CN205120829U - Little resistance test device - Google Patents

Little resistance test device Download PDF

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CN205120829U
CN205120829U CN201520840380.XU CN201520840380U CN205120829U CN 205120829 U CN205120829 U CN 205120829U CN 201520840380 U CN201520840380 U CN 201520840380U CN 205120829 U CN205120829 U CN 205120829U
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micro
test
fixed
fixture
circuit board
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陈哲
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Ao Gaode Science And Technology Ltd Of Shenzhen
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Ao Gaode Science And Technology Ltd Of Shenzhen
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Abstract

本实用新型公开了一种微电阻测试装置,用于测试电路板的微电阻,所述微电阻装置包括测试机构、驱动机构和控制机构,所述测试机构包括基座、工作台、测试治具、测试模组和电荷耦合图像传感仪,所述工作台包括下固定台和上固定台,所述测试治具包括下夹具和上夹具,所述上夹具相对所述下夹具设置,所述下夹具用以装夹电路板,所述上固定台和所述下固定台之间装夹所述测试模组,所述测试模组设有测试探头,所述测试探头接触所述电路板上的微电阻,所述电荷耦合监测电路板的位置信息,所述驱动机构驱动所述下固定台滑动,所述控制机构控制所述驱动机构运行,并控制所述测试模组测试电路板的微电阻。

The utility model discloses a micro-resistance testing device, which is used for testing the micro-resistance of a circuit board. The micro-resistance device includes a testing mechanism, a driving mechanism and a control mechanism. The testing mechanism includes a base, a workbench, and a testing fixture , a test module and a charge-coupled image sensor, the workbench includes a lower fixed table and an upper fixed table, the test fixture includes a lower fixture and an upper fixture, the upper fixture is set relative to the lower fixture, and the The lower fixture is used to clamp the circuit board, the test module is clamped between the upper fixed table and the lower fixed table, the test module is provided with a test probe, and the test probe contacts the circuit board The micro-resistor of the charge coupling monitors the position information of the circuit board, the driving mechanism drives the sliding of the lower fixed table, the control mechanism controls the operation of the driving mechanism, and controls the micro-circuit board of the test module to test resistance.

Description

微电阻测试装置Micro resistance test device

技术领域technical field

本实用新型涉及电路板电阻测试领域,尤其涉及一种微电阻测试装置。The utility model relates to the field of circuit board resistance testing, in particular to a micro-resistance testing device.

背景技术Background technique

众所周知,所有的电子电气设备或控制系统都要用到印刷线路板,为确保线路板不发生开路或短路,印刷线路板在出货前均需通过PCB测试机的测试,将不合格的线路板检出。As we all know, all electronic and electrical equipment or control systems must use printed circuit boards. In order to ensure that the circuit boards do not have open circuits or short circuits, printed circuit boards must pass the test of the PCB testing machine before shipment, and unqualified circuit boards Check out.

随着电子技术的迅猛发展,印制线路板(PCB)的制作层数越来越高、线路密度越来越密、焊盘尺寸越做越小,客户对板的要求越来越严,尤其是PCB的安全性与稳定性,比如说关乎生命安全的汽车板,心系国防的航天控制系统电子板等。普通的两端子测试机,通常采用的是断线测试方法,是由已知的排线阻抗、电子控制阻抗及接触阻抗再加上被测PCB之阻抗植,所以无法测出被测PCB内真正的阻抗,以致孔内微小缺陷及线路微小缺口,更是无法被检测出来。当线路阻值小于20Ω时,已基本成为它的测试盲区。在实际生产中发现PCB的某些缺陷,如孔内无铜、空洞、铜薄、线幼、线路缺口等问题均会影响到线路阻值,当阻值小于20Ω时测试结果显示PASS,但客户经过高温焊接后阻值发生变化,导致开路问题发生,最终导致客户投诉,严重的还需向客户赔款。With the rapid development of electronic technology, the number of layers of printed circuit boards (PCBs) is getting higher and higher, the circuit density is getting denser, and the pad size is getting smaller and smaller. Customers have stricter requirements for boards, especially It is the safety and stability of PCB, such as automobile boards that are related to life safety, and aerospace control system electronic boards that are concerned with national defense. Ordinary two-terminal testing machines usually use the disconnection test method, which is based on the known cable impedance, electronic control impedance, and contact impedance plus the impedance of the PCB under test, so it is impossible to measure the true value of the PCB under test. Impedance, so that small defects in the hole and small gaps in the circuit cannot be detected. When the line resistance is less than 20Ω, it has basically become its test blind area. In actual production, it is found that some defects of PCB, such as no copper in the hole, void, thin copper, thin line, line gap, etc., will affect the line resistance. When the resistance is less than 20Ω, the test result shows PASS, but the customer After high-temperature welding, the resistance value changes, resulting in an open circuit problem, which eventually leads to customer complaints, and in serious cases, compensation must be paid to the customer.

现有的印刷线路板测试机主要有以下几种:双倍密、四倍密、六倍密通用两线测试机,主要用于普通的线路板的测试;四线飞针测试机,主要用于小电阻PCB测试,但一般只用于样品测试,很难满足批量板测试的需求。The existing printed circuit board testing machines mainly include the following types: double-density, quadruple-density, and six-fold-density general-purpose two-wire testing machines, which are mainly used for testing ordinary circuit boards; four-wire flying probe testing machines are mainly used for It is suitable for small resistance PCB testing, but it is generally only used for sample testing, and it is difficult to meet the needs of batch board testing.

实用新型内容Utility model content

本实用新型的目的在于提供一种提高测试效率的微电阻测试装置。The purpose of the utility model is to provide a micro-resistance testing device which improves testing efficiency.

为了解决上述技术问题,本实用新型提供了一种微电阻测试装置,用于测试电路板的微电阻,其中,所述微电阻装置包括测试机构、驱动机构和控制机构,所述测试机构包括基座、工作台、测试治具、测试模组和电荷耦合图像传感仪,所述工作台包括安装于所述基座上的下固定台和相对所述下固定台滑动设置的上固定台,所述测试治具包括固定于所述下固定台上的下夹具和固定于所述上固定台上的上夹具,所述上夹具相对所述下夹具设置,所述下夹具用以装夹电路板,所述上固定台和所述下固定台之间装夹所述测试模组,所述测试模组设有测试探头和连接于所述测试探头的测试电路,所述测试探头用以在所述上夹具与所述下夹具靠拢时接触所述电路板上的微电阻,所述电荷耦合图像传感仪固定于所述上夹具和所述下夹具之间,用于监测电路板的位置信息,所述驱动机构驱动所述下固定台滑动,所述控制机构电连接所述驱动机构和所述测试模组,以控制所述驱动机构运行,并控制所述测试模组测试电路板的微电阻。In order to solve the above technical problems, the utility model provides a micro-resistance testing device for testing the micro-resistance of a circuit board, wherein the micro-resistance device includes a testing mechanism, a driving mechanism and a control mechanism, and the testing mechanism includes a basic seat, workbench, test fixture, test module and charge-coupled image sensor, the workbench includes a lower fixed platform mounted on the base and an upper fixed platform slidably arranged relative to the lower fixed platform, The test fixture includes a lower fixture fixed on the lower fixed platform and an upper fixture fixed on the upper fixed platform, the upper fixture is arranged relative to the lower fixture, and the lower fixture is used to clamp the circuit plate, the test module is clamped between the upper fixed table and the lower fixed table, the test module is provided with a test probe and a test circuit connected to the test probe, and the test probe is used for The upper fixture and the lower fixture contact the micro-resistance on the circuit board when they are close together, and the charge-coupled image sensor is fixed between the upper fixture and the lower fixture for monitoring the position of the circuit board information, the drive mechanism drives the lower fixed table to slide, the control mechanism is electrically connected to the drive mechanism and the test module to control the operation of the drive mechanism, and controls the test module to test the circuit board microresistor.

其中,所述微电阻测试装置还包括进料机构,所述进料机构包括进料架和滑动连接于所述进料架的进料台,所述进料架固定于所述基座一侧,所述进料台用以向所述下夹具放置电路板,所述驱动机构还驱动所述进料台滑动。Wherein, the micro-resistance testing device also includes a feeding mechanism, the feeding mechanism includes a feeding frame and a feeding table that is slidably connected to the feeding frame, and the feeding frame is fixed on one side of the base , the feeding table is used to place the circuit board to the lower fixture, and the driving mechanism also drives the feeding table to slide.

其中,所述进料机构还包括固定于所述进料架的第一竖直传动轴和滑动连接于所述第一竖直传动轴的第一水平传动轴,所述第一水平传动轴沿竖直方向在所述第一竖直传动轴上滑动设置,所述进料台沿水平方向在所述第一水平传动轴上滑动设置。Wherein, the feeding mechanism also includes a first vertical transmission shaft fixed to the feeding frame and a first horizontal transmission shaft slidingly connected to the first vertical transmission shaft, and the first horizontal transmission shaft is along the The vertical direction is slidably disposed on the first vertical transmission shaft, and the feed table is slidably disposed on the first horizontal transmission shaft along the horizontal direction.

其中,所述微电阻测试装置还包括出料机构,所述出料机构包括出料架和滑动连接于所述出料架的出料台,所述出料架固定于所述基座相对所述进料架的另一侧,所述出料台用以从所述下夹具取出电路板,所述驱动机构还驱动所述出料台滑动。Wherein, the micro-resistance testing device also includes a discharge mechanism, the discharge mechanism includes a discharge frame and a discharge platform that is slidably connected to the discharge frame, and the discharge frame is fixed on the base relative to the On the other side of the feeding rack, the discharging platform is used to take out the circuit board from the lower fixture, and the driving mechanism also drives the discharging platform to slide.

其中,所述出料机构还包括固定于所述出料架的第二竖直传动轴和滑动连接于所述第二竖直传动轴的第二水平传动轴,所述第二水平传动轴沿竖直方向在所述第二竖直传动轴上滑动设置,所述出料台沿水平方向在所述第二水平传动轴上滑动设置。Wherein, the discharge mechanism also includes a second vertical transmission shaft fixed to the discharge frame and a second horizontal transmission shaft slidingly connected to the second vertical transmission shaft, and the second horizontal transmission shaft is along the The vertical direction is slidably disposed on the second vertical transmission shaft, and the discharge platform is slidably disposed on the second horizontal transmission shaft along the horizontal direction.

其中,所述微电阻测试装置还包括微调机构,所述微调机构安装于所述基座上,用以调节所述上固定台或/和所述下固定台的水平面位置。Wherein, the micro-resistance testing device further includes a fine-tuning mechanism, and the fine-tuning mechanism is installed on the base to adjust the horizontal position of the upper fixed platform or/and the lower fixed platform.

其中,所述微调机构包括上调节组件和下调节组件,所述上调节组件安装于所述基座上,用以调节所述上固定台的前后、左右和旋转角度位置,所述下调节组件安装于所述基座上,用以调节所述下固定台的前后、左右和旋转角度位置。Wherein, the fine-tuning mechanism includes an upper adjustment assembly and a lower adjustment assembly, the upper adjustment assembly is installed on the base to adjust the front and rear, left and right, and rotation angle positions of the upper fixed table, and the lower adjustment assembly Installed on the base, it is used to adjust the front and rear, left and right and rotation angle positions of the lower fixed platform.

其中,所述控制机构包括显示器和操作键盘,所述显示器固定于所述基座上,电连接所述测试模组,用于显示所述测试模组的测试信息,所述操作键盘固定于所述基座上,电连接所述测试模组,用于向所述测试模组输入测试指令。Wherein, the control mechanism includes a display and an operation keyboard, the display is fixed on the base, electrically connected to the test module, and used to display the test information of the test module, and the operation keyboard is fixed on the The base is electrically connected to the test module for inputting test instructions to the test module.

其中,所述控制机构还包括电连接所述显示器和所述操作键盘的控制处理器,所述控制处理器为计算机。Wherein, the control mechanism further includes a control processor electrically connected to the display and the operation keyboard, and the control processor is a computer.

其中,所述驱动机构为马达。Wherein, the driving mechanism is a motor.

本实用新型的微电阻测试装置,通过所述测试治具包括固定于所述下固定台上的下夹具和固定于所述上固定台上的上夹具,所述上夹具相对所述下夹具设置,所述下夹具用以装夹电路板,所述上、下固定台装夹所述测试模组,所述测试模组设有测试探头和连接于所述测试探头的测试电路,所述测试探头用以在所述上夹具与所述下夹具靠拢时接触所述电路板上的微电阻,所述电荷耦合图像传感仪固定于所述上夹具和所述下夹具之间,用于监测电路板的位置信息,从而实现电路板的微电阻自动测试,以满足对批量电路板的微电阻进行测试,从而提高微电阻测试效率。The micro-resistance testing device of the present utility model comprises a lower clamp fixed on the lower fixed platform and an upper clamp fixed on the upper fixed platform through the test fixture, and the upper clamp is arranged relative to the lower clamp , the lower fixture is used to clamp the circuit board, the upper and lower fixed tables clamp the test module, the test module is provided with a test probe and a test circuit connected to the test probe, the test The probe is used to contact the micro-resistor on the circuit board when the upper fixture and the lower fixture are close together, and the charge-coupled image sensor is fixed between the upper fixture and the lower fixture for monitoring The location information of the circuit board, so as to realize the automatic test of the micro-resistance of the circuit board, so as to meet the test of the micro-resistance of the batch circuit board, thereby improving the efficiency of micro-resistance testing.

附图说明Description of drawings

为了更清楚地说明本实用新型的技术方案,下面将对实施方式中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本实用新型的一些实施方式,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solution of the utility model more clearly, the accompanying drawings that need to be used in the implementation will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some implementations of the utility model. Those of ordinary skill in the art can also obtain other drawings based on these drawings without any creative effort.

图1是本实用新型提供的微电阻测试装置的示意图;Fig. 1 is the schematic diagram of the micro-resistance testing device provided by the utility model;

图2是图1的微电阻测试装置的II部分的放大示意图。FIG. 2 is an enlarged schematic view of part II of the micro-resistance testing device of FIG. 1 .

具体实施方式detailed description

下面将结合本实用新型实施方式中的附图,对本实用新型实施方式中的技术方案进行清楚、完整地描述。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention.

请参阅图1和图2,本实用新型实施方式提供的一种微电阻测试装置100。本实用新型实施方式提供的一种微电阻测试装置100。所述微电阻测试装置100包括测试机构10、驱动机构20和控制机构30。所述测试机构10包括基座11、工作台12、测试治具13、测试模组14和电荷耦合图像传感仪(未图示)。所述工作台12包括固定于所述基座11上的上固定台122和相对所述上固定台122滑动设置的下固定台121,所述测试治具13包括固定于所述下固定台121上的下夹具131和固定于所述上固定台122上的上夹具132。所述上夹具132相对所述下夹具131设置,所述下夹具131用以装夹电路板(未图示),所述上固定台122和所述下固定台121之间装夹所述测试模组14。所述测试模组14设有测试探头(未图示)和连接于所述测试探头的测试电路(未图示),所述测试探头用以在所述上夹具132与所述下夹具131靠拢时接触所述电路板上的微电阻。所述电荷耦合图像传感仪固定于所述上夹具132和所述下夹具131之间,用于监测电路板的位置信息。所述驱动机构20驱动所述下固定台121滑动,所述控制机构30电连接所述驱动机构20和所述测试模组14,以控制所述驱动机构20运行,并控制所述测试模组14a测试电路板的微电阻。Please refer to FIG. 1 and FIG. 2 , a micro-resistance testing device 100 provided by an embodiment of the present invention. A micro-resistance testing device 100 provided in an embodiment of the present utility model. The micro-resistance testing device 100 includes a testing mechanism 10 , a driving mechanism 20 and a control mechanism 30 . The test mechanism 10 includes a base 11 , a workbench 12 , a test fixture 13 , a test module 14 and a charge-coupled image sensor (not shown). The workbench 12 includes an upper fixed platform 122 fixed on the base 11 and a lower fixed platform 121 slidably arranged relative to the upper fixed platform 122, and the test fixture 13 includes an upper fixed platform 121 fixed on the lower fixed platform 121. The upper lower clamp 131 and the upper clamp 132 fixed on the upper fixed platform 122 . The upper fixture 132 is arranged relative to the lower fixture 131, and the lower fixture 131 is used for clamping a circuit board (not shown), and the test is clamped between the upper fixing table 122 and the lower fixing table 121. Module 14. The test module 14 is provided with a test probe (not shown) and a test circuit (not shown) connected to the test probe, and the test probe is used to close the upper clamp 132 to the lower clamp 131 When touching the micro-resistor on the circuit board. The charge-coupled image sensor is fixed between the upper fixture 132 and the lower fixture 131 for monitoring the position information of the circuit board. The drive mechanism 20 drives the lower fixed table 121 to slide, and the control mechanism 30 is electrically connected to the drive mechanism 20 and the test module 14 to control the operation of the drive mechanism 20 and control the test module 14a Test the micro-resistance of the circuit board.

通过所述下固定台121带动所述下夹具131向所述上夹具132靠拢,从而实现所述测试模组14自动接触所述下夹具131上的电路板,从而实现自动测试微电阻,以满足对批量电路板的微电阻进行测试,从而使得所述微电阻测试装置100提高测试效率。The lower fixture 131 is driven closer to the upper fixture 132 by the lower fixing table 121, thereby realizing that the test module 14 automatically contacts the circuit board on the lower fixture 131, thereby realizing automatic testing of micro-resistance, so as to satisfy The micro-resistance of batch circuit boards is tested, so that the micro-resistance testing device 100 improves testing efficiency.

本实施方式中,所述基座11为一箱体,所述基座11包括相对设置的底端11a和顶端11b,所述底端11a固定于地面上,所述顶端11b上安装所述下固定台121。所述基座11内设置传动组件(未图示),所述传动组件将所述驱动机构20的驱动力传递至所述下固定台121,以带动所述下固定台121滑动。在其他实施方式中,所述基座11还可以是由多根钢杆构成。In this embodiment, the base 11 is a box, the base 11 includes a bottom end 11a and a top end 11b oppositely arranged, the bottom end 11a is fixed on the ground, and the bottom end 11b is installed on the top end 11b. Fixed table 121. A transmission assembly (not shown) is arranged in the base 11 , and the transmission assembly transmits the driving force of the driving mechanism 20 to the lower fixed platform 121 to drive the lower fixed platform 121 to slide. In other embodiments, the base 11 may also be composed of multiple steel rods.

本实施方式中,所述下固定台121为矩形板件,所述下固定台121滑动连接于所述基座11上,所述下固定台121可以在所述基座11上沿水平面滑动,以调节所述下固定台121的位置,以方便调节电路板的位置,提高所述微电阻测试装置100的测试准确率。所述下固定台121背离所述基座11的一面设置定位槽(未图示),所述定位槽用以固定所述下夹具131,并通过螺钉锁紧所述下夹具131。在其他实施方式中,所述下固定台121还可以是设置定位销,所述定位销对所述下夹具131进行定位,所述下固定台121还可以是设置卡扣卡合连接所述下夹具131。In this embodiment, the lower fixing platform 121 is a rectangular plate, the lower fixing platform 121 is slidably connected to the base 11, and the lower fixing platform 121 can slide along the horizontal plane on the base 11, The position of the lower fixing table 121 is adjusted to facilitate the adjustment of the position of the circuit board and improve the testing accuracy of the micro-resistance testing device 100 . A positioning groove (not shown) is provided on the side of the lower fixing table 121 facing away from the base 11 , and the positioning groove is used to fix the lower clamp 131 and lock the lower clamp 131 by screws. In other embodiments, the lower fixing platform 121 can also be provided with positioning pins, and the positioning pins can position the lower fixture 131, and the lower fixing platform 121 can also be provided with buckles to connect the lower fixture 131. Clamp 131 .

本实施方式中,所述上固定台122为矩形板件,所述上固定台122朝向所述下固定台121的一面固定所述上夹具132。所述上固定台122还可以沿水平方向滑动,从而可以调节所述上固定台122的水平位置,以方便调节上夹具132的位置,让其对准电路板上的位置。提高所述微电阻测试装置100的测试准确率。在其他实施方式中,所述上固定台122还可以是卡扣卡合连接于所述上夹具132。In this embodiment, the upper fixing platform 122 is a rectangular plate, and the upper fixture 132 is fixed on a side of the upper fixing platform 122 facing the lower fixing platform 121 . The upper fixing table 122 can also slide horizontally, so that the horizontal position of the upper fixing table 122 can be adjusted, so as to conveniently adjust the position of the upper clamp 132 to align with the position on the circuit board. The testing accuracy of the micro-resistance testing device 100 is improved. In other embodiments, the upper fixing platform 122 may also be connected to the upper clamp 132 by snap-fitting.

本实施方式中,所述下夹具131可拆卸连接所述测试模组14。利用所述下固定台121夹持所述测试模组14,从而方便拆卸维护所述测试模组14,从而提高所述微电阻测试装置100的使用寿命。具体的,所述下固定台121利用支撑板(未图示)和U形卡箱夹持所述测试模组14。In this embodiment, the lower fixture 131 is detachably connected to the testing module 14 . The test module 14 is clamped by the lower fixing table 121 , so that the test module 14 can be easily disassembled and maintained, thereby improving the service life of the micro-resistance testing device 100 . Specifically, the lower fixing table 121 uses a support plate (not shown) and a U-shaped card box to clamp the test module 14 .

本实施方式中,所述上夹具132可拆卸连接所述测试模组14。利用所述上固定台122夹持所述测试模组14,从而方便拆卸维护所述测试模组14,从而提高所述微电阻测试装置100的使用寿命。具体的,所述上固定台122利用支撑板(未图示)和U形卡箱夹持所述测试模组14。In this embodiment, the upper fixture 132 is detachably connected to the testing module 14 . The test module 14 is clamped by the upper fixing table 122 , so that the test module 14 can be easily disassembled and maintained, thereby improving the service life of the micro-resistance testing device 100 . Specifically, the upper fixing table 122 uses a support plate (not shown) and a U-shaped card box to clamp the test module 14 .

本实施方式中,所述测试模组14包括测试电路板141和固定于所述测试电路板141的测试针盘142,所述测试电路设置于所述测试电路板141上,所述测试电路板为四线电阻测试线路。所述测试针盘142上阵列多根所述探针,每一探针经线缆连接所述测试线路。利用所述测试模组14可以快速测试出电路板上任何电路结构的微电阻,提高所述微电阻测试装置100的测试效率。在其他事实方式中,所述测试模组14还可以包括稳压电路和稳流电路,以提高所述微电阻测试装置100的安全性。In this embodiment, the test module 14 includes a test circuit board 141 and a test dial 142 fixed on the test circuit board 141, the test circuit is arranged on the test circuit board 141, and the test circuit board Test line for 4-wire resistance. A plurality of probes are arrayed on the test dial 142 , and each probe is connected to the test circuit via a cable. The micro-resistance of any circuit structure on the circuit board can be quickly tested by using the testing module 14 , which improves the testing efficiency of the micro-resistance testing device 100 . In other actual manners, the test module 14 may also include a voltage stabilizing circuit and a current stabilizing circuit, so as to improve the safety of the micro-resistance testing device 100 .

本实施方式中,所述电荷耦合图像传感仪包括下传感仪(未图示)和上传感仪(未图示),所述下传感仪固定于所述基座11上,靠近所述下固定台121,以监测所述下固定台121的水平位置。所述上传感仪固定于所述上固定台122,以监测所述下固定台122的水平位置,从而方便调节所述下固定台121和所述上固定台122的水平位置,即方便调节所述夹具13和电路板的水平位置,从而使得夹具13精确对准电路板上的电路进行测试,从而提高微电阻测试装置100的测试准确性。In this embodiment, the charge-coupled image sensor includes a lower sensor (not shown) and an upper sensor (not shown), the lower sensor is fixed on the base 11, close to the The lower fixed platform 121 is described to monitor the horizontal position of the lower fixed platform 121. The upper sensor is fixed on the upper fixed platform 122 to monitor the horizontal position of the lower fixed platform 122, so as to facilitate the adjustment of the horizontal positions of the lower fixed platform 121 and the upper fixed platform 122, that is, to facilitate the adjustment of the lower fixed platform 122. The horizontal positions of the jig 13 and the circuit board are described, so that the jig 13 is accurately aligned with the circuit on the circuit board for testing, thereby improving the testing accuracy of the micro-resistance testing device 100 .

本实施方式中,所述驱动机构20固定于所述基座11内,所述驱动机构20位马达,所述驱动机构20利用传动组件将扭矩驱动力传导至所述下固定台121,以驱动所述下固定台121沿竖直方向相对所述上固定台122滑动。在所述驱动机构20驱动所述下固定台121向所述上固定台122靠拢时,以使所述上夹具132的电路板与所述下夹具131上的探针进行接触,从而实现对电路板上的微电阻进行测试,当该电路板的微电阻测试结束后,所述驱动机构20驱动所述下固定台121远离所述上固定台122,从而所述电路板远离所述测试模组14,从而方便取出电路板。在其他事实方式中,所述驱动机构20还可以是液压驱动机或气压驱动机。In this embodiment, the driving mechanism 20 is fixed in the base 11, and the driving mechanism 20 is a motor. The lower fixing platform 121 slides vertically relative to the upper fixing platform 122 . When the driving mechanism 20 drives the lower fixing table 121 to move closer to the upper fixing table 122, the circuit board of the upper fixture 132 is brought into contact with the probes on the lower fixture 131, so as to realize the circuit The micro-resistance on the board is tested, and when the micro-resistance test of the circuit board is finished, the driving mechanism 20 drives the lower fixed table 121 away from the upper fixed table 122, so that the circuit board is far away from the test module 14, so that it is convenient to take out the circuit board. In other practical ways, the driving mechanism 20 may also be a hydraulic driving machine or a pneumatic driving machine.

本实施方式中,所述控制机构30包括显示器31、操作键盘32和控制处理器33,所述显示器31固定于所述基座11上,电连接所述测试模组14,用于显示所述测试模组14的测试信息,所述操作键盘31固定于所述基座11上,电连接所述测试模组14,用于向所述测试模组14输入测试指令。所述控制处理器33为计算机。所述控制处理器33电连接所述显示器31和所述操作键盘32,以及电连接所述测试模组14,以处理所述测试模组14的测试信号,并向所述测试模组14的发送测试指令,同时所述控制处理器33从所述操作键盘32接受操控指令,以及向所述显示器31输入显示指令。在其他实施方式中,所述控制机构30还可以是多伺服器的计算机。In this embodiment, the control mechanism 30 includes a display 31, an operation keyboard 32, and a control processor 33. The display 31 is fixed on the base 11 and electrically connected to the test module 14 for displaying the For the test information of the test module 14 , the operation keyboard 31 is fixed on the base 11 and electrically connected to the test module 14 for inputting test instructions to the test module 14 . The control processor 33 is a computer. The control processor 33 is electrically connected to the display 31 and the operation keyboard 32, and is electrically connected to the test module 14, so as to process the test signal of the test module 14, and to the test signal of the test module 14. A test instruction is sent, and at the same time, the control processor 33 receives a manipulation instruction from the operation keyboard 32 and inputs a display instruction to the display 31 . In other embodiments, the control mechanism 30 may also be a multi-server computer.

进一步地,所述微电阻测试装置100还包括进料机构40,所述进料机构40包括进料架41和滑动连接于所述进料架41的进料台42,所述进料架41固定于所述基座11一侧,所述进料台42用以向所述上夹具11放置电路板,所述驱动机构20还驱动所述进料台42滑动。Further, the micro-resistance testing device 100 also includes a feeding mechanism 40, and the feeding mechanism 40 includes a feeding frame 41 and a feeding table 42 that is slidably connected to the feeding frame 41, and the feeding frame 41 Fixed on one side of the base 11 , the feeding table 42 is used to place the circuit board on the upper fixture 11 , and the driving mechanism 20 also drives the feeding table 42 to slide.

本实施方式中,所述进料机构40还包括固定于所述进料架41的第一竖直传动轴43和滑动连接于所述第一竖直传动轴43的第一水平传动轴44。所述第一水平传动轴44沿竖直方向在所述第一竖直传动轴43上滑动设置,所述进料台42沿水平方向在所述第一水平传动轴44上滑动设置。所述驱动机构20还包括进料马达(未图示),所述进料马达驱动所述第一水平传动轴44滑动,并驱动所述进料台42滑动。从而实现自动将电路板装夹所述下夹具131上,提高所述微电阻测试装置100的运行效率。在其他事实方式中,所述第一水平传动轴数目还可以是两个,从而使得电路板在水平面上的两个维度调节。In this embodiment, the feeding mechanism 40 further includes a first vertical transmission shaft 43 fixed to the feeding frame 41 and a first horizontal transmission shaft 44 slidably connected to the first vertical transmission shaft 43 . The first horizontal transmission shaft 44 is slidably disposed on the first vertical transmission shaft 43 along the vertical direction, and the feeding platform 42 is slidably disposed on the first horizontal transmission shaft 44 along the horizontal direction. The driving mechanism 20 also includes a feed motor (not shown), the feed motor drives the first horizontal transmission shaft 44 to slide, and drives the feed table 42 to slide. In this way, the circuit board can be automatically clamped on the lower fixture 131 , and the operating efficiency of the micro-resistance testing device 100 can be improved. In other practical ways, the number of the first horizontal transmission shafts may also be two, so that the circuit board can be adjusted in two dimensions on the horizontal plane.

进一步地,所述微电阻测试装置100还包括出料机构50,所述出料机构50包括出料架51和滑动连接于所述出料架51的出料台52,所述出料架51固定于所述基座11相对所述进料架41的另一侧,所述出料台52用以从所述下夹具131取出电路板,所述驱动机构20还驱动所述出料台52滑动。Further, the micro-resistance testing device 100 also includes a discharge mechanism 50, and the discharge mechanism 50 includes a discharge frame 51 and a discharge platform 52 that is slidably connected to the discharge frame 51, and the discharge frame 51 Fixed on the other side of the base 11 relative to the feed frame 41, the discharge table 52 is used to take out the circuit board from the lower fixture 131, and the drive mechanism 20 also drives the discharge table 52 slide.

本实施方式中,所述出料机构50还包括固定于所述出料架51的第二竖直传动轴53和滑动连接于所述第二竖直传动轴53的第二水平传动轴54,所述第二水平传动轴54沿竖直方向在所述第二竖直传动轴53上滑动设置,所述出料台52沿水平方向在所述第二水平传动轴54上滑动设置。所述驱动机构30还包括出料马达(未图示),所述出料马达驱动所述第二水平传动轴54滑动,并驱动所述出料台52滑动。从而实现自动从所述下夹具131上取出电路板,提高所述微电阻测试装置100的运行效率。在其他事实方式中,所述第二水平传动轴数目还可以是两个,从而使得电路板在水平面上的两个维度调节。In this embodiment, the discharge mechanism 50 further includes a second vertical transmission shaft 53 fixed to the discharge frame 51 and a second horizontal transmission shaft 54 slidingly connected to the second vertical transmission shaft 53, The second horizontal transmission shaft 54 is slidably disposed on the second vertical transmission shaft 53 along the vertical direction, and the discharge table 52 is slidably disposed on the second horizontal transmission shaft 54 along the horizontal direction. The driving mechanism 30 also includes a discharge motor (not shown), the discharge motor drives the second horizontal transmission shaft 54 to slide, and drives the discharge table 52 to slide. In this way, the circuit board can be automatically removed from the lower fixture 131 , and the operating efficiency of the micro-resistance testing device 100 can be improved. In other practical ways, the number of the second horizontal transmission shafts may also be two, so that the circuit board can be adjusted in two dimensions on the horizontal plane.

进一步地,所述微电阻测试装置100还包括微调机构60,所述微调机构60安装于所述基座11上,用以调节所述上固定台122或/和所述下固定台121的水平位置。Further, the micro-resistance testing device 100 also includes a fine-tuning mechanism 60, and the fine-tuning mechanism 60 is installed on the base 11 to adjust the level of the upper fixed platform 122 and/or the lower fixed platform 121. Location.

本实施方式中,所述微调机构60包括上调节组件61和下调节组件62,所述上调节组件61安装于所述基座11上,用以调节所述上固定台122的水平位置,所述下调节组件62安装于所述基座11上,用以调节所述下固定台121的水平位置。具体的,所述上调节组件61包括两组相互垂直的丝杆传动轴(未图示)和上调节马达(未图示),两组丝杆传动轴用以移动所述上固定台122在水平面的水平位置,在所述上传感仪152监测所述上固定台122水平位置存在偏差时,所述上传感仪152向所述控制机构30发送位置指令,从而所述控制机构30控制所述微调机构60的上调节组件61运行,所述上调节马达驱动两个丝杆传动转轴转动,从而微调所述上固定台122的水平位置,即微调电路板的水平位置,从而保证所述微电阻测试装置100的测试准确性。所述下调节组件62与所述上调节组件61结构相同设置,在此不再赘述。在其他实施方式中,所述上调节组件还可以是两个液压传动轴和液压驱动马达组成。In this embodiment, the fine-tuning mechanism 60 includes an upper adjustment assembly 61 and a lower adjustment assembly 62, and the upper adjustment assembly 61 is installed on the base 11 to adjust the horizontal position of the upper fixed platform 122. The lower adjusting assembly 62 is installed on the base 11 for adjusting the horizontal position of the lower fixing platform 121 . Specifically, the upper adjustment assembly 61 includes two sets of mutually perpendicular screw drive shafts (not shown) and an upper adjustment motor (not shown), the two sets of screw drive shafts are used to move the upper fixed table 122 The horizontal position of the horizontal plane, when the upper sensor 152 monitors that there is a deviation in the horizontal position of the upper fixed platform 122, the upper sensor 152 sends a position command to the control mechanism 30, so that the control mechanism 30 controls the The upper adjusting assembly 61 of the fine-tuning mechanism 60 operates, and the upper adjusting motor drives two screw shafts to rotate, thereby fine-tuning the horizontal position of the upper fixing table 122, that is, fine-tuning the horizontal position of the circuit board, thereby ensuring that the micro-resistance Test accuracy of the test device 100 . The lower adjustment assembly 62 is configured in the same structure as the upper adjustment assembly 61 , and will not be repeated here. In other embodiments, the upper adjustment assembly may also be composed of two hydraulic transmission shafts and a hydraulic drive motor.

本实用新型的微电阻测试装置,通过所述测试治具包括固定于所述下固定台上的下夹具和固定于所述上固定台上的上夹具,所述上夹具相对所述下夹具设置,所述下夹具用以装夹电路板,所述上固定台和所述下固定台之间装夹所述测试模组,所述测试模组设有测试探头和连接于所述测试探头的测试电路,所述测试探头用以在所述上夹具与所述下夹具靠拢时接触所述电路板上的微电阻,所述电荷耦合图像传感仪固定于所述上夹具和所述下夹具之间,用于监测电路板的位置信息,从而实现电路板的微电阻自动测试,以满足对批量电路板的微电阻进行测试,从而提高微电阻测试效率。The micro-resistance testing device of the present utility model comprises a lower clamp fixed on the lower fixed platform and an upper clamp fixed on the upper fixed platform through the test fixture, and the upper clamp is arranged relative to the lower clamp , the lower fixture is used to clamp the circuit board, the test module is clamped between the upper fixed table and the lower fixed table, and the test module is provided with a test probe and a test probe connected to the test probe A test circuit, the test probe is used to contact the micro-resistor on the circuit board when the upper fixture and the lower fixture are close together, the charge-coupled image sensor is fixed on the upper fixture and the lower fixture It is used to monitor the position information of the circuit board, so as to realize the automatic test of the micro-resistance of the circuit board, so as to meet the test of the micro-resistance of the batch circuit board, thereby improving the efficiency of the micro-resistance test.

以上所述是本实用新型的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本实用新型原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也视为本实用新型的保护范围。The foregoing is a preferred embodiment of the present utility model, and it should be pointed out that for those of ordinary skill in the art, without departing from the principle of the present utility model, some improvements and modifications can also be made. These improvements and modifications It is also regarded as the protection scope of the present utility model.

Claims (10)

1.一种微电阻测试装置,用于测试电路板的微电阻,其特征在于,所述微电阻装置包括测试机构、驱动机构和控制机构,所述测试机构包括基座、工作台、测试治具、测试模组和电荷耦合图像传感仪,所述工作台包括安装于所述基座上的下固定台和相对所述下固定台滑动设置的上固定台,所述测试治具包括固定于所述下固定台上的下夹具和固定于所述上固定台上的上夹具,所述上夹具相对所述下夹具设置,所述下夹具用以装夹电路板,所述上固定台和所述下固定台之间装夹所述测试模组,所述测试模组设有测试探头和连接于所述测试探头的测试电路,所述测试探头用以在所述上夹具与所述下夹具靠拢时接触所述电路板上的微电阻,所述电荷耦合图像传感仪固定于所述上夹具和所述下夹具之间,用于监测电路板的位置信息,所述驱动机构驱动所述下固定台滑动,所述控制机构电连接所述驱动机构和所述测试模组,以控制所述驱动机构运行,并控制所述测试模组测试电路板的微电阻。1. a micro-resistance testing device, for testing the micro-resistance of circuit board, it is characterized in that, described micro-resistance device comprises test mechanism, drive mechanism and control mechanism, and described test mechanism comprises base, workbench, test fixture A tool, a test module and a charge-coupled image sensor, the workbench includes a lower fixed table mounted on the base and an upper fixed table slidably set relative to the lower fixed table, and the test fixture includes a fixed The lower fixture on the lower fixed platform and the upper fixture fixed on the upper fixed platform, the upper fixture is arranged relative to the lower fixture, the lower fixture is used to clamp the circuit board, and the upper fixed platform The test module is clamped between the lower fixed table, the test module is provided with a test probe and a test circuit connected to the test probe, and the test probe is used for connecting the upper fixture and the The lower clamp contacts the micro-resistor on the circuit board when the lower clamp approaches, the charge-coupled image sensor is fixed between the upper clamp and the lower clamp, and is used to monitor the position information of the circuit board, and the driving mechanism drives The lower fixed table slides, and the control mechanism is electrically connected to the drive mechanism and the test module to control the operation of the drive mechanism and control the test module to test the micro-resistance of the circuit board. 2.根据权利要求1所述的微电阻测试装置,其特征在于,所述微电阻测试装置还包括进料机构,所述进料机构包括进料架和滑动连接于所述进料架的进料台,所述进料架固定于所述基座一侧,所述进料台用以向所述下夹具放置电路板,所述驱动机构还驱动所述进料台滑动。2. micro-resistance testing device according to claim 1, is characterized in that, described micro-resistance testing device also comprises feeding mechanism, and described feeding mechanism comprises feeding rack and is slidably connected to the feeder of described feeding rack. A feeding table, the feeding frame is fixed on one side of the base, the feeding table is used to place the circuit board to the lower fixture, and the driving mechanism also drives the feeding table to slide. 3.根据权利要求2所述的微电阻测试装置,其特征在于,所述进料机构还包括固定于所述进料架的第一竖直传动轴和滑动连接于所述第一竖直传动轴的第一水平传动轴,所述第一水平传动轴沿竖直方向在所述第一竖直传动轴上滑动设置,所述进料台沿水平方向在所述第一水平传动轴上滑动设置。3. micro-resistance testing device according to claim 2, is characterized in that, described feed mechanism also comprises the first vertical transmission shaft that is fixed on described feed rack and is slidably connected with described first vertical transmission shaft. The first horizontal transmission shaft of the shaft, the first horizontal transmission shaft is slidably arranged on the first vertical transmission shaft in the vertical direction, and the feeding table is slid on the first horizontal transmission shaft in the horizontal direction set up. 4.根据权利要求1所述的微电阻测试装置,其特征在于,所述微电阻测试装置还包括出料机构,所述出料机构包括出料架和滑动连接于所述出料架的出料台,所述出料架固定于所述基座相对所述进料架的另一侧,所述出料台用以从所述下夹具取出电路板,所述驱动机构还驱动所述出料台滑动。4. micro-resistance testing device according to claim 1, is characterized in that, described micro-resistance testing device also comprises discharge mechanism, and described discharge mechanism comprises discharge frame and is slidably connected to the discharge frame of described discharge frame. A material table, the discharge frame is fixed on the other side of the base relative to the feed frame, the discharge table is used to take out the circuit board from the lower fixture, and the drive mechanism also drives the discharge Table slides. 5.根据权利要求4所述的微电阻测试装置,其特征在于,所述出料机构还包括固定于所述出料架的第二竖直传动轴和滑动连接于所述第二竖直传动轴的第二水平传动轴,所述第二水平传动轴沿竖直方向在所述第二竖直传动轴上滑动设置,所述出料台沿水平方向在所述第二水平传动轴上滑动设置。5. micro-resistance testing device according to claim 4, is characterized in that, described discharge mechanism also comprises the second vertical transmission shaft that is fixed on described discharge rack and is slidably connected with described second vertical transmission shaft. The second horizontal transmission shaft of the shaft, the second horizontal transmission shaft is slid on the second vertical transmission shaft in the vertical direction, and the discharge table is slid on the second horizontal transmission shaft in the horizontal direction set up. 6.根据权利要求1所述的微电阻测试装置,其特征在于,所述微电阻测试装置还包括微调机构,所述微调机构安装于所述基座上,用以调节所述上固定台或/和所述下固定台的水平面位置。6. micro-resistance testing device according to claim 1, is characterized in that, described micro-resistance testing device also comprises fine-tuning mechanism, and described fine-tuning mechanism is installed on the described base, in order to adjust described upper fixed table or / and the horizontal plane position of the lower fixed platform. 7.根据权利要求1所述的微电阻测试装置,其特征在于,所述微调机构包括上调节组件和下调节组件,所述上调节组件安装于所述基座上,用以调节所述上固定台的前后、左右及旋转角度位置,所述下调节组件安装于所述基座上,用以调节所述下固定台的前后、左右及旋转角度位置。7. The micro-resistance testing device according to claim 1, wherein the fine-tuning mechanism includes an upper adjustment assembly and a lower adjustment assembly, and the upper adjustment assembly is installed on the base to adjust the upper adjustment assembly. The front, rear, left and right, and rotation angle positions of the fixed platform, the lower adjustment component is installed on the base, and is used to adjust the front, rear, left and right, and rotation angle positions of the lower fixed platform. 8.根据权利要求1所述的微电阻测试装置,其特征在于,所述控制机构包括显示器和操作键盘,所述显示器固定于所述基座上,电连接所述测试模组,用于显示所述测试模组的测试信息,所述操作键盘固定于所述基座上,电连接所述测试模组,用于向所述测试模组输入测试指令。8. micro-resistance testing device according to claim 1, is characterized in that, described control mechanism comprises display and operation keyboard, and described display is fixed on the described base, is electrically connected with described testing module, is used for displaying For the test information of the test module, the operation keyboard is fixed on the base, electrically connected to the test module, and used for inputting test instructions to the test module. 9.根据权利要求8所述的微电阻测试装置,其特征在于,所述控制机构还包括电连接所述显示器和所述操作键盘的控制处理器,所述控制处理器为计算机。9. The micro-resistance testing device according to claim 8, wherein the control mechanism further comprises a control processor electrically connected to the display and the operation keyboard, and the control processor is a computer. 10.根据权利要求1所述的微电阻测试装置,其特征在于,所述驱动机构为马达。10. The micro-resistance testing device according to claim 1, wherein the driving mechanism is a motor.
CN201520840380.XU 2015-10-27 2015-10-27 Little resistance test device Expired - Lifetime CN205120829U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106526327A (en) * 2016-12-26 2017-03-22 昆山丘钛微电子科技有限公司 DCR micro resistor automatic measuring machine
TWI658279B (en) * 2017-03-20 2019-05-01 上海騏宏電驅動科技有限公司 Resistance measurement system and resistance measurement device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106526327A (en) * 2016-12-26 2017-03-22 昆山丘钛微电子科技有限公司 DCR micro resistor automatic measuring machine
CN106526327B (en) * 2016-12-26 2023-08-29 昆山丘钛微电子科技有限公司 DCR micro-resistance automatic measuring machine
TWI658279B (en) * 2017-03-20 2019-05-01 上海騏宏電驅動科技有限公司 Resistance measurement system and resistance measurement device

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