CN205015299U - X X -ray diffraction device - Google Patents
X X -ray diffraction device Download PDFInfo
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- CN205015299U CN205015299U CN201520765284.3U CN201520765284U CN205015299U CN 205015299 U CN205015299 U CN 205015299U CN 201520765284 U CN201520765284 U CN 201520765284U CN 205015299 U CN205015299 U CN 205015299U
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Abstract
The utility model relates to a X X -ray diffraction device. Conventional X X -ray diffraction device can only carry out conventional X X -ray diffraction experiment, can not satisfy the needs of modern experimental science research. The utility model discloses an in some embodiments, X X -ray diffraction device still has and is used for applying the power of voltage and being used for shining the light source of light to the sample to the sample. Therefore, the utility model discloses a X X -ray diffraction device can carry out the X X -ray diffraction experiment under abundanter experiment condition, study the change of crystal structure under electric field and light field of sample. The utility model discloses can be applied to various X X -ray diffraction experimental apparatuss.
Description
Technical field
The utility model relates generally to X-ray diffraction (XRD) device, and more particularly, relate to a kind of XRD device, it comprises electric field application devices and light irradiation apparatus, thus can the characteristic variations of study sample under electric field and light field.
Background technology
X-ray diffraction device is one of basic tool used in modern crystals research.When X ray incides on crystal, the structure cell be arranged in by atomic rule due to crystal forms, distance between these regularly arranged atoms is in the identical order of magnitude with the wavelength of incident X ray, therefore mutually interfered by the X ray of different atomic scattering, some particular orientation produces strong X-ray diffraction.Diffracted ray the orientation of space distribution and intensity and crystal structure closely related, the ultimate principle of Here it is X-ray diffraction.
Developed a lot of X-ray diffraction device in prior art, it is according to above-mentioned ultimate principle, and studies each attribute of crystal in conjunction with computer disposal instrument.But, along with the development of science and technology, more requirement be it is also proposed to traditional XRD device.Such as, scientific research personnel wishes research crystalline material attribute change at different conditions.Therefore, wish that XRD device can provide the function more enriched to meet different measurement requirements.
Utility model content
An aspect of the present utility model is to provide a kind of X-ray diffraction device, and it comprises electric field application devices and light irradiation apparatus, thus can the characteristic variations of study sample under electric field and light field.
According to the utility model one one exemplary embodiment, a kind of X-ray diffraction device comprise sample stage for laying sample and for X-ray irradiation to the x-ray source on described sample.Described X-ray diffraction device also comprises: to be arranged on described sample stage and to be positioned at first electrode at the lower surface place of described sample; And power supply, its one end is connected to described first electrode by the first wire, and the other end is connected to the upper surface of described sample by the second wire.
In an exemplary embodiment, described X-ray diffraction device also comprises for the light source to described sample irradiation light.
In an exemplary embodiment, described light source is visible light source, infrared light light source, ultraviolet source or their combination.
In an exemplary embodiment, described light source is arranged on precalculated position and impinges perpendicularly on the upper surface of described sample with the light making described light source and launch.
In an exemplary embodiment, described X-ray diffraction device also comprises: the first track, described x-ray source to be arranged on described first track and can along described first track around described rotary sample to change the incident angle of the X ray that incide on described sample.
In an exemplary embodiment, described X-ray diffraction device also comprises the beam collimator for collimating the X ray that described x-ray source is launched.
In an exemplary embodiment, described X-ray diffraction device also comprises housing, and described sample stage and described x-ray source are all arranged in described housing.
In an exemplary embodiment, described X-ray diffraction device also comprises: for the air extractor of bleeding to described housing; And the aerating device for inflating described housing.
In an exemplary embodiment, the end that will be connected to described second wire of described sample is provided with the second electrode of the upper surface for attaching to described sample.
In an exemplary embodiment, described X-ray diffraction device also comprises the X-ray detector for detecting the X ray through described sample reflection or transmission.
Utilize X-ray diffraction device of the present utility model, can when applying separately electric field to sample, when separately applying illumination or when applying both electric field and illumination, utilize X-ray diffraction to carry out the crystal structure of study sample, thus achieve abundanter laboratory facilities.
Accompanying drawing explanation
Fig. 1 illustrates the XRD device according to the utility model one one exemplary embodiment.
Fig. 2 illustrates the XRD device according to another one exemplary embodiment of the utility model.
Embodiment
Fig. 1 illustrates the XRD device 100 according to the utility model one embodiment, and it comprises sample stage 110 for placing sample and for the x-ray source 120 to sample irradiation X ray.
As shown in Figure 1, sample stage 110 can be the sample stage that this area is commonly used, the disc structure be such as made up of stainless steel.In embodiment of the present utility model, sample stage 110 is also provided with the first electrode 112.Such as, the first electrode 112 can be Copper Foil or copper coin, and it also can have circular configuration, and is placed on sample stage 110.In certain embodiments, can be kept apart by insulating material between the first electrode 112 and sample stage 110, to avoid the signals such as electrostatic on sample stage 110 to the interference of the signal on the first electrode 112.First electrode 112 can be connected to power supply by the through hole of wire on sample stage 110, and this will describe below in further detail.
In further embodiments, the first electrode 112 can be omitted, and sample stage 110 itself can be such as made up of copper coin and be used as the first electrode.Like this can reducing portion number of packages, and make the structure of XRD device simpler.
Sample 114 can be placed on the first electrode 112.In one embodiment, sample 114 can be adhered on the first electrode 112 by conductive paste.Conductive paste can promote the excellent electric contact between sample 114 and the first electrode 112, and can also keep fixing to make it during X-ray measurement by fixed sample 114.The upper surface of sample 114 can be wired to power supply, and this also will describe below in further detail.
X-ray source 120 is for launching X ray 122, and X ray 122, after beam adjuster 124 collimates, is irradiated on sample 114 at a certain angle.Although not shown, x-ray source 120 can be arranged on the track (not shown) around sample stage 110, thus when x-ray source 120 is along rail moving, can change the incident angle of the X ray incided on sample 114.In certain embodiments, sample stage 110 can also rotate, to adjust the orientation of sample 114 relative to x-ray source 120.
X-ray detector 126 is for collecting the X ray reflected through sample 114.By analyzing the X-ray diffraction pattern detected, the related crystalline structural information of sample 114 can be obtained.
XRD device 100 can also comprise power supply 130, and its one end is connected to the upper surface of sample 114 by wire 132, and the other end is connected to first electrode 112 at the lower surface place being positioned at sample 114 by wire 134.In certain embodiments, wire 132 can be welded direct on the upper surface of sample 114.In further embodiments, the end of wire 132 can be welded with current-carrying plate such as copper coin, and this current-carrying plate can be adhered on the upper surface of sample 114 by such as conductive paste.This current-carrying plate answers area less, thus the wide area surface that can not cover sample 114 is to affect x-ray bombardment on sample 114.Wire 134 is connected to the first electrode 112 by the through hole on sample stage 110.In further embodiments, wire 134 also can be connected to the first electrode 112 from the side.In certain embodiments, sample stage 110 can rotate.Now, wire 132 and 134 can be fixed to the side of sample stage 110, in order to avoid affect the connection between wire and sample or electrode because of rotation.
As mentioned above, power supply 130 is executed alive to sample 114 while, X-ray diffraction measurement can be carried out, studies the impact of electric field on the crystal structure of sample 114.
In the embodiment shown in fig. 1, sample stage 110 and on the first electrode 112 and sample 114, x-ray source 120, beam adjuster 124 and X-ray detector 126 can be arranged in housing 102.When housing 102 is closed, can carry out vacuumizing or being filled with helium.Therefore, XRD device 100 can also include and bleed and charger.In the embodiment shown in fig. 1, power supply 130 can be arranged on outside housing 102.In further embodiments, power supply 130 also can be arranged in housing 102.
Referring to Fig. 2, the XRD device 200 according to another one exemplary embodiment of the utility model is described.In the XRD device 200 shown in Fig. 2, the parts identical with Fig. 1 identical Reference numeral instruction, herein by no longer repeated description.
As shown in Figure 2, XRD device 200 also comprises light source 140.Light source 140 can be visible light source, infrared light supply, ultraviolet source or their combination in any, to launch the light of different wave length.In the embodiment shown in Figure 2, the light 142 that light source 140 is launched can substantially vertically be irradiated on the surface of sample 114.In further embodiments, light source 140 also can be arranged on a position with the light 142 that it is launched at a predetermined angle oblique illumination on the surface of sample 114.In further embodiments, light source 140 can also be arranged on track (not shown), thus can change the incident angle of light 142 along rail moving.Be appreciated that vertical incidence is preferred, because maximum intensity of illumination can be realized.Equally, light source 140 also can be arranged in housing 102.
Here, utilize XRD device 200, when applying separately electric field to sample 114, when applying illumination separately or when applying both electric field and illumination, X-ray diffraction can be utilized to carry out the crystal structure of study sample 114, thus achieve abundanter laboratory facilities.
Although describe the embodiment of XRD device of the present utility model above with reference to reflective-mode, it should be understood that, principle of the present utility model also can be applied to the XRD device of transmission mode.Now, the first electrode 112 can be formed as having less area, thus can not block the X ray of transmission, or the first electrode 112 can be formed by transparent conductive material such as ITO, IZO etc.When being applied to transmission mode, according to instruction above, other adaptive change is that those skilled in the art are apparent, therefore repeats no more herein.
Describe the utility model with reference to specific embodiment above, it should be understood that, when not departing from thought of the present utility model and scope, the various changes in form and details can be carried out.Scope of the present utility model is defined by appended claims and equivalent thereof.
Claims (10)
1. an X-ray diffraction device, comprise sample stage for laying sample and for X-ray irradiation to the x-ray source on described sample, it is characterized in that, described X-ray diffraction device also comprises:
To be arranged on described sample stage and to be positioned at first electrode at the lower surface place of described sample; And
Power supply, its one end is connected to described first electrode by the first wire, and the other end is connected to the upper surface of described sample by the second wire.
2. X-ray diffraction device as claimed in claim 1, it is characterized in that, described X-ray diffraction device also comprises:
For the light source to described sample irradiation light.
3. X-ray diffraction device as claimed in claim 2, it is characterized in that, described light source is visible light source, infrared light light source, ultraviolet source or their combination.
4. X-ray diffraction device as claimed in claim 2, is characterized in that, described light source is arranged on precalculated position and impinges perpendicularly on the upper surface of described sample with the light making described light source and launch.
5. X-ray diffraction device as claimed in claim 1, it is characterized in that, described X-ray diffraction device also comprises:
First track, described x-ray source to be arranged on described first track and can along described first track around described rotary sample to change the incident angle of the X ray that incide on described sample.
6. X-ray diffraction device as claimed in claim 1, it is characterized in that, described X-ray diffraction device also comprises:
For collimating the beam collimator of the X ray that described x-ray source is launched.
7. X-ray diffraction device as claimed in claim 1, it is characterized in that, described X-ray diffraction device also comprises:
Housing, described sample stage and described x-ray source are all arranged in described housing.
8. X-ray diffraction device as claimed in claim 7, it is characterized in that, described X-ray diffraction device also comprises:
For the air extractor of bleeding to described housing; And
For the aerating device inflated described housing.
9. X-ray diffraction device as claimed in claim 1, it is characterized in that, the end that will be connected to described second wire of described sample is provided with the second electrode of the upper surface for attaching to described sample.
10. X-ray diffraction device as claimed in claim 1, it is characterized in that, described X-ray diffraction device also comprises:
For detecting the X-ray detector of the X ray through described sample reflection or transmission.
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CN201520765284.3U CN205015299U (en) | 2015-09-29 | 2015-09-29 | X X -ray diffraction device |
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CN201520765284.3U CN205015299U (en) | 2015-09-29 | 2015-09-29 | X X -ray diffraction device |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105738391A (en) * | 2016-03-09 | 2016-07-06 | 王利晨 | X-ray diffraction device with magnetic analysis function |
CN109416330A (en) * | 2016-07-16 | 2019-03-01 | 株式会社理学 | Mix inspection system |
WO2020220081A1 (en) * | 2019-05-02 | 2020-11-05 | Critus Pty Ltd | Thin film x-ray diffraction sample cell device and method |
-
2015
- 2015-09-29 CN CN201520765284.3U patent/CN205015299U/en active Active
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105738391A (en) * | 2016-03-09 | 2016-07-06 | 王利晨 | X-ray diffraction device with magnetic analysis function |
CN109416330A (en) * | 2016-07-16 | 2019-03-01 | 株式会社理学 | Mix inspection system |
US10983073B2 (en) | 2016-07-16 | 2021-04-20 | Rigaku Corporation | Hybrid inspection system |
CN109416330B (en) * | 2016-07-16 | 2022-09-27 | 株式会社理学 | Hybrid inspection system |
WO2020220081A1 (en) * | 2019-05-02 | 2020-11-05 | Critus Pty Ltd | Thin film x-ray diffraction sample cell device and method |
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