CN207124035U - A kind of DDR4 multipurpose test systems - Google Patents
A kind of DDR4 multipurpose test systems Download PDFInfo
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- CN207124035U CN207124035U CN201621407152.4U CN201621407152U CN207124035U CN 207124035 U CN207124035 U CN 207124035U CN 201621407152 U CN201621407152 U CN 201621407152U CN 207124035 U CN207124035 U CN 207124035U
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- ddr4
- cabinet
- testing host
- test systems
- trumpeter
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Abstract
The utility model provides a kind of DDR4 multipurpose test systems, includes:Cabinet, test module and blower fan and PC, test module is installed on cabinet, assembling is arranged on the back upper place of cabinet by connecting rod in the both sides of cabinet, PC, and PC is connected with test module;Test module includes:Plug-in and pull-off device, transition card, testing host, the fixing device of installation test memory is provided with the one side of transition card, transition card is arranged on below plug-in and pull-off device, is provided with slot above testing host one side, transition card is movably connected on testing host by slot.The utility model is simple in construction, easy for installation, improves the utilization rate of test device, saves the testing time, cost-effective, is easy to repair.
Description
Technical field
The utility model relates generally to memory test field, more particularly to a kind of DDR4 multipurpose test systems.
Background technology
First generation DDR4 test system equipment, can only test SD products, i.e. notebook computer memory bar, test product compares
It is single, diversification infrastructure product demand can not be met, i.e., can not realize notebook computer, common desktop computer and server electricity
The test of brain memory bar.In addition, testing host installation is few in test device, operating efficiency, testing cost increase are reduced.
Utility model content
The utility model provides a kind of DDR4 multipurpose test systems, using the combination of plug-in and pull-off device and transition card, and more
New testing host, realize that same test machine tests different memory articles, in order to achieve the above object, the utility model use with
Lower technical scheme:The utility model includes:Cabinet 1, test module 2 and blower fan 3 and PC 4, survey is installed on the cabinet 1
Die trial block 2, the blower fan 3 are arranged on the both sides of cabinet 1, and the PC 4 is arranged on the back upper place of cabinet 1 by connecting rod 5, described
PC 4 is connected with test module 2;The test module 2 includes:Plug-in and pull-off device 21, transition card 22, testing host 23, described turn
Change in the one side of card 22 and be provided with the fixing device 24 of installation test memory, the transition card 22 is arranged under plug-in and pull-off device 21
Side, the one side of testing host 23 top are provided with slot 25, and the transition card 22 is movably connected in test by slot 25
On mainboard 23.
Preferably, the plug-in and pull-off device 21 includes horizontal base 211, and horizontal slot is provided with the horizontal base 211,
Extend on the horizontal base 211 along horizontal slot both ends and be symmetrically arranged with fixing groove 212, it is solid on the horizontal base 211
Surely No. 1 connecting rod 215 is connected with, the upper end of No. 1 connecting rod 215 is connected with 1 trumpeter's handle 213, No. 1 connecting rod 215
Lower end is flexibly connected with the horizontal component of No. 2 connecting rods 216, and No. 2 connecting rods 216 are in L types, No. 2 connecting rods 216 it is vertical
Piecemeal activity is connected with 2 trumpeter's handles 214, and the 1 trumpeter handle 213 and 2 trumpeter's handles 214 are symmetrical arranged;The He of 1 trumpeter handle 213
The lower section of 2 trumpeter's handle 214 is connected to spring lever 217, and the spring lever 217 is arranged on above horizontal slot.
Preferably, the horizontal base 211 is provided at both ends with positioning hole, and the horizontal base 211 is logical with testing host 23
Bolt 218 is crossed to fix through positioning hole.
Preferably, blower fan is installed, the blower fan is connected to the power input of testing host 23 on the testing host 23
On end.
Preferably, the test module 2 at least opposed, side-by-side is provided with 20.
Preferably, in addition to alarm lamp 6, the alarm lamp 6 are connected on testing host 23, and the alarm lamp is arranged on PC
The rear of machine 4.
Preferably, in addition to controlling switch 7 and abnormal scram button 8.
Preferably, the both sides of cabinet 1 are additionally provided with air outlet 11.
Preferably, the lower section of cabinet 1 is provided with 4 universal wheels 9.
The beneficial effects of the utility model:The utility model installs transition card below plug-in and pull-off device, and to test module
Quantity, structure be adjusted, notebook, desktop computer can be applicable simultaneously, in server using same test device by having reached
Deposit into the purpose of row test.The utility model is simple in construction, easy for installation, improves the applicability and utilization rate of test device,
The testing time is saved, it is cost-effective, it is easy to repair, and can effectively exclude caused heat in test process.
Brief description of the drawings
Fig. 1 is front view of the present utility model;
Fig. 2 is left view of the present utility model;
Fig. 3 is the mplifying structure schematic diagram on test module in the utility model;
In figure,
1st, cabinet, 11, air outlet;
2nd, test module, 21, plug-in and pull-off device, 211, horizontal base, 212, fixing groove, 213,1 trumpeter's handle, 214,2 trumpeters
Handle, 215, No. 1 connecting rods, 216, No. 2 connecting rods, 217, spring lever, 218, bolt, 22, transition card, 23, testing host, 24, fixed
Device, 25, slot;
3rd, blower fan;
4th, PC;
5th, connecting rod;
6th, alarm lamp;
7th, controlling switch;
8th, abnormal scram button;
9th, universal wheel.
Embodiment
Understand as Figure 1-3, the utility model includes:Cabinet 1, test module 2 and blower fan 3 and PC 4, the machine
Test module 2 is installed, the blower fan 3 is arranged on the both sides of cabinet 1, and the PC 4 is arranged on cabinet 1 by connecting rod 5 on case 1
Back upper place, the PC 4 is connected with test module 2;The test module 2 includes:Plug-in and pull-off device 21, transition card 22, test
Mainboard 23, the fixing device 24 of installation test memory is provided with the one side of the transition card 22, and the transition card 22 is arranged on
The lower section of plug-in and pull-off device 21, the one side of testing host 23 top are provided with slot 25, and the transition card 22 is lived by slot 25
It is dynamic to be connected on testing host 23.
Preferable in this embodiment, the plug-in and pull-off device 21 includes horizontal base 211, is set in the horizontal base 211
There is horizontal slot, extend on the horizontal base 211 along horizontal slot both ends and be symmetrically arranged with fixing groove 212, the level
It is fixedly connected with No. 1 connecting rod 215 on pedestal 211, the upper end of No. 1 connecting rod 215 is connected with 1 trumpeter's handle 213, and described 1
The lower end of number connecting rod 215 is flexibly connected with the horizontal component of No. 2 connecting rods 216, and No. 2 connecting rods 216 are L-shaped, No. 2 connecting rods
216 vertical portion is connected with 2 trumpeter's handles 214, and the 1 trumpeter handle 213 and 2 trumpeter's handles 214 are symmetrical arranged;Described No. 1
The lower section of 213 and 2 trumpeter's handle of handle 214 is connected to spring lever 217, and the spring lever 217 is arranged on above horizontal slot.
Preferable in this embodiment, the horizontal base 211 is provided at both ends with positioning hole, and the horizontal base 211 is with surveying
Examination mainboard 23 is fixed by bolt 218 through positioning hole.
It is preferable in this embodiment, blower fan is installed, the blower fan is connected to testing host 23 on the testing host 23
Power input on.
Preferable in this embodiment, the test module 2 at least opposed, side-by-side is provided with 20.
In this embodiment preferably, in addition to alarm lamp 6, the alarm lamp 6 are connected on testing host 23, the alarm
Lamp is arranged on the rear of PC 4.
It is preferable in this embodiment, in addition to controlling switch 7 and abnormal scram button 8.
Preferable in this embodiment, the both sides of cabinet 1 are additionally provided with air outlet 11.
Preferable in this embodiment, the lower section of cabinet 1 is provided with 4 universal wheels 9.
In use, two horizontal slots, the opposite side of testing host 23 are arranged with horizontal base 211 in parallel
The positional symmetry that face corresponds to slot 25 is provided with slot 25.Typically in test process, test module is provided with 20, is provided with
20 mainboards, every mainboard test 2 products, and the overall efficiency of equipment is apparently higher than first generation equipment.
In implementation, it would be desirable to which the server or desktop computer memory bar of detection are directly installed on the horizontal slot of plug-in and pull-off device
Interior, being then plugged on testing host to be tested;And notebook memory bar is first arranged on transition card, then pass through plug
Device is fixed on testing host, starts control controlling switch, the memory bar on each testing host is tested, and instead
It is fed on PC, such as occurs surprisingly, to start abnormal scram button, alarm lamp Chang Liang, play warning function.
The principle and its effect of above-described embodiment only illustrative present patent application, not for limitation this patent Shen
Please.Any person skilled in the art can all be carried out under the spirit and scope without prejudice to present patent application to above-described embodiment
Modifications and changes.Therefore, such as those of ordinary skill in the art without departing from the essence disclosed in present patent application
God is covered with all equivalent modifications or change, the claim that should be asked by this patent completed under technological thought.
Claims (9)
1. a kind of DDR4 multipurpose test systems, including:Cabinet (1), test module (2) and blower fan (3) and PC (4), it is described
Test module (2) is installed, the blower fan (3) is arranged on the both sides of cabinet (1), and the PC (4) passes through connecting rod on cabinet (1)
(5) back upper place of cabinet (1) is arranged on, the PC (4) is connected with test module (2);
The test module (2) includes:Plug-in and pull-off device (21), transition card (22), testing host (23), the transition card (22)
The fixing device (24) of installation test memory is provided with simultaneously, the transition card (22) is arranged on below plug-in and pull-off device (21),
Slot (25) is provided with above testing host (23) one side, the transition card (22) is movably connected in by slot (25)
On testing host (23).
A kind of 2. DDR4 multipurpose test systems according to claim 1, it is characterised in that:Plug-in and pull-off device (21) bag
Include horizontal base (211), be provided with horizontal slot in the horizontal base (211), along level on the horizontal base (211)
The extension of slot both ends is symmetrically arranged with fixing groove (212), and No. 1 connecting rod (215) is fixedly connected with the horizontal base (211),
The upper end of No. 1 connecting rod (215) is connected with 1 trumpeter's handle (213), lower end and No. 2 connecting rods of No. 1 connecting rod (215)
(216) horizontal component is flexibly connected, and No. 2 connecting rods (216) are L-shaped, the vertical portion activity of No. 2 connecting rods (216)
2 trumpeter's handles (214) are connected with, the 1 trumpeter handle (213) and 2 trumpeter's handles (214) are symmetrical arranged;The 1 trumpeter handle (213) and 2
Spring lever (217) is connected to below trumpeter's handle (214), the spring lever (217) is arranged on above horizontal slot.
A kind of 3. DDR4 multipurpose test systems according to claim 2, it is characterised in that:The horizontal base (211)
Positioning hole is provided at both ends with, the horizontal base (211) is fixed with testing host (23) by bolt (218) through positioning hole.
A kind of 4. DDR4 multipurpose test systems according to claim 1, it is characterised in that:On the testing host (23)
Blower fan is installed, the blower fan is connected on the power input of testing host (23).
A kind of 5. DDR4 multipurpose test systems according to claim 1, it is characterised in that:The test module (2) is extremely
Few opposed, side-by-side is provided with 20.
A kind of 6. DDR4 multipurpose test systems according to claim 1, it is characterised in that:Also include alarm lamp (6), institute
State alarm lamp (6) to be connected on testing host (23), the alarm lamp is arranged on PC (4) rear.
A kind of 7. DDR4 multipurpose test systems according to claim 1, it is characterised in that:Also include controlling switch (7)
With abnormal scram button (8).
A kind of 8. DDR4 multipurpose test systems according to claim 1, it is characterised in that:Cabinet (1) both sides are also
It is provided with air outlet (11).
A kind of 9. DDR4 multipurpose test systems according to claim 1, it is characterised in that:Pacify below the cabinet (1)
Equipped with 4 universal wheels (9).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201621407152.4U CN207124035U (en) | 2016-12-21 | 2016-12-21 | A kind of DDR4 multipurpose test systems |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201621407152.4U CN207124035U (en) | 2016-12-21 | 2016-12-21 | A kind of DDR4 multipurpose test systems |
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CN207124035U true CN207124035U (en) | 2018-03-20 |
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CN201621407152.4U Active CN207124035U (en) | 2016-12-21 | 2016-12-21 | A kind of DDR4 multipurpose test systems |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111104268A (en) * | 2018-10-28 | 2020-05-05 | 海太半导体(无锡)有限公司 | Device for testing parallel application performance of multiple memory banks |
-
2016
- 2016-12-21 CN CN201621407152.4U patent/CN207124035U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111104268A (en) * | 2018-10-28 | 2020-05-05 | 海太半导体(无锡)有限公司 | Device for testing parallel application performance of multiple memory banks |
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