CN206976282U - A kind of sample platform of scanning electronic microscope suitable for semicolumn sample - Google Patents
A kind of sample platform of scanning electronic microscope suitable for semicolumn sample Download PDFInfo
- Publication number
- CN206976282U CN206976282U CN201720604339.1U CN201720604339U CN206976282U CN 206976282 U CN206976282 U CN 206976282U CN 201720604339 U CN201720604339 U CN 201720604339U CN 206976282 U CN206976282 U CN 206976282U
- Authority
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- China
- Prior art keywords
- sample
- semicolumn
- electronic microscope
- scanning electronic
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000000463 material Substances 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
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- Sampling And Sample Adjustment (AREA)
Abstract
It the utility model is related to a kind of sample platform of scanning electronic microscope suitable for semicolumn sample, including base, the upper surface of the base is installed with baffle plate vertically, the bottom of the baffle plate is evenly equipped with several horizontal grooves along longitudinal direction, the slide plate extended laterally is inserted with the horizontal groove, the both ends of the slide plate are vertically installed with projection, are respectively connected with spring between one end projection and baffle plate of the slide plate, the spring of several slide plates is respectively positioned on the same side.The structure that this is applied to the sample platform of scanning electronic microscope of semicolumn sample is simple.
Description
Technical field
It the utility model is related to a kind of sample platform of scanning electronic microscope suitable for semicolumn sample.
Background technology
Because in recent years, Materials and application are increasingly quicker and extensive, so that investigation of materials is further frequent, and its
In different, variable thickness material sample brought up to experimental bench.It is right but sample stage function commercial on the market is single at present
Aspect is measured simultaneously in different-thickness sample and there is no available appropriate samples platform, and this has just inspired researcher for integrated-type
The demand of sample stage.When being measured for the sample of different-thickness, typically use single specimen sample platform and measure successively, so
Operating efficiency is low, with duration and accuracy is without guarantee.
Utility model content
In view of the deficiencies in the prior art, technical problem to be solved in the utility model is to provide one kind and is applied to semicolumn
The sample platform of scanning electronic microscope of sample, is not only simple in structure, and convenient and efficient.
In order to solve the above-mentioned technical problem, the technical solution of the utility model is：A kind of sweeping suitable for semicolumn sample
Electron microscopic sample platform, including base are retouched, the upper surface of the base is installed with baffle plate vertically, and the bottom of the baffle plate is equal along longitudinal direction
Several horizontal grooves are furnished with, the slide plate extended laterally is inserted with the horizontal groove, the both ends of the slide plate are hung down
Projection directly is installed with, is respectively connected with spring between one end projection and baffle plate of the slide plate, the spring of several slide plates is respectively positioned on
The same side.
Preferably, one end of the spring is connected with projection, the other end and baffle plate are connected.
Preferably, the horizontal groove be shaped as it is square.
Preferably, the length of the base is 39.00mm, width 34.00mm, is highly 3.00mm.
Preferably, the quantity of the horizontal groove is three, and the quantity of the slide plate is three, and the length of the slide plate is
24.00mm, width 10.00mm, highly it is 3 mm, the thickness of the projection is 3.00mm.
Preferably, the gap size of two adjacent skillets is 2.00mm.
Preferably, the thickness of the baffle plate is 3.00mm, is highly 15.00mm.
Compared with prior art, the utility model has the advantages that：This is applied to the scanning electricity of semicolumn sample
The structure of mirror sample stage is simple, with the projection of the sideskid of hand propelled spring one during use so that between opposite side projection and baffle plate
Space is reserved, then sample is placed on and reserved spatially, and adjusts height of specimen to the height with being flushed at the top of projection
No longer exerted a force after degree, opposite side projection is bounced back under the action of the spring, play the effect of clamping sample, tightness is good, is not easy
Damage, can disposably place multiple samples, the flexible independence between each slide plate, efficiency high, strong adaptability.
The utility model is described in more detail with reference to the accompanying drawings and detailed description.
Brief description of the drawings
Fig. 1 is the organigram one of the utility model embodiment.
Fig. 2 is the organigram two of the utility model embodiment.
Fig. 3 is the organigram three of the utility model embodiment.
Fig. 4 is the organigram of the utility model embodiment center base.
Fig. 5 is the organigram of the utility model embodiment middle slide plate.
Embodiment
For features described above and advantage of the present utility model can be become apparent, special embodiment below, and coordinate accompanying drawing,
It is described in detail below.
As shown in Fig. 1 ~ 5, a kind of sample platform of scanning electronic microscope suitable for semicolumn sample, including base 1, the base
Upper surface is installed with baffle plate 2 vertically, and the bottom of the baffle plate is evenly equipped with several horizontal grooves 3 along longitudinal direction, and the transverse direction is led to
The slide plate 4 extended laterally is inserted with groove, the both ends of the slide plate are vertically installed with projection 5, one end of the slide plate
Spring 6 is respectively connected between projection and baffle plate, the spring of several slide plates is respectively positioned on the same side, and sliding block can slide laterally, with
The adjustment alignment of semicolumn or square sample suitable for different-thickness.
In the utility model embodiment, with the projection of the sideskid of hand propelled spring one during use so that opposite side projection
Space is reserved between baffle plate, then sample is placed on and reserved spatially, and adjust height of specimen to projection top
No longer exerted a force after the height that portion flushes, opposite side projection is bounced back under the action of the spring, clamping sample is played with baffle fit
Effect, if running into the not parallel situation of semicolumn or square sample side section, the method for conducting resinl adhesion can be used to solve, sample
Sample platform low cost, simple to operate, applicability is wide, it is with strong points, be hardly damaged.
In the utility model embodiment, base, baffle plate, slide plate, projection are aluminum alloy material, and spring is standard bullet
Spring.
In the utility model embodiment, one end of the spring and projection is connected, the other end and baffle plate are connected.
In the utility model embodiment, being shaped as the horizontal groove is square.
In the utility model embodiment, the length of the base is 39.00mm, width 34.00mm, is highly
3.00mm。
In the utility model embodiment, the quantity of the horizontal groove is three, and the quantity of the slide plate is three, institute
The length for stating slide plate is 24.00mm, width 10.00mm, is highly 3 mm, and the thickness of the projection is 3.00mm.
In the utility model embodiment, the gap size of two adjacent skillets is 2.00mm.
In the utility model embodiment, the thickness of the baffle plate is 3.00mm, is highly 15.00mm.
The utility model is applicable to most different-thickness samples, by taking common AZ31 magnesium alloys as an example：
When being scanned electron microscopic observation, the tested surface of each sample including special semicolumn sample need to be subjected to machine
Tool polishes to obtain a buffed surface parallel with sightingpiston.Then according to the different-thickness of the AZ31 each sample after polishing, promote
The projection of spring side to reserve required space between spring-compressed, opposite side projection and baffle plate, then by various kinds to be measured
Product are placed on the space, and height flushes with projection, then unloads power, and under spring reset effect, the projection retraction of sample side is simultaneously
Play a part of clamping sample jointly with baffle plate.
The utility model is not limited to above-mentioned preferred forms, and anyone can obtain under enlightenment of the present utility model
Go out other various forms of sample platform of scanning electronic microscope suitable for semicolumn sample.It is all according to present utility model application the scope of the claims institute
The equivalent changes and modifications done, it should all belong to covering scope of the present utility model.
Claims (7)
- A kind of 1. sample platform of scanning electronic microscope suitable for semicolumn sample, it is characterised in that：Including base, the upper table of the base Face is installed with baffle plate vertically, and the bottom of the baffle plate is evenly equipped with several horizontal grooves along longitudinal direction, in the horizontal groove The slide plate extended laterally is inserted with, the both ends of the slide plate are vertically installed with projection, one end projection and the gear of the slide plate Spring is respectively connected between plate, the spring of several slide plates is respectively positioned on the same side.
- 2. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：The spring One end and projection be connected, the other end and baffle plate are connected.
- 3. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：The transverse direction Being shaped as groove is square.
- 4. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：The base Length be 39.00mm, width 34.00mm, be highly 3.00mm.
- 5. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：The transverse direction The quantity of groove is three, and the quantity of the slide plate is three, the length of the slide plate is 24.00mm, width 10.00mm, Highly it is 3 mm, the thickness of the projection is 3.00mm.
- 6. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：Two adjacent cunnings The gap size of plate is 2.00mm.
- 7. the sample platform of scanning electronic microscope according to claim 1 suitable for semicolumn sample, it is characterised in that：The baffle plate Thickness be 3.00mm, be highly 15.00mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720604339.1U CN206976282U (en) | 2017-05-27 | 2017-05-27 | A kind of sample platform of scanning electronic microscope suitable for semicolumn sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720604339.1U CN206976282U (en) | 2017-05-27 | 2017-05-27 | A kind of sample platform of scanning electronic microscope suitable for semicolumn sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206976282U true CN206976282U (en) | 2018-02-06 |
Family
ID=61410234
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720604339.1U Expired - Fee Related CN206976282U (en) | 2017-05-27 | 2017-05-27 | A kind of sample platform of scanning electronic microscope suitable for semicolumn sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206976282U (en) |
-
2017
- 2017-05-27 CN CN201720604339.1U patent/CN206976282U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180206 |