CN206671488U - A kind of sensitive chip test equipment - Google Patents
A kind of sensitive chip test equipment Download PDFInfo
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- CN206671488U CN206671488U CN201720463265.4U CN201720463265U CN206671488U CN 206671488 U CN206671488 U CN 206671488U CN 201720463265 U CN201720463265 U CN 201720463265U CN 206671488 U CN206671488 U CN 206671488U
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- Prior art keywords
- upper lid
- sensitive chip
- test equipment
- base
- grab
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Abstract
It the utility model is related to chip testing technology field, more particularly to a kind of sensitive chip test equipment, including upper lid, base and grab, when testing sensitive chip, first sensitive chip is positioned in chip slot, then upper lid is engaged with base by grab, after engaging, the first seal convexity and the first sealed groove cooperatively form the first sealing, in addition, trigger unit compresses the sensitive chip in chip slot, and then sensitive chip compression probe, forms test loop.Test process is simple to operate, is readily produced, and cost is relatively low, and the light that the setting of the first seal convexity and the first sealed groove can avoid light source from sending leaks, and can also eliminate interference of the ambient light to test, improve the accuracy rate of test.
Description
Technical field
It the utility model is related to chip testing technology field, more particularly to a kind of sensitive chip test equipment.
Background technology
Sensitive chip is equipped with image recorder, such as camera, camera and video camera, is also image sensing
Device.Before sensitive chip is applied to actual product, it is tested more, special sensitive chip need to be used during test and is surveyed
Try equipment.
Existing sensitive chip test equipment mainly manually picks and places replacement when testing sensitive chip using filter,
Then irradiated by light source, click dependence test project in test process successively with mouse, to reach test purpose.This tradition is made
Industry is applied to low end, is unsuitable for the production requirement of high-order product；Production efficiency is relatively low, operation inconvenience；In addition, existing survey
Examination equipment can not eliminate interference of the ambient light to test, and the accuracy of experiment effect is not high.
With the needs of social development, shooting of the people to camera effect of taking pictures has higher and higher requirement, and this is just
There is higher requirement to the performance of chip, traditional type test can not meet the needs of present.
Utility model content
The purpose of this utility model is to provide a kind of sensitive chip test equipment, raw present in prior art to solve
Produce the problem of efficiency is low, operation inconvenience and experiment effect accuracy be not high.
To use following technical scheme up to this purpose, the utility model：
A kind of sensitive chip test equipment, including：
Upper lid, it include lid body and be set in turn in from top to bottom the intrinsic light source of the upper lid, optical filter and
Pressing plate, the lower surface of the pressing plate are provided with the trigger unit for protruding from the pressing plate end face；
Base, it includes base body, and the chip slot for placing sensitive chip, the chip are provided with the base body
Probe is provided with groove；
Grab, the upper lid is engaged with the base by the grab during test, and the snap-latch surface of the upper lid is provided with
First seal convexity, the snap-latch surface of the base are provided with the first sealed groove being engaged with first seal convexity, card
After conjunction, first seal convexity and the first sealed groove cooperatively form the first sealing, in addition, the trigger unit compress it is described
Sensitive chip in chip slot, the sensitive chip compresses the probe, so as to form test loop.
Preferably, the upper lid also includes upper casing and lower casing, the upper lid body is the hollow cavity of upper and lower opening, institute
State upper casing to be sealed at the upper shed of the upper lid body, the lower casing is arranged at the lower opening of the upper lid body.
Preferably, be provided with mounting hole in the middle part of the lower casing, the edge of the mounting hole is to the upper lid body direction
Extension forms location division, and the location division is caught in the under shed of the upper lid body, and the trigger unit passes through the mounting hole
Stretched out to the base direction.
Preferably, the lower surface of the upper casing is provided with the second seal convexity, the upper surface of the upper lid body is set
There is the second sealed groove being adapted with second seal convexity, the second seal convexity and the second sealed groove cooperatively form
Two sealings.
Preferably, spring is provided between the light source lower surface and the pressing plate upper surface, the pressing plate upper surface
The holding tank for accommodating the optical filter is provided with, is provided with control panel at optical filter lower section in the holding tank, institute
State and loophole is provided with control panel.
Preferably, the base also includes the seat of honour and lower seat, the seat of honour are arranged at the upper surface of the base body
On, the lower seat is arranged at the lower surface of the base body, and the chip slot is arranged on the seat of honour.
Preferably, circuit board is provided between the base body and the lower seat, the circuit board and base body
The position of chip slot described in upper face is provided with probe aperture, and the probe is located in the probe aperture.
Preferably, it is rotatably connected in the middle part of the grab with the upper lid body.
Preferably, being provided with the first pilot hole in the middle part of the grab, it is provided with and described first on the upper lid body
The second corresponding pilot hole of pilot hole, rotary shaft through after first pilot hole and the second pilot hole by the grab and institute
Lid body is stated to be rotatably connected.
Preferably, the first holding section to be fastened with the grab upper end is provided with the upper lid, the base sheet
The second holding section to be fastened with the grab lower end is provided with body.
The beneficial effects of the utility model：
The utility model provides a kind of sensitive chip test equipment, including upper lid, base and grab, is testing photosensitive core
During piece, first sensitive chip is positioned in chip slot, then engaged upper lid by grab with base, after engaging, the first sealing
Raised and the first sealed groove cooperatively forms the first sealing, in addition, trigger unit compresses the sensitive chip in chip slot, and then feels
Optical chip compresses probe, forms test loop.Test process is simple to operate, is readily produced, and cost is relatively low, and the first seal convexity
The light that setting with the first sealed groove can avoid light source from sending leaks, and can also eliminate interference of the ambient light to test, improve
The accuracy rate of test.
Brief description of the drawings
Fig. 1 is the decomposition texture schematic diagram of upper lid provided by the utility model and base；
Fig. 2 is the upward view of upper lid provided by the utility model；
Fig. 3 is the decomposition texture schematic diagram of upper lid provided by the utility model；
Fig. 4 is the decomposition texture schematic diagram of base provided by the utility model.
In figure：
Covered on 100-；200- bases；300- grabs；400- sensitive chips；
The upper lid bodies of 101-；102- light sources；103- optical filters；104- control panels；105- pressing plates；1051- trigger units；106-
Spring；107- upper casings；108- lower casings；1081- location divisions；The seal convexities of 1082- first；109- rotary shafts；
201- base bodies；The sealed grooves of 2011- first；The 202- seats of honour；2021- chip slots；203- circuit boards；Under 204-
Seat；205- probes.
Embodiment
It is clearer for the technical scheme and the technique effect that reaches that make technical problem that the utility model solves, use,
Further illustrate the technical solution of the utility model below in conjunction with the accompanying drawings and by embodiment.
As Figure 1-Figure 4, the utility model provides a kind of sensitive chip test equipment, including upper lid 100, base 200
With grab 300, wherein, upper lid 100 includes upper lid body 101 and the light source that is set in turn in from top to bottom in lid body 101
102nd, optical filter 103 and pressing plate 105, the lower surface of pressing plate 105 are provided with the trigger unit 1051 for protruding from the end face of pressing plate 105；Bottom
Seat 200 includes base body 201, and the chip slot 2021 for placing sensitive chip 400, chip slot are provided with base body 201
Probe 205 is provided with 2021；During test, upper lid 100 is engaged with base 200 by grab 300, and the snap-latch surface of upper lid 100 is set
The first seal convexity 1082 is equipped with, the snap-latch surface of base 200 is provided with the first sealing being engaged with the first seal convexity 1082
Groove 2011, after engaging, the first seal convexity 1082 and the first sealed groove 2011 cooperatively form the first sealing, in addition, touching
Hair portion 1051 compresses the sensitive chip 400 in chip slot 2021, and then sensitive chip 400 compresses probe 205, and formation is tested back
Road.Test process is simple to operate, is readily produced, and cost is relatively low, and the first seal convexity 1082 and the first sealed groove 2011
The light that setting can avoid light source 102 from sending leaks, and can also eliminate interference of the ambient light to test, improve the accuracy rate of test.
Specifically, upper lid body 101 is the hollow cavity of upper and lower opening, upper lid 100 also includes upper casing 107 and lower casing 108,
Wherein, upper casing 107 is sealed at the upper shed of lid body 101, and the lower surface of upper casing 107 is provided with the second seal convexity, on
The upper surface of lid body 101 is provided with the second sealed groove being adapted with the second seal convexity, the second seal convexity and second
Sealed groove cooperatively forms the second sealing, further increases the sealing of the test equipment；Lower casing 108 is arranged at lid originally
The lower opening of body 101, the middle part of lower casing 108 are provided with mounting hole, and the upward direction of lid body 101 in edge of mounting hole extends to be formed
Location division 1081, location division 1081 are caught in the under shed of lid body 101, and trigger unit 1051 is by mounting hole to base 200
Direction is stretched out.
Spring 106 is provided between the lower surface of light source 102 and the upper surface of pressing plate 105, when upper lid 100 engages with base 200,
The trigger unit 1051 that the setting of spring 106 can avoid the lower end of pressing plate 105 from setting impacts when pushing to sensitive chip 400.
The upper surface of pressing plate 105 is provided with the holding tank for accommodating optical filter 103, is located in holding tank at the lower section of optical filter 103
Control panel 104 is provided with, loophole is provided with control panel 104, loophole can control sensitive chip 400 and light source 102
Contact area, the big I of loophole is depending on actual test demand.
Base 200 also includes the seat of honour 202 and lower seat 204, and the seat of honour 202, which is bolted, is arranged at base body 201
On upper surface, lower seat 204 is bolted the lower surface for being arranged at base body 201.Base body 201 and lower seat 204 it
Between be provided with circuit board 203, said chip groove 2021 is arranged on the seat of honour 202, face on circuit board 203 and base body 201
The position of chip slot 2021 is provided with probe aperture, and above-mentioned probe 205 is located in the probe aperture.Above-mentioned first seal convexity 1082 is set
The lower surface of lower casing 108 is placed in, the first sealed groove 2011 is arranged at the upper surface of base body 201.
The middle part of grab 300 is rotatably connected with upper lid body 101, specifically, being provided with installation card on upper lid body 101
The mounting groove of hook 300, the middle part of grab 300 are provided with the first pilot hole, are provided with the cell wall of mounting groove and the first pilot hole
The second corresponding pilot hole, rotary shaft 109 through after the first pilot hole and the second pilot hole by grab 300 and upper lid body
101 are rotatably connected.The first holding section to be fastened with the upper end of grab 300 is provided with upper lid 100, is set on base body 201
It is equipped with the second holding section to be fastened with the lower end of grab 300.
Obviously, above-described embodiment of the present utility model is used for the purpose of clearly illustrating the utility model example, and
It is not the restriction to embodiment of the present utility model.For those of ordinary skill in the field, in described above
On the basis of can also make other changes in different forms.There is no need and unable to give all embodiments
It is exhaustive.All made within spirit of the present utility model and principle all any modification, equivalent and improvement etc., should be included in
Within the protection domain of the utility model claims.
Claims (10)
- A kind of 1. sensitive chip test equipment, it is characterised in that including：Upper lid, it includes lid body and is set in turn in upper lid intrinsic light source, optical filter and the pressing plate from top to bottom, The lower surface of the pressing plate is provided with the trigger unit for protruding from the pressing plate end face；Base, it includes base body, the chip slot for placing sensitive chip is provided with the base body, in the chip slot It is provided with probe；Grab, the upper lid is engaged with the base by the grab during test, and the snap-latch surface of the upper lid is provided with first Seal convexity, the snap-latch surface of the base is provided with the first sealed groove being engaged with first seal convexity, after engaging, First seal convexity and the first sealed groove cooperatively form the first sealing, in addition, the trigger unit compresses the chip Sensitive chip in groove, the sensitive chip compresses the probe, so as to form test loop.
- 2. sensitive chip test equipment according to claim 1, it is characterised in that the upper lid also includes upper casing with Shell, the upper lid body are the hollow cavity of upper and lower opening, and the upper casing is sealed at the upper shed of the upper lid body, described Lower casing is arranged at the lower opening of the upper lid body.
- 3. sensitive chip test equipment according to claim 2, it is characterised in that be provided with installation in the middle part of the lower casing Hole, the edge of the mounting hole extend to form location division to the upper lid body direction, and the location division is caught in the upper lid originally In the under shed of body, the trigger unit is stretched out by the mounting hole to the base direction.
- 4. sensitive chip test equipment according to claim 2, it is characterised in that the lower surface of the upper casing is provided with Two seal convexities, the upper surface of the upper lid body are provided with the second sealed groove being adapted with second seal convexity, Second seal convexity and the second sealed groove cooperatively form the second sealing.
- 5. sensitive chip test equipment according to claim 1, it is characterised in that the light source lower surface and the pressing plate It is provided with spring between upper surface, the pressing plate upper surface is provided with the holding tank for accommodating the optical filter, in the holding tank Control panel is provided with below the optical filter, loophole is provided with the control panel.
- 6. sensitive chip test equipment according to claim 1, it is characterised in that the base also includes the seat of honour with Seat, the seat of honour are arranged on the upper surface of the base body, and the lower seat is arranged at the lower surface of the base body, institute Chip slot is stated to be arranged on the seat of honour.
- 7. sensitive chip test equipment according to claim 6, it is characterised in that the base body and the lower seat it Between be provided with circuit board, the position of chip slot described in face is provided with probe aperture, the spy on the circuit board and base body Pin is located in the probe aperture.
- 8. sensitive chip test equipment according to claim 1, it is characterised in that in the middle part of the grab with the upper lid originally Body is rotatably connected.
- 9. sensitive chip test equipment according to claim 8, it is characterised in that be provided with first in the middle part of the grab and lead Xiang Kong, is provided with second pilot hole corresponding with first pilot hole on the upper lid body, and rotary shaft is through described the The grab and the upper lid body are rotatably connected after one pilot hole and the second pilot hole.
- 10. sensitive chip test equipment according to claim 9, it is characterised in that be provided with the upper lid with it is described The first holding section that grab upper end fastens, is provided with the base body and the grab lower end fastens second engages Portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720463265.4U CN206671488U (en) | 2017-04-28 | 2017-04-28 | A kind of sensitive chip test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720463265.4U CN206671488U (en) | 2017-04-28 | 2017-04-28 | A kind of sensitive chip test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206671488U true CN206671488U (en) | 2017-11-24 |
Family
ID=60371551
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720463265.4U Active CN206671488U (en) | 2017-04-28 | 2017-04-28 | A kind of sensitive chip test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206671488U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106896315A (en) * | 2017-04-28 | 2017-06-27 | 上海捷策创电子科技有限公司 | A kind of sensitive chip test equipment |
-
2017
- 2017-04-28 CN CN201720463265.4U patent/CN206671488U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106896315A (en) * | 2017-04-28 | 2017-06-27 | 上海捷策创电子科技有限公司 | A kind of sensitive chip test equipment |
| CN106896315B (en) * | 2017-04-28 | 2023-12-08 | 上海捷策创电子科技有限公司 | Photosensitive chip test equipment |
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