CN207301177U - A kind of resistance value test probe assembly and resistance value mechanism for testing - Google Patents

A kind of resistance value test probe assembly and resistance value mechanism for testing Download PDF

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Publication number
CN207301177U
CN207301177U CN201721297608.0U CN201721297608U CN207301177U CN 207301177 U CN207301177 U CN 207301177U CN 201721297608 U CN201721297608 U CN 201721297608U CN 207301177 U CN207301177 U CN 207301177U
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Prior art keywords
probe
resistance value
conductive part
probe assembly
syringe needle
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CN201721297608.0U
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Chinese (zh)
Inventor
刘月良
马天光
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Goertek Optical Technology Co Ltd
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Goertek Techology Co Ltd
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Abstract

It the utility model is related to a kind of resistance value test probe assembly and resistance value mechanism for testing.Including:First probe, the second probe, insulating layer, insulation sleeve;First probe includes the first conductive part and the first syringe needle, and second probe includes the second conductive part and the second syringe needle, the position correspondence of first conductive part and the second conductive part, the position correspondence of first syringe needle and the second syringe needle;The insulator separation is arranged between the first probe and the second probe;The insulation sleeve is set in the first probe and the second probe periphery.The overall compact degree that the technique effect that the utility model is reached plays pin for test improves, easy to test application.

Description

A kind of resistance value test probe assembly and resistance value mechanism for testing
Technical field
Mechanism for testing field is the utility model is related to, more specifically, the utility model is related to a kind of resistance value test probe groups Part and resistance value mechanism for testing.
Background technology
In the prior art, resistance value test is widely used in the performance detection of electronic product, device.For accurate device Resistance value test, generally require to be detected element resistance value using four-wire system test mode.
Four-wire system test mode realizes accurate measurement, its electric current supply circuit is completely independent with voltage determination circuit, energy It is enough effectively to reduce winding displacement impedance, the interference of probe impedance and contact impedance to test.Reduce measurement resistance value and measured device Error between actual resistance value.Four-wire system test mode can accurately measure the small resistance value of measured device, and measurement accuracy can reach m Ω Level.
But in actual production, on the one hand, sometimes can not be same in a test point since the structure of test product limits When put down more probes, bring inconvenience carry out four-wire system resistance value test situation.On the other hand, used in traditional four-wire system test Probe is meticulous, during schematic operation there are probe frangibility, need to frequently replace the defects of.
Therefore, it is necessary to the method or equipment of resistance value detection are improved, to overcome drawbacks described above.
Utility model content
One purpose of the utility model is to provide a kind of resistance value test probe assembly.
One side according to the present utility model, there is provided a kind of resistance value tests probe assembly, and the first probe, second are visited Pin, insulating layer, insulation sleeve;
First probe includes the first conductive part and the first syringe needle, and second probe includes the second conductive part and second Syringe needle, the position correspondence of first conductive part and the second conductive part, the position correspondence of first syringe needle and the second syringe needle;
The insulator separation is arranged between the first probe and the second probe;
The insulation sleeve is set in the first probe and the second probe periphery.
Preferably, the first wiring hole is provided with first conductive part, being provided with second on second conductive part connects String holes.
Preferably, the height of second conductive part is higher than the height of the first conductive part, and second wiring hole is arranged at Second conductive part is higher than at the position of the first conductive part.
Preferably, the length of first syringe needle and the second syringe needle is identical, and the insulating layer is in first syringe needle and Depressed area is formed between two syringe needles.
Preferably, first conductive part and the first syringe needle junction are formed with the first lug boss, second conductive part With the second syringe needle junction formed with the second lug boss, first lug boss and the second lug boss position correspondence.
Preferably, first probe, the second probe and insulating layer combine the probe assembly to be formed in cylinder.
Preferably, first probe is made with the second probe of alloy material, and alloy material hardness is more than 80HRA.
Other side according to the present utility model, additionally provides a kind of resistance value mechanism for testing, including:
The resistance value test probe assembly;
Driving mechanism, the driving mechanism test probe assembly movement for resistance value and provide driving force;
Buffer gear, the buffer gear include fixed plate, proae mounting plate and elastic parts;The probe assembly installation In the proae mounting plate, the proae mounting plate is connected with the fixed plate, and the fixed plate is fixed with the driving mechanism Connection, the elastic parts are arranged between fixed plate and proae mounting plate.
Preferably, the elastic parts includes connecting rod, spring;The fixed plate is connected with proae mounting plate by the connecting rod Connect, the spring pocket is arranged on the connecting rod between the fixed plate and proae mounting plate.
Preferably, mounting hole for installing probe assembly is provided with the proae mounting plate and for fastening probe groups The threaded hole of part, the threaded hole are set perpendicular to mounting hole, and one end of the threaded hole is connected with mounting hole;The threaded hole In be configured with bolt knob, the bolt knob is configured as forming the probe assembly in the mounting hole extruding fastening.
One of the utility model has technical effect that the overall compact degree that test plays pin improves, easy to test application.
By referring to the drawings to the detailed description of the exemplary embodiment of the utility model, the utility model it is other Feature and its advantage will be made apparent from.
Brief description of the drawings
The attached drawing of a part for constitution instruction describes the embodiment of the utility model, and uses together with the description In the principle for explaining the utility model.
Fig. 1 is the structure diagram for the resistance value test probe assembly that the embodiment of the utility model provides;
Fig. 2 is the side view of the resistance value test probe assembly shown in Fig. 1;
Fig. 3 is the top view of the resistance value test probe assembly shown in Fig. 1;
Fig. 4 is the structure diagram for the resistance value mechanism for testing that the embodiment of the utility model provides.
Embodiment
The various exemplary embodiments of the utility model are described in detail now with reference to attached drawing.It should be noted that:It is unless another Illustrate outside, the component and the positioned opposite of step, numerical expression and numerical value otherwise illustrated in these embodiments is unlimited The scope of the utility model processed.
The description only actually at least one exemplary embodiment is illustrative to be never used as to this practicality below New and its application or any restrictions used.
It may be not discussed in detail for technology and equipment known to person of ordinary skill in the relevant, but in appropriate situation Under, the technology and equipment should be considered as part for specification.
In shown here and discussion all examples, any occurrence should be construed as merely exemplary, without It is as limitation.Therefore, other examples of exemplary embodiment can have different values.
It should be noted that:Similar label and letter represents similar terms in following attached drawing, therefore, once a certain Xiang Yi It is defined, then it need not be further discussed in subsequent attached drawing in a attached drawing.
The utility model provides a kind of resistance value test probe assembly, as shown in Figs. 1-3, including:First probe 11, second Probe 12, insulating layer 13 and insulation sleeve 14.First probe 11 includes the first conductive part 111 and the first syringe needle 112, and described Two probes 12 include the second conductive part 121 and the second syringe needle 122;First conductive part, 111 and second conductive part, 121 position pair Should, 112 and second syringe needle of the first syringe needle, 122 position correspondence.The insulating layer 13 is arranged at first probe 11 and Between two probes 12, the first probe 11 is set definitely to insulate with the second probe 12, and 13 edge of insulating layer and the first probe 11 and Two probes, 12 mating surface edge is close.Insulating layer 13 is clipped in the middle by first probe 11 with the second probe 12.The insulation Set 14 is set in the periphery of the first probe 11 and the second probe 12, makes the first probe 11, the second probe 12 and is pressed from both sides between it exhausted Edge layer 13 forms the probe assembly 1 of a fastening.
Using the probe assembly of this technical solution, two probes of the four-wire system resistance value test application in a test point are closed Two be one, easy to carry out resistance test in narrow position.At the same time the probe assembly of this scheme because being formed using double probes One overall probe, the diameter of overall probe have increased relative to original independent pin that plays.This structure design adds probe Structural strength, thereby reduces the risk that probe fractures in use.Meanwhile this probe assembly is in combination and fractionation It is more convenient, facilitate using and replacing for probe.
The first wiring hole 113 is provided with first conductive part 111, first wiring hole 113 is conductive positioned at first One end away from the first syringe needle 112 in portion 111;The second wiring hole 123 is provided with second conductive part 21, described second connects String holes 123 is located at one end away from the second syringe needle 122 on the second conductive part 121.First wiring hole, 113 and second wiring hole There is screw thread, one section of conducting wire is provided with bolt, and it is detachably connected with conductive column to be connected through a screw thread mode, convenient in 123 holes The dismounting of probe assembly is replaced with each component.Those skilled in the art can also use other connection modes, such as weld, this The conversion of a little connection modes, belongs to the protection domain of the application.
Further, second conductive part 121 is higher relative to the height of the first conductive part 111, second wiring Hole 123 is located at the second conductive part 121 and is higher than at the position of the first conductive part 111.Such setting can make the first wiring hole 113 Stagger with the position of the second wiring hole 123, avoid the conducting wire bolt in the first wiring hole 113 and the second wiring hole 123 to insulation 13 corresponding position of layer forms extruding, causes insulating layer 13 to damage, so as to cause 13 failure of insulation of insulating layer, influences test result Stability and veracity.Moreover, the setting that two wire columns are one high and one low, can facilitate technical staff to understand resolution wire column Respective effect, avoids conducting wire wrong.
First syringe needle 112 is identical with the length of the second syringe needle 122, and when ensureing to carry out test action, two syringe needles can be same When contact tested element.There is insulating layer 13 between first syringe needle, 112 and second syringe needle 122, insulating layer 13 is at two The needle point position of syringe needle is formed with a depressed area.Syringe needle inevitably produces abrasion, depressed area after the work of more numbers Setting can ensure that syringe needle can work normally all the time, avoid syringe needle it is too short after insulating layer 13 to test impact.
First probe 11 is made with the second probe 12 of alloy material, and the hardness requirement of alloy material is more than 80HRA, Can so ensure that degree of wear when the first syringe needle 112 and the second syringe needle 122 work substantially reduces, extend the first probe 11 with In the service life of second probe 12, reduce maintenance cost.The utility model is not intended to limit the material hardness of the first probe and the second probe Above range is had to comply with, in other embodiments, the requirement of practical application can also be adapted to, select the material of other hardness Prepare probe.
The utility model additionally provides a kind of resistance value mechanism for testing, as shown in figure 4, including above-mentioned probe assembly 1, buffer Structure 2 and driving mechanism 3.The buffer gear 2 includes fixed plate 21, proae mounting plate 22, elastic parts 23, the probe assembly 1 is installed in the proae mounting plate 22, and the proae mounting plate 22 is connected with the fixed plate 21, the fixed plate 21 and institute Driving mechanism 3 is stated to connect.When the driving mechanism 3 drives the movement of fixed plate 21, the proae mounting plate 22 is with fixed plate 21 Mobile, the probe assembly 1 is moved with proae mounting plate 22, so that probe assembly 1 is moved to position to be tested, surveyed Examination.The driving mechanism 3 can be that mechanical devices, the utility model such as cylinder, hydraulic cylinder are limited not to this.
The proae mounting plate 22 and fixed plate 21 are floating connection, are provided between proae mounting plate 22 and fixed plate 21 Elastic parts 23, the elastic parts 23 include connecting rod and spring, and described connection one end is fixedly connected with fixed plate 21, the other end It is slidably connected with proae mounting plate 22, the spring pocket is arranged on connecting rod.When proae mounting plate 22 drives probe assembly 1 to touch After encountering element under test, if probe assembly 1 also continues to be subject to the power moved to element under test, at this moment, probe assembly 1 can be given and visit 22 1 reaction forces of pin installing plate, because the setting of elastic parts 23, proae mounting plate 22 can move in the opposite direction. Avoid, because driving mechanism causes probe assembly 1 to move down apart from excessive, making probe assembly 1 and the direct extruding force mistake of element under test Probe assembly 1 or damage element under test are damaged greatly, while also increase buffering reduction probe rent rushes element under test by 1 Hit, prevent probe assembly 1 from causing to weigh wounded to product, ensure that the stability of resistance value mechanism for testing, extend the longevity of probe assembly Life, reduces the abrasion of probe assembly and element under test, reduces resistance value mechanism for testing maintenance cost.
Two probe assemblies 1 are fixedly connected with the proae mounting plate 22, are provided with proae mounting plate 22 for pacifying The mounting hole of probe assembly 1 and the threaded hole for fastening probe assembly 1 are filled, the threaded hole is set perpendicular to mounting hole, It could be provided as substantially vertically, one end of threaded hole is connected with mounting hole, and bolt knob is configured with the threaded hole.It is described The size of mounting hole is more than the conductive part position of probe assembly 1, less than the protrusion position of probe assembly 1.During installation, by described in Probe assembly 1 is interspersed as in the mounting hole, probe assembly 1 then is fastened on mounting hole by the bolt knob in threaded hole In.When needing dismounting, bolt knob is unclamped by rotating, so that it may probe assembly is quickly removed from mounting hole.This practicality The resistance value mechanism for testing of new offer largely reduces process when usually safeguarding, the installation and removal of probe assembly are more Time saving for convenience, the combination of probe assembly in itself also more can be quick with splitting, when probe assembly needs replacing, it is not necessary to borrow Help other instruments.Meanwhile the service life of probe assembly is also extended, improve the stability of resistance value mechanism for testing.
Although some specific embodiments of the utility model are described in detail by example, this area It is to be understood by the skilled artisans that above example merely to illustrate, rather than in order to limit the scope of the utility model.This Field it is to be understood by the skilled artisans that can not depart from the scope of the utility model and spirit in the case of, to above example Modify.The scope of the utility model is defined by the following claims.

Claims (10)

1. a kind of resistance value tests probe assembly, it is characterised in that including:First probe, the second probe, insulating layer, insulation sleeve;
First probe includes the first conductive part and the first syringe needle, and second probe includes the second conductive part and the second pin Head, the position correspondence of first conductive part and the second conductive part, the position correspondence of first syringe needle and the second syringe needle;
The insulator separation is arranged between the first probe and the second probe;
The insulation sleeve is set in the first probe and the second probe periphery.
2. resistance value according to claim 1 tests probe assembly, it is characterised in that the is provided with first conductive part One wiring hole, is provided with the second wiring hole on second conductive part.
3. resistance value according to claim 2 tests probe assembly, it is characterised in that the height of second conductive part is higher than The height of first conductive part, second wiring hole are arranged at the second conductive part and are higher than at the position of the first conductive part.
4. resistance value according to claim 1 tests probe assembly, it is characterised in that first syringe needle and the second syringe needle Length is identical, and the insulating layer forms depressed area between first syringe needle and the second syringe needle.
5. resistance value according to claim 1 tests probe assembly, it is characterised in that first conductive part and the first syringe needle Junction formed with the first lug boss, second conductive part and the second syringe needle junction formed with the second lug boss, described One lug boss and the second lug boss position correspondence.
6. resistance value according to claim 1 tests probe assembly, it is characterised in that first probe, the second probe and Insulating layer combines the probe assembly to be formed in cylinder.
7. resistance value according to claim 1 tests probe assembly, it is characterised in that first probe is with the second probe Alloy material is made, and alloy material hardness is more than 80HRA.
A kind of 8. resistance value mechanism for testing, it is characterised in that including:
Any resistance value test probe assemblies of claim 1-7;
Driving mechanism, the driving mechanism test probe assembly movement for resistance value and provide driving force;
Buffer gear, the buffer gear include fixed plate, proae mounting plate and elastic parts;The probe assembly is installed on institute Proae mounting plate is stated, the proae mounting plate is connected with the fixed plate, and the fixed plate is fixedly connected with the driving mechanism, The elastic parts is arranged between fixed plate and proae mounting plate.
9. resistance value mechanism for testing according to claim 8, it is characterised in that the elastic parts includes connecting rod, spring;Institute State fixed plate to be connected by the connecting rod with proae mounting plate, the spring pocket is arranged between the fixed plate and proae mounting plate Connecting rod on.
10. resistance value mechanism for testing according to claim 8, it is characterised in that be provided with and be used in the proae mounting plate The mounting hole of probe assembly and the threaded hole for fastening probe assembly are installed, the threaded hole is set perpendicular to mounting hole, institute The one end for stating threaded hole is connected with mounting hole;It is configured with bolt knob in the threaded hole, the bolt knob is configured as pair Probe assembly in the mounting hole forms extruding fastening.
CN201721297608.0U 2017-10-10 2017-10-10 A kind of resistance value test probe assembly and resistance value mechanism for testing Active CN207301177U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201721297608.0U CN207301177U (en) 2017-10-10 2017-10-10 A kind of resistance value test probe assembly and resistance value mechanism for testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201721297608.0U CN207301177U (en) 2017-10-10 2017-10-10 A kind of resistance value test probe assembly and resistance value mechanism for testing

Publications (1)

Publication Number Publication Date
CN207301177U true CN207301177U (en) 2018-05-01

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ID=62414689

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201721297608.0U Active CN207301177U (en) 2017-10-10 2017-10-10 A kind of resistance value test probe assembly and resistance value mechanism for testing

Country Status (1)

Country Link
CN (1) CN207301177U (en)

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Effective date of registration: 20201016

Address after: 261031 north of Yuqing street, east of Dongming Road, high tech Zone, Weifang City, Shandong Province (Room 502, Geer electronic office building)

Patentee after: GoerTek Optical Technology Co.,Ltd.

Address before: 266104 Laoshan Qingdao District North House Street investment service center room, Room 308, Shandong

Patentee before: GOERTEK TECHNOLOGY Co.,Ltd.

TR01 Transfer of patent right