CN205898897U - Impedance detection's probe unit - Google Patents

Impedance detection's probe unit Download PDF

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Publication number
CN205898897U
CN205898897U CN201620514588.7U CN201620514588U CN205898897U CN 205898897 U CN205898897 U CN 205898897U CN 201620514588 U CN201620514588 U CN 201620514588U CN 205898897 U CN205898897 U CN 205898897U
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CN
China
Prior art keywords
fixed
probe
fixed structure
probe assembly
chassis
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Withdrawn - After Issue
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CN201620514588.7U
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Chinese (zh)
Inventor
赵凌云
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Nanjing Xie Chen Electronic Science And Technology Co Ltd
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Nanjing Xie Chen Electronic Science And Technology Co Ltd
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Priority to CN201620514588.7U priority Critical patent/CN205898897U/en
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Abstract

The utility model discloses an impedance detection's probe unit, which comprises a base, the fixed knot that perpendicular chassis set up constructs and the 2nd fixed knot structure, at least one first probe subassembly sets up respectively on the tip that the tip and the 2nd fixed knot of fixed knot structure construct with at least one second probe subassembly, second probe subassembly and the relative cooperation of first probe subassembly one -to -one are used for the impedance of detection line board, fixed knot structure is fixed on the chassis, the 2nd fixed knot constructs through the movably setting of drive arrangement on the chassis, and two one at least elevating gear, be used for first probe subassembly of separately -driven and second probe subassembly to do the elevating movement, be convenient for when the impedance detection to different thickness circuit boards, the height of first probe subassembly and second probe subassembly is adjusted according to the thickness of circuit board at any time, the win surface contact of probe subassembly and second probe subassembly and gate board of messenger, and accomplish the impedance detection of circuit board under the cooperation of two probe subassemblies.

Description

A kind of probe apparatus of impedance detection
Technical field
The utility model is related to the detection technique field of wiring board impedance and in particular to a kind of probe of impedance detection fills Put.
Background technology
In prior art, after preparing the circuit of required form in the circuit board, need to pop one's head in line using impedance detection Circuit on the plate of road is detected, to judge with this testing result whether the circuit on wiring board reaches requirement.
Chinese patent literature cn203385768u discloses a kind of impedance detection probe apparatus of wiring board, including having opening Housing upward, is arranged on the upper lid on shell nozzle;It is arranged on two probe assemblies in housing, probe assembly includes electricity Cable, is arranged on probe and the binding post at cable two ends, and the end away from cable one end of probe is located at outside housing, wiring Terminal is located at outside housing;And for adjusting the adjusting means of spacing between two probes.
Adjusting means includes having positive and negative tooth screw mandrel, two slide blocks, two fixed blocks, rotating wheel and locking device.Wherein, The two ends of forward lead screw are fixed in inner walls by a fixed block respectively, and a slide block is arranged on screw mandrel orthodontic part On, the anti-tooth that another slide block is arranged on screw mandrel is partly gone up, and two probes are separately fixed on a slide block;Rotating wheel is fixed on On screw mandrel, and it is located between two slide blocks, locking device is arranged in rotating wheel, for limiting the rotation of rotating wheel.
The probe apparatus of the impedance detection of said structure, when needing to adjust the spacing between two probes, need people Can be manually rotated rotating wheel, and then drive screw mandrel to rotate so that the slide block being arranged on screw mandrel moves, to change two probes it Between spacing, when the spacing between two probes reaches necessary requirement, limit the rotation of rotating wheel so that two with locking device Individual probe keeps above-mentioned desired spacing.But, this impedance probe device, between can only realizing adjusting between two probes Away from, if it is difficult to adjust two spacing between probe and wiring board when wiring board variable thickness to be detected causes, and then impact The testing result of probe apparatus.
Utility model content
Therefore, technical problem to be solved in the utility model is the impedance detection probe dress of wiring board in prior art Put and be difficult to adjust the spacing between probe and wiring board.
For this reason, the utility model provides a kind of probe apparatus of impedance detection, including
Chassis;
First fixed structure, perpendicular to the setting of described chassis, bottom is fixed on described chassis;
At least one first probe assembly, is vertically arranged on the end of described first fixed structure;
Second fixed structure, parallel with described first fixed structure, it is movably disposed at described bottom by driving means On disk;
At least one second probe assembly, is vertically arranged on the end of described second fixed structure, with the described first spy Head assembly correspondingly relative to and coordinate the impedance for detecting wiring board;Under the movement of described second fixed structure, band Move described second probe assembly to move towards or away from described first probe assembly direction;
At least two first lowering or hoisting gears, at least one described first lowering or hoisting gear is arranged on described first fixed structure On end, and at least another described first lowering or hoisting gear is arranged on the end of described second fixed structure, for driving respectively Move described first probe assembly and the second probe assembly vertically moves up and down.
The probe apparatus of above-mentioned impedance detection, also include at least two first connecting plates, at least one described first company Fishplate bar is fixed on described first fixed structure, and at least another described first connecting plate is fixed on described second fixed structure On;
Wherein, it is fixing that the one end of described first connecting plate being fixed on described first fixed structure stretches out in described first Structure setting has one end of described first probe assembly, forms the first sidepiece installing space with described first fixed structure, at least One described first lowering or hoisting gear is arranged in described first sidepiece installing space, and is fixed on this described first connecting plate;
The one end of described first connecting plate being fixed on described second fixed structure stretches out in described second fixed structure It is provided with one end of described second probe assembly, form the second sidepiece installing space with described second fixed structure, at least another Individual described first lowering or hoisting gear is arranged in described second sidepiece installing space, and is fixed on this described first connecting plate.
The probe apparatus of above-mentioned impedance detection, described first lowering or hoisting gear includes
First track plates, are vertically arranged on described first fixed structure or the end wall of the second fixed structure;
First slide block, is slidably arranged on described first track plates;
Rebound, is vertically arranged, and side wall is fixed on described first slide block, and opposite side wall is fixed described first probe Assembly or the second probe assembly;
First driver, is fixed on described first connecting plate, and its drive shaft is connected to institute through described first connecting plate State rebound.
The probe apparatus of above-mentioned impedance detection, described first probe assembly is two, and described second probe assembly is two Individual, two described first probe assemblies are separately fixed on the both ends of described first fixed structure;Two described second probes Assembly is separately fixed on the both ends of described second fixed structure.
The probe apparatus of above-mentioned impedance detection, described second fixed structure includes
Level board, described first connecting plate is fixed on level board;
Two cant boards, are separately fixed on the both ends of described level board, and extend downwardly perpendicular to described level board, Described second probe assembly is arranged on the wall outer surface of described cant board.
The probe apparatus of above-mentioned impedance detection, described driving means include
Installing plate, parallel with described level board, bottom is fixed on described chassis;
Screw component, positioned at the side relative with described first fixed structure of described second fixed structure, including screw mandrel With the nut block being set on described screw mandrel, described nut block is fixed on the lower section of level board, and described screw mandrel sequentially passes through described Installing plate, the lower section of described level board, and end are stretched in the through hole being opened on described first fixed structure;
Second driver, is fixed on described installing plate, for driving described screw mandrel to rotate;
Rotate limiter assembly, rotate in a circumferential direction under the drive of described screw mandrel for limiting nut block.
The probe apparatus of above-mentioned impedance detection, described rotation limiter assembly includes
Two the second track plates, are vertically arranged and parallel to described screw mandrel, the bottom of two described second track plates is fixed On described chassis, and it is located at the both sides of described screw mandrel;
At least two second slide blocks, at least one described second slide block is slidably arranged on described second track plates, The two ends bottom of the lower section of described level board is respectively fixed with least one described second slide block.
The probe apparatus of above-mentioned impedance detection, described chassis opens up at least two first through holes;
The bottom two ends of described first fixed structure have the projection extending downwardly, and two described projections are located at one respectively In described first through hole, so that described first probe assembly is located in described first through hole;
Two described cant boards of described second fixed structure are located in a described first through hole respectively;So that described Two probe assemblies are located in described first through hole.
The probe apparatus of above-mentioned impedance detection, also include whirligig, for driving described chassis to drive described first Probe assembly and the second probe assembly rotate in the horizontal direction.
The probe apparatus of above-mentioned impedance detection, described whirligig includes
Rotating disk, parallel with described chassis;
At least one connecting post, bottom is fixed on described chassis, and top is fixed on the bottom of described rotating disk;
Fixed block;
3rd driver, is fixed on described fixed block, and its rotary shaft is connected to described rotating disk through described fixed block.
The probe apparatus of above-mentioned impedance detection, also include the second lowering or hoisting gear, for driving described fixed block to drive institute State chassis to move up and down.
The probe apparatus of above-mentioned impedance detection, described second lowering or hoisting gear includes
3rd track plates, are two, are vertically arranged;
3rd slide block, is two, is slidably arranged in respectively on described 3rd track plates;
3rd fixed structure, is vertically arranged, and side is fixed on described 3rd slide block, and opposite side is fixed on described fixed block On;
Fourth drive, for driving described 3rd fixed structure to slide on described 3rd track plates.
The technical scheme that the utility model provides, has the advantage that
1. the probe apparatus of the impedance detection that the utility model provides, including chassis, are vertically arranged in first on chassis Fixed structure and the second fixed structure, at least one first probe assembly and at least one second probe assembly are separately positioned on On the end of the end of one fixed structure and the second fixed structure, the second probe assembly is relative with the first probe assembly one-to-one corresponding And coordinating impedance for detecting wiring board, first fixed structure is fixed on chassis, and the second fixed structure passes through driving means It is movably disposed on chassis, and at least two first lowering or hoisting gears, for driving the first probe assembly and second respectively Probe assembly moves up and down, and is easy to, in the impedance detection to different-thickness wiring board, be adjusted at any time according to the thickness of wiring board The height of whole first probe assembly and the second probe assembly is so that the table of the first probe assembly and the second probe assembly and wiring board Face contacts, and completes the impedance detection of wiring board under the cooperation of two probe assemblies.
2. the probe apparatus of the impedance detection that the utility model provides, also include at least two first connecting plates, solid respectively It is scheduled on first fixed structure and the second fixed structure, the one end of the first connecting plate being fixed on first fixed structure stretches out in First fixed structure is provided with one end of the first probe assembly, forms the first sidepiece installing space with first fixed structure, at least One the first lowering or hoisting gear is arranged in the first sidepiece installing space, and is fixed on this first connecting plate;It is fixed on second solid One end of the first connecting plate on fixed structure stretches out in one end that the second fixed structure is provided with the second probe assembly, solid with second Fixed structure forms the second sidepiece installing space, and at least another first lowering or hoisting gear is arranged in the second sidepiece installing space, and It is fixed on this first connecting plate.
The setting of at least two first connecting plates so that on the first connecting plate of being fixed on first fixed structure first Lowering or hoisting gear is located at the top of the first probe assembly, is fixed on the first lifting dress on the first connecting plate on the second fixed structure Setting in the top of the second probe assembly, it is easy to the first lowering or hoisting gear and drives the first probe assembly or the second probe assembly to lift Motion.
3. the probe apparatus of the impedance detection that the utility model provides, the first probe assembly is two, the second probe assembly For two, two described first probe assemblies are separately fixed on the both ends of described first fixed structure;Two described second Probe assembly is separately fixed on the both ends of described second fixed structure.
When the impedance to wiring board detects, first probe assembly coordinates second probe assembly to complete line The testing impedance of a location point on the plate of road, arranges two the second probe assemblies and two the first probe groups in this embodiment Part, realizes being carried out testing impedance at 2 points of various location on wiring board simultaneously, improves testing efficiency;Meanwhile, driving means When driving the second fixed structure mobile, drive two the second probe assemblies simultaneously towards or away from the first probe assembly direction Mobile, it is conveniently adjusted spacing respectively and each self-corresponding first probe assembly between for two the second probe assemblies.
4. the utility model improve impedance detection probe apparatus, the second fixed structure include level board and two edge-on Plate, the first connecting plate is fixed on level board, and two cant boards are separately fixed on the both ends of level board, and perpendicular to level Plate extends downwardly, and the second probe assembly is arranged on the wall outer surface of cant board.That is, level board and two cant boards are formed " several " font, is respectively mounted second probe assembly on the outer surface of the vertical plates on both sides of "Ji" type.
When driving means drive level board to move on chassis, drive and be arranged on two cant board wall outer surface Second probe assembly is overall to be moved towards or away from the first probe assembly direction, thus in the confined space on chassis, driving Multiple second probe assemblies move on chassis simultaneously so that probe apparatus carry out impedance to location points multiple on wiring board simultaneously Detection, the detection efficiency of raising probe apparatus, and make the compact conformation of whole probe apparatus, shared space is less.
5. the probe apparatus of the impedance detection that the utility model provides, chassis starts at least two first through holes, and first The bottom two ends of fixed structure have the projection extending downwardly, and two projections are located in a first through hole respectively, so that first Probe assembly is located in first through hole;Two cant boards of the second fixed structure are located in a first through hole respectively;So that the Two probe assemblies are located in first through hole.When driving means drive the second fixed structure mobile, the movement of the second probe assembly Scope is limited in first through hole;Meanwhile, the first probe assembly and the second probe assembly pass through first through hole and then touch The surface of wiring board to be detected, the impedance of wiring board is detected so that the first probe assembly and the second probe assembly exist On chassis 1, arrangement is more compact, and the space of occupancy is less.
6. the utility model provide impedance detection probe apparatus, also include whirligig, for drive chassis with First probe assembly and the second probe assembly rotate in the horizontal direction, and further, whirligig includes rotating disk, connection Post, fixed block and the 3rd driver, wherein rotating disk is parallel with chassis, and the top of connecting post is fixing on the rotating pan, and bottom is solid It is scheduled on chassis, the 3rd driver is fixed on fixed block, its rotary shaft passes through fixed block to connect and rotating disk.3rd driver Rotating disk is driven to drive the first probe assembly of setting and the second probe assembly on bottom and chassis to rotate in the horizontal direction, it is right to realize On wiring board, the location point of various location carries out testing impedance.
Brief description
In order to be illustrated more clearly that the utility model specific embodiment or technical scheme of the prior art, below will be right In specific embodiment or description of the prior art the accompanying drawing of required use be briefly described it should be apparent that, below describe In accompanying drawing be some embodiments of the present utility model, for those of ordinary skill in the art, do not paying creativeness On the premise of work, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is the perspective view of the probe apparatus of impedance detection provided in embodiment 1;
Fig. 2 is the perspective view of the probe apparatus of impedance detection provided in embodiment 1;
Fig. 3 is that the perspective view of the probe apparatus of impedance detection provided in embodiment 1 (removes second fixing Structure);
Fig. 4 is the structural representation of the second fixed structure provided in embodiment 1;
Fig. 5 is the structural representation of the first fixed structure provided in embodiment 1;
Whirligig and the second lifting in the probe apparatus of the impedance detection that Fig. 6 is provided by the utility model embodiment 1 The perspective view of device;
Description of reference numerals: 1- chassis;11- first through hole;2- first fixed structure;21- is raised;3- the first probe group Part;4- second fixed structure;41- level board;42- cant board;5- second probe assembly;6- first lowering or hoisting gear;61- first rail Guidance tape;62- first slide block;63- rebound;64- first driver;7- first connecting plate;8- driving means;81- installing plate; 821- screw mandrel;822- nut block;83- second track plates;84- second slide block;85- second driver;91- rotating disk;92- connects Post;93- the 3rd driver;94- fixed block;10- second lowering or hoisting gear;101- the 3rd fixed structure;102- the 3rd track plates; 103- the 3rd slide block;104- fourth drive;12- casing;13- lid;14- probe;15- binding post;16- second through hole; 17- second connecting plate.
Specific embodiment
Below in conjunction with accompanying drawing, the technical solution of the utility model is clearly and completely described it is clear that described Embodiment is a part of embodiment of the utility model, rather than whole embodiments.Based on the embodiment in the utility model, this The every other embodiment that field those of ordinary skill is obtained under the premise of not making creative work, broadly falls into this practicality Novel protected scope.
In description of the present utility model, " " center ", " on ", D score, "left", "right", " perpendicular it should be noted that term Directly ", the orientation of instruction such as " level ", " interior ", " outward " or position relationship are based on orientation shown in the drawings or position relationship, are only For the ease of description the utility model with simplify description, rather than instruction or the hint device of indication or element must have specific Orientation, with specific azimuth configuration and operation, therefore it is not intended that to restriction of the present utility model.Additionally, term " the One ", " second ", " the 3rd " are only used for describing purpose, and it is not intended that indicating or hint relative importance.
In description of the present utility model, it should be noted that unless otherwise clearly defined and limited, term " peace Dress ", " being connected ", " connection " should be interpreted broadly, for example, it may be being fixedly connected or being detachably connected, or integratedly Connect;Can be to be mechanically connected or electrically connect;Can be to be joined directly together it is also possible to be indirectly connected to by intermediary, It can be the connection of two element internals.For the ordinary skill in the art, above-mentioned art can be understood with concrete condition Concrete meaning in the utility model for the language.
As long as additionally, involved technical characteristic in the utility model different embodiments disclosed below is each other The conflict of not constituting just can be combined with each other.
Embodiment 1
As shown in figure 1, the present embodiment provides a kind of probe apparatus of impedance detection, including
Chassis 1;
First fixed structure 2, is arranged perpendicular to chassis 1, and bottom is fixed on chassis 1;
One the first probe assembly 3, is vertically arranged on the end of first fixed structure 2;
Second fixed structure 4, parallel with first fixed structure 2, it is movably disposed on chassis 1 by driving means 8;
One the second probe assembly 5, is vertically arranged on the end of the second fixed structure 4, relative with the first probe assembly 3 And coordinate impedance for detecting wiring board, under the movement of the second fixed structure 4, drive the second probe assembly 5 towards or remote Move from the first probe assembly 3 direction;
Two the first lowering or hoisting gears 6, are separately positioned on first fixed structure 2 and the end of the second fixed structure 4, are used for The first probe assembly 3 and the second probe assembly 5 is driven vertically to move up and down respectively.
The probe apparatus of said structure, two the first lowering or hoisting gears 6 of setting are used for driving respectively the first probe assembly 3 and the Two probe assembly 5 in the vertical direction moves up and down, and is easy in the impedance detection to different-thickness wiring board, according to circuit The thickness of plate adjusts the height of the first probe assembly 3 and the second probe assembly 5 at any time so that the first probe assembly 3 and second is visited Head assembly 5 is contacted with the surface of wiring board, and completes the impedance detection of wiring board under the cooperation of two probe assemblies.
As deformation, as shown in Fig. 2 the first probe assembly 3 is two, accordingly the second probe assembly 5 is two, two First probe assembly 3 is separately fixed on the both ends of first fixed structure 2, and two the second probe assemblies 5 are separately fixed at On the both ends of two fixed structures 4.When the impedance to wiring board detects, first probe assembly 3 cooperation one the Two probe assemblies 5 complete the testing impedance of a location point on wiring board, arrange two the second probe assemblies 5 in this embodiment With two the first probe assemblies 3, realize being carried out testing impedance at 2 points of various location on wiring board simultaneously, improve test effect Rate;Meanwhile, driving means 8 are when driving the second fixed structure 4 mobile, drive two the second probe assemblies 5 simultaneously towards or Away from the first probe assembly 3 direction move, be conveniently adjusted two the second probe assemblies 5 respectively with each self-corresponding first probe group Spacing between part 3.
As deformation, the first probe assembly 3 can also be three or four etc., and accordingly the second probe assembly 5 is three Individual or four etc., depending on concrete setting number is according to actually used situation, but the second probe assembly 5 and the first probe assembly 3 Must correspond and be oppositely arranged, thus can form multigroup detection components, respectively to the diverse location point on wiring board Carry out impedance detection, improve the operating efficiency of probe apparatus.
As the deformation of the first lowering or hoisting gear 6, the first lowering or hoisting gear 6 can also be three, four, five etc., in a word, At least one the first lowering or hoisting gear 6 is arranged on the end of first fixed structure 2, to drive one or more first probe groups Part 3 moves up and down;At least another first lowering or hoisting gear 6 is arranged on the end of the second fixed structure 4, to drive one Or multiple second probe assembly 5 moves up and down.
As preferred embodiment, as shown in figure 1, also including two the first connecting plates 7, it is separately fixed at first fixing In structure 2 and the second fixed structure 4;
The one end of the first connecting plate 7 being fixed on first fixed structure 2 stretches out in first fixed structure 2 and is provided with first One end of probe assembly 3, forms the first sidepiece installing space with first fixed structure 2, and first lowering or hoisting gear 6 is arranged on the In one sidepiece installing space, and it is fixed on this first connecting plate 7;
The one end of the first connecting plate 7 being fixed on the second fixed structure 4 stretches out in the second fixed structure 4 and is provided with second One end of probe assembly 5, forms the second sidepiece installing space with the second fixed structure 4, and another first lowering or hoisting gear 6 is arranged on In second sidepiece installing space, and it is fixed on this first connecting plate 7.
In this embodiment, first connecting plate 7 is respectively provided with first fixed structure 2 and the second fixed structure 4, The one end of the first connecting plate 7 being arranged on first fixed structure 2 is stretched out first fixed structure 2 and is provided with the first probe assembly 3 One end, so that the first lowering or hoisting gear 6 being arranged on the first connecting plate 7 is located at the top of the first probe assembly 3, is easy to first liter Falling unit 6 drives the first probe assembly 3 to move up and down.Similarly, it is arranged on the first connecting plate 7 on the second fixed structure 4 One end stretch out the second fixed structure 4 and be provided with one end of the second probe assembly 5 so that being arranged on this first connecting plate 7 One lowering or hoisting gear 6 is located at the top of the second probe assembly 5, is easy to drive the second probe assembly 5 to move up and down.
As deformation, the first above-mentioned connecting plate 7 can also be three, four or five etc., and for example, second is fixing Second probe assembly 5 is respectively provided with the both ends of structure 4, is accordingly respectively provided with the first spy on the both ends of first fixed structure 2 Head assembly 3, for driving two the second probe assemblies 5 and two the first probe assemblies 3 to move up and down respectively, in the second fixed knot The top two ends of the top two ends of structure 4 and first fixed structure 2 are respectively provided with the first connecting plate 7.
As deformation, first probe assembly 3 and the second probe assembly 5 in the vertical direction can also be only driven to rise Fall motion, or only the first probe assembly 3 of drive part and the second probe assembly 5 move up and down, but must be relatively to set The first probe assembly 3 put and the second probe assembly 5.
As the preferred embodiment of the first lowering or hoisting gear 6, as shown in Fig. 2 the first lowering or hoisting gear 6 includes
First track plates 61, are vertically arranged on first fixed structure 2 or the end wall of the second fixed structure 4;
First slide block 62, is slidably arranged on the first track plates 61;
Rebound 63, is vertically arranged, and side wall is fixed on the first slide block 62, and opposite side wall is fixed the first probe assembly 3 or second probe assembly 5;
First driver 64, is fixed on the first connecting plate 7, and its drive shaft is connected to rebound through the first connecting plate 7 63.
First lowering or hoisting gear 6 of this structure, positioned at the top of the first probe assembly 3 or the second probe assembly 5, the 3rd driving Device 93 directly drives rebound 63 and drives and is fixed on the first slide block 62 on the first probe assembly 3 or the second probe assembly 5 the Slide on one track plates 61, and then realize the motion in vertical direction of the first probe assembly 3 or the second probe assembly 5.
It is further preferred that the first driver 64 is cylinder, or others driver of the prior art.
As the deformation of the first lowering or hoisting gear 6, the first lowering or hoisting gear 6 can also be lifting dresses other in prior art Put, only need to meet driving the first probe assembly 3 or the second probe assembly 5 moves up and down in vertical direction.
As the preferred embodiment of the second fixed structure 4, as shown in figure 4, the second fixed structure 4 includes level board 41 He Two cant boards 42, two cant boards 42 are separately fixed on the both ends of level board 41, and perpendicular to level board 41 to downward Stretch, the first connecting plate 7 is fixed on level board 41, the second probe assembly 5 is arranged on the wall outer surface of cant board 42.? That is, this level board 41 and two cant boards 42 form "Ji" type.
Second fixed structure 4 of this structure, when driving means 8 drive level board 41 to move on chassis 1, drive is arranged on The second probe assembly 5 on two cant board 42 wall outer surface is overall to be moved towards or away from the first probe assembly 3 direction, from And in the One On The Chassis confined space, drive multiple second probe assemblies 5 to move on chassis so that probe apparatus are same simultaneously When location points multiple on wiring board are carried out with impedance detection, improve the detection efficiency of probe apparatus, and make whole probe apparatus Compact conformation, shared space is less.
As deformation, the second above-mentioned fixed structure 4 can also be the shape of falling u, or other shapes, only need to realize second The function of the second probe assembly 5 is fixed on the both ends of fixed structure 4.
It is further preferred that as shown in figure 3, driving means 8 include installing plate 81, screw mandrel 821 assembly and the second driver 85;Installing plate 81 is be arranged in parallel with level board 41, and bottom is fixed on chassis 1;Screw mandrel 821 assembly is located at the second fixed structure 4 Relative with first fixed structure 2 layer, including screw mandrel 821 with the nut block 822 that is set on screw mandrel 821, nut block 822 It is fixed on the lower section of level board 41, screw mandrel 821 sequentially passes through installing plate 81, the lower section of level board 41, and end and stretches into and be opened in In through hole on first fixed structure 2;Second driver 85 is fixed on installing plate 81, rotates for drive screw 821.
When second driver drives screw mandrel 821 rotates, nut block 822 is driven to move along a straight line along screw mandrel 821 axis direction, And then drive level board 41 to move towards or away from the first probe assembly 3 direction, realize the second probe assembly 5 and the first probe group Spacing adjustment between part 3.
It is further preferred that the second driver 85 is motor, or other driving means of the prior art, only need to realize The function that drive screw 821 rotates.
It is further preferred that driving means 8 also include rotating limiter assembly, for limiting nut block 822 in screw mandrel 821 Rotate in a circumferential direction under drive.Because screw mandrel 821 rotation can drive nut block 822 to have rotation in circumference, so that nut block 822 is not Can merely move along a straight line, the accuracy of spacing adjustment between the second probe assembly 5 and the first probe assembly 3 can be affected, Rotary spacing assembly is then set, to limit the circumferential movement that screw mandrel 821 drives nut block 822, so that nut block 822 is only Axis direction along screw mandrel 821 moves along a straight line, and improves spacing adjustment between the second probe assembly 5 and the first probe assembly 3 The degree of accuracy, improve probe apparatus accuracy of detection.
It is further preferred that rotary stopper assembly includes two the second track plates 83 and two the second slide blocks 84, two Two track plates 83 are vertically arranged and parallel to screw mandrel 821, and the bottom of two track plates is fixed on chassis 1, and are located at screw mandrel 821 Both sides;Two the second slide blocks 84 are slidably arranged on second track plates 83 respectively, the two ends bottom of the lower section of level board 41 Second slide block 84 is fixed in portion respectively.
In this embodiment, when screw mandrel 821 rotates, because two cant boards 42 are located at the outer surface of the second track plates 83 Locate, the second track plates 83 will limit the rotation of two cant boards 42, and then limit nut block 822 to rotate with screw mandrel 821, make Obtain nut block 822 only to move along a straight line on the axis direction of screw mandrel 821;Meanwhile, the setting of the second track plates 83, by screw mandrel 821 bearing capacities bearing the second fixed structure 4 are transferred on the second track plates 83, reduce the active force that screw mandrel 821 bears in itself, Thus playing a protective role to screw mandrel 821;In addition also allow for level board 41 to slide on the second track plates 83 it is easier to realize Two probe assemblies 5 are towards or away from the movement in the first probe assembly 3 direction.
As deformation, the quantity of the second slide block 84 can be two, three, four or five etc., specifically arranges number Depending on actually used situation, but at least provided with second slide block 84 on second track plates 83.
As further preferred embodiment, as shown in Figure 2 and Figure 5, chassis 1 opens up two first through holes 11, the The bottom two ends of one fixed structure 2 have the projection 21 extending downwardly, and two projections 21 are located in a first through hole 11 respectively, So that the first probe assembly 3 is located in first through hole 11;Two cant boards 42 of the second fixed structure 4 are located at one first respectively In through hole 11;So that the second probe assembly 5 is located in first through hole 11.
In this embodiment, two first through holes 11 that chassis 1 opens up are so that be fixed on the of first fixed structure 2 One probe assembly 3 and the second probe assembly 5 being fixed on the second fixed structure 4 end are respectively positioned in first through hole 11.Driving When dynamic device 8 drives the second fixed structure 4 mobile, the moving range of the second probe assembly 5 is limited in first through hole 11;With When, the first probe assembly 3 and the second probe assembly 5 pass through first through hole 11 and then touch the surface of wiring board to be detected, come Impedance to wiring board detected so that the first probe assembly 3 and the second probe assembly 5 arrange on chassis 1 more compact, The space taking is less.
It is further preferred that the profile of first through hole 11 is rectangle, or square, or circular, or other shapes Shape can.
As deformation, the number of above-mentioned first through hole 11 can be two, three, four fire five etc., concrete arranges Depending on number is according to actually used situation.
As further preferred embodiment, above-mentioned probe apparatus also include whirligig, for driving chassis 1 to carry Dynamic first probe assembly 3 and the second probe assembly 5 rotate in the horizontal direction, to change the first probe assembly 3 and the second probe Assembly 5 angle in the horizontal direction, the convenient location point to various location on wiring board carries out testing impedance.
Preferably, whirligig includes rotating disk 91, at least one connecting post 92, fixed block 94 and the 3rd driver 93.Wherein, rotating disk 91 is parallel with chassis 1;The top of connecting post 92 is fixed in rotating disk 91, and bottom is fixed on chassis 1; 3rd driver 93 is fixed on fixed block 94, and its rotary shaft is connected to rotating disk 91 through fixed block 94.3rd driver 93 Rotating disk 91 is driven to drive the first probe assembly 3 of setting and the second probe assembly 5 on chassis 1 and chassis to turn in the horizontal direction Dynamic, realize carrying out testing impedance to the location point of various location on wiring board.
Further, as shown in Fig. 2 starting two the second through holes 16 on chassis 1, connecting post 92 is two, rotating disk 91 On correspondingly open up two third through-holes, the bottom of connecting post 92 is fixed on the second through hole 16, and top is fixed on third through-hole On.More preferably, connecting post 92 is screw rod, and screw tip is located on third through-hole, and bottom is located on the second through hole 16, then uses The bottom of screw rod and top are locked on the second through hole 16 and third through-hole nut respectively.
As deformation, whirligig can also be other devices that chassis 1 can be driven in prior art to rotate.
As more preferably preferred embodiment, above-mentioned probe apparatus also include the second lowering or hoisting gear 10, solid for driving Determining block 94 drives chassis 1 to move up and down.
Preferred as the second lowering or hoisting gear 10, as shown in fig. 6, the second lowering or hoisting gear 10 includes two being vertically arranged Three track plates 102, are slidably arranged in two the 3rd slide blocks 103 on two the 3rd track plates 102, the 3rd being vertically arranged respectively Fixed structure 101, the 3rd fixed structure 101 side is fixed on the 3rd slide block 103, and opposite side is fixed on fixed block 94;With In the fourth drive 104 driving the 3rd fixed structure 101 to slide on the 3rd track plates 102.
In the presence of fourth drive 104, the 3rd fixed structure 101 is driven to drive fixed block 94 in the 3rd track plates Slide on 102, and then disk 91, chassis 1 and the One On The Chassis first probe assembly 3 and second probe assembly 5 overall edge are rotated Move up and down on vertical direction.
It is further preferred that setting block piece is so that the 3rd slide block 103 on the top and bottom of the 3rd track plates 102 The scope that in the vertical direction slides is limited in the space between two block pieces.
Additionally, the 3rd track plates 102 in the second above-mentioned lowering or hoisting gear 10 are fixed on frame by the second connecting plate 17 On;Four-drive device is arranged on the second connecting plate 17, and its drive shaft is connected to the 3rd fixed knot through the second connecting plate 17 Structure 101;Or the 3rd track plates 102 are fixed on other supports by the second connecting plate 17, or the spy with impedance detection On the miscellaneous part that head device matches, as the support member of whole probe apparatus.
As deformation, the second lowering or hoisting gear 10 can also be the lowering or hoisting gear of other structures in prior art.
As preferred embodiment, as shown in Fig. 2 the first probe assembly 3 in above-mentioned embodiment or the second probe Assembly 5 includes casing 12, lid 13, probe 14, binding post 15 and cable.Casing 12 is vertically arranged, the side wall of casing 12 It is fixed on rebound 63, opposite side wall is opening, lid 13 is arranged on this opening;Probe 14 is located on casing 12, its One end is located in casing 12, and the other end is located at outside casing 12, and extends downwardly;Binding post 15 is arranged on the top of casing 12 On, and be located at outside casing 12 and be connected to tester;Cable is located in casing 12, and bottom is connected to one end of probe 14, top Portion is connected to binding post 15.
As deformation, the first probe assembly 3 or the second probe assembly 5 can also be visited for impedance detection of the prior art Head.
Obviously, above-described embodiment is only intended to clearly illustrate example, and the not restriction to embodiment.Right For those of ordinary skill in the art, can also make on the basis of the above description other multi-forms change or Change.There is no need to be exhaustive to all of embodiment.And the obvious change thus extended out or Change among the protection domain created still in the utility model.

Claims (12)

1. a kind of probe apparatus of impedance detection are it is characterised in that include
Chassis (1);
First fixed structure (2), perpendicular to described chassis (1) setting, bottom is fixed on described chassis (1);
At least one first probe assembly (3), is vertically arranged on the end of described first fixed structure (2);
Second fixed structure (4), parallel with described first fixed structure (2), it is movably disposed at institute by driving means (8) State on chassis (1);
At least one second probe assembly (5), is vertically arranged on the end of described second fixed structure (4), with described first Probe assembly (3) correspondingly relative to and coordinate the impedance for detecting wiring board;Shifting in described second fixed structure (4) Under dynamic, described second probe assembly (5) is driven to move towards or away from described first probe assembly (3) direction;
At least two first lowering or hoisting gears (6), at least one described first lowering or hoisting gear (6) is arranged on described first fixed structure (2) on end, and at least another described first lowering or hoisting gear (6) is arranged on the end of described second fixed structure (4), For driving described first probe assembly (3) and the second probe assembly (5) vertically to move up and down respectively.
2. impedance detection according to claim 1 probe apparatus it is characterised in that: also include at least two first connection Plate (7), at least one described first connecting plate (7) is fixed on described first fixed structure (2), and at least another described One connecting plate (7) is fixed on described second fixed structure (4);
Wherein, the one end of described first connecting plate (7) being fixed on described first fixed structure (2) stretches out in described first Fixed structure (2) is provided with one end of described first probe assembly (3), forms the first sidepiece with described first fixed structure (2) Installing space, at least one described first lowering or hoisting gear (6) is arranged in described first sidepiece installing space, and is fixed on this institute State on the first connecting plate (7);
The one end of described first connecting plate (7) being fixed on described second fixed structure (4) stretches out in described second fixed knot Structure (4) is provided with one end of described second probe assembly (5), forms the second sidepiece with described second fixed structure (4) and installs sky Between, at least another described first lowering or hoisting gear (6) is arranged in described second sidepiece installing space, and be fixed on this described On one connecting plate (7).
3. impedance detection according to claim 2 probe apparatus it is characterised in that: described first lowering or hoisting gear (6) bag Include
First track plates (61), are vertically arranged in described first fixed structure (2) or the end wall of the second fixed structure (4) On;
First slide block (62), is slidably arranged on described first track plates (61);
Rebound (63), is vertically arranged, and side wall is fixed on described first slide block (62), and opposite side wall is fixed described first Probe assembly (3) or the second probe assembly (5);
First driver (64), is fixed on described first connecting plate (7), and its drive shaft passes through described first connecting plate (7) even It is connected to described rebound (63).
4. the impedance detection according to any one of claim 1-3 probe apparatus it is characterised in that: described first probe Assembly (3) is two, and described second probe assembly (5) is two, and two described first probe assemblies (3) are separately fixed at described On the both ends of first fixed structure (2);Two described second probe assemblies (5) are separately fixed at described second fixed structure (4) on both ends.
5. the impedance detection according to Claims 2 or 3 probe apparatus it is characterised in that: described second fixed structure (4) Including
Level board (41), described first connecting plate (7) is fixed on level board (41);
Two cant boards (42), are separately fixed on the both ends of described level board (41), and perpendicular to described level board (41) Extend downwardly, described second probe assembly (5) is arranged on the wall outer surface of described cant board (42).
6. impedance detection according to claim 5 probe apparatus it is characterised in that: described driving means (8) include
Installing plate (81), parallel with described level board (41), bottom is fixed on described chassis (1);
Screw mandrel (821) assembly, positioned at the side relative with described first fixed structure (2) of described second fixed structure (4), wraps Include screw mandrel (821) and the nut block (822) being set on described screw mandrel (821), described nut block (822) is fixed on level board (41) lower section, described screw mandrel (821) sequentially passes through described installing plate (81), the lower section of described level board (41), and end and stretches Enter to be opened in the through hole on described first fixed structure (2);
Second driver (85), is fixed on described installing plate (81), for driving described screw mandrel (821) to rotate;
Rotate limiter assembly, rotate in a circumferential direction under the drive of described screw mandrel (821) for limiting nut block (822).
7. the probe apparatus of impedance detection according to claim 6 are it is characterised in that described rotation limiter assembly includes
Two the second track plates (83), are vertically arranged and parallel to described screw mandrel (821), two described second track plates (83) Bottom be fixed on described chassis (1), and be located at described screw mandrel (821) both sides;
At least two second slide blocks (84), at least one described second slide block (84) is slidably arranged in described second track plates (83), on, the two ends bottom of the lower section of described level board (41) is respectively fixed with least one described second slide block (84).
8. the impedance detection according to claim 6 or 7 probe apparatus it is characterised in that: open up on described chassis (1) to Few two first through holes (11);
The bottom two ends of described first fixed structure (2) have the projection (21) extending downwardly, and two described projections (21) are respectively In a described first through hole (11), so that described first probe assembly (3) is located in described first through hole (11);
Two described cant boards (42) of described second fixed structure (4) are located in a described first through hole (11) respectively;With Described second probe assembly (5) is made to be located in described first through hole (11).
9. the impedance detection according to any one of claim 1-3 probe apparatus it is characterised in that: also include rotating dress Put, for driving described chassis (1) to drive described first probe assembly (3) and the second probe assembly (5) to revolve in the horizontal direction Turn.
10. impedance detection according to claim 9 probe apparatus it is characterised in that: described whirligig includes
Rotating disk (91), parallel with described chassis (1);
At least one connecting post (92), bottom is fixed on described chassis (1), and top is fixed on the bottom of described rotating disk (91) On;
Fixed block (94);
3rd driver (93), is fixed on described fixed block (94), and its rotary shaft is connected to institute through described fixed block (94) State rotating disk (91).
The probe apparatus of 11. impedance detection according to claim 10 it is characterised in that: also include the second lowering or hoisting gear (10), for driving described fixed block (94) to drive described chassis (1) to move up and down.
The probe apparatus of 12. impedance detection according to claim 11 it is characterised in that: described second lowering or hoisting gear (10) Including
3rd track plates (102), are two, are vertically arranged;
3rd slide block (103), is two, is slidably arranged in respectively on described 3rd track plates (102);
3rd fixed structure (101), is vertically arranged, and side is fixed on described 3rd slide block (103), and opposite side is fixed on described On fixed block (94);
Fourth drive (104), for driving described 3rd fixed structure (101) in the upper slip of described 3rd track plates (102).
CN201620514588.7U 2016-05-31 2016-05-31 Impedance detection's probe unit Withdrawn - After Issue CN205898897U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201620514588.7U CN205898897U (en) 2016-05-31 2016-05-31 Impedance detection's probe unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201620514588.7U CN205898897U (en) 2016-05-31 2016-05-31 Impedance detection's probe unit

Publications (1)

Publication Number Publication Date
CN205898897U true CN205898897U (en) 2017-01-18

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201620514588.7U Withdrawn - After Issue CN205898897U (en) 2016-05-31 2016-05-31 Impedance detection's probe unit

Country Status (1)

Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105911355A (en) * 2016-05-31 2016-08-31 南京协辰电子科技有限公司 Probe device for impedance detection

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105911355A (en) * 2016-05-31 2016-08-31 南京协辰电子科技有限公司 Probe device for impedance detection
CN105911355B (en) * 2016-05-31 2018-11-09 南京协辰电子科技有限公司 A kind of probe apparatus of impedance detection

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