CN206863151U - A kind of universal electrically open-short circuit tool - Google Patents

Abstract

A kind of universal electrically open-short circuit tool is the utility model is related to, it includes test bench（1）And test board（2）, the test bench（1）Front is provided with test probe matrix（3）, the test probe matrix（3）Test probe run through test bench（1）, the test board（2）On be provided with test point bit matrix（4）, the test probe matrix（3）With test point bit matrix（4）Electrically communicate, the test point bit matrix（4）Test wire is arranged outside around by the way of using being enclosed from center one（5）, the test point bit matrix（4）Periphery is provided with multiple efficiency plates（6）, the test point bit matrix（4）Pass through test wire（5）It is electrically connected to efficiency plate（6）.A kind of universal electrically open-short circuit tool of the utility model, it can accomplish that test board and test bench are all realized and shared, further improve the universal performance and utilization rate for opening short-circuit electrical testing tool, reduce the design cost for opening short-circuit electrical testing tool.

Description

A kind of universal electrically open-short circuit tool

Technical field

It the utility model is related to a kind of universal electrically open-short circuit tool.

Background technology

Electrical testing is done for the product of encapsulation, it detects tool and includes test bench and test board, and traditional O/S opens short circuit The size design of measurement jig is to go design according to size and the matrix of soldered ball, the size of spacing of product.Only product When size, matrix and the spacing of also soldered ball of soldered ball must be consistent, detection tool could share.As long as one of which condition is not Meet, just can not be general, it is necessary to change machine and change open-short circuit plate and test bench, both took, and cost of idleness.

The universal test device of existing sphere grid array encapsulation（As shown in Figure 1）, it mainly includes a determinand support plate 410th, an efficiency plate 420 and at least one pinboard 430 can be substituted, the system of pinboard 430 can be substituted and be electrically connected with determinand load Plate and the efficiency plate.According to different types of ball lattice array packaging member, different pinboards of substituting is disposed to be tested, with this Expand the application of test device.But its shortcoming is to need to realize that test board is public by reload signal pinboard, survey Trying different products needs to change different pinboards.

Utility model content

Technical problem to be solved in the utility model be for above-mentioned prior art provide it is a kind of it is universal electrically open it is short Road measurement jig, realize that the whole of test board and test bench shares, and need not set it is multiple substitute pinboard, further improve The universal performance and utilization rate of short-circuit electrical testing tool are opened, reduces the design cost for opening short-circuit electrical testing tool.

The technical scheme in the invention for solving the above technical problem is：A kind of universal electrically open-short circuit is controlled Tool, it includes test bench and test board, and the test bench is located above test board, and the test bench front is provided with test probe Matrix, the test probe matrix are to be spaced a distance arrangement in length and breadth by multiple test probes to form, the test probe Matrix size is slightly less than test bench size, and the test probe of the test probe matrix runs through test bench, set on the test board The test point bit matrix corresponding with test probe matrix size position is equipped with, the test point bit matrix is by multiple test points Position is spaced a distance arrangement and formed in length and breadth, and the test probe matrix electrically communicates with test point bit matrix, the test Point bit matrix arranges test wire using being enclosed from center one outside around by the way of, and the test point bit matrix periphery is provided with Multiple efficiency plates, the test point bit matrix are electrically connected to efficiency plate by test wire.

Test bench bottom surrounding is provided with multiple dowel pins, and multiple and dowel pins are provided with the test board Corresponding positioning hole, the dowel pins insertion positioning hole are fixed.

It is described test probe matrix longitudinally spaced and the test point bit matrix it is longitudinally spaced unanimously.

The lateral separation of the test probe matrix is consistent with the lateral separation of the test point bit matrix；

Compared with prior art, the utility model has the advantage of：

1st, when the utility model can realize that soldered ball spacing identical product does open-short circuit, test board and test bench are all Can be with general, without changing, without any test board connecting line of installation；

2nd, the utility model is in the case where product soldered ball spacing is consistent with opening short-circuit electrical testing probe spacing, Ke Yiman The open-short circuit of the different sized products of foot, improves the utilization rate for opening short-circuit electrical testing tool, and can reduce tool and set Meter cost and producing line repair machine and change engine efficiency.

Brief description of the drawings

Fig. 1 is the structural representation of the universal test device of existing sphere grid array encapsulation.

Fig. 2 is a kind of structural representation of universal electrically open-short circuit tool of the utility model.

Fig. 3 is a kind of structure sectional view of universal electrically open-short circuit tool of the utility model.

Wherein：

Test bench 1

Test board 2

Test probe matrix 3

Test point bit matrix 4

Test wire 5

Efficiency plate 6

Dowel pins 7

Positioning hole 8.

Embodiment

The utility model is described in further detail below in conjunction with accompanying drawing embodiment.

As shown in Figure 2 and Figure 3, a kind of universal electrically open-short circuit tool in the present embodiment, it includes test bench 1 With test board 2, the test bench 1 is located at the top of test board 2, and the front of test bench 1 is provided with test probe matrix 3, described Test probe matrix 3 is to be spaced a distance arrangement in length and breadth by multiple test probes to form, the test size of probe matrix 3 It is slightly less than the size of test bench 1, the test probe of the test probe matrix 3 runs through test bench 1, is provided with the test board 2 The test point bit matrix 4 corresponding with test probe matrix 3 size position, the test point bit matrix 4 is by multiple test points Position is spaced a distance arrangement and formed in length and breadth, and the test probe matrix 3 electrically communicates with test point bit matrix 4, the survey Pilot bit matrix 4 arranges test wire 5 using being enclosed from center one outside around by the way of, the periphery of test point bit matrix 4 Multiple efficiency plates 6 are provided with, the test point bit matrix 4 is electrically connected to efficiency plate 6, the efficiency plate 6 by test wire 5 For making O/S test machines be electrically connected with element under test；

The bottom surrounding of test bench 1 is provided with multiple dowel pins 7, is provided with the test board 2 multiple with positioning Positioning hole 8 corresponding to pin 7, the dowel pins 7 are inserted positioning hole 8 and are fixed；

It is described test probe matrix 3 longitudinally spaced and the test point bit matrix 4 it is longitudinally spaced unanimously；

The lateral separation of the test probe matrix 3 is consistent with the lateral separation of the test point bit matrix 4；

The soldered ball ball point signal of product to be measured is again via corresponding test by soldered ball ball point by corresponding test probe Wiring is communicated to efficiency plate after tested again for point position（Efficiency plate connects O/S test machine host computer systems）It is transmitted.According to multiple The function signal of product soldered ball ball point to be measured sets the function signal of each test point position on test point bit matrix, makes these to be measured The function signal that the soldered ball ball point signal of product has a matrix area in test point bit matrix corresponds to therewith.

The O/S softwares built up in advance are loaded into the host computer system of O/S test machines by operator, and O/S test machines are controlled by software, Current signal is sent to each test point position to be measured and analyzes each voltage readings, the specification of voltage readings is provided by client, according to This can determine whether that each test point position is open/short state.

In addition to the implementation, the utility model also includes other embodiment, all to use equivalents or equivalent The technical scheme that substitute mode is formed, all should fall within the protection domain of the utility model claims.

Claims (4)

1. A kind of 1. universal electrically open-short circuit tool, it is characterised in that：It includes test bench（1）And test board（2）, it is described Test bench（1）Positioned at test board（2）Top, the test bench（1）Front is provided with test probe matrix（3）, the test spy Pin matrix tube（3）It is to be spaced a distance arrangement in length and breadth by multiple test probes to form, the test probe matrix（3）Test Probe runs through test bench（1）, the test board（2）On be provided with test probe matrix（3）The corresponding test in size position Point bit matrix（4）, the test point bit matrix（4）It is to be spaced a distance arrangement in length and breadth by multiple test point positions to form, institute State test probe matrix（3）With test point bit matrix（4）Electrically communicate, the test point bit matrix（4）Enclosed using from center one One circle outside around mode arrange test wire（5）, the test point bit matrix（4）Periphery is provided with multiple efficiency plates（6）, institute State test point bit matrix（4）Pass through test wire（5）It is electrically connected to efficiency plate（6）.
2. 2. the universal electrically open-short circuit tool of one kind according to claim 1, it is characterised in that：The test bench （1）Bottom surrounding is provided with multiple dowel pins（7）, the test board（2）On be provided with multiple and dowel pins（7）It is corresponding Positioning hole（8）, the dowel pins（7）Insert positioning hole（8）It is fixed.
3. 3. the universal electrically open-short circuit tool of one kind according to claim 1, it is characterised in that：The test probe Matrix（3）It is longitudinally spaced with the test point bit matrix（4）It is longitudinally spaced consistent.
4. 4. the universal electrically open-short circuit tool of one kind according to claim 1, it is characterised in that：The test probe Matrix（3）Lateral separation and the test point bit matrix（4）Lateral separation it is consistent.