CN207557418U - A kind of circuit board global function test device - Google Patents
A kind of circuit board global function test device Download PDFInfo
- Publication number
- CN207557418U CN207557418U CN201721242204.1U CN201721242204U CN207557418U CN 207557418 U CN207557418 U CN 207557418U CN 201721242204 U CN201721242204 U CN 201721242204U CN 207557418 U CN207557418 U CN 207557418U
- Authority
- CN
- China
- Prior art keywords
- fixture block
- probe
- circuit board
- spring fixture
- connecting rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a kind of circuit board global function test devices, pedestal, switch and power supply indicator are respectively equipped on the right side of the pan frontward end, the pedestal upper end is equipped with mounting table, test machine cover is installed in the upper end activity, the test machine cover front center is equipped with handle, the test machine cover lower end inner wall is fixed with transverse slat, spring fixture block slot is provided in the middle part of the transverse slat, the circuit board global function test device, by being provided with spring fixture block card slot in connecting rod, spring fixture block is equipped in transverse slat spring fixture block slot, connecting rod is allow to be moved forward and backward in the middle part of transverse slat, convenient for staff's detection circuit plate, in the case of making not walking circuit plate and probe, can also detection circuit plate different location；By being equipped with multiple probe apertures on lifting platform, make the position of staff's shirtsleeve operation probe, improve the efficiency of work, make the data that detection circuit plate obtains more accurate.
Description
Technical field
The utility model is related to field of circuit technology, specially a kind of circuit board global function test device.
Background technology
In electronics industry, need in several cases as before dispatching from the factory, before installation, repair when) circuit board is carried out it is a large amount of
It tests to ensure the intact of circuit board or fix a breakdown.The circuit board detecting of the prior art is to be detected to contact using more probes
The contact point of circuit board, the buttock line connection detection circuit of probe, detection circuit calculate the test datas such as the voltage of electric shock.Due to
The test point position of various boards is different, and tester needs to adjust probe location according to test point position, expends a large amount of
Manpower, efficiency is lower, while is difficult to avoid that operation error, causes invalid detection, can not meet the need to large scale test
It asks, therefore, it is proposed that a kind of circuit board global function test device.
Utility model content
The purpose of this utility model is to provide a kind of circuit board global function test device, to solve in above-mentioned background technology
The problem of proposition.
To achieve the above object, the utility model provides following technical solution：A kind of circuit board global function test device, bottom
Seat, the pan frontward end right side are respectively equipped with switch and power supply indicator, and the pedestal upper end is equipped with mounting table, the upper end
Activity installation test machine cover, the test machine cover front center are equipped with handle, and the test machine cover lower end inner wall is consolidated
Surely transverse slat is equipped with, spring fixture block slot is provided in the middle part of the transverse slat, runs through in the middle part of the spring fixture block slot and is plugged with connecting rod, it is described
It is equipped with spring fixture block card slot in the middle part of connecting rod, the spring fixture block slot inner wall is installed with spring fixture block, under the connecting rod
Portion's side wall is socketed with lifting platform, card slot is provided in the middle part of the lifting platform, the card slot inner wall is equipped with oblique chute and perpendicular sliding slot, described
Connecting rod bottom is socketed with spring, and the connecting rod lower sides are fixed with position limiting slide block, spy is provided in the middle part of the lifting platform
Pin hole, the probe aperture inner wall are equipped with probe and adjustable resistor.
Preferably, the probe aperture has several, and probe aperture is uniformly arranged on lifting platform.
Preferably, the spring fixture block and the position of spring fixture block card slot or so are corresponding.
Preferably, the oblique chute is connected two-by-two with perpendicular sliding slot, forms " N " font, is looped around the madial wall of card slot.
Preferably, the probe is no less than four, and the length of the adjustable resistor is more than the length of probe, and adjustable
Resistance is no less than one.
Compared with prior art, the beneficial effects of the utility model are：The circuit board global function test device, by even
Spring fixture block card slot is provided on extension bar, spring fixture block is equipped in transverse slat spring fixture block slot, before alloing connecting rod in the middle part of the transverse slat
After move,, can also detection circuit plate in the case of making not walking circuit plate and probe convenient for staff's detection circuit plate
Different location；By being equipped with multiple probe apertures on lifting platform, make the position of staff's shirtsleeve operation probe, improve work
Efficiency, make the data that detection circuit plate obtains more accurate；By being equipped with " N " shape sliding slot in card slot inner wall, under connecting rod
Portion side wall installation position limiting slide block, connecting rod bottom sidewall are socketed with spring, liter when making the probe on lifting platform touch circuit board
Drop platform can rotate, and make probe that can be saved the time for adjusting probe with each position of detection circuit plate, be decreased circuit board
The error of detection, the data for making detection are more accurate.
Description of the drawings
Fig. 1 is the utility model transverse slat sectional view；
Fig. 2 is the utility model lifting platform sectional view；
Fig. 3 is the utility model card slot sectional view；
Fig. 4 is the utility model structural front view.
In figure：1 connecting rod, 2 spring fixture block slots, 3 spring fixture blocks, 4 transverse slats, 5 spring fixture block card slots, 6 probes, 7 are adjusted
Resistance, 8 probe apertures, 9 lifting platforms, 10 card slots, 11 perpendicular sliding slots, 12 oblique chutes, 13 springs, 14 position limiting slide blocks, 15 test machine machines
Lid, 16 mounting tables, 17 pedestals, 18 power supply indicators, 19 switches, 20 handles.
Specific embodiment
The following is a combination of the drawings in the embodiments of the present utility model, and the technical scheme in the embodiment of the utility model is carried out
It clearly and completely describes, it is clear that the described embodiments are only a part of the embodiments of the utility model rather than whole
Embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are without making creative work
All other embodiments obtained shall fall within the protection scope of the present invention.
- 4 are please referred to Fig.1, the utility model provides a kind of technical solution：A kind of circuit board global function test device, pedestal
17,17 front end of the pedestal right side is respectively equipped with switch 19 and power supply indicator 18,17 upper end of pedestal are equipped with mounting table
16, the 16 upper end activity installation test machine cover 15 of mounting table, 15 front center of test machine cover is equipped with handle 20,
15 lower end inner wall of test machine cover is fixed with transverse slat 4, and 4 middle part of transverse slat is provided with spring fixture block slot 2, the Spring Card
2 middle part of block slot is equipped with spring fixture block card slot 5, the spring fixture block slot 2 through connecting rod 1,1 middle part of connecting rod is plugged with
Inner wall is installed with spring fixture block 3, allows connecting rod 1 in horizontal stroke, 4 middle part back-and-forth motions, convenient for staff's detection circuit
Plate, in the case of making not walking circuit plate and probe 6, can also detection circuit plate different location, 1 lower side of connecting rod
Wall is socketed with lifting platform 9, and 9 middle part of lifting platform is provided with card slot 10, and 10 inner wall of card slot is equipped with oblique chute 12 and perpendicular sliding slot
11,1 bottom of connecting rod is socketed with spring 13, and 1 lower sides of connecting rod are fixed with position limiting slide block 14, make lifting platform
Lifting platform 9 can rotate when probe 6 on 9 touches circuit board, make probe 6 that can be saved with each position of detection circuit plate
The time of probe 6 is adjusted, decreases the error of circuit board detecting, the data for making detection are more accurate, 9 middle part of lifting platform
Probe aperture 8 is provided with, 8 inner wall of probe aperture is equipped with probe 6 and adjustable resistor 7.The probe aperture 8 has several, and probe
Hole 8 is uniformly arranged on lifting platform 9.Make the position of staff's shirtsleeve operation probe 6, improve the efficiency of work, make inspection
The data that slowdown monitoring circuit plate obtains are more accurate, and the spring fixture block 3 is corresponding with the position of spring fixture block card slot 5 or so.It is described oblique
Sliding slot 12 is connected two-by-two with perpendicular sliding slot 11, forms " N " font, is looped around the madial wall of card slot 10.Lifting platform 9 is made to reach a rotation
The effect turned, while or else taking away circuit board, probe 6 can also contact on circuit boards, then obtain monitoring data, described
Probe 8 is no less than four, and the length of the adjustable resistor 7 is more than the length of probe 6, and adjustable resistor 7 is no less than one.
By setting there are four probe 6, make circuit board detecting data more accurate, there are one data, adjustable resistors for each probe 6
The stabilization of 7 control circuits in the circuit board for detecting short circuit, can also make machine normal operation.
Operation principle：When starting detection circuit plate, circuit board is first placed on designated position, is then turned on the switch, lifted
Platform 9 moves downward, and probe 6 and adjustable resistor 7 also and then move downward, when probe 6 and the contact circuit board of regulation resistance 7,
Connecting rod 1 moves down, and spring 13 is shunk, and position limiting slide block 14 is slided in " N " shape sliding slot, when connecting rod 1 will slide into card slot 10
Bottom end, lifting platform 9 rotate a certain angle, and spring 13 stretches at this time, and connecting rod 1 moves upwards, and position limiting slide block 14 is slided along " N " shape
Slot slides, and lifter plate 9 moves up at this time, repeats aforesaid operations, until circuit board has all detected.
While there has been shown and described that the embodiment of the utility model, for the ordinary skill in the art,
It is appreciated that can these embodiments be carried out with a variety of variations in the case of the principle and spirit for not departing from the utility model, repaiied
Change, replace and modification, the scope of the utility model are defined by the appended claims and the equivalents thereof.
Claims (5)
1. a kind of circuit board global function test device, pedestal (17), it is characterised in that：It is set respectively on the right side of pedestal (17) front end
There are a switch (19) and power supply indicator (18), pedestal (17) upper end is equipped with mounting table (16), on the mounting table (16)
End activity installation test machine cover (15), test machine cover (15) front center are equipped with handle (20), the test machine
Cover (15) lower end inner wall is fixed with transverse slat (4), and spring fixture block slot (2), the spring fixture block are provided in the middle part of the transverse slat (4)
Through connecting rod (1) is plugged in the middle part of slot (2), spring fixture block card slot (5), the Spring Card are equipped in the middle part of the connecting rod (1)
Block slot (2) inner wall is installed with spring fixture block (3), and connecting rod (1) lower sides are socketed with lifting platform (9), the liter
Card slot (10) is provided in the middle part of drop platform (9), card slot (10) inner wall is equipped with oblique chute (12) and perpendicular sliding slot (11), the connecting rod
(1) bottom is socketed with spring (13), and connecting rod (1) lower sides are fixed with position limiting slide block (14), the lifting platform (9)
Middle part is provided with probe aperture (8), and probe aperture (8) inner wall is equipped with probe (6) and adjustable resistor (7).
2. a kind of circuit board global function test device according to claim 1, it is characterised in that：The probe aperture (8) has
Several, and probe aperture (8) is uniformly arranged on lifting platform (9).
3. a kind of circuit board global function test device according to claim 1, it is characterised in that：The spring fixture block (3)
It is corresponding with the position of spring fixture block card slot (5) or so.
4. a kind of circuit board global function test device according to claim 1, it is characterised in that：The oblique chute (12) with
Perpendicular sliding slot (11) is connected two-by-two, forms " N " font, is looped around the madial wall of card slot (10).
5. a kind of circuit board global function test device according to claim 1, it is characterised in that：The probe (6) is many
In four, the length of the adjustable resistor (7) is more than the length of probe (6), and adjustable resistor (7) is no less than one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721242204.1U CN207557418U (en) | 2017-09-26 | 2017-09-26 | A kind of circuit board global function test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721242204.1U CN207557418U (en) | 2017-09-26 | 2017-09-26 | A kind of circuit board global function test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207557418U true CN207557418U (en) | 2018-06-29 |
Family
ID=62676690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721242204.1U Expired - Fee Related CN207557418U (en) | 2017-09-26 | 2017-09-26 | A kind of circuit board global function test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207557418U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110031748A (en) * | 2019-04-29 | 2019-07-19 | 西安国是电子科技有限公司 | Integrated circuit component test device and test method |
| CN110470862A (en) * | 2019-08-16 | 2019-11-19 | 扬州华测光电技术有限公司 | A kind of Micrograving acceleration-grade capacitor-type acceleration sensor for microelectron-mechanical |
| CN113376511A (en) * | 2021-06-22 | 2021-09-10 | 江苏富联通讯技术有限公司 | Detection device for 5G communication module processing and detection method thereof |
-
2017
- 2017-09-26 CN CN201721242204.1U patent/CN207557418U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110031748A (en) * | 2019-04-29 | 2019-07-19 | 西安国是电子科技有限公司 | Integrated circuit component test device and test method |
| CN110470862A (en) * | 2019-08-16 | 2019-11-19 | 扬州华测光电技术有限公司 | A kind of Micrograving acceleration-grade capacitor-type acceleration sensor for microelectron-mechanical |
| CN110470862B (en) * | 2019-08-16 | 2021-07-02 | 扬州华测光电技术有限公司 | Micro-gravity acceleration level capacitive acceleration sensor for micro-electronic machinery |
| CN113376511A (en) * | 2021-06-22 | 2021-09-10 | 江苏富联通讯技术有限公司 | Detection device for 5G communication module processing and detection method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180629 Termination date: 20200926 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |