CN206431358U - A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed - Google Patents
A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed Download PDFInfo
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- CN206431358U CN206431358U CN201720044989.5U CN201720044989U CN206431358U CN 206431358 U CN206431358 U CN 206431358U CN 201720044989 U CN201720044989 U CN 201720044989U CN 206431358 U CN206431358 U CN 206431358U
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Abstract
A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed.It is made up of ball-type base, Automatic-clamping platform, spring clip, working plate and air level., can be freely to adjust the plane inclination to be observed of sample in certain limit using the present apparatus when the face to be observed of sample has certain gradient, it is impossible to be directly placed at when being observed under microscope.Present apparatus size is small, is directly placed on microscope carrier, then by specimen clamping in the present apparatus, after being finely tuned through working plate, you can directly observe sample with microscope.Smaller for size, the larger irregular sample of rigidity, secondary operation wastes time and energy, and cost is higher, and the present apparatus provides a kind of excellent solution in the case where not carrying out secondary operation to sample and not polluting sample.
Description
Technical field
The utility model is related to a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed.
Background technology
It is conventional observation procedure with observation by light microscope test button.However, microscopic test button is used,
Ask sample gradient to be observed to keep certain horizontality, if injustice is put in the face to be observed of sample, both influence observation
Effect, and easily collide micro- lens head.By secondary operation improve sample make quality, make its satisfaction directly observe will
Ask, sample manufacture difficulty and cost of manufacture can be increased；Wait to see to adjust sample below sample with the soft substance pad such as plasticine
Although the gradient in survey face is easier to implement, but it is cumbersome to operate, and Adjustment precision is relatively low and easily pollutes sample.
A kind of mechanical device is proposed in this context to adjust the gradient in sample face to be observed, it is directly seen with microscope
Survey.
The content of the invention
The utility model provides a kind of small mechanical devices, and the device directly can be adjusted quickly on microscope carrier
The gradient in sample face to be observed, makes its face to be observed reach certain horizontality, meets microscopic requirement.
The utility model adopts the technical scheme that to solve above-mentioned technical problem：Described device by a ball-type base,
One Automatic-clamping platform, a spring clip, a working plate and an air level are constituted.Ball-type base and Automatic-clamping platform
Material uses ABS resin, and spring clip material uses wooden, and working plate material uses aluminium alloy, and air level is with being related to screw and bullet
Spring is standard component.Ball-type base is positioned with Automatic-clamping platform by ball-shaped surface.Automatic-clamping platform is divided into two portions in left and right
Point, ball-type inner chamber is internally formed after fastening, can be enclosed on ball-type base, makes this two parts to centre by four extension springs
Draw close, so that Automatic-clamping platform can clamp ball-type base.Spring clip is arranged on the cylindrical type of Automatic-clamping platform upper end
In projection.Working plate and air level mode connects for screw.In use, by Automatic-clamping stage+module on ball-type base, then by bullet
Spring folder is arranged on Automatic-clamping platform upper end；Then the device connected is placed on microscopical objective table, sample is treated
Observation is placed on Automatic-clamping platform upper end up, and clamped with spring clip；Finally with air level working plate come by
Sample face to be observed is pressed, by observing air level, adjustment working plate pressing angle, until it is certain to reach sample face to be observed
Horizontality.Sample after being adjusted can use microscope directly to observe.
The utility model has the advantages that：The present apparatus can be placed on microscope carrier quick adjustment sample
The gradient in face to be observed, can be directly observed with microscope.The present apparatus is simple in construction, easy to operate, can be effective
Reduce sample and make requirement, reduce sample cost of manufacture, and do not pollute sample.
Brief description of the drawings
Fig. 1 is installation diagram of the present utility model；Fig. 2 is ball-type base part figure；Fig. 3 is Automatic-clamping platform installation diagram；
Fig. 4 is spring clip installation diagram；Fig. 5 is working plate part drawing.
Embodiment
Embodiment：Illustrate the utility model embodiment with reference to Fig. 1, Fig. 2, Fig. 3, Fig. 4 and Fig. 5.First by ball
Type base（1）, Automatic-clamping platform（2）, spring clip（3）Connect.Specific connected mode is first by ball-type base（2）It is placed on
In plane, then by Automatic-clamping platform（2）Two parts be fastened on ball-type base（1）On, it is connected with four extension springs
Automatic-clamping platform（2）, then by spring clip（3）Two panels clip be arranged on Automatic-clamping platform（2）The cylindrical protrusions of upper end
On, and install spring clip（3）Compression spring；Then by working plate（5）With air level（6）With mode connects for screw；Finally
By the ball-type base connected（1）, Automatic-clamping platform（2）It is placed on spring clip on microscopical objective table, by sample（4）
Use spring clip（3）Clamp, then with the working plate connected（5）With air level（6）Press sample（4）, to sample face to be observed
Gradient is finely adjusted.After being adjusted, sample is that available microscope is directly observed.
Claims (8)
1. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed, it is put down by ball-type base, Automatic-clamping
Platform, spring clip, working plate and air level are constituted, it is characterised in that：Ball-type base, Automatic-clamping platform and spring clip are assemblied in one
Rise, Automatic-clamping platform can within the specific limits be rotated around ball-type base, spring clip is used for clamping sample, working plate and air level
It is assembled together, the gradient for adjusting sample face to be observed.
2. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Ball-type base and Automatic-clamping platform material are ABS resin, and spring clip material is wooden, and working plate material is closed for aluminium
Gold, air level and used screw, extension spring and compression spring are standard component.
3. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Ball-type base carries ball shape structure, and Automatic-clamping platform clamping is on the ball shape structure of base, and Automatic-clamping platform can
Freely to be rotated for 360 ° around z-axis direction around ball-type base, around x, y-axis small range is rotated, Automatic-clamping platform upper end cylindrical projection
For installing spring clip.
4. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Automatic-clamping platform clamping by the way of horizontal clamping on ball-type base, reduces the whole height of device.
5. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：The spring clip of Automatic-clamping platform upper end connection, for clamping sample, spring clip is pacified by the way of laterally disposed
Dress, microscopic sample is not influenceed.
6. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Working plate is connected with air level, using single-hand held formula, is integrally separated from each other with the device of placement sample, uses work
The external part of plate presses the mode in sample face to be observed to adjust the gradient in sample face to be observed.
7. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Device overall dimensions are smaller, are placed on microscopical objective table without influenceing microscope normal work.
8. a kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed according to claim 1, it is special
Levy and be：Device action effect installs a clamp body equivalent to by sample, sample position is carried out micro adjustment, makes whole
It is individual to be observed dimension of object increase.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720044989.5U CN206431358U (en) | 2017-01-16 | 2017-01-16 | A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720044989.5U CN206431358U (en) | 2017-01-16 | 2017-01-16 | A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206431358U true CN206431358U (en) | 2017-08-22 |
Family
ID=59582334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720044989.5U Expired - Fee Related CN206431358U (en) | 2017-01-16 | 2017-01-16 | A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206431358U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107202757A (en) * | 2017-01-16 | 2017-09-26 | 哈尔滨理工大学 | A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed |
-
2017
- 2017-01-16 CN CN201720044989.5U patent/CN206431358U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107202757A (en) * | 2017-01-16 | 2017-09-26 | 哈尔滨理工大学 | A kind of small-sized microscope servicing unit for adjusting sample plane inclination to be observed |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170822 Termination date: 20180116 |