panel and surveyed
Examination, controller take the impedance of the station from test instrumentation.The temperature for being tested capacitor passes through the temperature controller of adjusting high-temperature test chamber
It is controlled.
The utility model has the beneficial effects that：1, easy to operate, operating personnel only need operation and control device that can complete it
Remaining operation.2, it can be seen that the partial data of capacitor testing includes working condition under high ambient temperatures.
Description of the drawings
Fig. 1 is the high/low temperature experimental box front view of the utility model.
Fig. 2 is the high/low temperature experimental box internal structure chart of the utility model.
Fig. 3 is the high/low temperature experimental box rearview of the utility model.
Fig. 4 is the high/low temperature experimental box side view of the utility model.
Fig. 5 is the high/low temperature experimental box vertical view of the utility model.
Fig. 6 is the operation principle block diagram of the utility model.
Specific implementation mode
The utility model is further illustrated below in conjunction with the accompanying drawings
With reference to attached drawing：
1 capacitor high temperature high resistant test device described in the utility model of embodiment, includes for providing hot environment
High-low temperature test chamber 1, the test instrumentation 2 for measuring capacitor resistance anti-performance, the test power supply 3 for testing power supply and use
In the controller 4 for controlling entire test process, the high-low temperature test chamber 1 include babinet 11, test board 12, to connected components 13,
Control panel 14 and temperature controller, the babinet 11 are equipped with for placing the test chamber 111 of capacitor 5, for installing control panel
Control chamber 112 and power supply placed cavity 113 for placing test power supply, and the test chamber 111 and the control chamber
112 are disposed side by side on 11 upper layer of babinet, therebetween be equipped with it is several for for connected components 13 by through hole；The power supply
The lower layer in babinet 11 is arranged in rest area 113；The temperature controller is arranged in the test chamber 111, the bottom of the babinet 11
Idler wheel 114 is installed；
The test board 12 is mounted in the capacitor testing chamber 111 of the babinet 11, if the test board 12 is equipped with
The capacitor testing station for installing capacitor 5 is done, and each capacitor station is correspondingly arranged one and is used for and peace
The capacitor testing pin that the capacitor connection terminal of dress thereon is in contact, the control port of the test board 12 pass through to connected components
13 connect with the first signal transmission port of the control panel 14, realize the signal two-way between test board 12 and control panel 14
Letter；The control panel 14 be mounted on the babinet 11 control chamber 112 in, the test signal input port of the control panel 14 with
The test signal output port of the controller 4 is electrically connected；
The test signal input terminal of the test instrumentation 2 is electrically connected with the test signal output end of the control panel 14, described
The test signal output end and the signal input port of the controller 4 of test instrumentation 2 are electrically connected, and realize test instrumentation 2 and control
Signal transmission between device 4；
The controller 4 includes the power supply control for controlling the test cell of test instrumentation 2, for controlling test power supply 3
Unit processed, for controlling the temperature conditioning unit of test temperature in babinet 11, the data link for being used for transmission test acquisition signal, using
The data processor of acquisition signal is tested in processing and for setting test parameter and showing human-computer interaction circle of test result
Face 41, the signal input part of the test cell and the testability input terminal of the test instrumentation are electrically connected, and the power supply control is single
The voltage and current output end and the test power input of the control panel of member are electrically connected；The signal output end of the temperature conditioning unit with
The control terminal of the temperature controller is electrically connected；The signal input part of the data test unit is inputted with the signal of the data link
End is electrically connected；The signal output end of the data link and the signal input part of the data processor are electrically connected, at the data
The voltage and current control terminal and the voltage and current control terminal of the power control unit for managing device are electrically connected, the temperature of the data processor
Control end and the control terminal of the temperature conditioning unit are electrically connected, the signal of the control terminal of the data processor and the human-computer interaction interface
Transmission port is electrically connected, and realizes the signal transmitted in both directions between data processor and human-computer interaction interface.
The test instrumentation 2 is impedance instrument.
If evenly distributed dry condenser on the test board 12.
5 test request of capacitor is high temperature testing impedance, and testing impedance tested with test instrumentation, and keeps its shell temperature to setting
Fixed temperature.
When experiment, the parameter that need to be tested, such as test temperature are set by human-computer interaction interface, testing impedance (includes
Test voltage, testing time, test speed etc.), wherein Impedance measurement parameter is sent to test instrumentation by controller, quilt when test
Examination capacitor by test board, connected components connected out with high-temperature test chamber be connected on test instrumentation by control panel and surveyed
Examination, controller take the impedance of the station from test instrumentation.The temperature for being tested capacitor passes through the temperature controller of adjusting high-temperature test chamber
It is controlled.
The human-computer interaction interface 41 of Fig. 1 is equipped with level-one overtemperature prote 411, two level overtemperature prote 412, for showing electric current
With the display window 413 and setting button 414 of voltage.
Damper is additionally provided on babinet, the control terminal control button corresponding with controller of damper is connected；Damper
Control button is arranged on human-computer interaction interface, and equipped with regulation and control button, and damping is arranged by mark.
Content described in this specification embodiment is only enumerating for the way of realization conceived to utility model, this practicality is new
The protection domain of type is not construed as being only limitted to the concrete form that embodiment is stated, the scope of protection of the utility model is also wrapped
Include those skilled in the art according to the utility model design it is conceivable that equivalent technologies mean.
Claims (3)
1. capacitor high temperature high resistant test device, it is characterised in that：Include for providing the high-low temperature test chamber of hot environment, using
In the test instrumentation of measurement capacitor resistance anti-performance, the test power supply for testing power supply and for controlling entire test process
Controller, the high-low temperature test chamber includes babinet, test board, to connected components, control panel and temperature controller, on the babinet
It is put equipped with the test chamber for placing capacitor, the control chamber for installing control panel and the power supply for placing test power supply
Chamber is set, and the test chamber is disposed side by side on babinet upper layer with the control chamber, is equipped with therebetween several for for docking
Component by through hole；The lower layer in babinet is arranged in the power supply rest area；The temperature controller is arranged in the test chamber,
The bottom of the babinet is installed by idler wheel；
The test board is mounted on the capacitor testing intracavitary of the babinet, and the test board is equipped with several for installing capacitance
The capacitor testing station of device, and each capacitor testing station is correspondingly arranged a capacitance for being used for and being installed on it
The control port of the capacitor testing pin that device connecting pin is in contact, the test board passes through to connected components and the control panel
First signal transmission port connects, and realizes the signal two-way communication between test board and control panel；The control panel is mounted on institute
It states in the control chamber of babinet, the test signal input port of the control panel and the test signal output port electricity of the controller
Even；
The test signal input terminal of the test instrumentation is electrically connected with the test signal output end of the control panel, the test instrumentation
Test signal output end and the signal input port of the controller be electrically connected, realize the signal between test instrumentation and controller
Transmission；
The controller include for controlling the test cell of test instrumentation, for control test power supply power control unit,
For control cabinet internal test temperature temperature conditioning unit, be used for transmission test acquisition signal data link, for handle survey
The data processor of test acquisition signal and for setting test parameter and showing the human-computer interaction interface of test result, the survey
The testability input terminal for trying the signal input part and the test instrumentation of unit is electrically connected, the voltage and current of the power control unit
The test power input of output end and the control panel is electrically connected；The signal output end of the temperature conditioning unit and the temperature controller
Control terminal is electrically connected；The signal input part of the test cell and the signal input part of the data link are electrically connected；The data
The signal output end of transmitter and the signal input part of the data processor are electrically connected, the voltage and current control of the data processor
End processed and the voltage and current control terminal of the power control unit are electrically connected, the temperature control end of the data processor and the temperature control list
The control terminal of member is electrically connected, and the control terminal of the data processor and the signal transmission port of the human-computer interaction interface are electrically connected, real
Existing signal transmitted in both directions between data processor and human-computer interaction interface.
2. capacitor high temperature high resistant test device as described in claim 1, it is characterised in that：The test instrumentation is surveyed for impedance
Try instrument.
3. capacitor high temperature high resistant test device as described in claim 1, it is characterised in that：It is evenly distributed on the test board
If dry condenser.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721512360.5U CN207752069U (en) | 2017-11-14 | 2017-11-14 | Capacitor high temperature high resistant test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721512360.5U CN207752069U (en) | 2017-11-14 | 2017-11-14 | Capacitor high temperature high resistant test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207752069U true CN207752069U (en) | 2018-08-21 |
Family
ID=63145950
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721512360.5U Expired - Fee Related CN207752069U (en) | 2017-11-14 | 2017-11-14 | Capacitor high temperature high resistant test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207752069U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
| CN111054663A (en) * | 2019-12-25 | 2020-04-24 | 株洲宏达电子股份有限公司 | Screening method of high-reliability tantalum capacitor |
-
2017
- 2017-11-14 CN CN201721512360.5U patent/CN207752069U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
| CN111054663A (en) * | 2019-12-25 | 2020-04-24 | 株洲宏达电子股份有限公司 | Screening method of high-reliability tantalum capacitor |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180821 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |