CN206804278U - Retardation of wave plate measurement apparatus - Google Patents
Retardation of wave plate measurement apparatus Download PDFInfo
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- CN206804278U CN206804278U CN201720601674.6U CN201720601674U CN206804278U CN 206804278 U CN206804278 U CN 206804278U CN 201720601674 U CN201720601674 U CN 201720601674U CN 206804278 U CN206804278 U CN 206804278U
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- wave plate
- polarizer
- measured
- polarization direction
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Abstract
The utility model discloses a kind of retardation of wave plate measurement apparatus, including light source, along the first polarizer of light source direction of illumination setting, adjustable phase retarder, wave plate to be measured and the second polarizer, the polarization direction of the polarization direction of the first polarizer and the second polarizer is orthogonal；Adjustable phase retarder is composite wave plate, is made up of successively the first quarter-wave plate, half wave plate and the second quarter-wave plate；Before measurement, the fast axle of wave plate to be measured is parallel with the polarization direction of the first polarizer, and the fast axle of the first quarter-wave plate, half wave plate and the second quarter-wave plate is identical with the polarization direction of the second polarizer；During measurement, the fast axle of wave plate to be measured and the angle of the polarization direction of the second polarizer are π/4；The utility model is simple in construction, easy to use, can quickly and efficiently measure the phase-delay quantity of wave plate to be measured.
Description
Technical field
Wave plate field of measuring technique is the utility model is related to, in particular to a kind of retardation of wave plate measurement apparatus.
Background technology
Wave plate is widely used in the optical systems such as photoelastic mechanics, optical precision measurement, biomedicine, and it can be used
To change the polarization state of incident light.The phase delay of wave plate is the important parameter that wave plate is modulated to the polarization state of light source,
Its accuracy has vital effect to technical parameters such as whole system accuracy.Wave plate is from mica, calcite, quartz etc.
The planopaallel plate that birefringece crystal is cut down, its surface are parallel with the optical axis of crystal.Existing many modes measure wave plate and prolonged
Chi Liang：1) polarimetry, this method mainly place wave plate to be measured between two λ/4, to form a compound polarization apparatus, ripple to be measured
Piece retardation can to obtain, [Wang Lan, Song Lianke, king green onion be quick, polarimetry measurement wave plate retardation by the measurement of angle of rotation
Amount, Qufu Normal University's journal, 2007,33 (4)：65-67]；2) white light Michelson Interferometer method is based on, this method is dry polarization
Relate to and combined with white light Michelson Interferometer interferometer, wave plate retardation is converted into the optical path difference between White Light Interference Envelope, lead to
Crossing the extraction to optical path difference, [Wang Jun, Chen Lei, Wu Quanying, Yao Qingxiang, one kind are stepped based on white light to realize the measurement of wave plate retardation
Gram ear grandson interferes the measuring method of wave plate retardation, Chinese laser, 2011,38 (5)：0508001-1]；3) half cloudy method, it is being polarized
Two wave plates are placed between device and analyzer, what one of wave plate retardation was to determine, another is wave plate to be measured, makes to treat
Survey wave plate and cover whole visual field, another wave plate covers half of visual field, makes visual field by rotating analyzer in experimentation
Reach balance twice, the retardation of wave plate to be measured can pass through the anglec of rotation of analyzer twice and the angle of two wave plate optical axises
Obtain [phase delay of the wave plate of Xue Qingwen, Li Guohua, half cloudy method measurement λ/4, optoelectronic laser, 1998,9 (2)：150-
151]；Subject matter and deficiency are existing for aforementioned four prior art：Debug relative complex, such as half cloudy method；Structure is more multiple
It is miscellaneous, such as it is based on white light michelson interferometry.
The content of the invention
A kind of the purpose of this utility model is to overcome above-mentioned deficiency, there is provided wave plate phase place simple in construction, easy to use
Retardation measurement apparatus, quickly and efficiently to measure the phase-delay quantity of wave plate to be measured.
The utility model is in order to solve the above technical problems, used technical scheme is：A kind of retardation of wave plate is surveyed
Device, including light source are measured, sets the first polarizer, adjustable phase retarder, wave plate to be measured and second inclined along light source direction of illumination
Shake device, and the polarization direction of first polarizer and the polarization direction of the second polarizer are orthogonal；
The adjustable phase retarder is composite wave plate, successively by the first quarter-wave plate, half wave plate and
Two quarter-wave plates form；
Before measurement, the fast axle of the wave plate to be measured is parallel with the polarization direction of the first polarizer, the first quarter-wave plate,
The fast axle of half wave plate and the second quarter-wave plate is identical with the polarization direction of the second polarizer；
During measurement, the fast axle of the wave plate to be measured and the angle of the polarization direction of the second polarizer are π/4.
Preferably, the first polarizer, wave plate to be measured, adjustable phase retarder and second are set gradually along light source direction of illumination
Polarizer.
Preferably, the first polarizer, adjustable phase retarder, wave plate to be measured and second are set gradually along light source direction of illumination
Polarizer.
The beneficial effects of the utility model：The utility model is simple in construction；The phase-delay quantity of wave plate to be measured is two/
4 times of the fast axle of one wave plate and the polarization direction angle theta of the second polarizer 4, when θ in the range of 0- pi/2s with regard to 0-2 π phases can be measured
Delay, phase delay very convenient to use, and applying this to be installed on measurement model (birefringent plate) in photoelastic mechanics
Also it is very convenient.
Brief description of the drawings
Fig. 1 is a kind of structural representation of retardation of wave plate measurement apparatus；
Fig. 2 for measurement when the first polarizer polarization direction, the second polarizer polarization direction and wave plate quick shaft direction to be measured it
Between angled relationships figure；
In figure, the first polarizer 1, adjustable phase retarder 2, the first quarter-wave plate 2.1, half wave plate 2.2,
Second quarter-wave plate 2.3, wave plate to be measured 3, the second polarizer 4, the first polarizer polarization direction 5, the second polarizer polarization
Direction 6, wave plate quick shaft direction 7 to be measured.
Embodiment
The utility model is described in further detail with specific embodiment below in conjunction with the accompanying drawings.
As illustrated in fig. 1 and 2, a kind of retardation of wave plate measurement apparatus, including light source, the is set along light source direction of illumination
One polarizer 1, adjustable phase retarder 2, the polarizer 4 of wave plate to be measured 3 and second, the polarization direction of first polarizer 1 and
The polarization direction of second polarizer 4 is orthogonal；
The adjustable phase retarder 2 is composite wave plate, successively by the first quarter-wave plate 2.1, half wave plate
2.2 and second quarter-wave plate 2.3 form；
Before measurement, the fast axle of the wave plate 3 to be measured is parallel with the polarization direction of the first polarizer 1, the first quarter-wave
The polarization direction phase of piece 2.1, the fast axle of the quarter-wave plate 2.3 of half wave plate 2.2 and second with the second polarizer 4
Together；
During measurement, the fast axle of the wave plate 3 to be measured and the angle of the polarization direction of the second polarizer 4 are π/4.Such as Fig. 2 institutes
Show, the polarization direction numbering of the first polarizer 1 is 5, and the polarization direction numbering of the second polarizer 4 is 6, the fast axle of wave plate 3 to be measured
Angle is π/4 between direction numbering is 7,7 and 6.
Preferably, the first polarizer 1, wave plate to be measured 3, the and of adjustable phase retarder 2 are set gradually along light source direction of illumination
Second polarizer 4.
Preferably, the first polarizer 1, adjustable phase retarder 2, the and of wave plate to be measured 3 are set gradually along light source direction of illumination
Second polarizer 4.
The present embodiment job step is as follows：Measuring process is as follows：
1) the first polarizer 1 is orthogonal with the second polarizer 4, between wave plate 3 to be measured is placed in into two polarizers, rotates ripple to be measured
Piece 3, making system, then now the fast axle (or slow axis) of wave plate 3 to be measured is parallel with the polarization direction of the first polarizer 1 without output；
2) wave plate 3 to be measured is rotated π/4, then (can also be in ripple to be measured between the polarizer 1 of wave plate 3 and first to be measured
Between the polarizer 4 of piece 3 and second) insertion adjustable phase retarder 2, make the first quarter-wave plate 2.1, half wave plate
2.2 and second quarter-wave plate 2.3 fast axle it is identical with the polarization direction of the second polarizer 4；
3) angle for rotating half wave plate 2.2 is θ, makes visual field most dark, then 4 times of this rotational angle theta are exactly to be measured
The phase-delay quantity of wave plate 3；This rotational angle theta is the fast axle and the polarization direction angle of the second polarizer 4 of half wave plate 2.2.
By the knowledge of optical matrix, the acting matrix of adjustable phase retarder 2 is compared with the general type of doublet refractor
Relatively understand：π -4 θ of the phase δ of adjustable phase retarder 2=2, when fast axle and the polarization direction of the second polarizer 4 of wave plate 3 to be measured
When angle is Ω=π/4, if the phase-delay quantity of wave plate to be measured 3 is δ1, at this moment wave plate 3 to be measured and adjustable phase retarder 2
Fast axle is parallel, therefore δ1+ δ=2k π, the light intensity that the second polarizer 4 is passed through are 0, then the retardation that can obtain wave plate 3 to be measured is δ1
=4 θ
The advantages of this patent embodiment
It is simple in construction；The phase-delay quantity of wave plate 3 to be measured be half wave plate 2.2 fast axle and the second polarizer 4 it is inclined
Shake 4 times of angular separation θ, when θ in the range of 0- pi/2s with regard to 0-2 π phase delays, very convenient to use, Er Qieying can be measured
The phase delay that measurement model (birefringent plate) in photoelastic mechanics is installed on this is also very convenient.
The above embodiments are only optimal technical scheme of the present utility model, and are not construed as limit of the present utility model
Make, the feature in embodiment and embodiment in the application can be mutually combined in the case where not conflicting.This practicality is new
Technical characteristic in the technical scheme that the protection domain of type should be recorded with claim, including the technical scheme of claim record
Equivalents are protection domain.Equivalent substitution i.e. within this range is improved, also the scope of protection of the utility model it
It is interior.
Claims (3)
1. a kind of retardation of wave plate measurement apparatus, including light source, it is characterised in that：It is inclined along the setting first of light source direction of illumination
Shake device（1）, adjustable phase retarder（2）, wave plate to be measured（3）With the second polarizer（4）, first polarizer（1）Polarization
Direction and the second polarizer（4）Polarization direction it is orthogonal；
The adjustable phase retarder（2）For composite wave plate, successively by the first quarter-wave plate（2.1）, half wave plate
（2.2）With the second quarter-wave plate（2.3）Composition；
Before measurement, the wave plate to be measured（3）Fast axle and the first polarizer（1）Polarization direction it is parallel, the first quarter-wave
Piece（2.1）, half wave plate（2.2）With the second quarter-wave plate（2.3）Fast axle with the second polarizer（4）Polarization
Direction is identical；
During measurement, the wave plate to be measured（3）Fast axle and the second polarizer（4）The angle of polarization direction be π/4.
2. retardation of wave plate measurement apparatus according to claim 1, it is characterised in that：Along light source direction of illumination successively
First polarizer is set（1）, wave plate to be measured（3）, adjustable phase retarder（2）With the second polarizer（4）.
3. retardation of wave plate measurement apparatus according to claim 1, it is characterised in that：Along light source direction of illumination successively
First polarizer is set（1）, adjustable phase retarder（2）, wave plate to be measured（3）With the second polarizer（4）.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720601674.6U CN206804278U (en) | 2017-05-26 | 2017-05-26 | Retardation of wave plate measurement apparatus |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720601674.6U CN206804278U (en) | 2017-05-26 | 2017-05-26 | Retardation of wave plate measurement apparatus |
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| Publication Number | Publication Date |
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| CN206804278U true CN206804278U (en) | 2017-12-26 |
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| CN201720601674.6U Expired - Fee Related CN206804278U (en) | 2017-05-26 | 2017-05-26 | Retardation of wave plate measurement apparatus |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108760249A (en) * | 2018-05-30 | 2018-11-06 | 西北大学 | The detection method and device of a kind of wave plate face phase-delay quantity |
-
2017
- 2017-05-26 CN CN201720601674.6U patent/CN206804278U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108760249A (en) * | 2018-05-30 | 2018-11-06 | 西北大学 | The detection method and device of a kind of wave plate face phase-delay quantity |
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171226 Termination date: 20180526 |
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| CF01 | Termination of patent right due to non-payment of annual fee |