CN205920961U - Package structure of flip chip - Google Patents

Package structure of flip chip Download PDF

Info

Publication number
CN205920961U
CN205920961U CN201620808349.2U CN201620808349U CN205920961U CN 205920961 U CN205920961 U CN 205920961U CN 201620808349 U CN201620808349 U CN 201620808349U CN 205920961 U CN205920961 U CN 205920961U
Authority
CN
China
Prior art keywords
metal
column
metal line
chip
metal column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201620808349.2U
Other languages
Chinese (zh)
Inventor
谭小春
陆培良
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hefei Silicon Microelectronics Technology Co Ltd
Original Assignee
Hefei Silicon Microelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hefei Silicon Microelectronics Technology Co Ltd filed Critical Hefei Silicon Microelectronics Technology Co Ltd
Priority to CN201620808349.2U priority Critical patent/CN205920961U/en
Application granted granted Critical
Publication of CN205920961U publication Critical patent/CN205920961U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector

Abstract

The utility model provides a package structure of flip chip, including graphical metal wiring bottom, chip and cladding the plastic -sealed body of metal wiring bottom and chip, graphical metal wiring bottom has a plurality of metal gaskets, be provided with at least one second metal column on the metal gasket upper surface, under the metal gasket surface exposure in the plastic -sealed body, the chip orientation the surface of metal wiring bottom is provided with at least one first metal column of being connected with the chip land electricity, first metal column with the second metal column corresponds the electricity and connects, just highly being greater than of second metal column the height of first metal column. The utility model has the advantages of, the height that highly is greater than the first metal column of chip side of second metal column, this structure can reduce stress, avoids the chip to receive the damage, and practices thrift the cost, can be with cost reduction to 20%.

Description

Flip chip packaging structure
Technical field
This utility model is related to field of semiconductor package, more particularly, to a kind of flip chip packaging structure.
Background technology
Conventional level package technology is all that the active area of chip faces up, and is bonded, such as lead back to after substrate and patch Bonding and tape automated bonding (tab).Flip-Chip Using then by chip active area in the face of substrate, by being in that array is arranged on chip The solder bump of row realizes the interconnection of chip and substrate.Silicon chip is directly installed to printed circuit board in back-off mode, from silicon chip to Surrounding draws input/output terminal, greatly shortening of interconnection, reduces the delay of phase-shift circuit, is effectively improved electrical property.Aobvious So, this chip interconnection mode is provided that the density of higher input/output terminal.Upside-down mounting occupied area almost with die size one Cause.In all surface mounting technique, flip-chip can reach minimum, the thinnest encapsulation.
But, existing flip-chip packaged method haves the shortcomings that stress is big, and chip can be led to be damaged.Therefore, need badly A kind of method for packing, reduces the stress of flip-chip packaged, it is to avoid chip is damaged.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of flip chip packaging structure, and it can reduce should Power, it is to avoid chip is damaged, and cost-effective.
In order to solve the above problems, this utility model provides a kind of flip chip packaging structure, including patterned gold Belong to wiring bottom, chip and the plastic-sealed body coating described metal line bottom and chip, described patterned metal line bottom There are multiple metal gaskets, described metal gasket upper surface is provided with least one second metal column, described metal gasket lower surface is naked It is exposed to described plastic-sealed body, described chip is provided with and is electrically connected at least with chip bonding pad towards the surface of described metal line bottom One the first metal column, the electrical connection corresponding with described second metal column of described first metal column, and the height of described second metal column Degree is more than the height of described first metal column.
Further, described encapsulating structure also includes at least one patterned metal line intermediate layer, multiple described metals Wiring intermediate layer is along described second metal intercolumniation short transverse and described metal line bottom interval setting.
Further, at least one described second metal column side wall and/or at least one described patterned metal line bottom Layer the side wall of metal gasket and/or at least one described patterned metal line intermediate layer metal gasket side wall have for The projection of locking encapsulating structure plastic-sealed body.
Further, the lower surface exposing described plastic-sealed body in the metal gasket of described metal line bottom have solderable Layer, for welding with extraneous.
The utility model has the advantage of, the height that this utility model forms the second metal column of a substrate-side is more than chip The flip chip packaging structure of the height of the first metal column of side, this structure can reduce stress, it is to avoid chip is damaged, and Cost-effective, cost can be reduced to 20%.
Brief description
Fig. 1 is the step schematic diagram of this utility model method for packing;
Fig. 2 a~Fig. 2 g is the schematic flow sheet of this utility model method for packing;
Fig. 3 a~Fig. 3 g is to form patterned metal line bottom and the upper surface in described metal gasket in substrate surface Form the schematic flow sheet of at least one the second metal column;
Fig. 4 a~Fig. 4 g is to form at least one patterned metal line intermediate layer in the second metal column correspondence position Schematic flow sheet;
Fig. 5 is to form raised structural representation;
Fig. 6 is the structural representation of one specific embodiment of this utility model flip chip packaging structure;
Fig. 7 is the structural representation of this utility model flip chip packaging structure another embodiment.
Specific embodiment
Below in conjunction with the accompanying drawings the specific embodiment of the flip chip packaging structure that this utility model provides is done specifically Bright.
Referring to Fig. 1, this utility model method for packing comprises the steps: step s10: provides a substrate and a chip, institute The bond pad surface stating chip has one first metal column;Step s12: form patterned metal line on described substrate one surface Bottom, described metal line bottom has multiple metal gaskets;Step s14: form at least one in the upper surface of described metal gasket Second metal column, the height of described second metal column is more than the height of described first metal column;Step s16: by described first gold medal Belong to post and described second metal column welding;Step s18: chip described in plastic packaging, the first metal column, the second metal column and patterned Metal line bottom;Step s20: remove described substrate, so that the metal gasket lower surface of metal line bottom is exposed, form upside-down mounting Chip-packaging structure.
Fig. 2 a~Fig. 2 g is the process chart of this utility model method for packing.
Referring to Fig. 2 a and step s10, provide a substrate 200 and a chip 300, the pad of described chip 300 is (in accompanying drawing not Indicating) surface has one first metal column 301.
Described substrate 200 can have a carrier of peelable metal level for simple carrier or surface, described can Stripping metal layer can be subsequently peelable by plating or other modes deposition.Described first metal column 301 can be prior It is produced on copper bump or other metal salient points of bond pad surface.
Referring to Fig. 2 b, step s12 and step s14, form patterned metal line bottom on described substrate 200 1 surface 201, described metal line bottom 201 has multiple metal gaskets 202.Form at least one in the upper surface of described metal gasket 202 Second metal column 203, the height of described second metal column 203 is more than the height of described first metal column 301.
In this embodiment, referring to Fig. 3 a~Fig. 3 g, form patterned metal on described substrate 200 1 surface Wiring bottom 201 and form the method for at least one the second metal column 203 and include walking as follows in the upper surface of described metal gasket 202 Rapid:
Referring to Fig. 3 a, cover photosensitive mask 301 on a surface of described substrate 200.
Referring to Fig. 3 b, graphically described photosensitive mask 301, form patterned first mask layer 302.
Referring to Fig. 3 c, deposited metal, such as electro-coppering at the figure of described first mask layer 302, formed patterned Metal line bottom 201, is deposited into the metal gasket of described metal line bottom 201 at the figure of described first mask layer 302 202.
Referring to Fig. 3 d, cover photosensitive mask 303 in described first mask layer 302 and metal line bottom 201 surface.
Referring to Fig. 3 e, graphically described photosensitive mask 303, form patterned second mask layer 304, described second mask Corresponding described metal gasket 202 at the figure of layer 304.
Referring to Fig. 3 f, deposited metal at the figure of described second mask layer 304, with described metal gasket 202 upper surface Form at least one second metal column 203.
Referring to Fig. 3 g, remove described first mask layer 302 and the second mask layer 304, expose patterned metal line Bottom 201 and the second metal column 203.After this step, the second metal column 203 described in a pair can also be included and carry out anti-oxidation place Reason step, the processing method of this step is prior art, will not be described here.
In another specific embodiment of this utility model, referring to Fig. 4 a, also include one and correspond to position in the second metal column 203 Put the step forming at least one patterned metal line intermediate layer 205.Described metal line intermediate layer 205 is in the second metal Post position has metal gasket 206, and at least one described metal line intermediate layer 205 is along described second metal column 203 short transverse Interval split described second metal column 203, that is, described metal line intermediate layer 205 described second metal column 203 is divided into some It is preferable that being divided into some equal portions, often a second metal column 203 is defined as time the second metal column to part.Referring to shown in Fig. 4 a, In this embodiment, comprise a described metal line intermediate layer 205, a described metal line intermediate layer 205 will Described second metal column 203 is divided into two parts.Described patterned metal line intermediate layer 205 is used for described chip 300 fan-out (fan out), to mate pcb plate.
The manufacture method in described metal line intermediate layer can be divided into two kinds of situations, after a kind of situation is step s12, that is, exists After described substrate 200 1 surface forms the step of patterned metal line bottom 201, make metal line intermediate layer 205; Another kind of situation is after step s14, and that is, the upper surface in described metal gasket 202 forms at least one second metal column 203 After step, make metal line intermediate layer 205.
In the case of being each described hereafter two kinds, the manufacture method in described metal line intermediate layer.
Fig. 4 b~Fig. 4 d is a kind of manufacture method in described metal line intermediate layer.Formed on described substrate 200 1 surface Form described metal line intermediate layer 205 after the step of patterned metal line bottom 201.
Referring to Fig. 4 b, after described substrate 200 1 surface forms the step of patterned metal line bottom 201, adopt Cover described patterned metal line bottom 201 and substrate 200 with insulant, form insulating barrier 210, and in described metal Metal gasket 202 correspondence position of wiring bottom 201 forms via 211, exposes described metal gasket 202.
Referring to Fig. 4 c, form a patterned metal line intermediate layer 205 in described insulating barrier 210 upper surface, in this step In rapid, metal deposit, in via 211, forms time the second metal column 212, described patterned metal line intermediate layer 205 The position of corresponding the second metal column 212 of metal gasket 206.
Referring to Fig. 4 d, the metal gasket 206 in described patterned metal line intermediate layer 205 forms a projection 213.Should Raised 213 in subsequent technique, for welding with the first metal column 301.This projection 213 is with described the second metal column 212 altogether With described second metal column 203 of composition.Formed by metal line bottom 201, the second metal column 203 on described substrate 200 surface And constitute along the metal line intermediate layer 205 of described second metal column 203 of described second metal column 203 short transverse interval segmentation Structure, the height sum in described second metal column 203 and described metal line intermediate layer 205 is more than described first metal column 301 height.
Fig. 4 e~Fig. 4 g is another kind of manufacture method in described metal line intermediate layer.Upper table in described metal gasket 202 After face forms at least one the second metal column 203 step, make metal line intermediate layer 205.
Formed at least one the second metal column 203 step in the upper surface of described metal gasket 202, shorten described second gold medal Belong to the height of post 203, the second metal column 203 that here defines this shortening is time the second metal column 212;
Referring to Fig. 4 e, described patterned metal line bottom 201, substrate are covered using capsulation material or insulant 200 and secondary second metal column 212, form an insulating barrier 210, the upper surface of described the second metal column 212 be exposed to described absolutely Edge layer 210 upper surface.
Referring to Fig. 4 f, form a patterned metal line intermediate layer 205 in described insulating barrier upper surface, described graphical Described time second metal column 212 of metal gasket 206 correspondence in metal line intermediate layer 205 position.
Referring to Fig. 4 g, it is raised that metal gasket 206 upper surface in described patterned metal line intermediate layer 205 forms one 213, this projection 213 collectively forms described second metal column 203, on described substrate 200 surface with described the second metal column 212 Formed by metal line bottom 201, the second metal column 203 and split along described second metal column 203 short transverse interval described The structure that the metal line intermediate layer 205 of the second metal column 203 is constituted, in described second metal column 203 and described metal line The height sum of interbed 205 is more than the height of described first metal column 301.
Wherein, in this two methods, the manufacture method of described patterned metal line intermediate layer 205 and projection 213 The method that mask can be adopted, the technology that the method is known in the art, will not be described here.In addition, it is described patterned making Conductive layer (not indicating in accompanying drawing) can be formed on described insulating barrier 210 surface before metal line intermediate layer 205, subsequently can adopt Electric plating method deposits patterned metal line intermediate layer 205.In this embodiment, mask film covering layer and graphical The method commonly used for those skilled in the art of method, will not be described here.
Referring to Fig. 2 c, after step s14, also including one, formed on described second metal column 203 surface can layer 204 Step, described can layer 204 be used for subsequent technique in use as weld layer.This step can be laggard in step shown in Fig. 3 f OK, formed before removing the step of the first mask layer 302 and the second mask layer 304 can layer 204 it is also possible to remove Except formed after the step of the first mask layer 302 and the second mask layer 304 can layer 204, herein this is not defined.
Referring to Fig. 2 d and step s16, described first metal column 301 is welded with described second metal column 203.Described The surface of one metal column 301 can be previously implanted metal ball, when being welded, can be by the metal on the first metal column 301 surface Ball layer 204 welding can form weld layer 400 with described.
Before welding step s16, referring to Fig. 5, also include one at least one described second metal column 203 side wall and/ Or the side wall of metal gasket 202 of at least one described patterned metal line bottom 201 and/or at least one is described graphical The side wall of the metal gasket 206 in metal line intermediate layer 205 form the step of the projection 207 for locking encapsulating structure plastic-sealed body Suddenly.Described second metal column 203 side wall, the side wall of metal gasket 202 of described patterned metal line bottom 201 and described figure One or more of side wall of metal gasket 206 in metal line intermediate layer 205 of shape all can form projection 207, described Raised 207 structures forming similar ear in side wall, can fix the plastic-sealed body 500 that follow-up encapsulation is formed, it is to avoid plastic packaging further Body 500 is separated with components and parts (such as chip 300).In this embodiment, only at described patterned metal line bottom The side wall of the metal gasket 202 of layer 201 forms raised 207.
Referring to Fig. 2 e and step s18, chip 300 described in plastic packaging, the first metal column 301, the second metal column 203 and graphical Metal line bottom 201, described plastic-sealed body 500 surround described chip 300, the first metal column 301, the second metal column 203 and Patterned metal line bottom 201.
Referring to Fig. 2 f and step s20, remove described substrate 200, so that metal gasket 202 following table of metal line bottom 201 Face is exposed, forms flip chip packaging structure 600.The method removing described substrate 200 is this area conventional method, and here is no longer Repeat.
Further, referring to Fig. 2 g, after removing described substrate 200, also include one in described metal line bottom 201 Metal gasket 202 expose described plastic-sealed body 500 lower surface formed can layer 208 step, described can layer 208 be used for Extraneous realization welding.Described can layer 208 can be by the heavy stannum of chemistry, deposition nickel gold or osp process (Organic Solderability protection) etc. Mode is formed.
This utility model also provides a kind of flip chip packaging structure, and referring to Fig. 6, flip chip packaging structure 600 includes Patterned metal line bottom 201, chip 300 and the plastic-sealed body 500 coating described metal line bottom 201 and chip 300, Described patterned metal line bottom 201 has multiple metal gaskets 202, and described metal gasket 202 upper surface is provided with least One the second metal column 203, described metal gasket 202 lower surface is exposed to described plastic-sealed body 500, and described chip 300 is towards described The surface of metal line bottom 201 is provided with least one first metal column 301 electrically connecting with chip bonding pad, described first gold medal Belong to post 301 and the corresponding electrical connection of described second metal column 203, and the height of described second metal column 203 is more than described first gold medal Belong to the height of post 301.
Referring to Fig. 7, in another specific embodiment of this utility model, described encapsulating structure also includes at least one figure Change metal line intermediate layer 205, multiple described metal line intermediate layers 205 along described second metal column 203 short transverse with Described metal line bottom 201 interval setting.In this embodiment, described encapsulating structure also include one patterned Metal line intermediate layer 205, described second metal column 203 is divided into two parts by a described metal line intermediate layer 205.
Preferably, at least one described second metal column 203 side wall and/or at least one described patterned metal line The side wall of the metal gasket 202 of bottom 201 and/or the metal gasket 206 at least one described patterned metal line intermediate layer 205 Side wall there is projection 207 for locking encapsulating structure plastic-sealed body, described raised 207 form the knot of similar ear in side wall Structure, can fix plastic-sealed body 500 further, it is to avoid plastic-sealed body 500 is separated with components and parts (such as chip 300), referring to Fig. 7, at this In specific embodiment, only the side wall in the metal gasket 202 of described patterned metal line bottom 201 forms raised 207.
Preferably, in the lower surface exposing described plastic-sealed body 500 of the metal gasket 202 of described metal line bottom 201 Also have can layer 208, described layer 208 can be used for and extraneous realize welding.
The above is only preferred implementation of the present utility model it is noted that common skill for the art Art personnel, on the premise of without departing from this utility model principle, can also make some improvements and modifications, these improvements and modifications Also should be regarded as protection domain of the present utility model.

Claims (4)

1. a kind of flip chip packaging structure, including patterned metal line bottom, chip and the described metal line bottom of cladding Layer and the plastic-sealed body of chip, described patterned metal line bottom has multiple metal gaskets, described metal gasket upper surface sets It is equipped with least one second metal column, described metal gasket lower surface is exposed to described plastic-sealed body, and described chip is towards described metal The surface of wiring bottom is provided with least one first metal column electrically connecting with chip bonding pad it is characterised in that described first Metal column electrical connection corresponding with described second metal column, and the height of described second metal column is more than the height of described first metal column Degree.
2. flip chip packaging structure according to claim 1 is it is characterised in that described encapsulating structure also includes at least one Individual patterned metal line intermediate layer, multiple described metal line intermediate layers are along described second metal intercolumniation short transverse and institute State metal line bottom interval setting.
3. the flip chip packaging structure according to claim 1 or 2 any one is it is characterised in that described at least one Second metal column side wall and/or the side wall of metal gasket and/or at least of at least one described patterned metal line bottom The side wall of the metal gasket in individual described patterned metal line intermediate layer has the projection for locking encapsulating structure plastic-sealed body.
4. flip chip packaging structure according to claim 1 is it is characterised in that metal in described metal line bottom The lower surface exposing described plastic-sealed body of pad have can layer, for extraneous welding.
CN201620808349.2U 2016-07-28 2016-07-28 Package structure of flip chip Active CN205920961U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620808349.2U CN205920961U (en) 2016-07-28 2016-07-28 Package structure of flip chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620808349.2U CN205920961U (en) 2016-07-28 2016-07-28 Package structure of flip chip

Publications (1)

Publication Number Publication Date
CN205920961U true CN205920961U (en) 2017-02-01

Family

ID=57873184

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620808349.2U Active CN205920961U (en) 2016-07-28 2016-07-28 Package structure of flip chip

Country Status (1)

Country Link
CN (1) CN205920961U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106057685A (en) * 2016-07-28 2016-10-26 合肥矽迈微电子科技有限公司 Packaging method and flip chip packaging structure
CN109427714A (en) * 2017-08-24 2019-03-05 日月光半导体制造股份有限公司 Semiconductor packages and its manufacturing method
US11239140B2 (en) 2017-12-20 2022-02-01 Hefei Smat Technology Co., Ltd. Chip packaging structure with heat dissipation layer, flange and sealing pin

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106057685A (en) * 2016-07-28 2016-10-26 合肥矽迈微电子科技有限公司 Packaging method and flip chip packaging structure
CN109427714A (en) * 2017-08-24 2019-03-05 日月光半导体制造股份有限公司 Semiconductor packages and its manufacturing method
CN109427714B (en) * 2017-08-24 2023-09-08 日月光半导体制造股份有限公司 Semiconductor package and method of manufacturing the same
US11239140B2 (en) 2017-12-20 2022-02-01 Hefei Smat Technology Co., Ltd. Chip packaging structure with heat dissipation layer, flange and sealing pin
US11735503B2 (en) 2017-12-20 2023-08-22 Hefei SMAT Technology Co., LTD Method of manufacturing chip packaging structure with dissipation layer, flange and sealing pin

Similar Documents

Publication Publication Date Title
CN101335253B (en) Semiconductor package and semiconductor device using the same
US20090115072A1 (en) BGA Package with Traces for Plating Pads Under the Chip
CN106816388B (en) Semiconductor packaging structure and manufacturing method thereof
KR20090055316A (en) Semiconductor package and electronic device, and method for manufacturing semiconductor package
CN102144291B (en) Semiconductor substrate, encapsulation and device
KR102385561B1 (en) Shielded semiconductor package with open terminal and methods of making
TWI674658B (en) Fully molded miniaturized semiconductor module
US9324633B2 (en) Multi-level package assembly having conductive vias coupled to chip carrier for each level and method for manufacturing the same
US10128221B2 (en) Package assembly having interconnect for stacked electronic devices and method for manufacturing the same
CN211404495U (en) Semiconductor device and semiconductor substrate
CN205920961U (en) Package structure of flip chip
TWI231165B (en) Method for fabricating electrical connection structure of circuit board
CN104766837A (en) Semiconductor package and fabrication method thereof
CN100501986C (en) Semiconductor device and its manufacturing method
KR20240017393A (en) Semiconductor device and manufacturing method thereof
TW201543583A (en) Integrated circuit packaging system with vialess substrate and method of manufacture thereof
CN105489565A (en) Package structure of embedded device and method for fabricating the same
KR101653563B1 (en) Stack type semiconductor package and method for manufacturing the same
CN105845585A (en) Chip packaging method and chip packaging structure
CN109559998A (en) Magnetic screen encapsulating structure and its manufacturing method for MRAM device
CN108183091A (en) A kind of encapsulating structure and its process
CN106057685A (en) Packaging method and flip chip packaging structure
CN114649226B (en) Selective EMI shielding using preformed masks with cusp designs
CN202473869U (en) Cylindrical bump packaging composition
CN104617075B (en) Packaging structure of lead frame and manufacturing method thereof

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant