CN205166880U - All -in -one platform fine -tuning - Google Patents
All -in -one platform fine -tuning Download PDFInfo
- Publication number
- CN205166880U CN205166880U CN201520884376.3U CN201520884376U CN205166880U CN 205166880 U CN205166880 U CN 205166880U CN 201520884376 U CN201520884376 U CN 201520884376U CN 205166880 U CN205166880 U CN 205166880U
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- CN
- China
- Prior art keywords
- micrometer
- fine setting
- guiding mechanism
- test platform
- mount pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
The utility model discloses an all -in -one platform fine -tuning, include PMKD, test platform, control guiding mechanism, upper and lower guiding mechanism, dabber and dabber fixed orifices, test platform sets up on PMKD, guiding mechanism and upper and lower guiding mechanism are controlled to last being equipped with of PMKD, about guiding mechanism fine setting micrometer mount pad and installation fine setting micrometer about above that about including, guiding mechanism is including finely tuning micrometer mount pad and installation upper and lower fine setting micrometer above that from top to bottom, it all has the shaft -like fine setting knob of spiral to control the fine setting micrometer and finely tune the micrometer from top to bottom, the last dabber fixed orifices that supplies the dabber to run through of predetermineeing of PMKD. This fine -tuning has improved the precision of having adjusted test platform, finely tunes the micrometer and finely tunes the micrometer from top to bottom about utilizing to make test platform reach desired position, it is when carrying out work piece processing, through the fine setting data adjustment of record, convenient, the accuracy is high.
Description
Technical field
The utility model belongs to Product processing equipment technical field, is specifically related to a kind of all-in-one platform micro-adjusting mechanism.
Background technology
In prior art, workpiece to be machined is in process, need to make it keep certain level degree, thus facilitate completing of equipment manufacturing procedure, in the movement design of all-in-one, how ensureing that camera lens, at the central point of its all multiple epigraph, skew does not occur is a key problem in technology, and this just needs to keep the pixel center point of Sensor must overlap with the central point of lens imaging.The point coincides of the pixel center of Sensor point and lens imaging is kept first just to complete in the design phase of equipment, but due to can error be produced in the process of making and paster, so just need to compensate error when the use in later stage, namely the side-play amount of image to first be known, in real work, when processing different workpieces, each all needs carries out adjusting different levelness, expend time in length, and accuracy also cannot be determined simultaneously, causes product that small error occurs and increase.
Utility model content
The technical problems to be solved in the utility model is the micro-adjusting mechanism providing a kind of all-in-one platform, solves in prior art that to finely tune production time long, the problem that product quality not easily ensures.
In order to solve the problems of the technologies described above, the utility model realizes in the following manner:
All-in-one platform micro-adjusting mechanism, comprise fixed base plate, test platform, left and right adjusting mechanism, upper and lower guiding mechanism, mandrel and mandrel fixing hole, described test platform is arranged on above fixed base plate, fixed base plate be provided with can left and right adjusting test platform left and right adjusting mechanism and can the guiding mechanism up and down of up-down adjustment test platform, described left and right adjusting mechanism comprises left and right fine setting micrometer mount pad and is arranged on the left and right fine setting micrometer of left and right fine setting micrometer mount pad, upper and lower guiding mechanism comprises finely tunes micrometer mount pad up and down and is arranged on the micrometer of fine setting up and down of finely tuning micrometer mount pad up and down, left and right fine setting micrometer and up and down fine setting micrometer all have spiral rod vernier knob, fixed base plate is preset with the mandrel fixing hole run through for mandrel.
Compared with prior art, the beneficial effect that the utility model has: the utility model passes through micro-adjusting mechanism, improve the precision that have adjusted test platform, utilize left and right fine setting micrometer and finely tune micrometer up and down, thus make the position that test platform reaches required, when carrying out work pieces process, by the fine setting data point reuse of record, convenience, accuracy are high.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
In figure, each mark is respectively: 1, fixed base plate, and 2, test platform, 3, left and right fine setting micrometer, 31, left and right fine setting micrometer mount pad, 4, finely tune micrometer up and down, 41, finely tune micrometer mount pad up and down, 5, mandrel, 6, mandrel fixing hole.
Detailed description of the invention
Below in conjunction with the drawings and specific embodiments, detailed description of the invention of the present utility model is described in further detail.
As shown in Figure 1, all-in-one platform micro-adjusting mechanism, comprise fixed base plate 1, test platform 2, left and right adjusting mechanism, upper and lower guiding mechanism, mandrel 5 and mandrel fixing hole 6, described test platform is arranged on above fixed base plate, fixed base plate be provided with can left and right adjusting test platform left and right adjusting mechanism and can the guiding mechanism up and down of up-down adjustment test platform, described left and right adjusting mechanism comprises left and right fine setting micrometer mount pad 31 and is arranged on the left and right fine setting micrometer 3 of left and right fine setting micrometer mount pad, upper and lower guiding mechanism comprises finely tunes micrometer mount pad 41 up and down and is arranged on the micrometer of fine setting up and down 4 of finely tuning micrometer mount pad up and down, left and right fine setting micrometer 3 and up and down fine setting micrometer 4 all have spiral rod vernier knob, fixed base plate is preset with the mandrel fixing hole run through for mandrel.Use technique scheme, in the use procedure of all-in-one platform micro-adjusting mechanism, by the adjustment to left-right adjusting mechanism, to meet test platform desired location in the lateral direction, concrete adjustment mode is vernier knob precession or the back-out of spiral rod by finely tuning micrometer afterbody about this, thus make test platform reach certain Plane Angle, equally, in adjustment up-down adjustment mechanism to meet test platform desired location in the vertical direction, concrete adjustment mode is also vernier knob precession or the back-out of spiral rod by finely tuning micrometer afterbody up and down, thus make test platform reach certain Plane Angle, after adjusting the angle of all directions, the degree that micrometer is finely tuned can be recorded easily, when carrying out processing same workpiece, directly can be adjusted by the fine setting data of record, accuracy is high, also save the time simultaneously, ensure that the quality of work pieces process.
The above is only embodiment of the present utility model; again state; for those skilled in the art; under the prerequisite not departing from the utility model principle; can also carry out some improvement to the utility model, these improvement are also listed in the protection domain of the utility model claim.
Claims (1)
1. all-in-one platform micro-adjusting mechanism, it is characterized in that: comprise fixed base plate (1), test platform (2), left and right adjusting mechanism, upper and lower guiding mechanism, mandrel (5) and mandrel fixing hole (6), described test platform is arranged on above fixed base plate, fixed base plate be provided with can left and right adjusting test platform left and right adjusting mechanism and can the guiding mechanism up and down of up-down adjustment test platform, described left and right adjusting mechanism comprises left and right fine setting micrometer mount pad (31) and is arranged on left and right fine setting micrometer (3) of left and right fine setting micrometer mount pad, upper and lower guiding mechanism comprises finely tunes micrometer mount pad (41) up and down and is arranged on the micrometer of fine setting up and down (4) of finely tuning micrometer mount pad up and down, left and right fine setting micrometer and up and down fine setting micrometer all have spiral rod vernier knob, fixed base plate is preset with the mandrel fixing hole run through for mandrel.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201520884376.3U CN205166880U (en) | 2015-11-06 | 2015-11-06 | All -in -one platform fine -tuning |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201520884376.3U CN205166880U (en) | 2015-11-06 | 2015-11-06 | All -in -one platform fine -tuning |
Publications (1)
Publication Number | Publication Date |
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CN205166880U true CN205166880U (en) | 2016-04-20 |
Family
ID=55730909
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201520884376.3U Expired - Fee Related CN205166880U (en) | 2015-11-06 | 2015-11-06 | All -in -one platform fine -tuning |
Country Status (1)
Country | Link |
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CN (1) | CN205166880U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107037622A (en) * | 2017-06-02 | 2017-08-11 | 江苏久正光电有限公司 | A kind of adjustable means for correcting of high accuracy |
CN107443328A (en) * | 2017-09-13 | 2017-12-08 | 苏州迈客荣自动化技术有限公司 | A kind of microcosmic detection micromotion platform |
-
2015
- 2015-11-06 CN CN201520884376.3U patent/CN205166880U/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107037622A (en) * | 2017-06-02 | 2017-08-11 | 江苏久正光电有限公司 | A kind of adjustable means for correcting of high accuracy |
CN107037622B (en) * | 2017-06-02 | 2020-06-30 | 江苏久正光电有限公司 | High-precision adjustable correcting device |
CN107443328A (en) * | 2017-09-13 | 2017-12-08 | 苏州迈客荣自动化技术有限公司 | A kind of microcosmic detection micromotion platform |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160420 Termination date: 20191106 |
|
CF01 | Termination of patent right due to non-payment of annual fee |