CN206470388U - The apparatus for evaluating of metering performance under dynamic load - Google Patents
The apparatus for evaluating of metering performance under dynamic load Download PDFInfo
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- CN206470388U CN206470388U CN201621120513.7U CN201621120513U CN206470388U CN 206470388 U CN206470388 U CN 206470388U CN 201621120513 U CN201621120513 U CN 201621120513U CN 206470388 U CN206470388 U CN 206470388U
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Abstract
The utility model embodiment provides a kind of apparatus for evaluating of the metering performance under dynamic load, and the device includes：Transformer collecting unit is converted to voltage signal and current signal the signal for meeting computation chip to be measured and AD modulus conversion chip requirements；Voltage signal and current signal after conversion is inputed into computation chip to be measured, while the voltage signal and current signal after conversion are inputed into AD conversion chip, computation chip to be measured generates instantaneous power curve according to the voltage signal after conversion and current signal；Voltage signal and current signal are respectively converted into the signal waveform of digital form by AD conversion chip；Instantaneous power curve is used to be compared with the waveform voltage signal and current signal waveform of digital form, to assess the metering performance of computation chip to be measured.The program can evaluate metering performance of the computation chip to be measured under dynamic load, can provide foundation to improve metering performance of the electric energy meter under dynamic load.
Description
Technical field
The utility model is related to electric energy meter Performance Evaluation technical field, more particularly to a kind of Targets under dynamic load
The apparatus for evaluating of energy.
Background technology
There is the phenomenon of current amplitude big ups and downs industrial at present and civilian electric electrical load, for example, the electricity of steel mill more
Arc stove, rolling mill, the tower crane at harbour, urban light rail and electric automobile charging station etc., are all typical dynamic load.Frequent fluctuation
Load current, influence can be produced on the metering of electric energy meter.It is dynamically negative that current each scientific research institution is proposed different electric energy meters
Lotus metering performance appraisal procedure, to carry out the evaluation of laboratory electric energy meter dynamic load performance.
The related electric energy meter dynamic load appraisal procedure announced at present mainly includes：
1st, using programmable unit and silicon controlled control circuit, generation three phase dynamic power is conveyed to electric energy meter, while than
The active pulse error exported to electric energy meter.This method electric energy meter oneself does not generate voltage and current signal, but by controllable
Silicon changes the voltage and current signal shape of external power source input according to programmed logic, to reach the mesh of output dynamic load
, while receiving the active energy pulse of electric energy meter output, carry out measuring accuracy judgement.
2nd, by active power signal source unit, the tested electric energy meter of power source signal input of Production development modulation is carried out
Electric energy meter dynamic load is tested.This method is in the integrated oblique line power source of device interior and index power source unit, directly
Voltage and current fluctuation signal that output is modulated are connect, while receiving the electrical energy pulse that tested electric energy meter is returned, active electricity is carried out
Can precision judgement.
The above method is evaluated and tested mainly for the overall dynamics load metering performance of electric energy meter, and test data can not conduct
Improve the foundation of electric energy meter dynamic load metering performance.
Utility model content
The utility model embodiment provides a kind of apparatus for evaluating of metering performance under dynamic load, existing to solve
In technology test data can not as improve electric energy meter dynamic load metering performance foundation technical problem.The device includes：
It is provided with the probe card of transformer collecting unit, AD (Analog to Digital, modulus) conversion chips and processor
Plate, wherein, the voltage signal, for obtaining voltage signal and current signal, is converted to symbol by the transformer collecting unit
The voltage signal of the computation chip to be measured and AD conversion chip requirement is closed, the current signal is converted into and meets described
Computation chip to be measured and the current signal of AD conversion chip requirement, the voltage signal and current signal after conversion are inputed to
The computation chip to be measured, while the voltage signal and current signal after conversion are inputed into the AD conversion chip, wherein,
In the computation chip to be measured, instantaneous power curve is generated according to the voltage signal after conversion and current signal；The electric current letter
Number amplitude dynamic fluctuation；The AD conversion chip, the voltage for the voltage signal after conversion to be converted into digital form is believed
Number waveform, the current signal after conversion is converted into the current signal waveform of digital form；The processor, for receiving and depositing
The current signal waveform of the instantaneous power curve, the waveform voltage signal of digital form and digital form is stored up, wherein, the wink
When power curve be used for be compared with the waveform voltage signal of digital form and the current signal waveform of digital form, assess institute
State the metering performance of computation chip to be measured.
In one embodiment, the transformer collecting unit, including：Zero-flux current transformer, for by the electricity
Stream signal is converted into secondary low current signal；Divider resistance array, believes for the voltage signal to be converted into secondary small voltage
Number.
In one embodiment, the processor, specifically for the voltage of the instantaneous power curve, digital form is believed
The current signal waveform of number waveform and digital form is sent to outside the apparatus for evaluating of the above-mentioned metering performance under dynamic load
Processing equipment；Receive the waveform voltage signal and the current signal waveform of digital form of the digital form of processing equipment transmission
Fluctuating change and the instantaneous power curve there is the relation of error in dipping, wherein, the waveform voltage signal of digital form and
The fluctuating change of the current signal waveform of digital form is by inciting somebody to action with the relation that error in dipping occurs in the instantaneous power curve
The instantaneous power curve and the waveform voltage signal of digital form and the current signal waveform of digital form are compared and obtained
's；The fluctuating change of the waveform voltage signal of digital form and the current signal waveform of digital form and the instantaneous power curve
There is the relation of error in dipping, be the foundation for the metering performance for assessing the computation chip to be measured.
In one embodiment, the fluctuation of the current signal waveform of the waveform voltage signal of digital form and digital form becomes
Change and the relation of error in dipping occur with the instantaneous power curve, be adjust the parameter of the computation chip to be measured come described in improving
The foundation of the metering performance of computation chip to be measured.
In one embodiment, in addition to：Core processor, by the first parallel bus and the probe card plate
Processor is connected, the metering performance test result of the computation chip to be measured evaluated for receiving and storing.
In one embodiment, the quantity of the probe card plate is less than or equal to 4, and each probe card plate passes through institute
The first parallel bus is stated to be connected with the core processor.
In one embodiment, in addition to：Display, is connected by the second parallel bus with the core processor, is used
The metering performance test result of the computation chip to be measured evaluated in display.
In one embodiment, in addition to：Keyboard, is connected with the core processor by the second parallel bus, is used for
The display of the display is controlled to operate.
In one embodiment, in addition to：Communication unit, is connected by the second parallel bus with the core processor,
The metering performance test result of the computation chip to be measured evaluated for being exported from the core processor.
In one embodiment, in addition to：Memory, is connected by the second parallel bus with the core processor, is used
The metering performance test result of the computation chip to be measured evaluated in storage.
In the utility model embodiment, the voltage and current signal of computation chip to be measured will be inputed to while inputing to AD
Conversion chip, gathers instantaneous power of the computation chip to be measured according to the voltage and current signal generation of input, and instantaneous power is used for
Analysis is compared with the voltage and current signal of AD conversion chip, computation chip to be measured is assessed Targets under dynamic load
Energy.Because inventor has found that computation chip is the core component of electric energy meter, the main metering algorithm and sampling element of electric energy meter are all
It is integrated in computation chip, it is Targets under dynamic load that inventor's proposition evaluates computation chip to be measured by said apparatus
After energy, according to metering performance of the computation chip to be measured under dynamic load substantially with regard to electric energy meter can be assessed under dynamic load
Metering performance, due to specify which error in dipping computation chip to be measured occurs under dynamic load so that can also be improvement
Metering performance of the electric energy meter under dynamic load provides foundation.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding to of the present utility model, constitutes the part of the application,
Do not constitute and limit of the present utility model.In the accompanying drawings：
Fig. 1 is a kind of structure of the apparatus for evaluating for metering performance under dynamic load that the utility model embodiment is provided
Block diagram；
Fig. 2 be the utility model embodiment provide a kind of metering performance under dynamic load apparatus for evaluating in signal stream
To schematic diagram；
Fig. 3 is a kind of apparatus for evaluating for specific metering performance under dynamic load that the utility model embodiment is provided
Schematic diagram；
Fig. 4 is a kind of schematic diagram for display that the utility model embodiment is provided.
Embodiment
For the purpose of this utility model, technical scheme and advantage is more clearly understood, with reference to embodiment and attached
Figure, is described in further details to the utility model.Here, exemplary embodiment of the present utility model and its illustrate be used for solve
The utility model is released, but is not intended as limiting of the present utility model.
There is provided a kind of apparatus for evaluating of the metering performance under dynamic load, such as Fig. 1 in the utility model embodiment
Shown, the device includes：It is provided with the probe card of transformer collecting unit 101, AD conversion chip 102 and processor 103
Plate, wherein,
The transformer collecting unit 101, for obtaining voltage signal and current signal, the voltage signal is converted to
Meet the voltage signal of the computation chip to be measured and AD conversion chip requirement, the current signal is converted into and meets institute
The current signal of computation chip to be measured and AD conversion chip requirement is stated, the voltage signal after conversion and current signal are inputted
To the computation chip to be measured, while the voltage signal and current signal after conversion are inputed into the AD conversion chip, wherein,
In the computation chip to be measured, instantaneous power curve is generated according to the voltage signal after conversion and current signal；The electric current
The amplitude dynamic fluctuation of signal；
The AD conversion chip 102, the waveform voltage signal for the voltage signal after conversion to be converted into digital form,
Current signal after conversion is converted into the current signal waveform of digital form；
The processor 103, for receive and store the instantaneous power curve, the waveform voltage signal of digital form and
The current signal waveform of digital form, wherein, the instantaneous power curve is used for the waveform voltage signal sum with digital form
The current signal waveform of font formula is compared, and assesses the metering performance of the computation chip to be measured.
Understand, in the utility model embodiment, the voltage and current for inputing to computation chip to be measured is believed as shown in Figure 1
Number input to AD conversion chip simultaneously, gather instantaneous work(of the computation chip to be measured according to the voltage and current signal generation of input
Rate, instantaneous power is used to be compared analysis with the voltage and current signal of AD conversion chip, assesses computation chip to be measured dynamic
Metering performance under state load.Because inventor has found that computation chip is the core component of electric energy meter, the main metering of electric energy meter
Algorithm and sampling element are all integrated in computation chip, and inventor proposes to evaluate computation chip to be measured dynamic by said apparatus
After metering performance under state load, according to metering performance of the computation chip to be measured under dynamic load substantially with regard to electric energy can be assessed
Metering performance of the table under dynamic load, due to specify that computation chip to be measured occurs which metering is missed under dynamic load
Difference so that foundation can also be provided to improve metering performance of the electric energy meter under dynamic load.
When it is implemented, in order that the voltage signal and current signal that obtain signal source meet computation chip to be measured and AD conversion
The requirement of chip, in the present embodiment, the transformer collecting unit, including：Zero-flux current transformer, for by the electricity
Stream signal is converted into secondary low current signal；Divider resistance array, believes for the voltage signal to be converted into secondary small voltage
Number, so as to which the secondary low current signal and secondary small voltage signal after conversion are inputed into computation chip to be measured, while will conversion
Secondary low current signal and secondary small voltage signal afterwards inputs to AD conversion chip.The use of zero-flux current transformer, can
Wide dynamic range, the high linearity collection of electric current are realized, influence of the current sampling circuit to dynamic load waveform is eliminated, makes metering
Metric results are more reliable, true under the dynamic load that chip is exported.
When it is implemented, in order to analyze the reason for dynamic load influences on computation chip metering performance, assessing computation chip
The accuracy of measuring under dynamic load input, in the present embodiment, the processor, specifically for the instantaneous power is bent
The current signal waveform of line, the waveform voltage signal of digital form and digital form is sent to the above-mentioned metering under dynamic load
Processing equipment outside the apparatus for evaluating of performance；Receive the waveform voltage signal and numeral of the digital form of processing equipment transmission
There is the relation of error in dipping with the instantaneous power curve in the fluctuating change of the current signal waveform of form, wherein, digital shape
The fluctuating change of the waveform voltage signal of formula and the current signal waveform of digital form is measured with the instantaneous power curve
The relation of error is by the way that the electric current of the waveform voltage signal of the instantaneous power curve and digital form and digital form is believed
Number waveform is compared what is obtained；The fluctuating change of the waveform voltage signal of digital form and the current signal waveform of digital form
There is the relation of error in dipping with the instantaneous power curve, be the foundation for the metering performance for assessing the computation chip to be measured.
Specifically, the processing equipment outside the apparatus for evaluating of the above-mentioned metering performance under dynamic load can be by following
Step obtains the metering performance test result of computation chip to be measured, for example, calculating the error in dipping that instantaneous power curve occurs；Will
The current signal waveform of the waveform voltage signal and digital form of instantaneous power curve and digital form is compared, it is determined that digital
The fluctuating change of the waveform voltage signal of form and the current signal waveform of digital form is counted with the instantaneous power curve
Measure the relation of error.For example, the error in dipping that instantaneous power curve occurs is calculated, by instantaneous power curve and the electricity of digital form
The current signal waveform of pressure signal waveform and digital form is compared, you can is determined and is gone out in which moment instantaneous power curve
Error in dipping is showed, the waveform voltage signal sum of digital form at the time of there is error in dipping just can be learnt in waveform
Which type of fluctuating change is the current signal waveform of font formula occur in that, you can determine digital form waveform voltage signal and
There is the relation of error in dipping with instantaneous power curve in the fluctuating change of the current signal waveform of digital form, and then can draw
The fluctuating change of the waveform voltage signal of which digital form and the current signal waveform of digital form can influence computation chip
Metering performance.
When it is implemented, digital form waveform voltage signal and digital form current signal waveform fluctuating change with
There is the relation of error in dipping in instantaneous power curve, can improve metering core to be measured as the parameter of computation chip to be measured is adjusted
The foundation of the metering performance of piece.For example, determining the current signal ripple of the waveform voltage signal of digital form and digital form
What kind of fluctuating change is shape occur in that, when can make it that error in dipping occurs in instantaneous power curve, it is possible to adjust metering core to be measured
The parameter of piece, for example, adjusting the parameter of computation chip median filter to be measured so that reduction digital form waveform voltage signal and
Influence of such fluctuating change of the current signal waveform of digital form to computation chip metering performance to be measured.
When it is implemented, signals below stream can be used in the apparatus for evaluating of the above-mentioned metering performance under dynamic load
To as shown in Figure 2：
The current signal for the amplitude dynamic fluctuation that calibration power source is produced is converted into secondary by zero-flux current transformer
Low current signal, the voltage signal that calibration power source is produced is converted into secondary small voltage signal by divider resistance array；By two
Secondary low current signal and secondary small voltage signal are input to AD conversion chip loop, while by secondary low current signal and secondary small
Voltage signal is input to the sampling loop of computation chip to be measured, secondary low current signal and two of the computation chip to be measured according to input
Secondary small voltage signal, is calculated as follows instantaneous power：
P (k)=u (k) i (k)；
Wherein, p (k) is instantaneous power, and u (k) is instantaneous secondary small voltage signal, and i (k) is instantaneous secondary low current letter
Number.
Computation chip to be measured is also added up instantaneous power as follows, and exports active energy pulse：
Wherein, PsIt is active energy pulse, T is pulse period, t0It is initial time.
Computation chip to be measured is completed after the calculating of instantaneous power, to DSP (Digital Signal Processor, numeral
Signal processor) (stating processor 103) return instantaneous power curve.
AD conversion chip loop is also received in the same time after secondary low current signal and secondary small voltage signal, by two
Secondary low current signal is converted into the current signal of digital form, and the voltage that secondary small voltage signal is converted into digital form is believed
Number, and the voltage signal and current signal of the digital form after conversion are input in DSP, DSP synchronous recording AD conversion chips
The waveform voltage signal and the current signal waveform of digital form for the digital form that loop is returned.DSP is by computation chip to be measured
The current signal waveform of instantaneous power curve, the waveform voltage signal of digital form and digital form is sent to above-mentioned processing and set
It is standby, and receive the fluctuation of the waveform voltage signal of the digital form of processing equipment transmission and the current signal waveform of digital form
There is the relation of error in dipping, the waveform voltage signal of digital form and the electric current letter of digital form with instantaneous power curve in change
There is the relation of error in dipping with the instantaneous power curve in the fluctuating change of number waveform, is to assess the computation chip to be measured
The foundation of metering performance, you can evaluate the metering performance of computation chip to be measured, and by parallel communication busses, by metering to be measured
The metering performance test result of chip is exported to be preserved to backstage MCU (Microcontroller Unit, micro-control unit).
When it is implemented, as shown in figure 3, each probe card plate 1 includes (the i.e. above-mentioned transformer of transformer collecting unit 3
Collecting unit 101), AD conversion chip 5 (i.e. above-mentioned AD conversion chip 102), computation chip to be measured 4 and (the i.e. above-mentioned places of DSP 6
Manage device 103).Specifically, AD conversion chip 5 can be 16 SAR type A/D chips, DSP 6 can be 30 binary digits of high speed
Signal processing chip.
When it is implemented, as shown in figure 3, the apparatus for evaluating of the above-mentioned metering performance under dynamic load also includes：Core
Processor 8, is connected by the first parallel bus with probe card plate 1, the metering to be measured evaluated for receiving and storing
The metering performance test result of chip.Specifically, core processor 8 can be the core processors of 200MHZ ARM 9.Meter to be measured
The metering performance test result of amount chip can be specifically the waveform voltage signal and digital form for the digital form that DSP 6 is received
Fluctuating change and the instantaneous power curve of current signal waveform there is the relation of error in dipping.
When it is implemented, when it is implemented, the core component that inventor has found to evaluate electric energy meter metering performance is metering core
Piece, can exclude the influence of electric energy meter miscellaneous part, metering performance of the independent assessment difference computation chip under dynamic load, and then
Metering performance of the Indirect evaluation electric energy meter under dynamic load.In order to improve testing efficiency, as shown in figure 3, the probe card
The quantity of plate 1 is less than or equal to 4, and each probe card plate is connected by first parallel bus 7 and the core processor
Connect.Specifically, the apparatus for evaluating of the above-mentioned metering performance under dynamic load mainly can be real by same probe card plate 1
It is existing, the metering performance test result of computation chip to be measured is transferred to by MCU (i.e. above-mentioned cores in backstage by the first parallel bus 7
Processor 8).The quantity of the probe card plate 1 can be, less than or equal to 4, to realize the design of many probe card plates of monobus, when
When the quantity of the probe card plate 1 is 4,4 probe card plates 1 can test the computation chip of different manufacturers respectively, each to survey
Computation chip to be measured and AD conversion chip in card 1 is tried to correspond, by the instantaneous power curve of computation chip to be measured with it is right
The waveform voltage signal of digital form and the current signal waveform of digital form of AD conversion chip output is answered to be transferred to a DSP
6 so that can test metering performance of the computation chip of different manufacturers under dynamic load simultaneously, 4 probe card plates 1 are distinguished
Test result is sent to by core processor 8 by the first parallel bus 7.
When it is implemented, the metering performance for the ease of directly understanding each computation chip to be measured, in the present embodiment,
As shown in figure 3, the apparatus for evaluating of the above-mentioned metering performance under dynamic load also includes：Display 9, passes through the second parallel bus
13 are connected with the core processor 8, the metering performance test result for showing the computation chip to be measured evaluated.Example
Such as, for each computation chip to be measured, the waveform voltage signal and numeral of digital form are shown in real time by liquid crystal display
There is the relation of error in dipping with instantaneous power curve in the fluctuating change of the current signal waveform of form.Specifically, display 9 can
To be liquid crystal display as shown in Figure 4, it obtains the metering of computation chip to be measured by interface 9-1 from core processor 8
The performance test results, can show the metering performance test result of computation chip to be measured by color liquid crystal screen, can be with root
According to the metering performance test result of computation chip to be measured, the ginseng of computation chip to be measured is set by the function key 9-2 of display 9
Number, the metering performance of computation chip to be measured is improved to adjust the parameter of the computation chip to be measured.
When it is implemented, as shown in figure 3, the apparatus for evaluating of the above-mentioned metering performance under dynamic load also includes：Keyboard
10, it is connected by the second parallel bus with the core processor, for controlling the display of the display to operate.For example, working as
There are multiple computation chips to be measured while when being tested, display 9 can be controlled simultaneously or sequentially to show by keyboard 10 many
The metering performance test result of individual computation chip to be measured.
When it is implemented, as shown in figure 3, the apparatus for evaluating of the above-mentioned metering performance under dynamic load also includes：Communication
Unit 12, is connected by the second parallel bus 13 with the core processor 8, is assessed for being exported from the core processor
The metering performance test result of the computation chip to be measured gone out.
When it is implemented, as shown in figure 3, the apparatus for evaluating of the above-mentioned metering performance under dynamic load also includes：Storage
Device 11, is connected by the second parallel bus 13 with the core processor 8, for storing the computation chip to be measured evaluated
Metering performance test result.
When it is implemented, the apparatus for evaluating of the above-mentioned metering performance under dynamic load can be with as shown in figure 3, core processing
Device 8 connects 4 blocks of probe card plates 1 by the first parallel bus 7, and in every block of probe card plate 1, transformer collecting unit 3 is wrapped
Contain current transformer and divider resistance array.The parallel connection of transformer collecting unit 3 has computation chip 4 to be measured to turn with AD
Chip 5 is changed, computation chip 4 to be measured is connected with DSP 6 with AD conversion chip 5, and DSP 6 is connected with bus plug, and access first is simultaneously
Row bus 7, are connected with core processor 8.Core processor 8 is also associated with display 9, keyboard by the second parallel bus 13
10th, memory 11 and communication unit 12.
The course of work of the apparatus for evaluating of the above-mentioned metering performance under dynamic load is：In each independent probe card plate 1
On, voltage sampling is carried out by the divider resistance array in transformer collecting unit 3, is secondary by the voltage conversion of signal source 2
Small voltage signal；Current signal and conversion by the zero-flux current transformer sampled signal source 2 in transformer collecting unit 3
Into secondary low current signal.Voltage signal and current signal after transformer collecting unit 3 is changed are input to metering core to be measured
The sample circuit of piece 4, while the voltage signal and current signal after transformer collecting unit 3 is changed are input to AD conversion chip
In 5 sample circuit.
Computation chip 4 to be measured is completed after sample of signal, completes the meter of the calculating of instantaneous power curve and active energy pulse
Calculate, and export active energy pulse, computation chip 4 to be measured by instantaneous power curve negotiating SPI port transmissions to DSP 6, meanwhile, AD
Voltage after conversion, current digital signal are input in DSP 6 by conversion chip 5, after the record AD conversion chips 5 of DSP 6 are changed
Voltage, current digital signal, deposit digital voltage, current waveform profile, and by the voltage of digital form, current waveform profile with
And the incoming instantaneous power curve of computation chip 4 to be measured is sent to above-mentioned processing equipment, and receive the number of processing equipment transmission
The fluctuating change of the waveform voltage signal of font formula and the current signal waveform of digital form is measured with instantaneous power curve
The relation of error, the fluctuating change of the waveform voltage signal of digital form and the current signal waveform of digital form with it is described instantaneous
There is the relation of error in dipping in power curve, is the foundation for the metering performance for assessing the computation chip to be measured, you can evaluate
The metering performance of computation chip to be measured, it is by parallel bus interface, the metering performance test result of computation chip to be measured is incoming
Into core processor 8.
Core processor 8 receives the computation chip to be measured that each probe card plate 1 is returned by the first parallel bus 7
Metering performance test result, and carry out data record, storage work.Core processor 8 is by display 9 to computation chip to be measured
Metering performance test result shown, it is possible to the ginseng of computation chip to be measured is carried out by function key 9-2 in display 9
Number is set, to improve the metering performance of computation chip to be measured.Core processor 8 completes each metering core to be measured by communication unit 12
The export work of the metering performance test result of piece.
In the utility model embodiment, the voltage and current signal of computation chip to be measured will be inputed to while inputing to AD
Conversion chip, gathers instantaneous power of the computation chip to be measured according to the voltage and current signal generation of input, and instantaneous power is used for
Analysis is compared with the voltage and current signal of AD conversion chip, computation chip to be measured is assessed Targets under dynamic load
Energy.Because inventor has found that computation chip is the core component of electric energy meter, the main metering algorithm and sampling element of electric energy meter are all
It is integrated in computation chip, it is Targets under dynamic load that inventor's proposition evaluates computation chip to be measured by said apparatus
Can, according to metering performance of the computation chip to be measured under dynamic load substantially with regard to meter of the electric energy meter under dynamic load can be assessed
Performance is measured, due to specify which error in dipping computation chip to be measured occurs under dynamic load so that can also be electric to improve
Can metering performance offer foundation of the table under dynamic load.
Preferred embodiment of the present utility model is the foregoing is only, the utility model is not limited to, for this
For the technical staff in field, the utility model embodiment can have various modifications and variations.It is all in spirit of the present utility model
Within principle, any modification, equivalent substitution and improvements made etc. should be included within protection domain of the present utility model.
Claims (10)
1. a kind of apparatus for evaluating of metering performance under dynamic load, it is characterised in that including：It is provided with transformer collection single
The probe card plate of member, modulus conversion chip and processor, wherein,
The transformer collecting unit, for obtaining voltage signal and current signal, the voltage signal is converted to meet and treated
The voltage signal of computation chip and modulus conversion chip requirement is surveyed, the current signal is converted into and meets the meter to be measured
The current signal of chip and modulus conversion chip requirement is measured, the voltage signal and current signal after conversion are inputed to described
Computation chip to be measured, while the voltage signal and current signal after conversion are inputed into the modulus conversion chip, wherein, in institute
State in computation chip to be measured, instantaneous power curve is generated according to the voltage signal after conversion and current signal；The current signal
Amplitude dynamic fluctuation；
The modulus conversion chip, the waveform voltage signal for the voltage signal after conversion to be converted into digital form will turn
Current signal after changing is converted into the current signal waveform of digital form；
The processor, for receive and store the instantaneous power curve, digital form waveform voltage signal sum font
The current signal waveform of formula, wherein, the instantaneous power curve is used for waveform voltage signal and digital form with digital form
Current signal waveform be compared, assess the metering performance of the computation chip to be measured.
2. the apparatus for evaluating of the metering performance as claimed in claim 1 under dynamic load, it is characterised in that the transformer
Collecting unit, including：
Zero-flux current transformer, for the current signal to be converted into secondary low current signal；
Divider resistance array, for the voltage signal to be converted into secondary small voltage signal.
3. the apparatus for evaluating of the metering performance as claimed in claim 1 under dynamic load, it is characterised in that the processing
Device, specifically for by the current signal waveform of the instantaneous power curve, the waveform voltage signal of digital form and digital form
It is sent to the processing equipment outside the apparatus for evaluating of the above-mentioned metering performance under dynamic load；Receive processing equipment transmission
The fluctuating change of the waveform voltage signal of digital form and the current signal waveform of digital form goes out with the instantaneous power curve
The relation of existing error in dipping, wherein, the fluctuation of the waveform voltage signal of digital form and the current signal waveform of digital form becomes
It is by by the electricity of the instantaneous power curve and digital form to change the relation for error in dipping occur with the instantaneous power curve
The current signal waveform of pressure signal waveform and digital form is compared what is obtained；The waveform voltage signal and numeral of digital form
The fluctuating change of the current signal waveform of form the relation of error in dipping occurs with the instantaneous power curve, is treated described in assessment
Survey the foundation of the metering performance of computation chip.
4. the apparatus for evaluating of the metering performance as claimed in claim 3 under dynamic load, it is characterised in that digital form
There is error in dipping with the instantaneous power curve in the fluctuating change of the current signal waveform of waveform voltage signal and digital form
Relation, be to adjust the parameter of the computation chip to be measured to improve the foundation of the metering performance of the computation chip to be measured.
5. the apparatus for evaluating of the metering performance under dynamic load as any one of Claims 1-4, its feature exists
In, in addition to：
Core processor, is connected by the first parallel bus with the processor in the probe card plate, for receiving and storing
The metering performance test result of the computation chip to be measured evaluated.
6. the apparatus for evaluating of the metering performance as claimed in claim 5 under dynamic load, it is characterised in that the test is inserted
The quantity of part plate is less than or equal to 4, and each probe card plate is connected by first parallel bus and the core processor
Connect.
7. the apparatus for evaluating of the metering performance as claimed in claim 5 under dynamic load, it is characterised in that also include：
Display, is connected by the second parallel bus with the core processor, for showing the metering to be measured evaluated
The metering performance test result of chip.
8. the apparatus for evaluating of the metering performance as claimed in claim 7 under dynamic load, it is characterised in that also include：
Keyboard, is connected by the second parallel bus with the core processor, for controlling the display of the display to operate.
9. the apparatus for evaluating of the metering performance as claimed in claim 5 under dynamic load, it is characterised in that also include：
Communication unit, is connected by the second parallel bus with the core processor, for being exported from the core processor
The metering performance test result of the computation chip to be measured evaluated.
10. the apparatus for evaluating of the metering performance as claimed in claim 5 under dynamic load, it is characterised in that also include：
Memory, is connected by the second parallel bus with the core processor, for storing the metering to be measured evaluated
The metering performance test result of chip.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405477A (en) * | 2016-10-13 | 2017-02-15 | 国网冀北电力有限公司电力科学研究院 | Evaluation method and device for metering performance under dynamic load |
| CN109085425A (en) * | 2018-07-20 | 2018-12-25 | 国网湖南省电力有限公司 | A kind of impact load calculation method |
| CN110596635A (en) * | 2019-07-26 | 2019-12-20 | 广西电网有限责任公司 | Method for detecting rear fault of electric energy meter and electric energy meter |
| CN112748388A (en) * | 2019-10-29 | 2021-05-04 | 国网宁夏电力有限公司电力科学研究院 | Test system and test method for intelligent electric meter |
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2016
- 2016-10-13 CN CN201621120513.7U patent/CN206470388U/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405477A (en) * | 2016-10-13 | 2017-02-15 | 国网冀北电力有限公司电力科学研究院 | Evaluation method and device for metering performance under dynamic load |
| CN106405477B (en) * | 2016-10-13 | 2023-11-24 | 国网冀北电力有限公司电力科学研究院 | Evaluation method and device for metering performance under dynamic load |
| CN109085425A (en) * | 2018-07-20 | 2018-12-25 | 国网湖南省电力有限公司 | A kind of impact load calculation method |
| CN109085425B (en) * | 2018-07-20 | 2020-10-20 | 国网湖南省电力有限公司 | Impact load calculation method |
| CN110596635A (en) * | 2019-07-26 | 2019-12-20 | 广西电网有限责任公司 | Method for detecting rear fault of electric energy meter and electric energy meter |
| CN110596635B (en) * | 2019-07-26 | 2021-10-22 | 广西电网有限责任公司 | Method for detecting rear fault of electric energy meter and electric energy meter |
| CN112748388A (en) * | 2019-10-29 | 2021-05-04 | 国网宁夏电力有限公司电力科学研究院 | Test system and test method for intelligent electric meter |
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