CN206431456U - Planar semiconductor sensor current detects circuit - Google Patents
Planar semiconductor sensor current detects circuit Download PDFInfo
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- CN206431456U CN206431456U CN201621485188.4U CN201621485188U CN206431456U CN 206431456 U CN206431456 U CN 206431456U CN 201621485188 U CN201621485188 U CN 201621485188U CN 206431456 U CN206431456 U CN 206431456U
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- differential comparator
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Abstract
The utility model provides a kind of planar semiconductor sensor current and detects circuit, MCU controllers connect power supply, one end connection power supply of planar semiconductor sensor, the other end of planar semiconductor sensor is sequentially connected in series after metal-oxide-semiconductor and resistance R6 and is grounded, resistance R3 one end is connected between metal-oxide-semiconductor and resistance R6, the resistance R3 other end connects the in-phase input end of differential comparator, resistance R7 one end ground connection, the resistance R7 other end connects the inverting input of differential comparator, the output end of differential comparator passes through affiliated resistance R4 connections MCU controllers, wherein the output end of differential comparator also passes through the inverting input of resistance R8 connection differential comparators, the grid G of metal-oxide-semiconductor passes through resistance R2 connection MCU controllers.The planar semiconductor sensor current detection circuit there is design science, it is practical, simple in construction, easy to use.
Description
Technical field
The utility model is related to a kind of current detection circuit, specifically, relate to a kind of planar semiconductor sensor electricity
Current detection circuit.
Background technology
Planar semiconductor sensor is a kind of gas sensor, because its small volume, sensitivity are high, drive circuit simply with
And stability is high and the features such as long service life, it is widely used in family, factory, is commercially filled with the combustible gas leakage monitoring of institute
Put, and safe detection system.The control circuit of current sensor occurs the situation of heater strip short circuit, open circuit in sensor, it is impossible to
The failure of enough timely, reliable detection sensors, especially heater strip occurs after short trouble, can drag down whole planar semiconductor
The level of sensor circuit, is impacted to whole planar semiconductor sensor circuit.
In order to solve the problem of above is present, people are seeking a kind of preferable technical solution always.
The content of the invention
The purpose of this utility model is in view of the shortcomings of the prior art, so as to provide a kind of design science, practical, knot
Simple, the easy to use planar semiconductor sensor current detection circuit of structure.
To achieve these goals, the technical scheme that the utility model is used is:A kind of planar semiconductor sensor electricity
Current detection circuit, including power supply, MCU controllers, planar semiconductor sensor, metal-oxide-semiconductor, resistance R3, resistance R4, resistance R6, electricity
Hinder R7, resistance R8 and differential comparator;One end connection power supply of the heating wire of the planar semiconductor sensor, the plane half
The other end of the heating wire of conductor sensor is sequentially connected in series after the metal-oxide-semiconductor and the resistance R6 and is grounded, and the one of the resistance R3
End is connected between the metal-oxide-semiconductor and the resistance R6, and the other end of the resistance R3 connects the same phase of the differential comparator
Input, one end ground connection of the resistance R7, the other end of the resistance R7 connects the inverting input of the differential comparator,
The output end of the differential comparator is by the affiliated resistance R4 connections MCU controllers, wherein the differential comparator is defeated
Go out end also by the inverting input of the resistance R8 connections differential comparator;The MCU controllers connect power supply, described
By the grid G of the resistance R2 connections metal-oxide-semiconductor, the logical of the metal-oxide-semiconductor also is controlled according to testing result for MCU controllers
It is disconnected.
Based on above-mentioned, in addition to display screen, the MCU controllers connect the display screen, output display current detecting knot
Really.
The utility model compared with the prior art there is substantive distinguishing features and progress, specifically, the utility model to pass through difference
Comparator is divided to detect the heater strip electric current of planar semiconductor sensor, and the level that will detect output is transferred to MCU controllers,
The break-make for the Automatic level control metal-oxide-semiconductor that MCU controllers are exported according to differential comparator, is protected, it has design department to circuit
, advantage practical, simple in construction, easy to use.
Brief description of the drawings
Fig. 1 is structural representation of the present utility model.
Embodiment
Below by embodiment, the technical solution of the utility model is described in further detail.
As shown in figure 1, a kind of planar semiconductor sensor current detection circuit, including power supply, MCU controllers, plane half
Conductor sensor, metal-oxide-semiconductor, resistance R3, resistance R4, resistance R6, resistance R7, resistance R8 and differential comparator;The plane is partly led
One end connection power supply of the heating wire of body sensor, the other end of the heating wire of the planar semiconductor sensor is sequentially connected in series institute
State and be grounded after metal-oxide-semiconductor and the resistance R6, one end of the resistance R3 is connected between the metal-oxide-semiconductor and the resistance R6, institute
The other end for stating resistance R3 connects the in-phase input end of the differential comparator, one end ground connection of the resistance R7, the resistance
The R7 other end connects the inverting input of the differential comparator, and the output end of the differential comparator passes through affiliated resistance R4
The MCU controllers are connected, wherein the output end of the differential comparator also passes through the resistance R8 connections differential comparison
The inverting input of device;The MCU controllers connect power supply, and the MCU controllers also pass through the resistance R2 connections MOS
The grid G of pipe, the break-make of the metal-oxide-semiconductor is controlled according to testing result.
Specifically, power supply is powered for the heater strip of the planar semiconductor sensor, and the MCU controllers are to the MOS
Pipe input high level, the metal-oxide-semiconductor conducting, sample rate current inputs the homophase input of the differential comparator by the resistance R3
End, after comparing amplification through the differential comparator, the MCU controllers are inputed to by the level of output.When the plane is partly led
When open circuit fault occurs for the heater strip of body sensor, the in-phase input end no current input of the differential comparator, the difference
Comparator is output as 0V, and the MCU controllers are not controlled to the metal-oxide-semiconductor.When adding for the planar semiconductor sensor
When short trouble occurs for heated filament, the input current of the in-phase input end of the differential comparator becomes big, and the differential comparator is defeated
Go out high level, the high level is more than the differential comparator under the heater strip normal operation of the planar semiconductor sensor
The level of output, the MCU controllers are received after the high level, to the metal-oxide-semiconductor input low level, and the metal-oxide-semiconductor ends,
The operating voltage of whole planar semiconductor sensor circuit is dragged down after avoiding the heating wire short circuit, while protecting the differential ratio
Avoid damaging compared with device.
Preferably, in addition to display screen, the MCU controllers connect the display screen, output display current detecting result.
When open circuit fault occurs for the heater strip of the planar semiconductor sensor, the in-phase input end no current of the differential comparator
Input, the differential comparator is output as 0V, and testing result is sent to the display screen by the MCU controllers, and display is described
There is open circuit fault in the heater strip of planar semiconductor sensor.When short circuit event occurs for the heater strip of the planar semiconductor sensor
During barrier, the input current of the in-phase input end of the differential comparator becomes big, and the differential comparator exports high level, height electricity
The level of the differential comparator output, described under the flat heater strip normal operation more than the planar semiconductor sensor
Testing result is sent to the display screen by MCU controllers, shows that short circuit occurs in the heater strip of the planar semiconductor sensor
Failure.
Finally it should be noted that:Above example is only to illustrate the technical solution of the utility model rather than it is limited
System;Although the utility model is described in detail with reference to preferred embodiment, those of ordinary skill in the art should
Understand:Still embodiment of the present utility model can be modified or some technical characteristics are equally replaced
Change;Without departing from the spirit of technical solutions of the utility model, it all should cover in the claimed technical scheme of the utility model
Among scope.
Claims (2)
1. a kind of planar semiconductor sensor current detects circuit, it is characterised in that:Partly led including power supply, MCU controllers, plane
Body sensor, metal-oxide-semiconductor, resistance R3, resistance R4, resistance R6, resistance R7, resistance R8 and differential comparator;
One end connection power supply of the heating wire of the planar semiconductor sensor, the heating wire of the planar semiconductor sensor
The other end is sequentially connected in series after the metal-oxide-semiconductor and the resistance R6 and is grounded, and one end of the resistance R3 is connected to the metal-oxide-semiconductor and institute
State between resistance R6, the other end of the resistance R3 connects the in-phase input end of the differential comparator, the one of the resistance R7
End ground connection, the other end of the resistance R7 connects the inverting input of the differential comparator, the output of the differential comparator
End is by the affiliated resistance R4 connections MCU controllers, wherein the output end of the differential comparator also passes through the resistance R8
Connect the inverting input of the differential comparator;
The MCU controllers connect power supply, the MCU controllers also by the grid G of the resistance R2 connections metal-oxide-semiconductor,
The break-make of the metal-oxide-semiconductor is controlled according to testing result.
2. planar semiconductor sensor current according to claim 1 detects circuit, it is characterised in that:Also include display
Screen, the MCU controllers connect the display screen, output display current detecting result.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201621485188.4U CN206431456U (en) | 2016-12-31 | 2016-12-31 | Planar semiconductor sensor current detects circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201621485188.4U CN206431456U (en) | 2016-12-31 | 2016-12-31 | Planar semiconductor sensor current detects circuit |
Publications (1)
Publication Number | Publication Date |
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CN206431456U true CN206431456U (en) | 2017-08-22 |
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CN201621485188.4U Active CN206431456U (en) | 2016-12-31 | 2016-12-31 | Planar semiconductor sensor current detects circuit |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113945778A (en) * | 2020-07-17 | 2022-01-18 | 中国石油化工股份有限公司 | Multi-section heating state monitoring device for electric roasting furnace |
-
2016
- 2016-12-31 CN CN201621485188.4U patent/CN206431456U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113945778A (en) * | 2020-07-17 | 2022-01-18 | 中国石油化工股份有限公司 | Multi-section heating state monitoring device for electric roasting furnace |
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