CN205787014U - A kind of D.C. contactor main contacts testing circuit - Google Patents
A kind of D.C. contactor main contacts testing circuit Download PDFInfo
- Publication number
- CN205787014U CN205787014U CN201620478847.5U CN201620478847U CN205787014U CN 205787014 U CN205787014 U CN 205787014U CN 201620478847 U CN201620478847 U CN 201620478847U CN 205787014 U CN205787014 U CN 205787014U
- Authority
- CN
- China
- Prior art keywords
- optocoupler
- pin
- connects
- circuit
- mcu
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 50
- 230000003287 optical effect Effects 0.000 claims abstract description 27
- 238000001514 detection method Methods 0.000 claims abstract description 16
- 239000004821 Contact adhesive Substances 0.000 claims abstract description 11
- 230000000737 periodic effect Effects 0.000 claims abstract description 8
- 101100236764 Caenorhabditis elegans mcu-1 gene Proteins 0.000 claims description 12
- 229910052982 molybdenum disulfide Inorganic materials 0.000 claims description 7
- 102100039435 C-X-C motif chemokine 17 Human genes 0.000 claims description 6
- 101000889048 Homo sapiens C-X-C motif chemokine 17 Proteins 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 6
- 238000002955 isolation Methods 0.000 abstract description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000003292 diminished effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
This utility model relates to a kind of D.C. contactor main contacts testing circuit, the Periodic signal drive circuit including isolating transformer, being connected on the former avris of isolating transformer, optical coupled switch circuit and the contact adhesive testing circuit of the secondary side being connected on isolating transformer: contact adhesive testing circuit includes two optocoupler testing circuits in parallel;Periodic signal drive circuit is for making an optocoupler testing circuit and optical coupled switch circuit turn-on form a measure loop in the conducting of the first detection time, make another optocoupler testing circuit and optical coupled switch circuit turn-on form another measure loop in the conducting of the second detection time, thus realize D.C. contactor main contacts attracting state is detected.This utility model is that main auxiliary testing circuit is as detection D.C. contactor main contacts duty by using transformator, insulating requirements can be accomplished in safety range and the nonpolarity requirement of wiring, accomplish the security isolation of high pressure and low pressure, avoid the generation of danger, wiring simultaneously is any, and does not has dividing of positive-negative polarity.
Description
Technical field
This utility model belongs to D.C. contactor detection technique field, is specifically related to a kind of D.C. contactor main contacts testing circuit.
Background technology
What D.C. contactor controlled is high pressure, big electric current, its position installed is difficult to that touch and suitable danger often, but have to grasp its duty accurately in real time, therefore its state can only be accurately judged by indirect and reliable method, the most not only avoid direct contact with high pressure but also can accurately judge, not only can guarantee that safety but also can monitor in real time, reach to make the best of both worlds.
Current D.C. contactor divides in terms of big and can be divided into two big classes: a class is band auxiliary contact;Another kind of without auxiliary contact.Needing D.C. contactor to be band auxiliary contact in many application scenarios, because only that we could judge that its main contacts is Guan Bi or disconnects by auxiliary contact, its state is that comparison is crucial, often involves safety problem.If the D.C. contactor used in high-voltage detecting circuit judges that state breaks down, it will cause the most serious consequence.
The auxiliary contact of the relay of band auxiliary contact are often easier to lose efficacy and usually occurred in reality uses that auxiliary contact damaged and main contacts is working properly currently on the market, and it does not play due effect as main contacts duty detection feedback.If in use, D.C. contactor breaks down, and can produce a series of problem, as high-tension circuit cannot go up high pressure, high-tension circuit cannot disconnect and cannot accurately judge the various safety problems such as its state.
The auxiliary contact of D.C. contactor easily lost efficacy and mainly reached the critical life-span along with long-time use of catalyst at present, shell fragment elasticity is diminished, during conducting, elastic force is inadequate so that do not reach contact thus cause D.C. contactor main contacts be conducting and auxiliary contact are off.Although the D.C. contactor of band auxiliary contact is high relative to the price without auxiliary contact of equivalent specifications at present, but the quantity of many catalyst manufacturer production band auxiliary contact is fewer than the quantity without auxiliary contact, it is primarily due to auxiliary contact easily lost efficacy, causes the life-span of whole catalyst and then to decline.Therefore, for the D.C. contactor duty neither one system as control device, perfect, reliable monitoring means in high-voltage detecting circuit in use.
That is its duty, as the device of a big electric current of Small current control, is not the most accomplished the function that main circuit monitors in real time by D.C. contactor at present.D.C. contactor is likely to occur the phenomenons such as viscous dead, main contacts contact position disconnection at work, causes voltage detecting circuit to be in abnormal operating state.And the most it is not carried out implementing monitoring in main circuit, thus it cannot be guaranteed that whether being in normal operating conditions of circuit.
At present, flourish along with new-energy automobile, D.C. contactor is widely used in the car load high pressure controlling new forms of energy pure electric automobile, can can the duty of its main contacts concern automobile and connect the high pressure of high pressure and automobile normally and disconnect safely, therefore detects the duty moment of its main contacts and monitoring is just particularly important.
Utility model content
The purpose of this utility model is to solve above-mentioned technical problem and provide a kind of non-polar D.C. contactor main contacts testing circuit.
For achieving the above object, this utility model adopts the following technical scheme that
A kind of D.C. contactor main contacts testing circuit, connect Periodic signal drive circuit, the two ends of one secondary coil in secondary side including the two ends of the former avris primary coil of isolating transformer T1, described isolating transformer T1 and connect the voltage input end of optical coupled switch circuit and contact adhesive testing circuit respectively;Described Periodic signal drive circuit includes that the first drive circuit and the second drive circuit, described contact adhesive testing circuit include two optocoupler testing circuits in parallel;The voltage output end of described optical coupled switch circuit is connected to the binding post S1 that a pole with D.C. contactor is connected, and the voltage output end of described contact adhesive testing circuit is connected to the binding post S2 that another pole with D.C. contactor is connected;Described first drive circuit is used for turning in the first detection time and made by isolating transformer T1 an optocoupler testing circuit to form a measure loop with optical coupled switch circuit turn-on and export high level at the first test point, and described second drive circuit is used for turning in the second detection time and made by isolating transformer T1 another optocoupler testing circuit and optical coupled switch circuit turn-on to form another measure loop and export high level at the second test point.
The outfan of described first drive circuit and the second drive circuit two ends with the former avris primary coil of described isolating transformer respectively are connected, described first drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS1, N-MOS2, and described second drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS3, N-MOS4;The grid of described N-MOS1 connects the MCU-1 end of controller MCU, source electrode connects 1 end of primary coil of isolating transformer T1, drain electrode connects VCC voltage end, and the grid of described N-MOS2 connects the MCU-1 end of controller MCU, source ground, drain electrode connect 2 ends of primary coil of isolating transformer T1;The grid of described N-MOS4 connects the MCU-2 end of controller MCU, source ground, drain electrode connect 1 end of primary coil of isolating transformer T1;The grid of described N-MOS3 connects the MCU-2 end of controller MCU, source electrode connects 2 ends of primary coil of isolating transformer T1, drain electrode connects VCC voltage end.
Said two optocoupler testing circuit include two optocouplers OP1, OP2, pin 3 ground connection of described optocoupler OP2, pin 4 connect the MCU-1 end of controller MCU and connect VCC1 voltage by a resistance R7, pin 1 connects with the pin 2 of optocoupler OP1 through diode D1, resistance R4;The pin 2 of optocoupler OP2 connects the pin 1 of optocoupler OP1 through resistance R5, diode D2;The pin 1 of optocoupler OP1 connects pin 3 ground connection of binding post S2 optocoupler OP1 through resistance R3, and pin 4 connects the MCU-3 end of controller MCU and connects VCC1 voltage by a resistance R6;One termination 4 ends of isolating transformer T1, the other end of one resistance R1 is connected on the circuit that the pin 1 of optocoupler OP2 connects with diode D1.
Said two optocoupler OP1, OP2 are respectively associated two audions Q1, Q2 of connection, and the base stage of audion Q1 connects the pin 2 of optocoupler OP1, colelctor electrode connects the pin 1 of optocoupler OP1, emitter stage is connected on the connecting line of resistance R4 and diode D1;The base stage of audion Q connects the pin 2 of optocoupler OP2, colelctor electrode is connected on the circuit that the pin 1 of diode D1 and optocoupler OP1 connects, emitter stage is connected on the connecting line of resistance R5 and diode D2.
Described optical coupled switch circuit includes an optical coupled switch OP3, and the pin 1 of optical coupled switch OP3 connects the MCU-5 end of controller MCU through a resistance R8, pin 2 ground connection, pin 3 connect binding post S1, pin 4 and be connected to 5 ends of isolating transformer T1 through resistance R2.
This utility model is that main auxiliary testing circuit is as detection D.C. contactor main contacts duty by using transformator, insulating requirements can be accomplished in safety range and the nonpolarity requirement of wiring, accomplish the security isolation of high pressure and low pressure, avoid the generation of danger, wiring simultaneously is any, does not has dividing of positive-negative polarity.
Accompanying drawing explanation
The circuit diagram of the D.C. contactor main contacts testing circuit that Fig. 1 provides for this utility model embodiment.
Detailed description of the invention
Below, in conjunction with example, substantive distinguishing features of the present utility model and advantage are further described, but this utility model is not limited to listed embodiment.
This utility model D.C. contactor main contacts testing circuit is to be effectively isolated former limit low pressure and secondary high pressure by transformator;The sense of current is not limited to single simultaneously so that wiring is any, does not i.e. differentiate between positive-negative polarity.
Shown in Figure 1, a kind of D.C. contactor main contacts testing circuit, including isolating transformer T1, the two ends connection Periodic signal drive circuit of the former avris primary coil of described isolating transformer T1, the two ends of one secondary coil in secondary side connect the voltage input end of optical coupled switch circuit and contact adhesive testing circuit respectively: described Periodic signal drive circuit includes that the first drive circuit and the second drive circuit, described contact adhesive testing circuit include two optocoupler testing circuits in parallel;The voltage output end of described optical coupled switch circuit is connected to the binding post S1 that a pole with D.C. contactor is connected, and the voltage output end of described contact adhesive testing circuit is connected to the binding post S2 that another pole with D.C. contactor is connected;Described first drive circuit is used for turning in the first detection time and made by isolating transformer T1 an optocoupler testing circuit to form a measure loop with optical coupled switch circuit turn-on and export high level at the first test point, and described second drive circuit is used for turning in the second detection time and made by isolating transformer T1 another optocoupler testing circuit and optical coupled switch circuit turn-on to form another measure loop and export high level at the second test point.
The voltage output end of described first drive circuit and the second drive circuit two ends with the former avris primary coil of described isolating transformer respectively are connected, described first drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS1, N-MOS2, and described second drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS3, N-MOS4;The grid of described N-MOS1 connects the MCU-1 end of controller MCU, source electrode connects 1 end of primary coil of isolating transformer T1, drain electrode connects VCC voltage end, and the grid of described N-MOS2 connects the MCU-1 end of controller MCU, source ground, drain electrode connect 2 ends of primary coil of isolating transformer T1;The grid of described N-MOS4 connects the MCU-2 end of controller MCU, source ground, drain electrode connect 1 end of primary coil of isolating transformer T1;The grid of described N-MOS3 connects the MCU-2 end of controller MCU, source electrode connects 2 ends of primary coil of isolating transformer T1, drain electrode connects VCC voltage end.
Said two optocoupler testing circuit include two optocouplers OP1, OP2, pin 3 ground connection of described optocoupler OP2, pin 4 connect the MCU-1 end of controller MCU and connect VCC1 voltage by a resistance R7, pin 1 connects with the pin 2 of optocoupler OP1 through diode D1, resistance R4;The pin 2 of optocoupler OP2 connects the pin 1 of optocoupler OP1 through resistance R5, diode D2;The pin 1 of optocoupler OP1 meets binding post S2 (binding post S2 is for being connected to a pole of D.C. contactor) through resistance R3, and pin 3 ground connection of optocoupler OP1, pin 4 connects the MCU-3 end of controller MCU and connects VCC1 voltage by a resistance R6;One termination 4 ends of isolating transformer T1, the other end of one resistance R1 is connected on the circuit that the pin 1 of optocoupler OP2 connects with diode D1.
Further, said two optocoupler OP1, OP2 are respectively associated two audions Q1, Q2 of connection, and concrete, the base stage of audion Q1 connects the pin 2 of optocoupler OP1, colelctor electrode connects the pin 1 of optocoupler OP1, emitter stage is connected on the connecting line of resistance R4 and diode D1;The base stage of audion Q connects the pin 2 of optocoupler OP2, colelctor electrode is connected on the circuit that the pin 1 of diode D1 and optocoupler OP1 connects, emitter stage is connected on the connecting line of resistance R5 and diode D2.
Described optical coupled switch circuit includes an optical coupled switch OP3, and the pin 1 of optical coupled switch OP3 connects the MCU-5 end of controller MCU through a resistance R8, pin 2 ground connection, pin 3 meet binding post S1 (binding post S1 is for being connected to another pole of D.C. contactor), pin 4 is connected to 5 ends of isolating transformer T1 through resistance R2.
During work, need first the two of testing circuit binding posts S1, S2 to be connected to two poles of D.C. contactor, then power on to low-pressure side.The operation principle of circuit is as follows:
1, after low pressure powers on, controller MCU drives MCU-5 end that optical coupled switch OP3 is turned on.If now D.C. contactor main contacts does not has adhesive and two ends to have corresponding pressure reduction, can detect that in controller MCU the level of MCU-3 end or MCU-4 end is low level;If D.C. contactor main contacts does not has adhesive and two ends without pressure reduction, can detect that in controller MCU the level of MCU-3 end and MCU-4 end is all high level.
2, controller MCU timesharing (cycle is t) and Continuous Drive MCU-1 end and MCU-2 end, driving the MCU-1 end time is t1, and driving the MCU-2 end time is t2, t1=t1+t2.Twice detection, i.e. twice detection of t1, t2 is made respectively in cycle T 1.When t1, MCU-1 end drives high level that N-MOS1 Yu N-MOS2 is turned on, transformer primary side 1 terminal voltage is identical with the voltage of secondary 4 end, Kopin voltage makes optocoupler OP2 turn on after resistance R1, again through resistance R5, diode D2, resistance R3, binding post S2, S1, optical coupled switch OP3 and resistance R2 forms measure loop;Now, MCU-3 end detects that into low level, MCU-4 end detects as high level.
When t2, MCU-2 end drives high level that N-MOS3 Yu N-MOS4 is turned on, transformer primary side 2 terminal voltage is identical with the voltage of secondary 5 end, Kopin voltage makes optical coupled switch OP3, optocoupler OP1 turn on after resistance R2, then forms measure loop through resistance R3, diode D1, resistance R4, binding post S1, S2;Now, MCU-3 end detects that into high level, MCU-4 end detects as low level.Through twice detection, it is ensured that the accuracy of detection.
Further, since optocoupler OP1, OP2 can only pass through small area analysis, being likely to result in damage during big electric current, therefore, audion Q1 and audion Q2 in parallel reaches shunting action respectively, plays optocoupler OP1, the overcurrent protection function of optocoupler OP2.
3, low and high level detected discontinuously when MCU-3 end and MCU-4 end, illustrate that now D.C. contactor main contacts is adhesive.
This utility model utilizes transformator conversion can make insulation in safety range and the nonpolarity requirement of wiring, accomplishes the security isolation of high pressure and low pressure, it is to avoid the generation that Keep Clear-High Voltage.
This utility model achieves the real time monitoring function of battery management system (BMS system) mesohigh testing circuit D.C. contactor duty, use transformer scheme, make insulating requirements can do in safety range, accomplish the security isolation of high pressure and low pressure, it is to avoid dangerous generation;Binding post does not differentiates between polarity simultaneously, expands its range.
The above is only preferred implementation of the present utility model; it should be pointed out that, for those skilled in the art, on the premise of without departing from this utility model principle; can also make some improvements and modifications, these improvements and modifications also should be regarded as protection domain of the present utility model.
Claims (5)
1. a D.C. contactor main contacts testing circuit, it is characterized in that, connect Periodic signal drive circuit, the two ends of one secondary coil in secondary side including the two ends of the former avris primary coil of isolating transformer T1, described isolating transformer T1 and connect the voltage input end of optical coupled switch circuit and contact adhesive testing circuit respectively;Described Periodic signal drive circuit includes that the first drive circuit and the second drive circuit, described contact adhesive testing circuit include two optocoupler testing circuits in parallel;The voltage output end of described optical coupled switch circuit is connected to the binding post S1 that a pole with D.C. contactor is connected, and the voltage output end of described contact adhesive testing circuit is connected to the binding post S2 that another pole with D.C. contactor is connected;Described first drive circuit is used for turning in the first detection time and made by isolating transformer T1 an optocoupler testing circuit to form a measure loop with optical coupled switch circuit turn-on and export high level at the first test point, and described second drive circuit is used for turning in the second detection time and made by isolating transformer T1 another optocoupler testing circuit and optical coupled switch circuit turn-on to form another measure loop and export high level at the second test point.
The most according to claim 1, D.C. contactor main contacts testing circuit, it is characterised in that described first drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS1, N-MOS2, described second drive circuit includes two N road ditch metal-oxide-semiconductors of N-MOS3, N-MOS4;The grid of described N-MOS1 connects the MCU-1 end of controller MCU, source electrode connects 1 end of primary coil of isolating transformer T1, drain electrode connects VCC voltage end, and the grid of described N-MOS2 connects the MCU-1 end of controller MCU, source ground, drain electrode connect 2 ends of primary coil of isolating transformer T1;The grid of described N-MOS4 connects the MCU-2 end of controller MCU, source ground, drain electrode connect 1 end of primary coil of isolating transformer T1;The grid of described N-MOS3 connects the MCU-2 end of controller MCU, source electrode connects 2 ends of primary coil of isolating transformer T1, drain electrode connects VCC voltage end.
D.C. contactor main contacts testing circuit the most according to claim 1 or claim 2, it is characterized in that, said two optocoupler testing circuit include two optocouplers OP1, OP2, pin 3 ground connection of described optocoupler OP2, pin 4 connect the MCU-1 end of controller MCU and connect VCC1 voltage by a resistance R7, pin 1 connects with the pin 2 of optocoupler OP1 through diode D1, resistance R4;The pin 2 of optocoupler OP2 connects the pin 1 of optocoupler OP1 through resistance R5, diode D2;The pin 1 of optocoupler OP1 connects pin 3 ground connection of binding post S2, optocoupler OP1 through resistance R3, and pin 4 connects the MCU-3 end of controller MCU and connects VCC1 voltage by a resistance R6;One termination 4 ends of isolating transformer T1, the other end of one resistance R1 is connected on the circuit that the pin 1 of optocoupler OP2 connects with diode D1.
D.C. contactor main contacts testing circuit the most according to claim 3, it is characterized in that, said two optocoupler OP1, OP2 are respectively associated connection two audions Q1, Q2, and the base stage of audion Q1 connects the pin 2 of optocoupler OP1, colelctor electrode connects the pin 1 of optocoupler OP1, emitter stage is connected on the connecting line of resistance R4 and diode D1;The base stage of audion Q connects the pin 2 of optocoupler OP2, colelctor electrode is connected on the circuit that the pin 1 of diode D1 and optocoupler OP1 connects, emitter stage is connected on the connecting line of resistance R5 and diode D2.
5. according to D.C. contactor main contacts testing circuit described in any one of claim 1,2 or 4, it is characterized in that, described optical coupled switch control circuit includes an optical coupled switch OP3, and the pin 1 of optical coupled switch OP3 connects the MCU-5 end of controller MCU through a resistance R8, pin 2 ground connection, pin 3 connect binding post S1, pin 4 and be connected to 5 ends of isolating transformer T1 through resistance R2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201620478847.5U CN205787014U (en) | 2016-05-24 | 2016-05-24 | A kind of D.C. contactor main contacts testing circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201620478847.5U CN205787014U (en) | 2016-05-24 | 2016-05-24 | A kind of D.C. contactor main contacts testing circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
CN205787014U true CN205787014U (en) | 2016-12-07 |
Family
ID=58113255
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201620478847.5U Active CN205787014U (en) | 2016-05-24 | 2016-05-24 | A kind of D.C. contactor main contacts testing circuit |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN205787014U (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108448725A (en) * | 2018-04-12 | 2018-08-24 | 哈工大机器人(合肥)国际创新研究院 | A kind of power control circuit and control method |
CN108832590A (en) * | 2018-07-13 | 2018-11-16 | 浙江英洛华新能源科技有限公司 | overcurrent protection relay |
CN109031107A (en) * | 2018-07-13 | 2018-12-18 | 浙江英洛华新能源科技有限公司 | Detect the electron assistant contact circuit of high-voltage relay contact on-off |
CN109709479A (en) * | 2018-12-29 | 2019-05-03 | 深圳市英威腾电动汽车驱动技术有限公司 | Contactor adhesion detection circuit and contactor adhesion detection method |
CN111983298A (en) * | 2020-08-24 | 2020-11-24 | 南京磐能电力科技股份有限公司 | Switching value acquisition circuit and method |
CN117110946A (en) * | 2023-10-25 | 2023-11-24 | 西安热工研究院有限公司 | Analog signal output broken line detection circuit |
-
2016
- 2016-05-24 CN CN201620478847.5U patent/CN205787014U/en active Active
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108448725A (en) * | 2018-04-12 | 2018-08-24 | 哈工大机器人(合肥)国际创新研究院 | A kind of power control circuit and control method |
CN108448725B (en) * | 2018-04-12 | 2023-06-27 | 合肥哈工特安智能科技有限公司 | Power supply control circuit and control method |
CN108832590A (en) * | 2018-07-13 | 2018-11-16 | 浙江英洛华新能源科技有限公司 | overcurrent protection relay |
CN109031107A (en) * | 2018-07-13 | 2018-12-18 | 浙江英洛华新能源科技有限公司 | Detect the electron assistant contact circuit of high-voltage relay contact on-off |
CN108832590B (en) * | 2018-07-13 | 2023-09-29 | 浙江英洛华新能源科技有限公司 | Overcurrent protection relay |
CN109031107B (en) * | 2018-07-13 | 2023-10-03 | 浙江英洛华新能源科技有限公司 | Electronic auxiliary contact circuit for detecting on-off of high-voltage relay contact |
CN109709479A (en) * | 2018-12-29 | 2019-05-03 | 深圳市英威腾电动汽车驱动技术有限公司 | Contactor adhesion detection circuit and contactor adhesion detection method |
CN111983298A (en) * | 2020-08-24 | 2020-11-24 | 南京磐能电力科技股份有限公司 | Switching value acquisition circuit and method |
CN117110946A (en) * | 2023-10-25 | 2023-11-24 | 西安热工研究院有限公司 | Analog signal output broken line detection circuit |
CN117110946B (en) * | 2023-10-25 | 2024-01-23 | 西安热工研究院有限公司 | Analog signal output broken line detection circuit |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN205787014U (en) | A kind of D.C. contactor main contacts testing circuit | |
CN103427607B (en) | The drive circuit of insulated gate bipolar transistor | |
CN107345979B (en) | Insulator leakage current on-line monitoring system | |
CN203299327U (en) | IGBT (Insulated Gate Bipolar Transistor) module short circuit test apparatus | |
CN103105572B (en) | Device for testing IGBT module | |
CN203481783U (en) | Short circuit and overcurrent protection circuit and mass production test equipment | |
CN106655145B (en) | A kind of battery power feeds electric voltage reverse-connection protection circuit | |
CN201270416Y (en) | Reverse connection protection circuit | |
CN103490374A (en) | Mass production test device and short-circuit current foldback circuit thereof | |
CN204304965U (en) | A kind of IGBT push-pull driver circuit | |
CN102998620B (en) | Device and method for quick online fault detection of high voltage thyristor valve block | |
CN203117259U (en) | Direct current leakage detection circuit | |
CN104198926A (en) | Anti-trip loop test device for breaker and control method thereof | |
CN203788174U (en) | Impact-resistant DC high-voltage generator | |
CN220234179U (en) | Overcurrent protection circuit | |
CN108181528B (en) | High-voltage cable differential protection checking system in no-load state | |
CN201917605U (en) | High-voltage alive passive indicator | |
CN204597453U (en) | Electric prospection switch | |
CN106771907A (en) | Low voltage equipment intellectuality power frequency withstanding voltage pilot system and method | |
CN207675865U (en) | A kind of high-tension cable differential protection check system of no load condition | |
CN102957133A (en) | IGBT (Insulated Gate Bipolar Translator) over-current withdraw protection circuit of frequency converter | |
CN203513016U (en) | Power supply open-phase protection device of lift control cabinet | |
CN211123134U (en) | IGBT characteristic testing device | |
CN212229096U (en) | IGBT drive plate aging test circuit | |
CN112834869A (en) | Differential protection calibration system for large-length submarine cable in no-load state |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
PP01 | Preservation of patent right |
Effective date of registration: 20180428 Granted publication date: 20161207 |
|
PP01 | Preservation of patent right | ||
PD01 | Discharge of preservation of patent |
Date of cancellation: 20210428 Granted publication date: 20161207 |
|
PD01 | Discharge of preservation of patent | ||
PP01 | Preservation of patent right |
Effective date of registration: 20210428 Granted publication date: 20161207 |
|
PP01 | Preservation of patent right | ||
PD01 | Discharge of preservation of patent |
Date of cancellation: 20240428 Granted publication date: 20161207 |
|
PD01 | Discharge of preservation of patent |