CN206235711U - A kind of arrangement for testing integrated circuit - Google Patents
A kind of arrangement for testing integrated circuit Download PDFInfo
- Publication number
- CN206235711U CN206235711U CN201621110705.XU CN201621110705U CN206235711U CN 206235711 U CN206235711 U CN 206235711U CN 201621110705 U CN201621110705 U CN 201621110705U CN 206235711 U CN206235711 U CN 206235711U
- Authority
- CN
- China
- Prior art keywords
- substrate
- integrated circuit
- storage tank
- arrangement
- testing integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model is related to a kind of arrangement for testing integrated circuit,Including substrate,Horizontal storage tank is offered on the upper surface of substrate,The right flank of horizontal storage tank is provided with button switch,Vertical output magazine is further opened with the upper surface of substrate,The trailing flank of substrate is provided with release cylinder,The piston rod for releasing cylinder passes through the side wall of substrate and can stretch in horizontal storage tank,Supporting plate is provided with rear side of substrate,The leading flank of supporting plate is provided with installing plate,The upper side of installing plate is provided with compression cylinder,The output shaft of compression cylinder is fixedly connected through installing plate and with connecting plate,Test machine is fixedly installed on the upper surface of connecting plate,The lower surface of connecting plate is provided with the multiple connection terminals being adapted with IC chip pin,Connection terminal is connected with test machine,Arrangement for testing integrated circuit also includes main frame,Keyboard and display,Arrangement for testing integrated circuit test speed of the present utility model is fast,Efficiency high.
Description
Technical field
The utility model is related to a kind of circuit test device, more particularly to a kind of arrangement for testing integrated circuit.
Background technology
Integrated circuit needs by certain test before dispatching from the factory, and existing circuit test device includes test substrate and test
Main frame, IC chip is connected by testing substrate with test main frame, so that the test to integrated circuit is realized, however it is existing
Arrangement for testing integrated circuit need that circuit chip is arranged on test substrate by hand in test, and can only once install
One IC chip, therefore its test speed is slower, so as to increased the testing cost of integrated circuit.
In view of above-mentioned defect, the design people is actively subject to research and innovation, to found a kind of the integrated of new structure
Circuit test device.
The content of the invention
In order to solve the above technical problems, the purpose of this utility model to be to provide a kind of test speed fast, efficiency high integrated
Circuit test device.
Arrangement for testing integrated circuit of the present utility model, including substrate, offer along substrate on the upper surface of the substrate
The horizontal storage tank that length direction extends, the right flank of the horizontal storage tank is provided with button switch, the upper table of the substrate
Be further opened with face with the horizontal vertically disposed vertical output magazine of storage tank, the vertical output magazine is from horizontal storage tank
Leading flank extends to the leading flank of substrate, and laterally the right flank of storage tank is flushed with the right flank of vertical output magazine, described
The trailing flank of substrate is provided with release cylinder, and the piston rod of the release cylinder passes through the side wall of substrate and can stretch to horizontal appearance
Put in groove, and it is corresponding with vertical output magazine to release the piston rod of cylinder, and supporting plate, the branch are provided with rear side of the substrate
The leading flank of fagging is provided with installing plate, and the trailing flank of the installing plate is fixedly installed on the leading flank of supporting plate, installing plate
Upper side be provided with compression cylinder, the output shaft of the compression cylinder is fixedly connected through installing plate and with connecting plate, described
Connecting plate is located at the surface of horizontal storage tank right-hand member, test machine is fixedly installed on the upper surface of connecting plate, under connecting plate
Surface is provided with the multiple connection terminals being adapted with IC chip pin, and the connection terminal is connected with test machine, institute
State arrangement for testing integrated circuit also include main frame, keyboard and display, main frame respectively with display, keyboard, button switch, test
Machine, compression cylinder, release cylinder electrical connection.
Further, arrangement for testing integrated circuit of the present utility model, the downside of the installing plate is provided with limited block.
Further, arrangement for testing integrated circuit of the present utility model, the main frame is that desktop computer is notebook computer.
Further, arrangement for testing integrated circuit of the present utility model, the end of the release cylinder piston rod is provided with and pushes away
Plate, the trailing flank of the horizontal storage tank is provided with the groove being adapted with the push pedal.
Further, arrangement for testing integrated circuit of the present utility model, the substrate is made of plastics.
By such scheme, the utility model at least has advantages below：The utility model arrangement for testing integrated circuit, leads to
Cross compression cylinder the connection terminal on connecting plate is compressed and be connected with the integrated circuit pin being arranged in horizontal storage tank, from
And the test machine enabled the host to by being arranged on connecting plate realizes the test to IC chip, while operating personnel
Multiple IC chips can be successively horizontally installed in horizontal storage tank simultaneously, when the integrated circuit positioned at low order end is completed
After test, releasing cylinder can release it from vertical output, so that next chip can be under certain pressure effect
Move right and squeeze buttons switch, to be tested next time, so as to substantially increase test speed and the survey of integrated circuit
Examination efficiency.When specifically used, be successively set on tested IC chip in horizontal storage tank by operating personnel, when positioned at most
When the IC chip of right-hand member contacts with button switch and it is pressed, test machine can receive button switch
Compression cylinder is opened after signal so that the piston rod of compression cylinder drives connecting plate to move downward, until the connection on connecting plate
Terminal is contacted with the pin of integrated circuit, IC chip is pressed in horizontal storage tank, is then connected with connection terminal
Test machine IC chip is tested by the test program that main frame sends, when actually used test machine be tool
It can be common desktop computer or notebook computer to have the single board computer of the units such as process chip, internal memory, main frame, and operating personnel are by master
Test program is sent into test machine by machine, so as to realize the test to IC chip by test machine, after the completion of test, is compressed
Air cylinder driven connects sheet reset, while the piston rod for releasing cylinder promotes IC chip to be exported from vertical output magazine, from
And realize to a wheel test.In sum, arrangement for testing integrated circuit test speed of the present utility model is fast, efficiency high.
Described above is only the general introduction of technical solutions of the utility model, in order to better understand skill of the present utility model
Art means, and being practiced according to the content of specification, with preferred embodiment of the present utility model and coordinate accompanying drawing detailed below
Describe in detail bright as after.
Brief description of the drawings
Fig. 1 is the structural representation of the utility model arrangement for testing integrated circuit；
Fig. 2 is the top view of substrate.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the present utility model is described in further detail.Below
Embodiment is used to illustrate the utility model, but is not limited to scope of the present utility model.
Referring to Fig. 1 to Fig. 2, a kind of arrangement for testing integrated circuit of the preferred embodiment of the utility model one, including substrate 1,
The horizontal storage tank 2 extended along zig direction is offered on the upper surface of substrate, the right flank of horizontal storage tank is provided with
Button switch 3, is further opened with vertical output magazine 4 vertically disposed with horizontal storage tank, vertical output magazine on the upper surface of substrate
Extend to the leading flank of substrate from the leading flank of horizontal storage tank, and the laterally right side of the right flank of storage tank and vertical output magazine
Side flushes, and the trailing flank of substrate is provided with release cylinder 5, and the piston rod for releasing cylinder passes through the side wall of substrate and can stretch to
In horizontal storage tank, and it is corresponding with vertical output magazine to release the piston rod of cylinder, and supporting plate 6 is provided with rear side of substrate, props up
The leading flank of fagging is provided with installing plate 7, and the trailing flank of installing plate is fixedly installed on the leading flank of supporting plate, installing plate it is upper
Side is provided with compression cylinder 8, and the output shaft of compression cylinder is fixedly connected through installing plate and with connecting plate 9, and connecting plate is located at
The surface of horizontal storage tank right-hand member, is fixedly installed test machine 10 on the upper surface of connecting plate, set on the lower surface of connecting plate
There are the multiple connection terminals 11 being adapted with IC chip pin, connection terminal is connected with test machine, integrated circuit testing
Device also include main frame 12, keyboard 13 and display 14, main frame respectively with display, keyboard, button switch, test machine, compression
Cylinder, release cylinder electrical connection.
The utility model arrangement for testing integrated circuit, by compression cylinder by the connection terminal on connecting plate be arranged on horizontal stroke
Compress and connect to the integrated circuit pin in storage tank, so that main frame can be by the test machine that is arranged on connecting plate
The test to IC chip is realized, while multiple IC chips can be successively horizontally installed on horizontal stroke by operating personnel simultaneously
To in storage tank, after the integrated circuit positioned at low order end completes test, releasing cylinder can release it from vertical output, from
And enable that next chip is moved right under certain pressure effect and squeeze buttons are switched, to be tested next time,
So as to substantially increase the test speed and testing efficiency of integrated circuit.When specifically used, the integrated electricity that operating personnel will be tested
Road chip is successively set in horizontal storage tank, when the IC chip positioned at low order end is contacted with button switch and it is entered
During row pressing, test machine can open compression cylinder after the signal for receiving button switch so that the piston rod of compression cylinder
Drive connecting plate move downward, until the connection terminal on connecting plate contacted with the pin of integrated circuit, IC chip quilt
It is pressed in horizontal storage tank, the test program that the test machine being then connected with connection terminal is sent by main frame is to integrated
Circuit chip is tested, and test machine is that the single board computer with units such as process chip, internal memories, main frame can be general when actually used
Test program is sent into test machine by logical desktop computer or notebook computer, operating personnel by main frame, so as to be realized by test machine
Test to IC chip, after the completion of test, compression cylinder drive connection sheet reset, while releasing the piston rod of cylinder
IC chip is promoted to be exported from vertical output magazine, so as to realize to a wheel test.In sum, collection of the present utility model
Into circuit test device test speed is fast, efficiency high.
Preferably, arrangement for testing integrated circuit of the present utility model, the downside of installing plate is provided with limited block 15.
Being provided in of limited block prevents the test machine on connecting plate from producing collision with installing plate and damaging.
Preferably, arrangement for testing integrated circuit of the present utility model, main frame is that desktop computer is notebook computer.
Preferably, arrangement for testing integrated circuit of the present utility model, the end for releasing cylinder piston rod is provided with push pedal 16,
The trailing flank of horizontal storage tank is provided with the groove being adapted with push pedal.
Preferably, arrangement for testing integrated circuit of the present utility model, substrate is made of plastics.
The above is only preferred embodiment of the present utility model, be not limited to the utility model, it is noted that for
For those skilled in the art, on the premise of the utility model know-why is not departed from, if can also make
Dry to improve and modification, these are improved and modification also should be regarded as protection domain of the present utility model.
Claims (5)
1. a kind of arrangement for testing integrated circuit, it is characterised in that：Including substrate, offered along substrate on the upper surface of the substrate
The horizontal storage tank that length direction extends, the right flank of the horizontal storage tank is provided with button switch, the upper table of the substrate
Be further opened with face with the horizontal vertically disposed vertical output magazine of storage tank, the vertical output magazine is from horizontal storage tank
Leading flank extends to the leading flank of substrate, and laterally the right flank of storage tank is flushed with the right flank of vertical output magazine, described
The trailing flank of substrate is provided with release cylinder, and the piston rod of the release cylinder passes through the side wall of substrate and can stretch to horizontal appearance
Put in groove, and it is corresponding with vertical output magazine to release the piston rod of cylinder, and supporting plate, the branch are provided with rear side of the substrate
The leading flank of fagging is provided with installing plate, and the trailing flank of the installing plate is fixedly installed on the leading flank of supporting plate, installing plate
Upper side be provided with compression cylinder, the output shaft of the compression cylinder is fixedly connected through installing plate and with connecting plate, described
Connecting plate is located at the surface of horizontal storage tank right-hand member, test machine is fixedly installed on the upper surface of connecting plate, under connecting plate
Surface is provided with the multiple connection terminals being adapted with IC chip pin, and the connection terminal is connected with test machine, institute
State arrangement for testing integrated circuit also include main frame, keyboard and display, main frame respectively with display, keyboard, button switch, test
Machine, compression cylinder, release cylinder electrical connection.
2. arrangement for testing integrated circuit according to claim 1, it is characterised in that：The downside of the installing plate is provided with
Limited block.
3. arrangement for testing integrated circuit according to claim 1, it is characterised in that：The main frame is that desktop computer is notebook
Computer.
4. arrangement for testing integrated circuit according to claim 1, it is characterised in that：The end for releasing cylinder piston rod
Push pedal is provided with, the trailing flank of the horizontal storage tank is provided with the groove being adapted with the push pedal.
5. arrangement for testing integrated circuit according to claim 1, it is characterised in that：The substrate is made of plastics.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621110705.XU CN206235711U (en) | 2016-10-10 | 2016-10-10 | A kind of arrangement for testing integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621110705.XU CN206235711U (en) | 2016-10-10 | 2016-10-10 | A kind of arrangement for testing integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206235711U true CN206235711U (en) | 2017-06-09 |
Family
ID=58982425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621110705.XU Expired - Fee Related CN206235711U (en) | 2016-10-10 | 2016-10-10 | A kind of arrangement for testing integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206235711U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107219454A (en) * | 2017-07-28 | 2017-09-29 | 江苏凯尔生物识别科技有限公司 | Fingerprint module test device |
| CN108646171A (en) * | 2018-05-18 | 2018-10-12 | 广东中南人力资源有限公司 | A kind of automation arrangement for testing integrated circuit |
-
2016
- 2016-10-10 CN CN201621110705.XU patent/CN206235711U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107219454A (en) * | 2017-07-28 | 2017-09-29 | 江苏凯尔生物识别科技有限公司 | Fingerprint module test device |
| CN108646171A (en) * | 2018-05-18 | 2018-10-12 | 广东中南人力资源有限公司 | A kind of automation arrangement for testing integrated circuit |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170609 Termination date: 20181010 |