CN205120829U - Little resistance test device - Google Patents
Little resistance test device Download PDFInfo
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- CN205120829U CN205120829U CN201520840380.XU CN201520840380U CN205120829U CN 205120829 U CN205120829 U CN 205120829U CN 201520840380 U CN201520840380 U CN 201520840380U CN 205120829 U CN205120829 U CN 205120829U
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Abstract
The utility model discloses a little resistance test device for little resistance of test circuit board, little electrical resistance device includes accredited testing organization, actuating mechanism and control mechanism, accredited testing organization includes base, workstation, test fixture, test module and electric charge coupling image sensing appearance, the workstation includes fixed station and last fixed station down, test fixture includes anchor clamps and last anchor clamps down, it is relative to go up anchor clamps lower fixture set, anchor clamps are for clamping circuit board down, go up the fixed station with clamping between the lower fixed station test module, test module is equipped with the test probe, the test probe contact little resistance on the circuit board, the positional information of electric charge coupling observation circuit board, the actuating mechanism drive the fixed station slides down, control mechanism control actuating mechanism operation, and control little resistance of test module test circuit board.
Description
Technical field
The utility model relates to circuit board resistance test field, particularly relates to a kind of micro-resistance testing device.
Background technology
As everyone knows, all electronic electric equipments or control system all will use printed-wiring board (PWB), and for guaranteeing that open circuit or short circuit do not occur wiring board, printed-wiring board (PWB) all needs the test by PCB test machine before shipment, is detected by underproof wiring board.
Along with the fast development of electronic technology, the making number of plies of printed wiring board (PCB) is more and more higher, line density is more and more closeer, pad size does less and less, the requirement of client to plate is more and more tighter, especially the security of PCB and stability, such as concern the Automobile Plate of life security, feel concerned about the Aerospace Control system electronic plate etc. of national defence.Common two-terminal test machine, usual employing be broken string method of testing, that the impedance of adding tested PCB by known winding displacement impedance, Electronic Control impedance and contact impedance is planted, so impedance real in tested PCB cannot be measured, with tiny flaw in pore and circuit microscopic nicks, cannot be detected especially.When circuit resistance is less than 20 Ω, substantially become its testing blind zone.Some defect of PCB is found in actual production, as the problems such as having no copper in the holes, cavity, copper is thin, line is young, circuit breach all can have influence on circuit resistance, the test result display PASS when resistance is less than 20 Ω, but client's resistance after high-temperature soldering changes, open circuit problem is caused to occur, finally cause customer complaint, serious also need is paid an indemnity to client.
Existing printed-wiring board (PWB) test machine mainly contains following several: double close, four times of close, six times of close general two line test machines, are mainly used in the test of common wiring board; Four line flying probe testers, are mainly used in small resistor PCB and test, but general only for sample test, are difficult to the demand meeting batch board test.
Utility model content
The purpose of this utility model is to provide a kind of micro-resistance testing device improving testing efficiency.
In order to solve the problems of the technologies described above, the utility model provides a kind of micro-resistance testing device, for micro-resistance of testing circuit board, wherein, described micro-resistance device comprises mechanism for testing, driving mechanism and control gear, described mechanism for testing comprises pedestal, worktable, measurement jig, test module and charge-coupled image sensing instrument, described worktable comprises the upper fixed station that the lower fixed station be installed on described pedestal is arranged with relative described lower fixed station slip, described measurement jig comprises the lower clamp be fixed on described lower fixed station and the upper fixture be fixed on fixed platform, the relatively described lower clamp of described upper fixture is arranged, described lower clamp is in order to clamping circuit board, module is tested described in clamping between fixed and described lower fixed station, described test module is provided with test probe and is connected to the test circuit of described test probe, described test probe contacts the micro-resistance on described circuit board when drawing close with described lower clamp in order to fixture on described, described charge-coupled image sensing instrument is fixed between described upper fixture and described lower clamp, for the positional information of observation circuit plate, described driving mechanism drives described lower fixed station to slide, described control gear is electrically connected described driving mechanism and described test module, run to control described driving mechanism, and control micro-resistance of described test module testing circuit board.
Wherein, described micro-resistance testing device also comprises feeding mechanism, described feeding mechanism comprises feeding rack and is slidably connected to the loading bay of described feeding rack, described feeding rack is fixed on described pedestal side, described loading bay is in order to place circuit board to described lower clamp, and described driving mechanism also drives described loading bay to slide.
Wherein, described feeding mechanism also comprises the first vertical transmission shaft being fixed on described feeding rack and the first horizontal drive shaft being slidably connected to the described first vertical transmission shaft, described first horizontal drive shaft vertically slides and arranges on the described first vertical transmission shaft, and described loading bay slides in the horizontal direction and arranges on described first horizontal drive shaft.
Wherein, described micro-resistance testing device also comprises discharging mechanism, described discharging mechanism comprises discharge rack and is slidably connected to the discharge pedestal of described discharge rack, described discharge rack is fixed on the opposite side of the relatively described feeding rack of described pedestal, described discharge pedestal is in order to take out circuit board from described lower clamp, and described driving mechanism also drives described discharge pedestal to slide.
Wherein, described discharging mechanism also comprises the second vertical transmission shaft being fixed on described discharge rack and the second horizontal drive shaft being slidably connected to the described second vertical transmission shaft, described second horizontal drive shaft vertically slides and arranges on the described second vertical transmission shaft, and described discharge pedestal slides in the horizontal direction and arranges on described second horizontal drive shaft.
Wherein, described micro-resistance testing device also comprises micro-adjusting mechanism, and described micro-adjusting mechanism is installed on described pedestal, in order to regulate fixed or/and the horizontal plane position of described lower fixed station.
Wherein, described micro-adjusting mechanism comprises adjusting part and lower adjusting part, described upper adjusting part is installed on described pedestal, in order to regulate all around and the rotary angle position of fixed, described lower adjusting part is installed on described pedestal, in order to regulate all around and the rotary angle position of described lower fixed station.
Wherein, described control gear comprises display and operation keyboard, described display is fixed on described pedestal, be electrically connected described test module, for showing the detecting information of described test module, described operation keyboard is fixed on described pedestal, is electrically connected described test module, for described test module input test instruction.
Wherein, described control gear also comprises the control processor of the described display of electrical connection and described operation keyboard, and described control processor is computing machine.
Wherein, described driving mechanism is motor.
Micro-resistance testing device of the present utility model, the lower clamp be fixed on described lower fixed station and the upper fixture be fixed on fixed platform is comprised by described measurement jig, the relatively described lower clamp of described upper fixture is arranged, described lower clamp is in order to clamping circuit board, on described, module is tested described in lower fixed station clamping, described test module is provided with test probe and is connected to the test circuit of described test probe, described test probe contacts the micro-resistance on described circuit board when drawing close with described lower clamp in order to fixture on described, described charge-coupled image sensing instrument is fixed between described upper fixture and described lower clamp, for the positional information of observation circuit plate, thus micro-resistance of realizing circuit plate is tested automatically, to meet, micro-resistance of volume circuit board is tested, thus improve micro-resistance test efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical solution of the utility model, be briefly described to the accompanying drawing used required in embodiment below, apparently, accompanying drawing in the following describes is only embodiments more of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the schematic diagram of micro-resistance testing device that the utility model provides;
Fig. 2 is the enlarged diagram of the II part of micro-resistance testing device of Fig. 1.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is clearly and completely described.
Refer to Fig. 1 and Fig. 2, the micro-resistance testing device 100 of the one that the utility model embodiment provides.The micro-resistance testing device 100 of the one that the utility model embodiment provides.Described micro-resistance testing device 100 comprises mechanism for testing 10, driving mechanism 20 and control gear 30.Described mechanism for testing 10 comprises pedestal 11, worktable 12, measurement jig 13, test module 14 and charge-coupled image sensing instrument (not shown).Described worktable 12 comprises and is fixed on upper fixed station 122 on described pedestal 11 and relative fixed the 122 lower fixed station 121 arranged that slides, and described measurement jig 13 comprises the lower clamp 131 be fixed on described lower fixed station 121 and the upper fixture 132 be fixed on fixed 122.The relatively described lower clamp 131 of described upper fixture 132 is arranged, and described lower clamp 131, in order to clamping circuit board (not shown), tests module 14 described in clamping between fixed 122 and described lower fixed station 121.Described test module 14 is provided with test probe (not shown) and is connected to the test circuit (not shown) of described test probe, contacts the micro-resistance on described circuit board when described test probe is drawn close with described lower clamp 131 in order to fixture 132 on described.Described charge-coupled image sensing instrument is fixed between described upper fixture 132 and described lower clamp 131, for the positional information of observation circuit plate.Described driving mechanism 20 drives described lower fixed station 121 to slide, and described control gear 30 is electrically connected described driving mechanism 20 and described test module 14, runs to control described driving mechanism 20, and controls micro-resistance of described test module 14a testing circuit board.
Described lower clamp 131 is driven to draw close to described upper fixture 132 by described lower fixed station 121, thus the circuit board realized on the described lower clamp 131 of the automatic contact of described test module 14, thus realize the micro-resistance of test automatically, to meet, micro-resistance of volume circuit board is tested, thus make described micro-resistance testing device 100 improve testing efficiency.
In present embodiment, described pedestal 11 is a casing, and described pedestal 11 comprises the bottom 11a and top 11b that are oppositely arranged, and described bottom 11a is fixed on ground, and described top 11b installs described lower fixed station 121.Arrange transmission component (not shown) in described pedestal 11, the driving force of described driving mechanism 20 is passed to described lower fixed station 121 by described transmission component, slides to drive described lower fixed station 121.In other embodiments, described pedestal 11 can also be made up of many steel poles.
In present embodiment, described lower fixed station 121 is rectangle plate, described lower fixed station 121 is slidably connected on described pedestal 11, described lower fixed station 121 can slide along the horizontal plane on described pedestal 11, to regulate the position of described lower fixed station 121, to facilitate the position of regulating circuit plate, improve the test accuracy rate of described micro-resistance testing device 100.The one side that described lower fixed station 121 deviates from described pedestal 11 arranges locating slot (not shown), and described locating slot in order to fixing described lower clamp 131, and passes through lower clamp 131 described in screw lock.In other embodiments, described lower fixed station 121 can also be arrange register pin, and described register pin positions described lower clamp 131, and described lower fixed station 121 can also be arrange buckle to be connected together described lower clamp 131.
In present embodiment, fixed 122 is rectangle plate, and fixed 122 one side towards described lower fixed station 121 fixes described upper fixture 132.Can also slide in the horizontal direction for fixed 122, thus the horizontal level of fixed 122 can be regulated, to facilitate the position regulating upper fixture 132, allow position on its alignment circuit plate.Improve the test accuracy rate of described micro-resistance testing device 100.In other embodiments, fixed 122 can also be that buckle is connected together in described upper fixture 132.
In present embodiment, described lower clamp 131 removably connects described test module 14.Described lower fixed station 121 is utilized to clamp described test module 14, thus the described test module 14 of maintenance for convenience detach, thus improve the serviceable life of described micro-resistance testing device 100.Concrete, described lower fixed station 121 utilizes back up pad (not shown) and U-shaped card clamp to hold described test module 14.
In present embodiment, described upper fixture 132 removably connects described test module 14.Utilize fixed 122 and clamp described test module 14, thus the described test module 14 of maintenance for convenience detach, thus improve the serviceable life of described micro-resistance testing device 100.Concrete, fixed 122 utilizes back up pad (not shown) and U-shaped card clamp to hold described test module 14.
In present embodiment, described test module 14 comprises testing circuit board 141 and is fixed on the test dials 142 of described testing circuit board 141, and described test circuit is arranged on described testing circuit board 141, and described testing circuit board is four-wire ohm measurement circuit.The described probe of array many on described test dials 142, each probe connects described measurement circuit through cable.Utilize described test module 14 can test out micro-resistance of any circuit structure on circuit board fast, improve the testing efficiency of described micro-resistance testing device 100.In other embodiment, described test module 14 can also comprise mu balanced circuit and current stabilization circuit, to improve the security of described micro-resistance testing device 100.
In present embodiment, described charge-coupled image sensing instrument comprises lower sensing instrument (not shown) and upper sensing instrument (not shown), described lower sensing instrument is fixed on described pedestal 11, near described lower fixed station 121, to monitor the horizontal level of described lower fixed station 121.Described upper sensing instrument is fixed on fixed 122, to monitor the horizontal level of described lower fixed station 122, thus the convenient horizontal level regulating described lower fixed station 121 and fixed 122, the i.e. convenient horizontal level regulating described fixture 13 and circuit board, thus the circuit on the accurate alignment circuit plate of fixture 13 is tested, thus improve the test accuracy of micro-resistance testing device 100.
In present embodiment, described driving mechanism 20 is fixed in described pedestal 11, described driving mechanism 20 motors, described driving mechanism 20 utilizes transmission component that torque drive power is conducted to described lower fixed station 121, vertically slides for relatively fixed 122 to drive described lower fixed station 121.When described driving mechanism 20 drives described lower fixed station 121 to draw close to fixed 122, contact with the probe on described lower clamp 131 to make the circuit board of described upper fixture 132, thus realize testing the micro-resistance on circuit board, after micro-resistance test of this circuit board terminates, described driving mechanism 20 drives described lower fixed station 121 away from fixed 122, thus described circuit board is away from described test module 14, thus conveniently take out circuit board.In other embodiment, described driving mechanism 20 can also be hydraulic driving machine or air pressure driving machine.
In present embodiment, described control gear 30 comprises display 31, operation keyboard 32 and control processor 33, described display 31 is fixed on described pedestal 11, be electrically connected described test module 14, for showing the detecting information of described test module 14, described operation keyboard 31 is fixed on described pedestal 11, is electrically connected described test module 14, for described test module 14 input test instruction.Described control processor 33 is computing machine.Described control processor 33 is electrically connected described display 31 and described operation keyboard 32, and be electrically connected described test module 14, to process the test signal of described test module 14, and to the transmission test instruction of described test module 14, described control processor 33 accepts manipulation instruction from described operation keyboard 32 simultaneously, and inputs idsplay order to described display 31.In other embodiments, described control gear 30 can also be the computing machine of many servomechanisms.
Further, described micro-resistance testing device 100 also comprises feeding mechanism 40, described feeding mechanism 40 comprises feeding rack 41 and is slidably connected to the loading bay 42 of described feeding rack 41, described feeding rack 41 is fixed on described pedestal 11 side, described loading bay 42 is in order to place circuit board to described upper fixture 11, and described driving mechanism 20 also drives described loading bay 42 to slide.
In present embodiment, described feeding mechanism 40 also comprises the first vertical transmission shaft 43 being fixed on described feeding rack 41 and the first horizontal drive shaft 44 being slidably connected to the described first vertical transmission shaft 43.Described first horizontal drive shaft 44 vertically slides and arranges on the described first vertical transmission shaft 43, and described loading bay 42 slides in the horizontal direction and arranges on described first horizontal drive shaft 44.Described driving mechanism 20 also comprises feed motor (not shown), and described feed motor drives described first horizontal drive shaft 44 to slide, and drives described loading bay 42 to slide.Thus realize, automatically by lower clamp 131 described in circuit board clamping, improving the operational efficiency of described micro-resistance testing device 100.In other embodiment, described first horizontal drive shaft number can also be two, thus circuit board two dimensions are in the horizontal plane regulated.
Further, described micro-resistance testing device 100 also comprises discharging mechanism 50, described discharging mechanism 50 comprises discharge rack 51 and is slidably connected to the discharge pedestal 52 of described discharge rack 51, described discharge rack 51 is fixed on the opposite side of the relatively described feeding rack 41 of described pedestal 11, described discharge pedestal 52 is in order to take out circuit board from described lower clamp 131, and described driving mechanism 20 also drives described discharge pedestal 52 to slide.
In present embodiment, described discharging mechanism 50 also comprises the second vertical transmission shaft 53 being fixed on described discharge rack 51 and the second horizontal drive shaft 54 being slidably connected to the described second vertical transmission shaft 53, described second horizontal drive shaft 54 vertically slides and arranges on the described second vertical transmission shaft 53, and described discharge pedestal 52 slides in the horizontal direction and arranges on described second horizontal drive shaft 54.Described driving mechanism 30 also comprises discharging motor (not shown), and described discharging motor drives described second horizontal drive shaft 54 to slide, and drives described discharge pedestal 52 to slide.Thus realize automatically taking out circuit board from described lower clamp 131, improve the operational efficiency of described micro-resistance testing device 100.In other embodiment, described second horizontal drive shaft number can also be two, thus circuit board two dimensions are in the horizontal plane regulated.
Further, described micro-resistance testing device 100 also comprises micro-adjusting mechanism 60, and described micro-adjusting mechanism 60 is installed on described pedestal 11, in order to regulate fixed 122 or/and the horizontal level of described lower fixed station 121.
In present embodiment, described micro-adjusting mechanism 60 comprises adjusting part 61 and lower adjusting part 62, described upper adjusting part 61 is installed on described pedestal 11, in order to regulate the horizontal level of fixed 122, described lower adjusting part 62 is installed on described pedestal 11, in order to regulate the horizontal level of described lower fixed station 121.Concrete, described upper adjusting part 61 comprises two groups of orthogonal screw rod transmission axles (not shown) and upper governor motor (not shown), two groups of screw rod transmission axles are in order to mobile fixed 122 horizontal level at surface level, sensing instrument 152 monitors fixed 122 horizontal levels when there is deviation on described, described upper sensing instrument 152 sends position command to described control gear 30, thus the upper adjusting part 61 that described control gear 30 controls described micro-adjusting mechanism 60 runs, described upper governor motor drives two screw rod transmission axis of rotation, thus finely tune the horizontal level of fixed 122, the i.e. horizontal level of trimming circuit plate, thus ensure the test accuracy of described micro-resistance testing device 100.Described lower adjusting part 62 and the identical setting of described upper adjusting part 61 structure, do not repeat them here.In other embodiments, described upper adjusting part can also be two hydrostatic transmission axles and hydraulic drive motor composition.
Micro-resistance testing device of the present utility model, the lower clamp be fixed on described lower fixed station and the upper fixture be fixed on fixed platform is comprised by described measurement jig, the relatively described lower clamp of described upper fixture is arranged, described lower clamp is in order to clamping circuit board, module is tested described in clamping between fixed and described lower fixed station, described test module is provided with test probe and is connected to the test circuit of described test probe, described test probe contacts the micro-resistance on described circuit board when drawing close with described lower clamp in order to fixture on described, described charge-coupled image sensing instrument is fixed between described upper fixture and described lower clamp, for the positional information of observation circuit plate, thus micro-resistance of realizing circuit plate is tested automatically, to meet, micro-resistance of volume circuit board is tested, thus improve micro-resistance test efficiency.
The above is preferred implementation of the present utility model; it should be pointed out that for those skilled in the art, under the prerequisite not departing from the utility model principle; can also make some improvements and modifications, these improvements and modifications are also considered as protection domain of the present utility model.
Claims (10)
1. a micro-resistance testing device, for micro-resistance of testing circuit board, it is characterized in that, described micro-resistance device comprises mechanism for testing, driving mechanism and control gear, described mechanism for testing comprises pedestal, worktable, measurement jig, test module and charge-coupled image sensing instrument, described worktable comprises the upper fixed station that the lower fixed station be installed on described pedestal is arranged with relative described lower fixed station slip, described measurement jig comprises the lower clamp be fixed on described lower fixed station and the upper fixture be fixed on fixed platform, the relatively described lower clamp of described upper fixture is arranged, described lower clamp is in order to clamping circuit board, module is tested described in clamping between fixed and described lower fixed station, described test module is provided with test probe and is connected to the test circuit of described test probe, described test probe contacts the micro-resistance on described circuit board when drawing close with described lower clamp in order to fixture on described, described charge-coupled image sensing instrument is fixed between described upper fixture and described lower clamp, for the positional information of observation circuit plate, described driving mechanism drives described lower fixed station to slide, described control gear is electrically connected described driving mechanism and described test module, run to control described driving mechanism, and control micro-resistance of described test module testing circuit board.
2. micro-resistance testing device according to claim 1, it is characterized in that, described micro-resistance testing device also comprises feeding mechanism, described feeding mechanism comprises feeding rack and is slidably connected to the loading bay of described feeding rack, described feeding rack is fixed on described pedestal side, described loading bay is in order to place circuit board to described lower clamp, and described driving mechanism also drives described loading bay to slide.
3. micro-resistance testing device according to claim 2, it is characterized in that, described feeding mechanism also comprises the first vertical transmission shaft being fixed on described feeding rack and the first horizontal drive shaft being slidably connected to the described first vertical transmission shaft, described first horizontal drive shaft vertically slides and arranges on the described first vertical transmission shaft, and described loading bay slides in the horizontal direction and arranges on described first horizontal drive shaft.
4. micro-resistance testing device according to claim 1, it is characterized in that, described micro-resistance testing device also comprises discharging mechanism, described discharging mechanism comprises discharge rack and is slidably connected to the discharge pedestal of described discharge rack, described discharge rack is fixed on the opposite side of the relatively described feeding rack of described pedestal, described discharge pedestal is in order to take out circuit board from described lower clamp, and described driving mechanism also drives described discharge pedestal to slide.
5. micro-resistance testing device according to claim 4, it is characterized in that, described discharging mechanism also comprises the second vertical transmission shaft being fixed on described discharge rack and the second horizontal drive shaft being slidably connected to the described second vertical transmission shaft, described second horizontal drive shaft vertically slides and arranges on the described second vertical transmission shaft, and described discharge pedestal slides in the horizontal direction and arranges on described second horizontal drive shaft.
6. micro-resistance testing device according to claim 1, it is characterized in that, described micro-resistance testing device also comprises micro-adjusting mechanism, and described micro-adjusting mechanism is installed on described pedestal, in order to regulate fixed or/and the horizontal plane position of described lower fixed station.
7. micro-resistance testing device according to claim 1, it is characterized in that, described micro-adjusting mechanism comprises adjusting part and lower adjusting part, described upper adjusting part is installed on described pedestal, in order to regulate all around and the rotary angle position of fixed, described lower adjusting part is installed on described pedestal, in order to regulate all around and the rotary angle position of described lower fixed station.
8. micro-resistance testing device according to claim 1, it is characterized in that, described control gear comprises display and operation keyboard, described display is fixed on described pedestal, be electrically connected described test module, for showing the detecting information of described test module, described operation keyboard is fixed on described pedestal, be electrically connected described test module, for described test module input test instruction.
9. micro-resistance testing device according to claim 8, is characterized in that, described control gear also comprises the control processor of the described display of electrical connection and described operation keyboard, and described control processor is computing machine.
10. micro-resistance testing device according to claim 1, is characterized in that, described driving mechanism is motor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520840380.XU CN205120829U (en) | 2015-10-27 | 2015-10-27 | Little resistance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520840380.XU CN205120829U (en) | 2015-10-27 | 2015-10-27 | Little resistance test device |
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| Publication Number | Publication Date |
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| CN205120829U true CN205120829U (en) | 2016-03-30 |
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| CN201520840380.XU Active CN205120829U (en) | 2015-10-27 | 2015-10-27 | Little resistance test device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526327A (en) * | 2016-12-26 | 2017-03-22 | 昆山丘钛微电子科技有限公司 | DCR micro resistor automatic measuring machine |
| TWI658279B (en) * | 2017-03-20 | 2019-05-01 | 上海騏宏電驅動科技有限公司 | Resistance measurement system and resistance measurement device |
-
2015
- 2015-10-27 CN CN201520840380.XU patent/CN205120829U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526327A (en) * | 2016-12-26 | 2017-03-22 | 昆山丘钛微电子科技有限公司 | DCR micro resistor automatic measuring machine |
| CN106526327B (en) * | 2016-12-26 | 2023-08-29 | 昆山丘钛微电子科技有限公司 | DCR micro-resistance automatic measuring machine |
| TWI658279B (en) * | 2017-03-20 | 2019-05-01 | 上海騏宏電驅動科技有限公司 | Resistance measurement system and resistance measurement device |
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