CN206193213U - Aging testing device of optical module - Google Patents
Aging testing device of optical module Download PDFInfo
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- CN206193213U CN206193213U CN201621261670.XU CN201621261670U CN206193213U CN 206193213 U CN206193213 U CN 206193213U CN 201621261670 U CN201621261670 U CN 201621261670U CN 206193213 U CN206193213 U CN 206193213U
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Abstract
The utility model relates to an aging testing device of optical module, this aging testing device include a plurality of survey test panel, host computer and distributed generator, and distributed generator includes two at least power module, and power module includes: the control unit, the voltage transformation circuit, the monitoring and protection unit is used for carrying out the one -level protection to this power module to report the control unit with this power module's guard mode, output unit is used for the guard mode of export power supply module, it includes to survey test panel: MCU for running state to the optical module monitors, the electron fuse is used for carrying out the second grade protection to power module to report MCU with the guard mode, the interface unit is used for sending the running state of optical module and corresponding power module's guard mode to the host computer to at the enterprising line display of host computer. Implement a control unit.
Description
Technical field
The utility model is related to testing field, more particularly to a kind of ageing tester of optical module.
Background technology
In the burn-in test of optical module, generally using such ageing tester, i.e. in the ageing tester
In, the power supply of centrally connected power supply is used, so the requirement to the centrally connected power supply power supply is very high, for example, to have very perfect
Over-current over-voltage protection, can arbitrarily set the function of cut-off current size.But, because centrally connected power supply power supply only has so one-level to protect
Shield, if situations such as abnormality, such as suddenly-applied short circuit occur in optical module in aging so that centrally connected power supply power work exists
The mode of operation of current limliting, so as to cause voltage to be pulled low, in this way it is possible to cause the aging of this collection of optical module to be not just
Carried out under normal operating voltage, therefore do not meet the requirement of burn-in test.Again or, mistake of multiple optical modules in burn-in test
The situation of short circuit is occurred in that in journey so that under overcurrent protection pattern, power supply output is directly turned off centrally connected power supply power work,
The burn-in test of this collection of optical module will be had influence on.
Also a kind of more serious situation be cannot be oriented in this batch of optical module of burn-in test specifically which
Individual optical module is out of joint, in addition it is also necessary to takes much time and investigates problematic optical module, wastes time and energy, cause it is huge into
This expenditure.
Utility model content
The technical problems to be solved in the utility model is, for the drawbacks described above of prior art, there is provided a kind of optical module
Ageing tester, do not influence the test of entire block when power supply goes wrong, and, can orient and occur what is gone wrong
Optical module.
The utility model solves the technical scheme that its technical problem used：Construct a kind of burn-in test dress of optical module
Put, including multiple test boards, each test board is electrically connected with least one optical module, the ageing tester also includes upper
Machine and distributed power source, the distributed power source include at least two power modules, and, each power module and at least one
Test board is electrically connected, wherein,
The power module includes：
Control unit；
Voltage conversion circuit, the DC voltage for electric main to be converted into 3.3V；
Monitoring protection location, for carrying out first class of protection to this power module, and by the guard mode of this power module
Offer described control unit；
Output unit, under the control of described control unit, the guard mode of out-put supply module；
The test board includes：
MCU, is connected with least one optical module, and is supervised for the running status at least one optical module
Control；
With the one-to-one electrical fuse of optical module, the corresponding output end and corresponding optical mode of corresponding power module are connected to
Between block, for carrying out second class protection to corresponding power module, and the guard mode of corresponding power module is reported into MCU；
Interface unit, under the control of the MCU, by the running status of at least one optical module and corresponding electricity
The guard mode of source module is sent to the host computer, is shown with the host computer.
Preferably, the output unit includes sound light alarming circuit and/or display screen.
Preferably, the interface unit is USB interface.
Preferably, the MCU is connected with least one optical module by I2C.
Preferably, the monitoring protection location is connected by PMBUS with control unit.
Preferably, the first class of protection include input overvoltage protection, output over-voltage protection, overcurrent protection, overheat protector, owe
Pressure protection.
Preferably, the second class protection includes overvoltage protection, overcurrent protection, overheat protector.
Preferably, the voltage conversion circuit includes the rectification circuit and DC/DC translation circuits that are connected.
Implement the technical solution of the utility model, due to the distributed power source using low power density, and carry out two-stage electricity
Source protection, low cost and reliability is high.And, the synergy that can pass through the MCU in host computer and each test board can be accurate
Find out failure power module position and there is the position of abnormal optical module, save it is substantial amounts of search failure when
Between, while also not interfering with the aging of product by the gross, solve in the prior art because centralized power failure causes appearance whole
The optical module for criticizing burn-in test scraps the problem of situation, while the optical module after also solving due to burn-in test is also needed to subsequently
Test the problem big to filter out workload that abnormal optical module brought.
Brief description of the drawings
In order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art, below will be to embodiment
Or the accompanying drawing to be used needed for description of the prior art is briefly described, it should be apparent that, drawings in the following description are only
It is some embodiments of the present utility model, for those of ordinary skill in the art, is not paying the premise of creative work
Under, other accompanying drawings can also be obtained according to these accompanying drawings.In accompanying drawing：
Fig. 1 is the building-block of logic of the ageing tester embodiment one of the utility model optical module；
Fig. 2 is the building-block of logic of power module embodiment one in Fig. 1；
Fig. 3 is the building-block of logic of test board embodiment one in Fig. 1.
Specific embodiment
Fig. 1 is the building-block of logic of the ageing tester embodiment one of the utility model optical module, the embodiment it is old
Changing test device includes distributed power source 10, multiple test boards (such as test board 20), host computer 40, and, each test board
It is connected with host computer 40 and multiple optical modules (such as optical module 30), distributed power source 10 includes at least two power module (examples
Such as power module 11), each power module is connected with two test boards.
Power module with reference to shown in Fig. 2, the power module includes voltage conversion circuit, monitoring protection location 113, control
Unit 114 and output unit 115, wherein, voltage conversion circuit is converted into the DC voltage of 3.3V for electric main, and it can
The rectification circuit 111 and DC/DC translation circuits 112 being connected are specifically included, the electric main that rectification circuit 111 will can be input into turns
Change DC voltage into, DC/DC translation circuits 112 can power needs the optical module that the output voltage of rectification circuit is converted into stabilization
Voltage, i.e. the DC voltage of 3.3V.Monitoring protection location 113 is used to carry out this power module first class of protection, and by this electricity
The guard mode of source module reports described control unit, it is preferable that monitoring protection location 113 passes through PMBUS and control unit
114 are connected.Output unit 115 is used under the control of described control unit, the guard mode of out-put supply module, it is preferable that
The output unit includes sound light alarming circuit and/or display screen.
In the power module of the embodiment, monitoring protection location 113 can be supervised to the running status of this power module
Control, such as monitoring voltage, electric current, temperature, and input overvoltage protection, output over-voltage protection, excessively stream guarantor are carried out to this power module
The protection of shield, overheat protector, under-voltage protection etc..Wherein, input overvoltage protection ensure that power module is not damaged by itself, export
Overvoltage protection ensures that the power supply of rear class will not be damaged because of overvoltage.Overcurrent protection be rear class electric current because overload or
It is that the supply of level power supply after cutting off, it is ensured that power module work safety in itself is also prevented from late-class circuit and goes out when there is short circuit
Existing uncontrollable situation.Under-voltage protection purpose is ensuring that rear class electric current has the energy resource supply of abundance, prevents from being led because of input undervoltage
Cause the voltage status of output abnormal and have influence on the circuit normal work of rear class.Overheat protector is then that expire long to power module is born
Lotus runs a kind of safeguard measure of the itself during excess temperature that the heat produced own loss when chip operation produces, protection electricity
The safe operation in source.When there is any guard mode in power module, all can be by PMBUS real-time reports to control unit
114, and shown by display screen and audible alarm.
Test board with reference to shown in Fig. 3, the test board include MCU22, interface unit 23 and with optical module 30 ..., 30' mono-
One corresponding electrical fuse 21 ..., 21'.Wherein, MCU22 with 30 ..., 30' be connected, preferably connected by I2C, and be used for
To optical module 30 ..., the running status of 30' is monitored.Electrical fuse 21 ..., 21' be connected to the phase of corresponding power module
Answer between output end and corresponding optical module, and for carrying out second class protection to corresponding power module, and by corresponding power module
Guard mode reports MCU, and the second class protection for being carried out includes overvoltage protection, overcurrent protection, overheat protector.In addition, interface list
Unit 23 is used under the control of MCU22, by optical module 30 ..., the guard mode hair of the running status of 30' and corresponding power module
Host computer is delivered to, is shown with host computer.Preferably, interface unit 23 is USB interface, i.e. MCU22 passes through USB numbers
It is connected with host computer according to line.
In the test board of the embodiment, after the output of power module is given to test board, electrical fuse is first passed around,
By taking electrical fuse 21 as an example, overvoltage protection, overcurrent protection and overheat protector are realized by the electrical fuse 21.Electronic insurance
Whether the meeting automatic decision input voltage of silk 21 is over-pressed, if over-pressed, starts overvoltage protection, the output of module of cutting off the electricity supply, such as
Fruit then starts the power supply output of rear class, automatically into the monitor in real time of overcurrent protection without overvoltage.The mistake of electrical fuse 21
Stream defencive function is to realize overcurrent protection function by external current-limiting resistance, when the load excessive for detecting optical module,
Electrical fuse 21 will automatically cut off the output of rear level power supply.When the operating temperature of electrical fuse 21 is too high will start in
The overheat protector function in portion, it is ensured that electrical fuse 21 will not be damaged because of excess temperature.When electrical fuse 21 is detected
MCU22 is reported after these abnormalities, MCU22 will be shown by usb communication on the monitoring software of host computer, and
Alarm.MCU22 can accurately be known by the state reporting pin of the protection supervisory circuit inside electrical fuse 21
Electric power loop corresponding to which electrical fuse 21 is out of joint, so search problem particularly to facilitate, also saves
The time for searching failure is saved.The optical module that can be monitored in real time just in burn-in test while MCU22 can be communicated by I2C,
If optical module has an exception in aging, it is that the optical module of which position has abnormal appearance that MCU22 can accurately also find out, while
Shown in real time on the monitoring software of host computer, abnormal optical module is weeded out in time, both conveniently also saved big
The time of the lookup failure of amount.
Here, it should be noted that, above example illustrate only the logical construction of a power module and a test board
Figure, it should be appreciated that the building-block of logic of other power modules and other test boards is similar to therewith, will not be repeated here.
In addition, it should be noted that, the quantity of the power module in distributed power source can be set according to the actual requirements, example
Such as, two, three, five etc. are set, these power modules can be independent of one another, can also output it and be arranged in parallel.One electricity
The quantity of the test board that source module is powered is set also dependent on actual demand, and such as one power module connects two tests
Plate, can also connect a test board, or connect other quantity test boards.The quantity of optical module can be tested on one test board
Also can arbitrarily set.
In sum, the ageing tester of optical module of the present utility model is due to the distributed electrical using low power density
Source, and carry out two-stage power protection, low cost and reliability is high.And, can be by the MCU's in host computer and each test board
Synergy accurately finds out the position of the power module of failure and occurs the position of abnormal optical module, saving substantial amounts of
The time of failure is searched, while also not interfering with the aging of product by the gross, is solved in the prior art because of centralized power failure
The situation for causing the optical module of burn-in test by the gross to be scrapped, while the optical module also solved after burn-in test also needs to follow-up survey
Examination filters out the big problem of abnormal problem optical module workload.
Preferred embodiment of the present utility model is the foregoing is only, the utility model is not limited to, for this
For the technical staff in field, the utility model can have various modifications and variations.It is all it is of the present utility model spirit and principle
Within, made it is any distort, equivalent, improvement etc., should be included within right of the present utility model.
Claims (8)
1. a kind of ageing tester of optical module, including multiple test boards, each test board is electrically connected with least one optical module
Connect, it is characterised in that the ageing tester also includes host computer and distributed power source, the distributed power source is included at least
Two power modules, and, each power module is electrically connected with least one test board, wherein,
The power module includes：
Control unit；
Voltage conversion circuit, the DC voltage for electric main to be converted into 3.3V；
Monitoring protection location, for carrying out first class of protection to this power module, and the guard mode of this power module is reported
Described control unit；
Output unit, under the control of described control unit, the guard mode of out-put supply module；
The test board includes：
MCU, is connected with least one optical module, and is monitored for the running status at least one optical module；
With the one-to-one electrical fuse of optical module, be connected to corresponding power module corresponding output end and corresponding optical module it
Between, for carrying out second class protection to corresponding power module, and the guard mode of corresponding power module is reported into MCU；
Interface unit, under the control of the MCU, by the running status of at least one optical module and corresponding power supply mould
The guard mode of block is sent to the host computer, is shown with the host computer.
2. the ageing tester of optical module according to claim 1, it is characterised in that the output unit includes acousto-optic
Warning circuit and/or display screen.
3. the ageing tester of optical module according to claim 1, it is characterised in that the interface unit connects for USB
Mouthful.
4. the ageing tester of optical module according to claim 1, it is characterised in that the MCU and described at least
Individual optical module is connected by I2C.
5. the ageing tester of optical module according to claim 1, it is characterised in that the monitoring protection location passes through
PMBUS is connected with control unit.
6. the ageing tester of optical module according to claim 1, it is characterised in that the first class of protection includes input
Overvoltage protection, output over-voltage protection, overcurrent protection, overheat protector, under-voltage protection.
7. the ageing tester of optical module according to claim 1, it is characterised in that the second class protection includes overvoltage
Protection, overcurrent protection, overheat protector.
8. the ageing tester of optical module according to claim 1, it is characterised in that the voltage conversion circuit includes
The rectification circuit and DC/DC translation circuits being connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621261670.XU CN206193213U (en) | 2016-11-13 | 2016-11-13 | Aging testing device of optical module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621261670.XU CN206193213U (en) | 2016-11-13 | 2016-11-13 | Aging testing device of optical module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206193213U true CN206193213U (en) | 2017-05-24 |
Family
ID=58724353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621261670.XU Active CN206193213U (en) | 2016-11-13 | 2016-11-13 | Aging testing device of optical module |
Country Status (1)
| Country | Link |
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| CN (1) | CN206193213U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405441A (en) * | 2016-11-13 | 2017-02-15 | 深圳市迅特通信技术有限公司 | Aging testing device for optical module |
-
2016
- 2016-11-13 CN CN201621261670.XU patent/CN206193213U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106405441A (en) * | 2016-11-13 | 2017-02-15 | 深圳市迅特通信技术有限公司 | Aging testing device for optical module |
| CN106405441B (en) * | 2016-11-13 | 2023-08-04 | 深圳市迅特通信技术股份有限公司 | Aging test device of optical module |
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Legal Events
| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 701, 801, building C3, Nanshan wisdom garden, 1001 Xueyuan Avenue, Changyuan community, Taoyuan Street, Nanshan District, Shenzhen, Guangdong 518000 Patentee after: Shenzhen Xunte Communication Technology Co.,Ltd. Address before: 7 / F, block a, building 1, phase II, gaoxinxin Industrial Park, Bao'an District, Shenzhen, Guangdong 518000 Patentee before: SHENZHEN SONT TECHNOLOGY Co.,Ltd. |
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| CP03 | Change of name, title or address | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20210607 Address after: 701, 801, building C3, Nanshan wisdom garden, 1001 Xueyuan Avenue, Changyuan community, Taoyuan Street, Nanshan District, Shenzhen, Guangdong 518000 Patentee after: Shenzhen Xunte Communication Technology Co.,Ltd. Patentee after: JIANGXI SONT COMMUNICATION TECHNOLOGY Co.,Ltd. Address before: 701, 801, building C3, Nanshan wisdom garden, 1001 Xueyuan Avenue, Changyuan community, Taoyuan Street, Nanshan District, Shenzhen, Guangdong 518000 Patentee before: Shenzhen Xunte Communication Technology Co.,Ltd. |
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| TR01 | Transfer of patent right |