CN206405068U - A kind of intelligent test system - Google Patents

A kind of intelligent test system Download PDF

Info

Publication number
CN206405068U
CN206405068U CN201621489621.1U CN201621489621U CN206405068U CN 206405068 U CN206405068 U CN 206405068U CN 201621489621 U CN201621489621 U CN 201621489621U CN 206405068 U CN206405068 U CN 206405068U
Authority
CN
China
Prior art keywords
defective products
tester
circuit board
test
test system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201621489621.1U
Other languages
Chinese (zh)
Inventor
熊天剑
孙双立
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Simcom Ltd
Original Assignee
Shanghai Simcom Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Simcom Ltd filed Critical Shanghai Simcom Ltd
Priority to CN201621489621.1U priority Critical patent/CN206405068U/en
Application granted granted Critical
Publication of CN206405068U publication Critical patent/CN206405068U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

The utility model is related to testing field, disclose a kind of intelligent test system, it is that unit is measured to each module of circuit board using test group, to set there is more preferable adaptability for streamline compared in units of tester, so as to distribute more testers to needing testing time longer module, with the contradiction that this has reconciled between limited equipment cost and Geng Gao testing efficiencies, time cost is make use of to a greater degree, the testing efficiency of test system is improved.And, by being set and each one-to-one M layers of defective products settlement of module to be measured on defective products collection device, defective products is taken out from tester by mechanical arm, in the corresponding defective products settlement of test group where being placed on current tester, so as to which the defective products in circuit board testing is not carried out into classification recovery by test module according to corresponding, the follow-up maintenance to defective products is facilitated, the cost that secondary classification is brought is eliminated.

Description

A kind of intelligent test system
Technical field
The utility model is related to testing field, more particularly to a kind of intelligent test system.
Background technology
With the development of science and technology, electronic equipment universalness to personal use person.Because circuit board is weight in electronic equipment The electronic component wanted, and the pattern of circuit board is diversified, there is different circuits on every kind of circuit board.Therefore, set in electronics During the standby manufacturing, it is necessary to carry out strict test to the circuit board produced, can just be applied to electronics and set In standby, to ensure that the function of electronic equipment is normal.Also, circuit board testing is general to be carried out before assembling electronic equipment, to keep away Exempt from electronic equipment after assembling is completed, ability discovery circuit plate existing defects, caused dismounting electronic equipment is wrong caused to remove Man-hour waste.
In the prior art, factory needs to carry out independent module testing to the circuit board of electronic equipment.Due to needs pair Answer each module on circuit board to use independent test program, therefore, in existing test system, be commonly provided with and electricity The module number identical tester to be tested of road plate, and constitute streamline.Circuit board is passed sequentially through on this streamline Every tester test, you can complete to test the standalone module of circuit board.
However, in the prior art, what the underproof circuit board in circuit board testing can be unified is placed on collection dress In putting, to carry out recovery maintenance.However, in same collection device, the underproof module corresponding to each circuit board has very much can It can differ, for example, the circuit board having is that bluetooth module test does not pass through, and some circuit boards are WIFI module tests Do not pass through.It is in this way of recycling, each circuit board is mixed in together, cause subsequently to also need to the circuit board at recovery Reclassify, therefore be not easy to the maintenance in subsequent step to unqualified circuit board.
Utility model content
The purpose of this utility model is to provide a kind of intelligent test system, can prevent circuit board from being sent out in test process It is raw to overstock, improve testing efficiency.Further, it is possible to which according to corresponding the defective products in circuit board testing is not passed through into test module Classification recovery is carried out, the maintenance to unqualified circuit board in subsequent step is facilitated, improves overhaul efficiency.
In order to solve the above technical problems, embodiment of the present utility model provides a kind of intelligent test system, for surveying Circuit board is tried, circuit board includes M modules to be measured, and intelligent test system includes:Mechanical arm, defective products collection device and N number of Tester;Wherein, N and M are natural number, also, N is more than 1, M less than or equal to N;
N number of tester is divided into M group test groups, and M groups test group is corresponded with M modules to be measured on circuit board;Survey Trying instrument is used to test module to be measured corresponding with test group where this tester;
Defective products collection device includes M defective products settlement, and M defective products settlement is corresponded with M groups test group;
Mechanical arm is used to capture circuit board, and consigns to the tester test of different test groups successively;When certain of circuit board When one module to be measured is not by testing, mechanical arm circuit board is transferred to current tester where the corresponding defective products of test group Settlement.
In terms of existing technologies, embodiment of the present utility model is each mould of the unit to circuit board using test group Block is measured, and has more preferable adaptability for streamline compared in units of tester to set, so as to distribute more Many testers, which are given, needs testing time longer module, has been reconciled with this between limited equipment cost and Geng Gao testing efficiencies Contradiction, time cost is make use of to a greater degree, the testing efficiency of test system is improved.Also, by being received in defective products Set on acquisition means with each one-to-one M floor defective products placing layer area of module to be measured, by mechanical arm by defective products from test Taken out in instrument, in the corresponding defective products settlement of test group where being placed on current tester, so as to which circuit board is surveyed Defective products in examination does not carry out classification recovery according to corresponding by test module, facilitates in subsequent step to defective products Maintenance, eliminates the cost that secondary classification is brought.
Preferably, defective products collection device also includes elevating mechanism, elevating mechanism is used to drive each defective products placing layer Moved along short transverse;Elevating mechanism is communicated to connect with each tester, when a certain module to be measured of circuit board is not by testing, The place that elevating mechanism is used to defective products placing layer corresponding with the test group where current tester being moved to mechanical arm is high Spend identical height and position.Using the drive of elevating mechanism, realize defective products collection device voluntarily in the height direction It is mobile, defective products can be accurately placed on to the correspondence position in defective products collection device in order to mechanical arm.Also, pass through The communication connection of elevating mechanism and tester, elevating mechanism results in accurate moving displacement information, so as to carry The degree of accuracy of high elevating mechanism control defective products collection device movement.
Wherein, preferably, elevating mechanism includes the connection component being connected with each defective products placing layer, with connection component The ball screw of drive connection and the motor for driving ball screw to move;Motor is communicated to connect with tester.Wherein, motor Stepper motor with low cost can be selected, coordinates screw mandrel to accurately control the displacement of elevating mechanism in the height direction, So as to realize stable step motion.
Wherein, preferably, connection component includes linking arm and chassis, each defective products placing layer is mutually interconnected by linking arm Connect and chassis is connected to by linking arm, so as to realize the synchronizing moving of each defective products placing layer.
Preferably, mechanical arm is four shaft mechanical arms.Relative to six shaft mechanical arms, its equipment cost is relatively low.
Preferably, mechanical arm is provided with least two grasping mechanisms, and each grasping mechanism is only capable of capturing one piece of circuit Plate.Utilize set multiple grasping mechanisms so that mechanical arm can capture multiple circuit boards so that the test of circuit board is obtained Improve.Also, only set the mechanical arm of two grasping mechanisms to have more preferable reliability, cost is also lower.
Brief description of the drawings
Fig. 1 is a kind of dimensional structure diagram of intelligent test system in the utility model first embodiment;
Fig. 2 is a kind of top view of intelligent test system in the utility model first embodiment;
Fig. 3 is a kind of defective products collection device of intelligent test system in the utility model first embodiment Dimensional structure diagram;
Fig. 4 is a kind of defective products collection device of intelligent test system in the utility model second embodiment Dimensional structure diagram.
1st, mechanical arm;Grasping mechanism 11;
2nd, defective products collection device;Defective products placing layer 21;Elevating mechanism 22;Connection component 221;Ball screw 222;Electricity Machine 223;
3rd, tester.
Embodiment
It is new to this practicality below in conjunction with accompanying drawing to make the purpose of this utility model, technical scheme and advantage clearer Each embodiment of type is explained in detail.However, it will be understood by those skilled in the art that each in the utility model In embodiment, in order that reader more fully understands the application and proposes many ins and outs.But, even if without these skills Art details and many variations based on following embodiment and modification, can also realize the required guarantor of each claim of the application The technical scheme of shield.
First embodiment of the present utility model provides a kind of intelligent test system, referring to shown in Fig. 1 to Fig. 2, is used for Test circuit plate, circuit board includes M modules to be measured.Intelligent test system in present embodiment includes being used to capture circuit board Mechanical arm 1, for collecting defective products collection device 2 not by the circuit board of test, and N number of tester 3.Wherein, N and M is natural number, and N is more than 1, M and is less than or equal to N.
Wherein, all testers 3 are divided into M group test groups, each module one to be measured of each test group respectively with circuit board One correspondence, tester 3 is used for module to be measured corresponding with test group where this tester.
Specifically, in present embodiment, intelligent test system also includes workbench, and N number of tester 3 is looped around mechanical arm 1 surrounding, mechanical arm 1 is located at the center of workbench.Also, tester 3 include test storehouse and can from test storehouse in ejection and The test panel of retraction, mechanical arm 1 is used to circuit board to be tested being put in test panel, and test panel is retracted after circuit board is obtained Storehouse is tested, starts test.Using the expanding-contracting action of test panel, directly perceived the test process of current test system can must be judged, It is easy to operating personnel's early warning analysis.In this way, it is that unit is measured to each module of circuit board using test group, phase Than being set in units of tester 3 there is more preferable adaptability for streamline, so as to distribute more testers 3 to The module that the testing time is longer is needed, with the contradiction that this has reconciled between limited equipment cost and Geng Gao testing efficiencies, more greatly Time cost is make use of to degree, the testing efficiency of test system is improved.
And defective products collection device 2 includes M defective products settlement, a pair of M defective products settlement and M groups test group 1 Should.In present embodiment, M defective products settlement is along the spaced M defective products placing layer 21 of short transverse, and respectively not Non-defective unit placing layer 21 is corresponded with each module to be measured.In this way, equivalent to by bad collection device according to mould to be measured Block is classified, so that each defective products can carry out classification recovery according to module to be measured.Certainly, in practical operation, M Defective products settlement horizontally spaced can also be set, in present embodiment, not to the setting of M defective products settlement Mode does any limitation.
In the present embodiment, defective products collection device 2 includes elevating mechanism 22, and elevating mechanism 22 is each bad for driving Product placing layer 21 is moved along short transverse, as shown in Figure 3.Elevating mechanism 22 includes the company being connected with each defective products placing layer 21 Connected components 221, the ball screw 222 being connected with connection component 221 and the motor for driving ball screw 222 to move 223;Motor 223 is communicated to connect with tester 3.Also, elevating mechanism 22 is communicated to connect with tester 3, a certain of circuit board is treated When surveying module not by testing, elevating mechanism 22 is used for defective products placing layer corresponding with the test group where current tester 21 are moved to the place height identical height and position of mechanical arm 1.
Wherein, connection component 221 includes linking arm and chassis, and each defective products placing layer 21 is connected with each other simultaneously by linking arm Chassis is connected to by linking arm, so as to realize elevating mechanism and defective products collection device synchronizing moving.Wherein, motor 223 can To select stepper motor with low cost, screw mandrel is coordinated to accurately control the displacement of elevating mechanism 22 in the height direction, So as to realize stable step motion.
Specifically, using the drive of elevating mechanism 22, defective products collection device 2 is realized voluntarily in the height direction Movement, defective products can be accurately placed on to the correspondence position in defective products collection device 2 in order to mechanical arm 1.Also, By the communication connection of elevating mechanism 22 and tester 3, elevating mechanism 22 results in accurate moving displacement information, from And the degree of accuracy of the movement of the control defective products of elevating mechanism 22 collection device 2 can be improved.
In present embodiment, mechanical arm 1 is four shaft mechanical arms, and relative to six shaft mechanical arms, its equipment cost is relatively low.Machinery Arm 1 is used to capture circuit board, and consigns to successively and belong to the testers 3 of different test groups and test;The a certain mould to be measured of circuit board When block is not by testing, mechanical arm 1 be additionally operable to by the circuit board be transferred to should module to be measured defective products placing layer 21.
It is noted that in present embodiment, mechanical arm 1 is provided with least two grasping mechanisms 11, and each crawl Mechanism 11 is only capable of capturing one piece of circuit board.Utilize set multiple grasping mechanisms 11 so that mechanical arm 1 can capture multiple electricity Road plate so that the test of circuit board is improved.Also, only set the mechanical arm 1 of two grasping mechanisms 11 to have more preferably Reliability, cost is also lower.
Second embodiment of the present utility model provides a kind of intelligent test system, the second embodiment party of the present utility model Formula is roughly the same with first embodiment, is in place of the main distinction:In first embodiment of the present utility model, defective products Collection device 2 includes elevating mechanism 22, and mechanical arm 1 is four shaft mechanical arms, by both cooperations, with realize by defective products according to Corresponding does not carry out classification recovery by test module.And in second embodiment of the present utility model, mechanical arm 1 is six Shaft mechanical arm so that defective products collection device 2 can still be realized in the case where not including elevating mechanism 22 and press defective products Classification recovery is not carried out by test module according to corresponding.
Specifically, the defective products collection device 2 (as shown in Figure 4) in present embodiment, is included in short transverse interval The N layer defective products placing layer 21 of setting, and each defective products placing layer 21 and each module one-to-one corresponding to be measured.Manipulator and tester 3 communication connection, when a certain module to be measured of circuit board is not by testing, mechanical arm 1 be moved to corresponding to the module to be measured The place height identical height and position of defective products placing layer 21, it is achieved thereby that according to corresponding defective products is not passed through into test Module carries out classification recovery.
It will be understood by those skilled in the art that the respective embodiments described above are to realize specific implementation of the present utility model Example, and in actual applications, can to it, various changes can be made in the form and details, without departing from spirit of the present utility model And scope.

Claims (8)

1. a kind of intelligent test system, for test circuit plate, the circuit board includes M modules to be measured, it is characterised in that bag Include:Mechanical arm, defective products collection device and N number of tester;Wherein, the N and the M are natural number, also, the N More than 1, the M is less than or equal to the N;
N number of tester is divided into M group test groups, the M groups test group with M modules to be measured on the circuit board one by one Correspondence;The tester is used to test module to be measured corresponding with test group where this tester;
The defective products collection device includes M defective products settlement, the M defective products settlement and the M groups test group Correspond;
The mechanical arm is used to capture the circuit board, and consigns to the tester test of different test groups successively;When the electricity When a certain module to be measured of road plate is not by testing, the circuit board is transferred to the survey where current tester by the mechanical arm The corresponding defective products settlement of examination group.
2. intelligent test system according to claim 1, it is characterised in that the M defective products settlement is along height The spaced M defective products placing layer in direction.
3. intelligent test system according to claim 2, it is characterised in that the defective products collection device also includes lifting Mechanism, the elevating mechanism is used to drive each defective products placing layer to move along short transverse;
The elevating mechanism is communicated to connect with each tester;When a certain module to be measured of the circuit board is not by testing, institute State elevating mechanism defective products placing layer corresponding with the test group where current tester is moved to it is contour with the mechanical arm.
4. intelligent test system according to claim 3, it is characterised in that the elevating mechanism includes:With each defective products Connection component that placing layer is connected, the ball screw being connected with the connection component and for driving the ball wire The motor of bar motion;
The motor is communicated to connect with the tester.
5. intelligent test system according to claim 4, it is characterised in that the connection component includes linking arm and bottom Disk;
Each defective products placing layer is connected with each other by the linking arm, and is connected to the chassis by the linking arm.
6. intelligent test system according to claim 1, it is characterised in that the mechanical arm is four shaft mechanical arms.
7. intelligent test system according to claim 1, it is characterised in that the mechanical arm is six shaft mechanical arms.
8. intelligent test system according to claim 1, it is characterised in that the mechanical arm is provided with least two crawls Mechanism, and each grasping mechanism is only capable of one piece of circuit board of crawl.
CN201621489621.1U 2016-12-30 2016-12-30 A kind of intelligent test system Expired - Fee Related CN206405068U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201621489621.1U CN206405068U (en) 2016-12-30 2016-12-30 A kind of intelligent test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201621489621.1U CN206405068U (en) 2016-12-30 2016-12-30 A kind of intelligent test system

Publications (1)

Publication Number Publication Date
CN206405068U true CN206405068U (en) 2017-08-15

Family

ID=59553208

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201621489621.1U Expired - Fee Related CN206405068U (en) 2016-12-30 2016-12-30 A kind of intelligent test system

Country Status (1)

Country Link
CN (1) CN206405068U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108840098A (en) * 2018-07-11 2018-11-20 江苏富联通讯技术有限公司 A kind of single track automatically testing platform and its test method
CN109967382A (en) * 2019-03-19 2019-07-05 环鸿电子(昆山)有限公司 A kind of test device and test method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108840098A (en) * 2018-07-11 2018-11-20 江苏富联通讯技术有限公司 A kind of single track automatically testing platform and its test method
CN109967382A (en) * 2019-03-19 2019-07-05 环鸿电子(昆山)有限公司 A kind of test device and test method

Similar Documents

Publication Publication Date Title
CN106771976A (en) A kind of intelligent test method of intelligent test system and circuit board
CN107678960B (en) Intelligent ammeter software black box testing system and method
CN103713221A (en) Low-frequency transformer automatic comprehensive test machine based on GROOVY data collecting and analyzing system controlled by PLC
CN201449426U (en) Full-automatic tester for transformer
CN203178453U (en) Automatic test system for switch power supply module
CN104155563A (en) Test fixture of circuit board
CN207992377U (en) A kind of transformer automatization test system
CN106226684A (en) Assembling printed circuit board test fixture
CN103063677A (en) Multifunctional printed circuit board (PCB) test system
CN206405068U (en) A kind of intelligent test system
CN104142454A (en) PCB testing device
CN102692598A (en) Electric cabinet logic tester device of railway vehicle
CN203069520U (en) Multifunctional automatic PCB (Printed Circuit Board) test system
CN203929909U (en) Transformer voltage-withstand test mechanism
CN202974890U (en) Multifunctional PCB (Printed Circuit Board) testing device
CN109738788A (en) Flying probe tester test method, device, flying probe tester and storage medium
CN103512616A (en) Circuit board testing machine
CN107271886A (en) A kind of rapid-aligning method of flying probe tester
CN207231398U (en) One kind contraposition fitting vision detection system
CN107561474A (en) Measuring equipment detecting system
CN102662092A (en) Device and method for testing wafer
CN207424148U (en) A kind of power line carrier module multifunctional detecting device
CN203922037U (en) A kind of Novel PCB board test carrying platform
CN212749127U (en) Batch capacitor multi-parameter automatic testing device
CN102735965B (en) Full-automatic efficient product function testing device

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20170815