CN204925167U - Diode test fixture - Google Patents
Diode test fixture Download PDFInfo
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- CN204925167U CN204925167U CN201520618411.7U CN201520618411U CN204925167U CN 204925167 U CN204925167 U CN 204925167U CN 201520618411 U CN201520618411 U CN 201520618411U CN 204925167 U CN204925167 U CN 204925167U
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- conductive test
- electrically conductive
- diode
- test
- piece
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Abstract
The utility model relates to a diode test fixture, including first electrically conductive test piece, the electrically conductive test piece of second, first electrically conductive test seat, the electrically conductive test seat of second and fixing base, first, two electrically conductive test seats all include corresponding electrically conductive linking piece and are used for supporting the electrically conductive bracket of a pin of diode, in the fixing base is inserted respectively to the one end of the first electrically conductive linking piece of first electrically conductive test seat and the one end of first electrically conductive test piece, and an end lap of the one end of first electrically conductive linking piece and first electrically conductive test piece, the other end of first electrically conductive test piece lies in outside the fixing base, in the fixing base is inserted respectively to the one end and the one end of the electrically conductive test piece of second that the second of the electrically conductive test seat of second is electrically conductive to link up the piece, and the electrically conductive one end of piece and the end lap of the electrically conductive test piece of second of linking up of second, the electrically conductive other end of testing the piece of second lies in outside the fixing base. The utility model discloses the area of contact of ability increase and diode pin, and can form good ohmic contact.
Description
Technical field
The utility model relates to a kind of test fixture, is specifically related to a kind of Test Diode frock.
Background technology
The package dimension of existing diode is more and more less, and product all needs to carry out electric performance test before dispatching from the factory, and to be testedly qualifiedly just to dispatch from the factory afterwards.The package dimension of some diodes is less, and two of such diode pins are positioned at the back side of insulating gel shell after stretching out rear bending from the two ends of insulating gel shell respectively, existing test fixture is maked somebody a mere figurehead by two of diode pins to implement test in the groove of the V-shaped shape be made up of two test pieces, but this kind of test fixture makes the pin of diode bending part and test pieces be point cantact, and diode can cause insulating gel to overflow on pin in mold pressing procedure, such diode is when high temperature test, just make not become good Ohmic contact between test pieces and pin, cause test result bad, also out of true.
Summary of the invention
The purpose of this utility model is: provide a kind of contact area with diode pin that can increase, and can form the Test Diode frock of good ohmic contact, to overcome the deficiencies in the prior art.
In order to achieve the above object, the technical solution of the utility model is: a kind of Test Diode frock, and its innovative point is: comprise the first conductive test sheet, the second conductive test sheet, the first conductive test seat, the second conductive test seat and fixing holder on the table;
Described first conductive test seat comprise with its each other one or be fixedly connected with first conduct electricity joining piece and being used for and supports first of a diode pin and conduct electricity bracket, the second conductive test seat comprise with its each other integrally or be fixedly connected with second conduct electricity joining piece be used for supporting second of another pin of diode and conduct electricity bracket;
First conduction one end of joining piece of described first conductive test seat and one end of the first conductive test sheet are inserted in holder respectively, and first conduction one end of joining piece and one end of the first conductive test sheet overlap, the other end of described first conductive test sheet is positioned at outside holder;
Second conduction one end of joining piece of described second conductive test seat and one end of the second conductive test sheet are inserted in holder respectively, and second conduction one end of joining piece and one end of the second conductive test sheet overlap, the other end of described second conductive test sheet is positioned at outside holder.
In technique scheme, described first conduction bracket comprises the first brace of one each other and is used for supporting the first horizontal saddle of a diode pin, and the second conduction bracket comprises the second brace of one each other and is used for supporting the second horizontal saddle of another pin of diode.
In technique scheme, the angle between described first brace and the first horizontal saddle controls within the scope of 115 ° ~ 125 °, and the angle between the second brace and the second horizontal saddle controls within the scope of 115 ° ~ 125 °.
In technique scheme, described first conductive test sheet and the second conductive test sheet have two panels respectively, and the first conductive test seat and the second conductive test seat have two respectively.
The good effect that the utility model has is: after adopting Test Diode frock of the present utility model, during use, diode pin is overlapped on the first conduction bracket, another pin is overlapped on the second conduction bracket, and two of diode pins are that face contacts with conduction bracket, which adds the contact area of pin and conduction bracket, and be point cantact unlike the pin of diode in prior art and test pieces, make diode when high temperature test, two pins of diode form good Ohmic contact with conduction bracket, the degree of accuracy of test can be improved.Achieve the purpose of this utility model.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of embodiment of the utility model;
Fig. 2 is schematic perspective view of the present utility model.
Embodiment
Below in conjunction with accompanying drawing and the embodiment that provides, the utility model is further described, but is not limited thereto.
As shown in Figure 1, 2, a kind of Test Diode frock, comprises the first conductive test sheet 2, second conductive test sheet 3, first conductive test seat 4, second conductive test seat 5 and fixing holder 1 on the table;
Described first conductive test seat 4 comprise with its each other one or be fixedly connected with first conduct electricity joining piece 4-2 and being used for and supports first of a diode pin and conduct electricity bracket 4-1, the second conductive test seat 5 comprise with its each other integrally or be fixedly connected with second conduct electricity joining piece 5-2 be used for supporting second of another pin of diode and conduct electricity bracket 5-1;
One end of the first conduction joining piece 4-2 and one end of the first conductive test sheet 2 of described first conductive test seat 4 are inserted in holder 1 respectively, and one end of the first conduction joining piece 4-2 and one end of the first conductive test sheet 2 overlap, the other end of described first conductive test sheet 2 is positioned at outside holder 1;
One end of the second conduction joining piece 5-2 and one end of the second conductive test sheet 3 of described second conductive test seat 5 are inserted in holder 1 respectively, and one end of the second conduction joining piece 5-2 and one end of the second conductive test sheet 3 overlap, the other end of described second conductive test sheet 3 is positioned at outside holder 1.
As shown in Figure 1, 2, in order to improve the contact area of diode and conduction bracket further, make bottom surface and the level holder deck contact of the pin of diode, and the side of the pin of diode and brace also can contact, described first conduction bracket 4-1 comprises the first brace 4-1-2 of one each other and is used for supporting the first horizontal saddle 4-1-1 of a diode pin, and the second conduction bracket 5-1 comprises the second brace 5-1-2 of one each other and is used for supporting the second horizontal saddle 5-1-1 of another pin of diode.
As shown in Figure 1, 2, in order to make the utility model structure more reasonable, angle between described first brace 4-1-2 and the first horizontal saddle 4-1-1 controls within the scope of 115 ° ~ 125 °, and the angle between the second brace 5-1-2 and the second horizontal saddle 5-1-1 controls within the scope of 115 ° ~ 125 °.Like this, brace and horizontal saddle can contact with the pin of diode, improve the degree of accuracy of Test Diode further.
As shown in Figure 2, in order to make long service life of the present utility model, described first conductive test sheet 2 and the second conductive test sheet 3 have two panels respectively, and the first conductive test seat 4 and the second conductive test seat 5 have two respectively.During use, two the first conductive test seats 4 and two the second conductive test seats 5 are electrically connected with test machine respectively by coaxial p-wire, if one of them conductive test seat loose contact or be damaged, also have another one conductive test seat to use.
When the utility model uses, the first conductive test sheet 2 and the second conductive test sheet 3 are electrically connected with one end of test coaxial cable respectively, and the other end of test coaxial cable is electrically connected with test machine; Two of diode 6 pins are overlapped on the first horizontal saddle 4-1-1 and the second horizontal saddle 5-1-1 by testing staff respectively, make two of diode 6 between pin with horizontal saddle for face contacts, enlarge active surface, make it form good ohmic contact therebetween, just can implement electric performance test.The utility model not only structure is simple, and is convenient to holding workpiece.
The utility model pilot run shows, and its effect is well-content.
Claims (4)
1. a Test Diode frock, is characterized in that: comprise the first conductive test sheet (2), the second conductive test sheet (3), the first conductive test seat (4), the second conductive test seat (5) and fixing holder (1) on the table;
Described first conductive test seat (4) comprise with its each other one or be fixedly connected with first conduct electricity joining piece (4-2) and being used for and supports first of a diode pin and conduct electricity bracket (4-1), the second conductive test seat (5) comprise with its each other integrally or be fixedly connected with second conduct electricity joining piece (5-2) and be used for supporting second of another pin of diode and conduct electricity bracket (5-1);
One end of the first conduction joining piece (4-2) and one end of the first conductive test sheet (2) of described first conductive test seat (4) are inserted in holder (1) respectively, and one end of the first conduction joining piece (4-2) and one end of the first conductive test sheet (2) overlap, the other end of described first conductive test sheet (2) is positioned at holder (1) outward;
One end of the second conduction joining piece (5-2) and one end of the second conductive test sheet (3) of described second conductive test seat (5) are inserted in holder (1) respectively, and one end of the second conduction joining piece (5-2) and one end of the second conductive test sheet (3) overlap, the other end of described second conductive test sheet (3) is positioned at holder (1) outward.
2. Test Diode frock according to claim 1, it is characterized in that: described first conduction bracket (4-1) comprises first brace (4-1-2) of one each other and is used for supporting the first horizontal saddle (4-1-1) of a diode pin, the second conduction bracket (5-1) comprises second brace (5-1-2) of one each other and is used for supporting the second horizontal saddle (5-1-1) of another pin of diode.
3. Test Diode frock according to claim 2, it is characterized in that: the angle between described first brace (4-1-2) and the first horizontal saddle (4-1-1) controls within the scope of 115 ° ~ 125 °, the angle between the second brace (5-1-2) and the second horizontal saddle (5-1-1) controls within the scope of 115 ° ~ 125 °.
4. Test Diode frock according to claim 1, is characterized in that: described first conductive test sheet (2) and the second conductive test sheet (3) have two panels respectively, and the first conductive test seat (4) and the second conductive test seat (5) have two respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520618411.7U CN204925167U (en) | 2015-08-17 | 2015-08-17 | Diode test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520618411.7U CN204925167U (en) | 2015-08-17 | 2015-08-17 | Diode test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204925167U true CN204925167U (en) | 2015-12-30 |
Family
ID=54974280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520618411.7U Active CN204925167U (en) | 2015-08-17 | 2015-08-17 | Diode test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204925167U (en) |
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2015
- 2015-08-17 CN CN201520618411.7U patent/CN204925167U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee after: Changzhou Galaxy century microelectronics Limited by Share Ltd Address before: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee before: Changzhou Galaxy Century Micro-Electronics Co., Ltd. |