CN205002736U - Surface mounting integrated circuit pin coplanarity test platform - Google Patents
Surface mounting integrated circuit pin coplanarity test platform Download PDFInfo
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- CN205002736U CN205002736U CN201520746196.9U CN201520746196U CN205002736U CN 205002736 U CN205002736 U CN 205002736U CN 201520746196 U CN201520746196 U CN 201520746196U CN 205002736 U CN205002736 U CN 205002736U
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- optical glass
- backlight
- base
- precision optical
- workseat
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Abstract
The utility model relates to a surface mounting integrated circuit pin coplanarity test platform, including base and the backlight of setting on the base, the backlight outside in edge still is provided with the basis of reference of square tube -shape on the characterized by base, be provided with high printing opacity glass workseat on the backlight, high printing opacity glass workseat's upper surface is located same horizontal plane with the up end of basis of reference, the basis of reference outside is provided with high accuracy optical glass reflector all around respectively on the base, it is trapezoidal that high accuracy optical glass reflector is gone to the bottom for the upper base is greater than, contained angle on high accuracy optical glass reflector and the base between the plane is 45, the mirror surface of high accuracy optical glass reflector inwards. Adopt the utility model discloses, can reduce the cost of labor and directly test SMIC pin coplanarity and need not to use the reference block to mark the basis of reference plane. The utility model discloses simple structure, convenient to use, precision height.
Description
Technical field
The utility model relates to test platform, specifically surface mount integrated circuit pin coplanarity test platform.
Background technology
Surface mount integrated circuit (SMIC) is applied to practice widely, lead coplanarity is the important component part of SMIC outline dimension standard, this index carries out hand inspection by the operator on production line usually, its result affects greatly by artificial subjective factor, the not high and labor expense of accuracy.Existing automatic detection system error is little, but need use High-precision standard block and through strict calibration, not only use loaded down with trivial details, calibration result also directly affects accuracy of detection, and in addition, when sample and pedestal relative position change, test result is by inaccurate.Therefore, design that structure is simple, easy to use, precision is high and the surface mount integrated circuit pin coplanarity test platform do not affected by reference data calibration result is very necessary.
Summary of the invention
The purpose of this utility model is to provide that a kind of structure is simple, easy to use, precision is high and not by the surface mount integrated circuit pin coplanarity test platform that reference data calibration result affects.
For achieving the above object, the utility model adopts following technical scheme:
Surface mount integrated circuit pin coplanarity test platform, comprise pedestal and be arranged on the backlight on pedestal, it is characterized in that reference data pedestal being also provided with outside backlight square tubular, backlight is provided with high transparent glass workseat, the high upper surface of transparent glass workseat and the upper surface of reference data are positioned at same level, on pedestal, outside reference data, surrounding is respectively arranged with high-precision optical glass mirror, high-precision optical glass mirror is that upper base is greater than go to the bottom trapezoidal, angle on high-precision optical glass mirror and pedestal between plane is 45 °, the minute surface of high-precision optical glass mirror inwardly.
Further, the deviations from planarity of described high transparent glass workseat is not more than 2 μm, and described high-precision optical glass mirror is isosceles trapezoid, and adjacent high precision optical glass reflective mirror is connected to each other by its side.
Adopt the utility model, can cost of labor be reduced and directly test SMIC lead coplanarity without the need to using calibrated bolck to demarcate reference data plane.The utility model structure is simple, easy to use, precision is high.
Accompanying drawing explanation
Fig. 1 is the utility model structural representation;
Fig. 2 is the vertical view of Fig. 1;
Fig. 3 is that the A-A of Fig. 1 is to cut-open view;
Fig. 4 is the schematic diagram after the utility model puts SMIC.
In figure: 1-pedestal; 2-backlight; 3-reference data; 4-height transparent glass workseat; 5-high-precision optical glass mirror; The reflected image of 6-reference data in high-precision optical glass mirror; 7-SMIC; The reflected image of 8-SMIC in high-precision optical glass mirror.
Embodiment
Below in conjunction with the drawings and specific embodiments, the utility model is described in further detail, but this embodiment should not be construed as restriction of the present utility model.
Surface mount integrated circuit pin coplanarity test platform shown in figure, the backlight 2 comprising pedestal 1 and be arranged on pedestal 1, pedestal 1 is also provided with outside backlight 2 reference data 3 of square tubular, backlight 2 is provided with high transparent glass workseat 4, the upper surface of high transparent glass workseat 4 and the upper surface of reference data 3 are positioned at same level, on pedestal 1, outside reference data 3, surrounding is respectively arranged with high-precision optical glass mirror 5, it is trapezoidal that high-precision optical glass mirror 5 is gone to the bottom for upper base is greater than, angle on high-precision optical glass mirror 5 and pedestal 1 between plane is 45 °, the minute surface of high-precision optical glass mirror 5 inwardly.
Preferred embodiment is: in such scheme, and the deviations from planarity of described high transparent glass workseat 4 is not more than 2 μm, and described high-precision optical glass mirror 5 is isosceles trapezoid, and adjacent high precision optical glass reflective mirror 5 is connected to each other by its side.
During the work of this device, first SMIC7 pin is placed on downwards on high transparent glass workseat 4, then with the reflected image 8 of SMIC and the reflected image 6 of reference data 3 in industrial camera shooting high-precision optical glass mirror 5, then above-mentioned image is passed to computing machine.
The content be not described in detail in this instructions, belongs to the known prior art of those skilled in the art.
Claims (2)
1. surface mount integrated circuit pin coplanarity test platform, comprise pedestal (1) and be arranged on the backlight (2) on pedestal (1), it is characterized in that: the reference data (3) pedestal (1) being also provided with square tubular along backlight (2) outside, backlight (2) is provided with high transparent glass workseat (4), the upper surface of high transparent glass workseat (4) and the upper surface of reference data (3) are positioned at same level, in pedestal (1) upper reference data (3) outside, surrounding is respectively arranged with high-precision optical glass mirror (5), it is trapezoidal that high-precision optical glass mirror (5) is gone to the bottom for upper base is greater than, angle between high-precision optical glass mirror (5) and the upper plane of pedestal (1) is 45 °, the minute surface of high-precision optical glass mirror (5) inwardly.
2. surface mount integrated circuit pin coplanarity test platform according to claim 1, it is characterized in that: the deviations from planarity of described high transparent glass workseat (4) is not more than 2 μm, described high-precision optical glass mirror (5) is isosceles trapezoid, and adjacent high precision optical glass reflective mirror (5) is connected to each other by its side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520746196.9U CN205002736U (en) | 2015-09-23 | 2015-09-23 | Surface mounting integrated circuit pin coplanarity test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520746196.9U CN205002736U (en) | 2015-09-23 | 2015-09-23 | Surface mounting integrated circuit pin coplanarity test platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205002736U true CN205002736U (en) | 2016-01-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520746196.9U Active CN205002736U (en) | 2015-09-23 | 2015-09-23 | Surface mounting integrated circuit pin coplanarity test platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205002736U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106682413A (en) * | 2016-12-23 | 2017-05-17 | 湖北航天技术研究院计量测试技术研究所 | Determination method of base plane of lead of surface-mounted integrated circuit |
| CN109000593A (en) * | 2018-06-21 | 2018-12-14 | 上海先方半导体有限公司 | A kind of gauge device verifying thimble coplanarity |
-
2015
- 2015-09-23 CN CN201520746196.9U patent/CN205002736U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106682413A (en) * | 2016-12-23 | 2017-05-17 | 湖北航天技术研究院计量测试技术研究所 | Determination method of base plane of lead of surface-mounted integrated circuit |
| CN106682413B (en) * | 2016-12-23 | 2019-01-29 | 湖北航天技术研究院计量测试技术研究所 | The determination method of Surface Mount leads of IC basal plane |
| CN109000593A (en) * | 2018-06-21 | 2018-12-14 | 上海先方半导体有限公司 | A kind of gauge device verifying thimble coplanarity |
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|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |