CN205300562U - Probe - Google Patents
Probe Download PDFInfo
- Publication number
- CN205300562U CN205300562U CN201521035881.7U CN201521035881U CN205300562U CN 205300562 U CN205300562 U CN 205300562U CN 201521035881 U CN201521035881 U CN 201521035881U CN 205300562 U CN205300562 U CN 205300562U
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- CN
- China
- Prior art keywords
- probe
- test department
- axis
- main body
- transition part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
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Abstract
The utility model relates to a probe, include: the main part, for cylindric setting, the one end of main part is equipped with and is used for and detects the connecting portion that the board is connected, the probe is for the cydariform setting, including last test portion, transition portion and lower test portion, going up test portion and being cylindric setting for round platform form setting, transition portion, lower test portion sets up for radius platform form. The beneficial effects of the utility model are that: the generating line department inclined plane of the last test portion that round platform form set up can with the incline direction matching of the lower chamfer of arc profile for probe can go out the profile value of chamfer down by the accurate measurement. The generating line department inclined plane of the lower test portion that radius platform form set up can with the incline direction matching of the last chamfer shape of arc profile for probe can go out the upward profile value of chamfer by the accurate measurement. Thereby, improve probe's measurement accuracy.
Description
Technical field
This utility model relates to CNC and processes Detection Techniques, particularly relates to a kind of probe.
Background technology
Probe, is a kind of instrument for CNC processing detection. Probe is arranged on detection board and uses, the profile of workpiece is touched under the drive of detection board, the displacement signal of detection board is fed back to according to probe, detection board calculates the profile parameters of workpiece, and compare with the theoretical reference value being pre-recorded in detection board, draw the deviation value of actual value and theoretical value. Certified products and defective products can be distinguished according to this deviation value, and this deviation value can be used in the profile of workpiece is modified, to save defective products.
Traditional probe, its probe is generally pylindrical or spherical, it is polymorphic structure for contour shape, as there is the workpiece of the curved profile of upper chamfering and lower chamfering, because the inclined plane of upper chamfering and lower chamfering is contrary, the probe and the spherical probe that cause cylinder are all difficult to find that the contact point simultaneously matching chamfering and lower chamfering, cause that the profile parameters value that detection board calculates exists bigger error with actual value, and certainty of measurement declines.
Utility model content
Based on this, for the problems referred to above, it is provided that the probe of a kind of high measurement accuracy.
A kind of probe, for being connected with detection board to realize CNC processing detection, this probe includes:
Main body, this main body is cylindric setting, and one end of main body is provided with connecting portion to be connected with described detection board;
Probe, this probe is that cydariform is arranged, and probe includes test department, transition part and lower test department; Upper test department is round table-like setting, and transition part is cylindric setting, and lower test department is that rounding mesa-shaped is arranged; The axis of upper test department, the axis of transition part, the axis of lower test department and the axis of main body all overlap; The top of upper test department is connected with the other end of main body, and the bottom of upper test department is connected with one end of transition part; The other end of transition part is connected with the top of lower test department.
Above-mentioned probe, its probe is arranged for cydariform, and the transition part of this cylindric setting is for, in the curved profile of workpiece being carried out point, determining the upper chamfering of curved profile and lower chamfered area after in dividing. The inclined-plane, bus place of the upper test department of round table-like setting can mate with the incline direction of the lower chamfering of curved profile so that probe can accurately measure the profile value of lower chamfering. The inclined-plane, bus place of the lower test department that rounding mesa-shaped is arranged can mate with the incline direction of the upper chamfering of curved profile so that probe can accurately measure the profile value of chamfering. Thus, improve the certainty of measurement of probe.
Wherein in an embodiment, probe also includes height value test department, and this height value test department is cylindric setting and one end is connected to one end that lower test department is narrower, and the axis of height value test department overlaps with the axis of lower test department.
Wherein in an embodiment, the obtuse angle that the bus of upper test department is formed with axis is sized to 130 �㡫140 ��.
Wherein in an embodiment, the obtuse angle that the bus of lower test department is formed with axis is sized to 130 �㡫140 ��.
Wherein in an embodiment, main body also includes trunk and empty avoiding portion, trunk and empty avoiding portion and is cylindric setting, and the diameter of trunk is more than the diameter in empty avoiding portion; One end of trunk and connecting portion connect, and the other end is connected with the one end in empty avoiding portion; The other end in empty avoiding portion is connected with the top of upper test department.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the probe of a kind of embodiment of the present utility model;
Fig. 2 is the schematic diagram at another visual angle of Fig. 1;
Fig. 3 is the schematic diagram in utilizing the probe shown in Fig. 1 to carry out point;
Fig. 4 utilizes the probe shown in Fig. 1 to carry out lower chamfering instrumentation plan;
Fig. 5 utilizes the probe shown in Fig. 1 to carry out upper chamfering instrumentation plan;
Fig. 6 utilizes the probe shown in Fig. 1 to carry out height value instrumentation plan;
In accompanying drawing, the implication of each label is:
10-probe;
20-main body, 21-connecting portion, 211-screw thread, 212-lockhole, 22-trunk, 23-empty avoiding portion;
30-pops one's head in, the upper test department of 31-, 311-obtuse angle alpha, 32-transition part, test department under 33-, 331-obtuse angles beta, 34-height value test department;
40-workpiece, the upper chamfering of 41-, chamfering under 42-, 43-curved profile.
Detailed description of the invention
For feature of the present utility model, technological means and the specific purposes reached, function can be further appreciated that, resolve advantage of the present utility model and spirit, by below in conjunction with accompanying drawing and detailed description of the invention, detailed description of the present utility model is further understood.
Referring to Fig. 1, it is the probe 10 of a kind of embodiment of the present utility model.
A kind of probe 10, for being connected with detection board to realize CNC processing detection, this probe 10 includes:
Main body 20, this main body 20 is cylindric setting. Main body 20 includes connecting portion 21, trunk 22 and empty avoiding portion 23. This connecting portion 21 is used for and detection board connects, and this connecting portion 21 is provided with screw thread 211 and lockhole 212. Trunk 22 and empty avoiding portion 23 are cylindric setting, and the diameter of trunk 22 is more than the diameter in empty avoiding portion 23. One end and the connecting portion 21 of trunk 22 connect, and the other end is connected with the one end in empty avoiding portion 23.
Probe 30, this probe 30 is arranged for cydariform, and probe 30 includes test department 31, transition part 32, lower test department 33 and height value test department 34. Upper test department 31 is round table-like setting, and transition part 32 is cylindric setting, and lower test department 33 is arranged for rounding mesa-shaped. The axis of upper test department 31, the axis of transition part 32, the axis of lower test department 33 and the axis of main body 20 all overlap. The top of upper test department 31 is connected with the other end in empty avoiding portion 23, and the bottom of upper test department 31 is connected with one end of transition part 32. The other end of transition part 32 is connected with the top of lower test department 33. This height value test department 34 is cylindric setting and one end is connected to one end that lower test department 33 is narrower, and the axis of height value test department 34 overlaps with the axis of lower test department 33. The obtuse angle alpha 311 that the bus of upper test department 31 and axis are formed be sized to 130 �㡫140 ��. The obtuse angles beta 331 that the bus of lower test department 33 and axis are formed be sized to 130 �㡫140 ��. Specifically, in the present embodiment, obtuse angle alpha 311 is sized to 135 ��, and obtuse angles beta 331 is sized to 135 ��.
Above-mentioned probe 10, its probe 30 is arranged for cydariform, the transition part 32 of this cylindric setting is for, in the curved profile of workpiece being carried out point, determining the upper chamfering of the curved profile of workpiece and the center of lower chamfering, to distinguish upper chamfering and the scope of lower chamfering after in dividing. The inclined-plane, bus place of the upper test department 31 of round table-like setting can mate with the incline direction of the lower chamfering of the curved profile of workpiece so that probe 10 can accurately measure the profile value of lower chamfering. The inclined-plane, bus place of the lower test department 33 that rounding mesa-shaped is arranged can mate with the incline direction of the upper chamfering of the curved profile of workpiece so that probe 10 can accurately measure the profile value of chamfering. Thus, improve the certainty of measurement of probe 10. Additionally, when measuring lower chamfering, empty avoiding portion 23 provides and allows what probe 10 avoided the upper chamfering of curved profile and core to dodge space, it is to avoid the main body 20 of probe 10 collides workpiece. The diameter that the diameter of trunk 22 compares empty avoiding portion 23 is big, reduces the intensity deficiency causing probe 10 because the diameter of trunk 22 is too little and affects certainty of measurement.
Referring to Fig. 2 to Fig. 6, it is provided that a kind of CNC utilizing above-mentioned probe 10 to carry out process detection method.
This CNC processes detection method, including step:
Step one: shown in Fig. 1, it is provided that a kind of probe 10, for being connected with detection board to realize CNC processing detection. This probe 10 includes: main body 20, and this main body 20 is cylindric setting. Main body 20 includes connecting portion 21, trunk 22 and empty avoiding portion 23. This connecting portion 21 is used for and detection board connects, and this connecting portion 21 is provided with screw thread 211 and lockhole 212. Trunk 22 and empty avoiding portion 23 are cylindric setting, and the diameter of trunk 22 is more than the diameter in empty avoiding portion 23. One end and the connecting portion 21 of trunk 22 connect, and the other end is connected with the one end in empty avoiding portion 23. Probe 30, this probe 30 is arranged for cydariform, and probe 30 includes test department 31, transition part 32, lower test department 33 and height value test department 34. Upper test department 31 is round table-like setting, and transition part 32 is cylindric setting, and lower test department 33 is arranged for rounding mesa-shaped. The axis of upper test department 31, the axis of transition part 32, the axis of lower test department 33 and the axis of main body 20 all overlap. The top of upper test department 31 is connected with the other end in empty avoiding portion 23, and its bottom is then connected with one end of transition part 32. The other end of transition part 32 is connected with the top of lower test department 33. This height value test department 34 is the bottom that cylindric setting and one end are connected to lower test department 33, and the axis of height value test department 34 overlaps with the axis of lower test department 33. The obtuse angle alpha 311 that the bus of upper test department 31 and axis are formed be sized to 130 �㡫140 ��. The obtuse angles beta 331 that the bus of lower test department 33 and axis are formed be sized to 130 �㡫140 ��. Specifically, in the present embodiment, obtuse angle alpha 311 size value is 135 ��, and obtuse angles beta 331 size value is 135 ��.
Step 2: probe 10 is connected with detection board.
Step 3: as shown in Figure 3, the XYZ axle of detection board moves, probe 10 is driven to move the radian maximum place of the curved profile 43 to workpiece 40, the Center Offset of the curved profile 43 of workpiece 40 is measured by the transition part 32 of probe 10, update the central value of curved profile 43, and then determine the upper chamfering 41 of this curved profile 43 and the center of lower chamfering 42.
Step 4: as shown in Figure 4, the XYZ axle of detection board moves, and drive probe 10 moves the position of the lower chamfering 42 of the curved profile to workpiece 40, is measured the profile value of lower chamfering 42 by the upper test department 31 of probe 10.During measurement, empty avoiding portion 23 provides and allows what probe 10 avoided the upper chamfering 41 of curved profile and core to dodge space, it is to avoid the main body 20 of probe 10 collides workpiece 40. Detection board records the profile value of chamfering 42, the profile value of lower chamfering 42 is compared with the lower chamfering theoretical value preset, and draws lower chamfering 42 error amount and records in the system variable table of detection board.
Step 5: as shown in Figure 5, the XYZ axle of detection board moves, drive probe 10 moves the position of the upper chamfering 41 of the curved profile to workpiece 40, the profile value of upper chamfering 41 is measured by the lower test department 33 of probe 10, the profile value of chamfering 41 on detection board record, the profile value of upper chamfering 41 is compared with the upper chamfering theoretical value preset, draws chamfering error amount and record in the system variable table of detection board.
Step 6: as shown in Figure 6, the XYZ axle of detection board moves, default highest point during the design that drive probe 10 moves to workpiece 40, measured the height value of the highest point of workpiece 40 by the height value test department 34 of probe 10, the theoretical value of the height value of highest point with the highest point preset is compared and draws height error value.
Each technical characteristic of embodiment described above can combine arbitrarily, for making description succinct, the all possible combination of each technical characteristic in above-described embodiment is not all described, but, as long as the combination of these technical characteristics is absent from contradiction, all it is considered to be the scope that this specification is recorded.
Embodiment described above only have expressed several embodiments of the present utility model, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to utility model patent scope. It should be pointed out that, for the person of ordinary skill of the art, without departing from the concept of the premise utility, it is also possible to make some deformation and improvement, these broadly fall into protection domain of the present utility model. Therefore, the protection domain of this utility model patent should be as the criterion with claims.
Claims (5)
1. a probe, for being connected with detection board to realize CNC processing detection, it is characterised in that this probe includes:
Main body, this main body is cylindric setting, and one end of described main body is provided with connecting portion to be connected with described detection board;
Probe, this probe includes test department, transition part and lower test department; Described upper test department is round table-like setting, and described transition part is cylindric setting, and described lower test department is that rounding mesa-shaped is arranged; The axis of described upper test department, the axis of described transition part, the axis of described lower test department and the axis of described main body all overlap; The top of described upper test department is connected with the other end of described main body, and the bottom of described upper test department is connected with one end of described transition part; The other end of described transition part is connected with the top of described lower test department.
2. probe according to claim 1, it is characterized in that, described probe also includes height value test department, and this height value test department is cylindric setting and one end is connected to one end that described lower test department is narrower, and the axis of described height value test department overlaps with the axis of described lower test department.
3. probe according to claim 1, it is characterised in that the obtuse angle that the bus of described upper test department is formed with axis is sized to 130 �㡫140 ��.
4. probe according to claim 1, it is characterised in that the obtuse angle that the bus of described lower test department is formed with axis is sized to 130 �㡫140 ��.
5. probe according to claim 1, it is characterised in that described main body also includes trunk and empty avoiding portion, described trunk and described empty avoiding portion and is cylindric setting, and the diameter of described trunk is more than the diameter in described empty avoiding portion; One end of described trunk and described connecting portion connect, and the other end is connected with the one end in described empty avoiding portion; The other end in described empty avoiding portion is connected with the top of described upper test department.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521035881.7U CN205300562U (en) | 2015-12-11 | 2015-12-11 | Probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521035881.7U CN205300562U (en) | 2015-12-11 | 2015-12-11 | Probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205300562U true CN205300562U (en) | 2016-06-08 |
Family
ID=56430756
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521035881.7U Withdrawn - After Issue CN205300562U (en) | 2015-12-11 | 2015-12-11 | Probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205300562U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105466384A (en) * | 2015-12-11 | 2016-04-06 | 广东长盈精密技术有限公司 | Probe and CNC processing detection method |
-
2015
- 2015-12-11 CN CN201521035881.7U patent/CN205300562U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105466384A (en) * | 2015-12-11 | 2016-04-06 | 广东长盈精密技术有限公司 | Probe and CNC processing detection method |
| CN105466384B (en) * | 2015-12-11 | 2017-10-27 | 广东长盈精密技术有限公司 | Probe and CNC processing detection methods |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20160608 Effective date of abandoning: 20170908 |
|
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20160608 Effective date of abandoning: 20171027 |