CN207440201U - A kind of condenser leakage current multichannel independent test system - Google Patents
A kind of condenser leakage current multichannel independent test system Download PDFInfo
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- CN207440201U CN207440201U CN201721511115.2U CN201721511115U CN207440201U CN 207440201 U CN207440201 U CN 207440201U CN 201721511115 U CN201721511115 U CN 201721511115U CN 207440201 U CN207440201 U CN 207440201U
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Abstract
The utility model is related to a kind of condenser leakage current multichannel independent test systems, are mainly made of capacitance charging measurement unit, analog switch switch unit, A/D converting units and the CPU element of multiple parallel connections;The capacitance charging measurement unit is connected to A/D converting units by analog switch switch unit, and the A/D converting units connect CPU.Testing capacitor is connected respectively with each capacitance charging measurement unit, and each capacitor possesses independent charging measurement unit, and charging is not interfere with each other, and test capacitors leakage current value successively after the charging time is shown successively.The utility model can test multiple capacitor products simultaneously, substantially increase testing efficiency.
Description
Technical field
The utility model is related to capacitor testing system more particularly to a kind of condenser leakage current multichannel independent test systems
System.
Background technology
Capacitor, be largely used in electronic equipment, one of indispensable electronic component, be widely used in blocking, coupling
The various aspects such as conjunction, bypass, filtering, resonant tank, energy conversion, control circuit;Capacitor especially electrolytic capacitor, makes
Leakage current with measurement capacitor before is indispensable step.
Traditional condenser leakage current test method is:By the positive and negative anodes of electrolytic capacitor respectively with leakage current tester
Positive and negative anodes are connected, and setting the charging time, (some special requirement product charging time were 120 seconds, specifically refer to this as 60 seconds
The specifications of capacitance) and then start instrument, after the completion of the charging time, the value shown by instrument is the leakage current of the capacitance.
The shortcomings that conventional test methodologies, is:A product, inefficiency can only be once tested, for example to test 10 productions
Product, a product test time are 60s, and 10 product test tests at least need 600s (not include client also and replace product
Time), efficiency is very low, and in order to improve efficiency, client, which usually requires to buy more instruments, to be used in combination, and cost is very high, and common customer is born
It does not rise.
Utility model content
In order to solve the above-mentioned technical problem, the capacitor testing system that a kind of detection speed is fast, efficient, this practicality are provided
New offer following technical scheme:
A kind of condenser leakage current multichannel independent test system, by the capacitance charging measurement unit of multiple parallel connections, simulation
Switch switching unit, A/D converting units, CPU element and signal output unit composition;The capacitance charging measurement unit passes through
Analog switch switch unit is connected to A/D converting units, and the A/D converting units connect CPU element, the CPU element connection
Signal output unit, testing capacitor are connected respectively with each capacitance charging measurement unit.
If testing 10 products simultaneously, a product test time is 60s, and the testing time of 10 products is equally
For 60s (traditional test 600s), the testing time is greatly reduced, improves testing efficiency.
Further, the capacitance charging measurement unit include short-circuit test unit, open test unit, charhing unit with
And leakage current test cell, the short-circuit test unit, open test unit, charhing unit, leakage current test cell respectively with
The positive and negative anodes connection of testing capacitor, and be connected respectively by analog switch switch unit, A/D converting units with CPU element.
It is that a power supply fills many electrolytic capacitors simultaneously when carrying out multiple products using the above program and testing simultaneously
Electricity, such as a certain capacitor short-circuit, then numerous electrolytic capacitors of this power source charges, which may all fill, not to be powered on, then during test,
Many certified products may think that substandard products, and there are many waste;If electrolytic capacitor is opened a way, leakage current can be very small, defective work
It may be considered non-defective unit, bring hidden danger of quality.Therefore, it is necessary to first carry out once electrolytic capacitor open-circuit, short before charging
Drive test tries, and filters out open circuit or the electrolytic capacitor of short circuit, while avoiding the product from wasting, improves the quality of product.
Further, the signal output unit is HDL output units.
The beneficial effects of the utility model are:Multiple capacitor products can be tested simultaneously, substantially increase test effect
Rate;And the waste of product can be avoided while the accuracy of test is improved.
Description of the drawings
During 10 testing capacitors of Fig. 1 while test, the test system block diagram of the utility model.
Fig. 2, the utility model capacitance charging measurement unit structure diagram.
The circuit diagram of short-circuit test unit in Fig. 3, Fig. 2.
The circuit diagram of open test unit in Fig. 4, Fig. 2.
The circuit diagram of analog switch switch unit in Fig. 5, Fig. 1.
Specific embodiment
A kind of condenser leakage current multichannel independent test system as shown in Figure 1 is charged by the capacitance of multiple parallel connections and surveyed
Try unit, analog switch switch unit, A/D converting units, CPU element and signal output unit composition;The capacitance charges
Test cell is connected to A/D converting units by analog switch switch unit, and the A/D converting units connect CPU element, described
CPU element connects signal output unit, and testing capacitor is connected respectively with each capacitance charging measurement unit.Described in the present embodiment
Analog switch switch unit be made of the analog switch and other electric elements on four tunnel of three pieces, physical circuit as shown in figure 5, this
The A/D converting units of embodiment use the A/D conversion regimes of more skew products point.The system can independent output multi-channel it is qualified or do not conform to
Lattice signal will not interfere with each other, convenient for connecting automated test device.
If testing 10 products simultaneously, a product test time is 60s, and the testing time of 10 products is equally
For 60s (traditional test 600s), the testing time is greatly reduced, improves testing efficiency.
As shown in Fig. 2, the capacitance charging measurement unit includes short-circuit test unit, open test unit, charhing unit
And leakage current test cell, the short-circuit test unit, open test unit, charhing unit, leakage current test cell difference
It is connected with the positive and negative anodes of testing capacitor, and is connected respectively by analog switch switch unit, A/D converting units with CPU element.
It is that a power supply charges simultaneously to many electrolytic capacitors, such as certain when being tested while carrying out multiple products using the scheme of Fig. 1
One capacitor short-circuit, then numerous electrolytic capacitors of this power source charges, which may all fill, not to be powered on, then many qualified during test
Product may think that substandard products, and there are many waste;If electrolytic capacitor is opened a way, leakage current can be very small, and defective work may be by
Think non-defective unit, bring hidden danger of quality.Therefore, it is necessary to first carry out once electrolytic capacitor open-circuit, short-circuit test, sieve before charging
Open circuit or the electrolytic capacitor of short circuit are selected, while avoiding the product from wasting, improves the quality of product.
Wherein the circuit diagram of short-circuit test unit and open test unit is as shown in Figure 3 and Figure 4.In Fig. 3, high-power resistance
R100 is 100 Ω (50W), and C0 is capacitor to be tested, and R2, R3 are 10 Ω resistance, and R1 is 10k Ω resistance, and Z1 is two poles of protection
Pipe, U1 are the effect that follows of amplifier OP07 starting voltage, socket J2 connection A/D converting units, and Vshort short-circuit detectings voltage can be with
For 10.0V, test acquisition is the voltage value on R2 and R3.10/ (R100+ of electrolytic capacitor short circuit leakage current maximum detected value
R2+R3 it is) 83mA, usual short circuit current flow>50mA is just believed that electrolytic capacitor is in short-circuit condition.In Fig. 4, R101 is 1k Ω heat
Quick resistance, R8 are 1k Ω resistance, and R13 is 10k Ω resistance, and R11 is 22k Ω resistance, and D2, D3, D4, D5 are protection diode
1N4148, R9 are 1M Ω resistance, and D1 is diode 1N4148, and R14 is 22k Ω resistance, and R15 is 1k Ω resistance, and U3 is amplifier
TL071CD, C8, C9 are 0.1uF filter capacitors, and R12 is 1k Ω resistance, and U4 is optocoupler TLP185GB, and R10 is 10k Ω resistance.
Under normal circumstances, the voltage of U3_3 pins is for 12*1K/ (22K+1K)=0.52V, Vopen open circuit detection voltage
5.0V.During test, such as capacitance open circuit, amplifier U3_3 level is more than U3_2 foot level, optocoupler U4 conductings, and signal CHKOUT is low electricity
It is flat;If capacitance is not opened a way normally, amplifier U3_3 level is less than U3_2 foot level, and optocoupler U4 is not turned on, then CHKOUT is high level.
Using above-mentioned foundation the utility model desirable embodiment as enlightenment, pass through above-mentioned description, relevant staff
Various changes and amendments can be carried out in the range of without departing from this item utility model technological thought completely.This item is practical
New technical scope is not limited to the content on specification, it is necessary to determine that its is technical according to right
Scope.
Claims (3)
1. a kind of condenser leakage current multichannel independent test system, it is characterised in that:By the capacitance charging measurement of multiple parallel connections
Unit, analog switch switch unit, A/D converting units, CPU element and signal output unit composition;The capacitance, which charges, to be surveyed
Examination unit is connected to A/D converting units by analog switch switch unit, and the A/D converting units connect CPU element, described
CPU element connects signal output unit, and testing capacitor is connected respectively with each capacitance charging measurement unit.
2. a kind of condenser leakage current multichannel independent test system as described in claim 1, it is characterised in that:The capacitance
Charging measurement unit includes short-circuit test unit, open test unit, charhing unit and leakage current test cell, the short circuit
Test cell, open test unit, charhing unit, leakage current test cell are connected respectively with the positive and negative anodes of testing capacitor, and
It is connected respectively by analog switch switch unit, A/D converting units with CPU element.
3. a kind of condenser leakage current multichannel independent test system as described in claim 1, it is characterised in that:The signal
Output unit is HDL output units.
Priority Applications (1)
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CN201721511115.2U CN207440201U (en) | 2017-11-14 | 2017-11-14 | A kind of condenser leakage current multichannel independent test system |
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CN201721511115.2U CN207440201U (en) | 2017-11-14 | 2017-11-14 | A kind of condenser leakage current multichannel independent test system |
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CN201721511115.2U Expired - Fee Related CN207440201U (en) | 2017-11-14 | 2017-11-14 | A kind of condenser leakage current multichannel independent test system |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111337741A (en) * | 2020-04-17 | 2020-06-26 | 常州华威电子有限公司 | Automatic test recorder for leakage current of electrolytic capacitor |
CN113504489A (en) * | 2021-08-16 | 2021-10-15 | 南京理工大学工程技术研究院有限公司 | Capacitance leakage current detection device based on tantalum capacitance leakage current detection and use process |
-
2017
- 2017-11-14 CN CN201721511115.2U patent/CN207440201U/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111337741A (en) * | 2020-04-17 | 2020-06-26 | 常州华威电子有限公司 | Automatic test recorder for leakage current of electrolytic capacitor |
CN113504489A (en) * | 2021-08-16 | 2021-10-15 | 南京理工大学工程技术研究院有限公司 | Capacitance leakage current detection device based on tantalum capacitance leakage current detection and use process |
CN113504489B (en) * | 2021-08-16 | 2024-01-30 | 南京理工大学工程技术研究院有限公司 | Capacitance leakage current detection device based on tantalum capacitance leakage current detection and use process |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180601 Termination date: 20201114 |