CN206990743U - A kind of IGBT Simplified Test Equipments - Google Patents
A kind of IGBT Simplified Test Equipments Download PDFInfo
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- CN206990743U CN206990743U CN201720892788.0U CN201720892788U CN206990743U CN 206990743 U CN206990743 U CN 206990743U CN 201720892788 U CN201720892788 U CN 201720892788U CN 206990743 U CN206990743 U CN 206990743U
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- jack
- igbt
- colelctor electrode
- emitter stage
- power supply
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Abstract
The utility model discloses a kind of IGBT Simplified Test Equipments, including grid jack, colelctor electrode jack, emitter stage jack, power supply, indicator lamp, test switch and examination lamp switch；Wherein, the grid jack is used for the grid for connecting IGBT；The colelctor electrode jack is used for the colelctor electrode for connecting IGBT；The emitter stage jack is used for the emitter stage for connecting IGBT；Colelctor electrode jack described in the positive pole connection of the power supply, the emitter stage jack described in the negative pole connection of the power supply；The indicator lamp is connected between the positive pole of the power supply and colelctor electrode jack；The test switch is connected between the positive pole of the power supply and grid jack；The examination lamp switch is connected across between the colelctor electrode jack and emitter stage jack.Test device of the present utility model is simple in construction, easy to use, and facility can be not only provided for service work, shortens the repair time, and trouble-free IGBT device can be avoided to be abandoned, and saves maintenance cost.
Description
Technical field
The utility model belongs to detection device technology field, is to be related to one kind to be for detecting IGBT device specifically
The test device of no damage.
Background technology
IGBT（Insulated Gate Bipolar Transistor）Insulated gate bipolar transistor, it is by BJT（It is double
Polar form triode）And MOS（Insulating gate type field effect tube）The compound full-control type voltage driven type power semiconductor of composition, it is simultaneous
The aspect advantage of low conduction voltage drop two of high input impedance and GTR with MOSFET, is highly suitable to be applied for DC voltage and exists
In more than 600V converter system, such as the field such as alternating current generator, frequency converter, towing gear.
At present, sea transport is most important means of transportation in international logistics, in the total freight volume of international trade more than 2/3,
About the 90% of China's inlet and outlet shipping total amount is all to utilize marine transportation.And bridge crane as on harbour be used for carry out handling operation
Crane, is the heart strength of harbour, and bridge crane work capacity decides the cargo loading and unloading ability of a harbour.And IGBT is bridge crane
The core power device of driver converter plant, in the failure that bridge crane frequency converter occurs, IGBT damages occupy very big ratio.
But after IGBT damages, some has obvious damage sign, it is easy to recognizes；And some can not only identify from outward appearance
It is bad, so as to bring certain difficulty to malfunction elimination work, it drastically influence the operating efficiency and ocean cargo transport of harbour
Bulk velocity.Therefore, a IGBT test devices easy to use of design just seem and are highly desirable.
The content of the invention
The purpose of this utility model is to provide a kind of IGBT Simplified Test Equipments whether can occur event to IGBT device
Barrier is realized and fast and accurately detected.
In order to solve the above technical problems, the utility model is achieved using following technical scheme：
A kind of IGBT Simplified Test Equipments, including grid jack, colelctor electrode jack, emitter stage jack, power supply, indicator lamp,
Test switch and examination lamp switch；Wherein, the grid jack is used for the grid for connecting IGBT；The colelctor electrode jack is used to connect
IGBT colelctor electrode；The emitter stage jack is used for the emitter stage for connecting IGBT；Current collection described in the positive pole connection of the power supply
Pole jack, the emitter stage jack described in the negative pole connection of the power supply；The indicator lamp is connected on the positive pole and collection of the power supply
Between electrode jack；The test switch is connected between the positive pole of the power supply and grid jack；The examination lamp switch bridging
Between the colelctor electrode jack and emitter stage jack.
Further, be additionally provided with current-limiting resistance in the IGBT Simplified Test Equipments, the current-limiting resistance with it is described
After indicator lamp series connection, it is connected between the positive pole of the power supply and colelctor electrode jack.
Preferably, the power supply can select 9V batteries.
For the ease of execute-in-place, shell and three probes are additionally provided with the IGBT Simplified Test Equipments；Institute
State and described grid jack, colelctor electrode jack and emitter stage jack are laid on the housing of shell；Three probes are placed on institute
Shell is stated, is inserted in use, being plugged on described grid jack, colelctor electrode jack and emitter stage correspondingly by wire respectively
Kong Zhong.Using three probe contact measured IGBT grid, collector and emitter, therefore without by IGBT to be measured from original equipment
On pull down, you can at the scene complete IGBT test assignment, it is convenient and swift.
For the ease of the IGBT Simplified Test Equipments described in technical staff's hand-held, preferably by the grid jack, collection
Electrode jack and emitter stage jack are laid in the left side of shell, and the test switch is laid in the right side of shell, the indicator lamp
The top of shell is laid in, the examination lamp switch is laid in the bottom of shell；The power supply is laid in the inside of shell.
Compared with prior art, the advantages of the utility model and good effect is：The utility model is according to IGBT device
Working characteristics devises a IGBT test devices, has the characteristics that simple in construction, cost is cheap, compact, easy to use,
On-the-spot test environment can be well adapted for, and it is simple to operate, it is easy to grasp, facility can be not only provided for service work, contracts
The short repair time, and trouble-free IGBT device can be avoided to be abandoned, save maintenance cost.
After the detailed description of the utility model embodiment is read in conjunction with the figure, other features and advantage of the present utility model
It will become clearer.
Brief description of the drawings
Fig. 1 is the equivalent circuit schematic of igbt transistor；
Fig. 2 is a kind of circuit theory diagrams of the embodiment for the IGBT Simplified Test Equipments that the utility model is proposed；
Fig. 3 is a kind of outside overall structure signal of the embodiment for the IGBT Simplified Test Equipments that the utility model is proposed
Figure；
Fig. 4 is a kind of embodiment of the IGBT method of testings proposed based on IGBT Simplified Test Equipments of the present utility model
Flow chart.
Embodiment
Specific embodiment of the present utility model is described in more detail below in conjunction with the accompanying drawings.
First, the IGBT equivalent circuit diagrams with reference to shown in Fig. 1, brief analysis is carried out to the operation principle of igbt transistor：
Igbt transistor includes three grid g, colelctor electrode c, emitter e terminals, non-through i.e. disconnected between emitter e and colelctor electrode c.When
When the forward voltage equal to 6V is applied more than between the grid g and emitter e of igbt transistor, MOSFET conductings, such PNP
Into low resistive state, PNP transistor conducting, so that the transmitting of igbt transistor between the colelctor electrode and base stage of transistor npn npn
It is in the conduction state between pole e and colelctor electrode c.And when the voltage between IGBT grid g and emitter e for 0V or applies anti-
During to voltage, MOSFET cut-offs, the supply of PNP transistor base current is cut off so that PNP transistor turns off, so as to
With allow igbt transistor emitter e and colelctor electrode c between be in cut-off state.
Above-mentioned working characteristics based on igbt transistor, the present embodiment propose a kind of IGBT Simplified Test Equipments, its electricity
Line structure including grid jack G, colelctor electrode jack C, emitter stage jack E, power supply VCC, indicator lamp L, test as shown in Fig. 2 open
Close the chief component such as K1 and examination lamp switch K2.Wherein, grid jack G, colelctor electrode jack C and emitter stage jack E can be adopted
With the standard metal female part of routine, the grid, colelctor electrode and transmitting with igbt transistor to be measured are respectively used in test
Pole corresponds connection, and igbt transistor to be measured is linked into test circuit.Power supply VCC is low-voltage dc power supply, preferably
It is more than or equal to 6V battery, such as 9V lithium battery using output voltage, is provided for igbt transistor to be measured and be enough to control it to lead
Logical driving voltage.Indicator lamp L is used for indicating fault status, can select the luminescent devices such as bulb or LED, be connected on power supply
Between VCC positive pole and colelctor electrode jack C.As a kind of preferred circuit design of the present embodiment, in power supply VCC positive pole
In connection line between colelctor electrode jack C, in addition to the described indicator lamp L that connects, the current limliting that can also further connect electricity
R is hindered, the electric current of igbt transistor to be measured is flowed through with limitation, and then improve the reliability of test circuit work.By the negative of power supply VCC
Pole is connected to described emitter stage jack E, and test switch K1 is connected between power supply VCC positive pole and grid jack G, with selection
Property to igbt transistor to be measured provide driving voltage.Lamp switch K2 will be tried and be connected across described colelctor electrode jack C and emitter stage
Between jack E, by by described colelctor electrode jack C and emitter stage jack E short circuits, for detection indicator lamp L's itself therefore
Barrier state.
In the present embodiment, the test switch K1 and examination lamp switch K2 preferably use the button that function is kept without pressing,
And button, when pressing, switch conduction, circuit is connected；When button lifts, switch off, circuit cut-out.By changing different switches
On off operating mode, to control test circuit to be operated under different test patterns.
For the ease of execute-in-place and use, shell 1 is additionally provided with the Simplified Test Equipment of the present embodiment, such as Fig. 3
It is shown, such as rectangular parallelepiped structure can be designed to.By grid jack G, colelctor electrode jack C, emitter stage jack E, indicator lamp L, survey
K1 is closed in runin and examination lamp switch K2 is laid on the housing of the shell 1, in order to which user operates.
Specifically, the grid jack G, colelctor electrode jack C, emitter stage jack E can be laid in the left side of shell 1
Housing 11（Or right shell 12）On, test switch K1 is laid in the right shell 12 of shell 1（Or left shell 11）On, instruction
Lamp L is laid on the top shell 13 of shell 1, and examination lamp switch K2 is laid on the bottom shell 14 of shell 1, power supply VCC and limit
Leakage resistance R is built in shell 1.When being tested using the Simplified Test Equipment igbt transistor to be measured, in order to just
In igbt transistor to be measured is linked into test circuit as shown in Figure 2, the present embodiment is gone back in the Simplified Test Equipment
Three probes 2,3,4 are configured with, as shown in Figure 3.Three probes 2,3,4 are passed through into the grafting correspondingly of wire 5,6,7 respectively
In described colelctor electrode jack C, emitter stage jack E and grid jack G, contact measured is distinguished using three probes 2,3,4
Colelctor electrode, emitter stage and the grid of igbt transistor, to realize igbt transistor to be measured and the test electricity in Simplified Test Equipment
The electric connection on road, and then by operating fault detect of the Simplified Test Equipment completion to igbt transistor to be measured.
With reference to the hardware configuration of the IGBT Simplified Test Equipments shown in Fig. 2, Fig. 3, to the test side of igbt transistor
Method is specifically addressed, as shown in figure 4, including procedure below：
1st, indicator lamp test process：
S401, examination lamp switch K2 is pressed, whether good detect indicator lamp L；
The present embodiment to igbt transistor to be measured before fault detect is carried out, and detecting indicator lamp L first, whether performance is good
It is good, to avoid the IGBT test result mistakes caused by indicator lamp L failures.
Specifically, examination lamp switch K2 can be pressed first before fault detect is carried out to igbt transistor to be measured, will
Colelctor electrode jack C and emitter stage jack E short circuits, with reference to shown in Fig. 2.Now, if indicator lamp L lights, indicator lamp L is being judged just
Often；If indicator lamp L does not light, indicator lamp L failures are judged.
Examination lamp switch K2 is lifted, performs subsequent process.
If S402, indicator lamp L are normal, follow-up IGBT test process is performed；If indicator lamp L failures, change indicator lamp
L, and repetitive process S401, until the indicator lamp L detections in test circuit are normal, enter back into follow-up IGBT test process.
2nd, IGBT test process：
S403, the colelctor electrode, emitter stage and grid for corresponding to using three probes 2,3,4 contact measured igbt transistor respectively
Pole；
Specifically, the current collection of the contact measured igbt transistor of probe 2 plugged with colelctor electrode jack C can be utilized
Pole；Using the emitter stage of the contact measured igbt transistor of probe 3 plugged with emitter stage jack E, using with grid jack G phases
The grid of the contact measured igbt transistor of probe 4 of grafting, so as to which igbt transistor to be measured to be linked into test as shown in Figure 2
In circuit.
Whether S404, viewing lamp L light, and judge igbt transistor to be measured with the presence or absence of breakdown event according to luminance
Barrier；
This process is i.e. executable when igbt transistor to be measured is linked into test circuit.
If S405, indicator lamp L light, the colelctor electrode and emitter stage that judge igbt transistor to be measured puncture, IGBT to be measured
Transistor has damaged；If indicator lamp L does not light, follow-up further IGBT test process is performed；
If the collector and emitter of igbt transistor to be measured has breakdown fault, by the igbt transistor to be measured
When being linked into test circuit, because the collector and emitter of igbt transistor to be measured punctures, thus cause colelctor electrode jack C
With emitter stage jack E short circuits, indicator lamp L current supply circuit connects, and indicator lamp L lights, and indicates IGBT failures.
If indicator lamp L does not light, it can be determined that breakdown event is not present in the collector and emitter of igbt transistor to be measured
Barrier, but it is whether normal, also need further to perform follow-up test process.
S406, press test switch K1, according to indicator lamp L luminance judge igbt transistor to be measured whether failure.
If S407, indicator lamp L light, the igbt transistor fault-free to be measured is judged；If indicator lamp L does not light,
Judge that the igbt transistor to be measured has damaged；
With reference to shown in Fig. 2, after test switch K1 is pressed, grids and emitter stage of the power supply VCC in igbt transistor to be measured
Between apply positive drive voltage, now, if igbt transistor to be measured is normal, igbt transistor to be measured conducting, indicator lamp L hairs
Light；If igbt transistor failure to be measured, igbt transistor to be measured keeps cut-off state, and indicator lamp L does not light, it is possible thereby to sentence
Fixed igbt transistor failure to be measured.
So far, the test process of igbt transistor is just completed.
The IGBT Simplified Test Equipments of the present embodiment are simple and practical, although simply forming a few electronic component
Test circuit is encapsulated in set up in a compact shell and formed, and cost is cheap, but function is notable, simple to operate, easily the palm
Hold, applied in the fault detect of bridge crane frequency converter, can quickly and accurately identify rapid wear device in bridge crane frequency converter
IGBT quality, so as to improve overhaul efficiency, ensure being smoothed out for dock operation.
Certainly, it is to be also not limited to the example above to limitation of the present utility model, the utility model that described above, which is not,
The variations, modifications, additions or substitutions that those skilled in the art are made in essential scope of the present utility model,
Also the scope of protection of the utility model should be belonged to.
Claims (5)
- A kind of 1. IGBT Simplified Test Equipments, it is characterised in that including：Grid jack, for connecting IGBT grid；Colelctor electrode jack, for connecting IGBT colelctor electrode；Emitter stage jack, for connecting IGBT emitter stage；Power supply, the described colelctor electrode jack of its positive pole connection, the described emitter stage jack of its negative pole connection；Indicator lamp, it is connected between the positive pole of the power supply and colelctor electrode jack；Test switch, it is connected between the positive pole of the power supply and grid jack；Lamp switch is tried, it is connected across between the colelctor electrode jack and emitter stage jack.
- 2. IGBT Simplified Test Equipments according to claim 1, it is characterised in that also include：Current-limiting resistance, after it connects with the indicator lamp, it is connected between the positive pole of the power supply and colelctor electrode jack.
- 3. IGBT Simplified Test Equipments according to claim 1, it is characterised in that the power supply is 9V batteries.
- 4. IGBT Simplified Test Equipments according to any one of claim 1 to 3, it is characterised in that also include：Shell, described grid jack, colelctor electrode jack and emitter stage jack are laid on its housing；Three probes, its external described shell, inserted in use, being plugged on described grid correspondingly by wire respectively In hole, colelctor electrode jack and emitter stage jack.
- 5. IGBT Simplified Test Equipments according to claim 4, it is characterised in that the grid jack, colelctor electrode jack The left side of shell is laid in emitter stage jack, the test switch is laid in the right side of shell, and the indicator lamp is laid in outer The top of shell, the examination lamp switch are laid in the bottom of shell；The power supply is laid in the inside of shell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720892788.0U CN206990743U (en) | 2017-07-21 | 2017-07-21 | A kind of IGBT Simplified Test Equipments |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720892788.0U CN206990743U (en) | 2017-07-21 | 2017-07-21 | A kind of IGBT Simplified Test Equipments |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206990743U true CN206990743U (en) | 2018-02-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720892788.0U Expired - Fee Related CN206990743U (en) | 2017-07-21 | 2017-07-21 | A kind of IGBT Simplified Test Equipments |
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| CN (1) | CN206990743U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110632492A (en) * | 2019-10-12 | 2019-12-31 | 盐田国际集装箱码头有限公司 | Portable IGBT tester |
-
2017
- 2017-07-21 CN CN201720892788.0U patent/CN206990743U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110632492A (en) * | 2019-10-12 | 2019-12-31 | 盐田国际集装箱码头有限公司 | Portable IGBT tester |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180209 Termination date: 20180721 |
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| CF01 | Termination of patent right due to non-payment of annual fee |