CN206493304U - Pallet - Google Patents

Abstract

The utility model provides a kind of pallet, and it includes：Sub-disk, including multiple first through holes and multiple first receiving openings；Stamper, including multiple locating slots and multiple receiving channels；Characterized in that, be provided with the first locating dowel in each locating slot, the first locating dowel from locating slot extend through sub-disk in the first through hole, pallet also includes：Multiple first regulating parts, its one end is received into the receiving channel of stamper, and the other end is connected in the first receiving opening of sub-disk, and each first regulating part is configured to adjust the depth of parallelism between sub-disk and stamper.

Description

Pallet

Technical field

The utility model is related to industrial test field, more particularly, to carries the pallet of device under test.

Background technology

To improve the quality of electronic product, it usually needs the device of product is tested, so just it can guarantee that for producing The performance of the device of product meets standard.Pallet (hereinafter referred to as " test pallet ") for placing tested device is industrial production The equipment on basis.With the development of science and technology, the electronic product of mobile phone, computer, monitoring system, intelligent robot etc. is obtained Comprehensive and at full speed development.Most of electronic product includes high-accuracy device, such as high-resolution camera.Most of high-accuracy production Device (for example, camera lens of the camera) test of product is required for the auxiliary of tool, and the height of tool designing technique has formed measurement production One important symbol of product manufacture level height, largely determines the ability of the quality, benefit and exploitation of this product.

In addition, in order to test device performance exactly, to test pallet and for testing the test equipment of device (hereinafter referred to as For " test equipment ") relative space position required precision it is high, while between test pallet and device under test cooperation essence Degree requires also very high.

Currently used unitary tray for testing the test equipment of device when being used together, due to adaptability not It can not realize that the automation with industrial equipment is combined by force and mostly, it is therefore desirable to be manually placed in device in pallet one by one, consume When effort.

Utility model content

According to the disclosure embodiment, a kind of pallet includes：Sub-disk, including multiple first through holes and multiple One receiving opening；Stamper, including multiple locating slots and multiple receiving channels；Determine characterized in that, being provided with first in each locating slot Position post, the first locating dowel from locating slot extend through sub-disk in the first through hole, pallet also includes：Multiple first regulations Part, its one end is received into the receiving channel of stamper, and the other end is connected in the first receiving opening of sub-disk, and each first regulating part is matched somebody with somebody It is set to the depth of parallelism between regulation sub-disk and stamper.

Alternatively, stamper also includes being provided with multiple second through holes, each second through hole slidably extending through it In the second locating dowel.

Alternatively, pallet also includes multiple second regulating parts, and its one end is connected to the seating surface of pallet, other end connection Into the second receiving opening of stamper, each second regulating part is configured to adjust the depth of parallelism between seating surface and stamper.

Alternatively, stamper picks and places groove including multiple first, and sub-disk picks and places groove including multiple second, and multiple first pick and place Two two picked and placeed with multiple second in groove in groove are aligned on the same line.

Alternatively, sub-disk is provided with multiple placement sections suitable for receiving device under test on the surface for receiving device under test, Multiple placement sections being capable of arbitrary arrangement.

Alternatively, multiple first through holes are in a center of symmetry in sub-disk.

Alternatively, multiple first receiving openings are in a center of symmetry in sub-disk.

Alternatively, multiple second through holes are in a center of symmetry in stamper.

Alternatively, multiple second receiving openings are in a center of symmetry in stamper.

Alternatively, sub-disk includes：Rest area for placing multiple placement sections；And the non-rest area around rest area, Plurality of first through hole and multiple first receiving openings are arranged in non-rest area.

Alternatively, what stamper included being bearing on sub-disk is bearing on area and around the non-breasting area for being bearing on area, multiple locating slots and many Individual receiving channel is arranged in breasting area, and multiple second through holes are arranged in non-breasting area.

Alternatively, stamper includes being bearing on the breasting area of sub-disk and around the non-breasting area for being bearing on area, multiple second receiving openings It is arranged in non-breasting area.

Beneficial effect

Because the equipment of industrial product should not be transformed more because cost is tall and big, therefore, in industrial production application, according to Pallet of the present utility model is the separable Split tray of primary and secondary, and individually sub-disk can be designed, for example, sub-disk is settable Into it is variously-shaped, settable have place device under test, placement section of arbitrary shape etc. can be arranged in be adapted to industrial production Equipment, so can design sub-disk according to the structure and function of equipment is produced, realize efficient industrialized production.In addition, in example When being such as applied to industrial test, it can adjust parallel between sub-disk and stamper as needed according to pallet of the present utility model Degree, so as to improve measuring accuracy, it is ensured that device quality.

According at least one above-mentioned scheme, the split type test pallet design of primary and secondary is employed, in pallet Precision adjustment mistake Cheng Zhong, because device under test is very high to the required precision of pallet, therefore pallet adds adjustable apparatus (for example, the first regulation Part and the second regulating part), it is ensured that the measuring accuracy of pallet, it can make up due to test error caused by mismachining tolerance.

In addition, being designed according to the split type test pallet of above-mentioned primary and secondary, device under test can directly for example be detained the side of turnover panel Formula is buckled in sub-disk, is bearing on stamper and is tested, and saves the manpower that traditional mode is manually placed in test pallet one by one, and significantly Testing efficiency is improved, manpower is saved.Moreover, picking and placeing groove and multiple by configuring multiple first in stamper and sub-disk respectively Two pick and place groove, can be easy to picking and placeing for sub-disk, and that improves sub-disk picks and places efficiency.

Brief description of the drawings

Fig. 1 schematically shows the top view of the pallet of an embodiment according to the disclosure；

Fig. 2 schematically shows the top view of the sub-disk according to one embodiment of the disclosure；

Fig. 3 is the top view of the stamper according to one embodiment of the disclosure；

Fig. 4 is the top view of the pallet according to disclosure embodiment；And

Fig. 5 is the top view for showing the pallet according to disclosure embodiment.

Embodiment

In order to more fully understand the application, refer to the attached drawing is made into more detailed description to the various aspects of the application.Can To understand, the drawings and detailed description are the description to the application illustrative embodiments, rather than are limited in any way Scope of the present application.

It should be understood that, although the grade of term first, second herein can be for the various elements of description, region or portion Part, but these elements, region or part should not be limited by these terms.These terms are only used for element, part, an area Domain is distinguished with another element, part, region.

It will also be appreciated that term " comprising ", " including ", " having ", "comprising" and/or " including ", when in this theory Represent there is stated feature when being used in bright book, but do not preclude the presence or addition of one or more of the other feature.In addition, When describing presently filed embodiment, " can with " be used to represent " one or more embodiments of the application ".Also, term " exemplary " is intended to refer to example or illustration.

As it is used in the present context, term " substantially ", " about " and similar term are used as the approximate term of table, and The term of table degree is not used as, and is intended to explanation by recognized by those of ordinary skill in the art, measured value or calculated value In inherent variability.

The size in all parts shown in accompanying drawing and region is exemplary only.

Unless otherwise defined, otherwise all terms (including technical terms and scientific words) used herein be respectively provided with The application one skilled in the art's is generally understood that identical implication.It will also be appreciated that term is (such as in everyday words Term defined in allusion quotation) implication consistent with their implications in the context of correlation technique should be interpreted as having, and It will not explained with idealization or excessively formal sense, unless clearly such herein limit.

Fig. 1 schematically shows the top view of the pallet 1 of an embodiment according to the disclosure, and Fig. 2 is schematically The top view of the sub-disk 20 according to one embodiment of the disclosure is shown, and Fig. 3 is according to one embodiment of the disclosure Stamper 10 top view.

As shown in figures 1 and 3, pallet 1 includes stamper 10 and sub-disk 20.Stamper 10 and sub-disk 20 are not limited to shown in figure Shape, and may be designed to be suitable to any shape that operates together with test equipment.

Sub-disk 20 may include multiple first through holes 21 and multiple first receiving openings 22.First through hole 21 can be through son The hole of disk 20.First receiving opening 22 can run through sub-disk 20.Alternatively, the first receiving opening 22 also can be not through sub-disk 20.

Stamper 10 includes multiple locating slots 11 and multiple receiving channels 12, wherein, first is provided with each locating slot 11 and is determined Position post (not shown).First locating dowel extends through the first through hole 21 in sub-disk 20 from locating slot 11.In the embodiment party In formula, locating slot 11 and receiving channel 12 may be designed to not through stamper 10.Alternatively, locating slot 11 and receiving channel 12 may also extend through Stamper 10.First locating dowel is designed to slide in its longitudinal direction in the first through hole 21, and the first locating dowel can It is fixedly connected with locating slot 11.First locating dowel can be set to the shapes such as cylinder, prism, correspondingly, locating slot 11 and first Through hole 21 is not limited to the shape shown in figure, and can be set to be suitable to the shape with the cooperation of the first locating dowel, and passes through This cooperation can on the direction parallel with the plane of stamper position of the siding stopping disk 20 on stamper 10.

In addition, pallet 1 also includes multiple first regulating part (not shown).One end of first regulating part is received into stamper 10 In receiving channel 12, the other end is connected in the first receiving opening 22 of sub-disk 20., each first regulating part by with receiving channel 12 and First receiving opening 22 coordinates can fix sub-disk 20 on the direction vertical with stamper 10, and be adjusted by adjusting the first regulating part The depth of parallelism of knot disk 20 and stamper 10.

For example, each first regulating part can be removably secured in the receiving opening 22 of receiving channel 12 and first, with logical Overwinding transfers regulation sub-disk 20 and the depth of parallelism of stamper 10.For example, the first regulating part can be screw, receiving channel 12 is suitable to screw Not threaded one end be rotatably received into wherein, the first receiving opening 22 can be with suitable for the cooperation of the screw thread of screw Screw thread.So by rotary screw, the position of the screw and the vertical range of stamper 10 are received in adjustable sub-disk 20, and then Sub-disk 20 and the depth of parallelism of stamper 10 are adjusted, so as to adjust the depth of parallelism of sub-disk 20 and the placement plane of stamper 10.

Certainly, the first regulating part can be other devices, as another example, and the first regulating part can be liftable component, i.e., Length-adjustable component.Therefore, the first regulating part can adjust the depth of parallelism of sub-disk 20 and stamper 10 by adjustment length.

By this embodiment, Split tray can be achieved, sub-disk 10 is held by the first locating dowel and the first regulating part Lean against on stamper, and sub-disk 20 and the depth of parallelism of stamper 10 can be adjusted by the first regulating part.

As depicted in figs. 1 and 2, sub-disk 20 is in addition to including the feature described in reference picture 1, and sub-disk 20 can also receive device to be measured Multiple placement section PP suitable for receiving device under test are provided with the surface of part, the multiple placement section PP is not limited to shown in figure Shape, multiple placement section PP are not limited to be arranged in the shape shown in Fig. 2, and can be arranged in any shape.Due to sub-disk 20 Shape and its multiple placement PP can arbitrarily be configured, therefore, can be only by changing sub-disk according to pallet of the present utility model To adapt to the equipment of industrial product and device under test.

As shown in figure 1, sub-disk 20 may include：Rest area PA for placing multiple placement section PP；And put around described Area PA non-rest area NPA is put, wherein, multiple first through holes 21 and multiple first receiving openings 22 may be provided at non-rest area In NPA.Multiple first through holes 21 can be in a center of symmetry in sub-disk 20, and multiple first receiving openings 22 can be in sub-disk 20 into center pair Claim.

Sub-disk 20 may also include multiple second and pick and place groove 23.Second picks and places the non-placement that groove 23 may be disposed at sub-disk 20 In area NPA, and the second shape for picking and placeing groove 23 is not limited to the shape shown in figure and can be arbitrary shape.

As shown in figure 3, stamper 10 may also include multiple second receiving openings 14 and multiple second through holes 15, the second through hole It is provided with 15 and slidably extends through the second locating dowel (not shown) therein.The other end of second locating dowel may be connected to pallet On 1 seating surface, that is, it is arranged in test equipment.Multiple second receiving openings 14 can be in a center of symmetry in stamper 10.Multiple Two through holes 15 can be in a center of symmetry in stamper 10.

Second locating dowel is designed to slide in its longitudinal direction in the second through hole 15, and the second locating dowel can It is fixedly connected with the seating surface of pallet 1.Second locating dowel can be set to the shapes such as cylinder, prism, correspondingly, and second runs through Hole 15 can be set to the shape for being suitable to coordinate with the second locating dowel, and can be in the side parallel with seating surface by this cooperation The position of stamper 10 is limited upwards.

Stamper 10 may also include the breasting area BA for the being bearing on sub-disk 20 and non-breasting area NBA around breasting area BA, scheme multiple Locating slot 11 and multiple receiving channels 12 be may be provided in breasting area BA, and individual second receiving opening 14 and multiple second through holes 15 can be set Put in the non-breasting area NBA.

Fig. 4 is the top view of the pallet 1 according to disclosure embodiment.

Reference picture 4, pallet 1 also includes the second regulating part (not shown), and one end of the second regulating part is connected to the peace of pallet 1 Put surface, the other end is connected in the second receiving opening 14 of stamper 10, each second regulating part be configured to regulation seating surface with The depth of parallelism between stamper 10.

One end of each second regulating part is received into the second receiving opening 14 of stamper 10, and the other end is connected to pallet 1 Seating surface.Further, each second regulating part by the cooperation with the second receiving opening 14 and seating surface can with placement Stamper 10 is fixed on the vertical direction in surface, and it is parallel with seating surface by adjusting the adjustable stamper 10 of the second regulating part Degree.For example, each second regulating part can be removably secured in seating surface and the second receiving opening 14, to pass through rotation To adjust the depth of parallelism of sub-disk 20 and stamper 10, such as seating surface is provided with the groove for receiving the second regulating part.For example, the Two regulating parts can be screw, and the groove being arranged in seating surface is suitable to not threaded one end of screw being rotatably received into Wherein, the second receiving opening 14 can be with suitable for the screw thread with the cooperation of the screw thread of screw.It is so adjustable by rotary screw The position of the screw and the vertical range of seating surface are received on stamper 10, and then it is parallel with seating surface to adjust stamper 10 Degree.

Certainly, the second regulating part can be other devices, as another example, and the second regulating part can be liftable component, i.e., Length-adjustable component.Therefore, the second regulating part can adjust the depth of parallelism of stamper 10 and seating surface by adjustment length.

Although the second through hole 15 not shown in FIG. 4 and slidably the second locating dowel therethrough, according to The pallet 1 of embodiment described in reference picture 4 may include the second through hole 15 and the second locating dowel, or may include can be achieved The combination of the structure or structure of similar functions.

Fig. 5 is the top view for showing the pallet 1 according to disclosure embodiment.

As shown in figure 5, pallet 1 may include stamper 20 and sub-disk 10.Sub-disk 20 includes embodiment described with reference to Figure 1 Multiple first through holes 21 and multiple first receiving openings 22, and may include multiple placement section PP described in reference picture 2 and many Individual second picks and places groove 23.Stamper 10 may include reference picture 3 and multiple locating slots 11 shown in Fig. 4, multiple receiving channels 12, multiple Second receiving opening 14 and multiple second through holes 15, in addition stamper 10 may also include multiple first and pick and place groove 13.Such as Fig. 5 institutes Show, multiple first pick and place two in groove 13 picks and places two in groove 23 preferably with always with the multiple second It is aligned on line, can be so easy to picking and placeing for sub-disk 20, so that the personnel of improving pick and place efficiency.

The disclosure is not limited to embodiment described above, and the embodiment shown in accompanying drawing is only exemplary , not the disclosure is limited, therefore, in the case of without departing substantially from spirit and scope of the present disclosure, people in the art Member can embodiment of this disclosure make various changes in form and details.

Claims (12)

1. a kind of pallet, including：

Sub-disk, including multiple first through holes and multiple first receiving openings；

Stamper, including multiple locating slots and multiple receiving channels；

Characterized in that, being provided with the first locating dowel in each locating slot, first locating dowel is prolonged from the locating slot The first through hole stretched and run through in the sub-disk；

The pallet also includes：

Multiple first regulating parts, its one end is received into the receiving channel of the stamper, and the other end is connected to the first of the sub-disk In receiving opening, each first regulating part is configured to adjust the depth of parallelism between the sub-disk and the stamper.

2. pallet as claimed in claim 1, it is characterised in that the stamper also includes multiple second through holes, each described It is provided with second through hole and slidably extends through the second locating dowel therein.

3. pallet as claimed in claim 1, it is characterised in that also including multiple second regulating parts, second regulating part One end is connected to the seating surface of the pallet, and the other end is connected in the second receiving opening of the stamper, and each described second Regulating part is configured to adjust the depth of parallelism between the seating surface and the stamper.

4. pallet as claimed in claim 1, it is characterised in that the stamper picks and places groove, the sub-disk including multiple first Groove is picked and placeed including multiple second,

The multiple first two two picked and placeed with the multiple second in groove picked and placeed in groove are right on the same line It is accurate.

5. pallet as claimed in claim 1, it is characterised in that the sub-disk is provided with suitable on the surface for receiving device under test In the multiple placement sections for receiving device under test, the multiple placement section being capable of arbitrary arrangement.

6. pallet as claimed in claim 1, it is characterised in that the multiple first through hole is in the sub-disk into center pair Claim.

7. pallet as claimed in claim 1, it is characterised in that the multiple first receiving opening is in the sub-disk into center pair Claim.

8. pallet as claimed in claim 2, it is characterised in that the multiple second through hole is in the stamper into center pair Claim.

9. pallet as claimed in claim 3, it is characterised in that the multiple second receiving opening is in the stamper into center pair Claim.

10. pallet as claimed in claim 5, it is characterised in that the sub-disk includes：

Rest area for placing the multiple placement section；And

Non- rest area around the rest area, wherein, the multiple first through hole and the multiple first receiving opening are set In the non-rest area.

11. pallet as claimed in claim 2, it is characterised in that in, the stamper include being bearing on the breasting area of the sub-disk and Non- breasting area around the breasting area, the multiple locating slot and the multiple receiving channel are arranged in the breasting area, institute Multiple second through holes are stated to be arranged in the non-breasting area.

12. pallet as claimed in claim 3, it is characterised in that the stamper includes the breasting Qu Hewei for being bearing on the sub-disk Non- breasting area around the breasting area, the multiple second receiving opening is arranged in the non-breasting area.