CN205483461U - Pin grid array type wrapper spare test bench - Google Patents
Pin grid array type wrapper spare test bench Download PDFInfo
- Publication number
- CN205483461U CN205483461U CN201521138640.5U CN201521138640U CN205483461U CN 205483461 U CN205483461 U CN 205483461U CN 201521138640 U CN201521138640 U CN 201521138640U CN 205483461 U CN205483461 U CN 205483461U
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- pin grid
- array type
- grid array
- testing stand
- test bench
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Abstract
Pin grid array type wrapper spare test bench, the whole cube structure that is of test bench, wherein heart horizontal direction is opened has square horizontal through -hole, and its upper cover plate is installed respectively in the test bench top and bottom through the screw with lower apron, has a plurality of convex -concave grooves that can install needle bars structure device in upper cover plate and lower cover inboard side.
Description
Technical field
The invention belongs to testing stand field, be specifically related to pin grid array type packaging testing stand.
Background technology
Vibration, impact test will need to be connected with vibration, impact device by test specimen with special fixture, it is desirable to by vibration, excited by impact pass to without distortion by test specimen.Therefore vibration, the success or not of impact apparatus design are directly connected to being normally carried out of test.Vibration, impact test are under lab to simulate various vibration, shock environment, pin grid array type packaging is fastened on vibration, impact test special fixture, according to certain vibration, impact test standard and method, device is vibrated accordingly, impact test.Therefore this just requires that this vibration, impact apparatus have good contact, rigid contact, lightweight, center of gravity and symmetrical move down, fill payload more.
Summary of the invention
It is an object of the invention to propose one and relate to pin grid array type packaging testing stand, solve the problem that pin grid array type packaging originally cannot be carried out shock and vibration test.
Technical scheme is as follows: pin grid array type packaging testing stand, testing stand generally cube structure, wherein heart horizontal direction has square horizontal through hole, its upper cover plate and lower cover are separately mounted to testing stand top and bottom, have some convex-concave grooves that can install pin grid structure devices inside upper cover plate with lower cover.
Described upper cover plate and lower cover are separately mounted to testing stand top and bottom by screw.
The remarkable result of the present invention is: solve the problem that pin grid array type packaging originally cannot be carried out shock and vibration test.Reduction of expenditure, improves manufacturing schedule.
Accompanying drawing explanation
Fig. 1 is pin grid array type packaging testing stand schematic diagram of the present invention
Fig. 2 is pin grid array type packaging testing stand top view of the present invention
Fig. 3 is pin grid array type packaging testing stand upper cover plate sectional view of the present invention
Fig. 4 is pin grid array type packaging testing stand lower cover sectional view of the present invention
Detailed description of the invention
Pin grid array type packaging testing stand, as shown in Figure 1, testing stand generally cube structure, wherein heart horizontal direction has square horizontal through hole, as shown in Figure 3, Figure 4, its upper cover plate and lower cover are separately mounted to testing stand top and bottom by screw, have some convex-concave grooves that can install pin grid structure devices inside upper cover plate with lower cover.
Claims (2)
1. pin grid array type packaging testing stand, it is characterized in that: testing stand generally cube structure, wherein heart horizontal direction has square horizontal through hole, its upper cover plate and lower cover are separately mounted to testing stand top and bottom, have some convex-concave grooves that can install pin grid structure devices inside upper cover plate with lower cover.
Pin grid array type packaging testing stand the most according to claim 1, it is characterised in that: described upper cover plate and lower cover are separately mounted to testing stand top and bottom by screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521138640.5U CN205483461U (en) | 2015-12-31 | 2015-12-31 | Pin grid array type wrapper spare test bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521138640.5U CN205483461U (en) | 2015-12-31 | 2015-12-31 | Pin grid array type wrapper spare test bench |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205483461U true CN205483461U (en) | 2016-08-17 |
Family
ID=56663159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521138640.5U Active CN205483461U (en) | 2015-12-31 | 2015-12-31 | Pin grid array type wrapper spare test bench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205483461U (en) |
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2015
- 2015-12-31 CN CN201521138640.5U patent/CN205483461U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |