CN204495705U - The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer - Google Patents
The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer Download PDFInfo
- Publication number
- CN204495705U CN204495705U CN201520230653.9U CN201520230653U CN204495705U CN 204495705 U CN204495705 U CN 204495705U CN 201520230653 U CN201520230653 U CN 201520230653U CN 204495705 U CN204495705 U CN 204495705U
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- China
- Prior art keywords
- underframe
- infrared spectrometer
- specimen holder
- flat end
- circular hole
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- Spectrometry And Color Measurement (AREA)
Abstract
A kind of specimen holder carrying out monocrystalline silicon test for infrared spectrometer is provided, comprise underframe and spring leaf, the side, upper surface of underframe is provided with boss, the upper surface opposite side of underframe is shaped with circular hole, spring leaf is the ear type structure be made up of arc tips and flat end, flat end is shaped with elliptical aperture, the end of arc tips is connected with the upper surface of boss, the lower surface of flat end and the upper surface parallel registration of underframe also make the center of elliptical aperture and circular hole just right, clamp print and carry out infrared spectrometer detection in the middle of the elliptical aperture of flat end and the circular hole of underframe.The print that the utility model can be used for clamping difformity and size carries out infrared spectrometer test, and solve the fixing confinement problems that former stainless steel specimen holder exists, and do not pollute print in device process, fixed, cost of manufacture is low.
Description
Technical field
The utility model belongs to the outfit device technique field of infrared spectrometer test, is specifically related to a kind of specimen holder carrying out monocrystalline silicon test for infrared spectrometer.
Background technology
At present, carrying out with infrared spectrometer the specimen holder that monocrystalline silicon test uses is stainless steel specimen holder, the shortcoming that this stainless steel specimen holder exists: one is that size is fixed, the circular single crystal silicon print that can only be generally 11mm for diameter carries out infrared spectrometer test, the circle larger or less for size and prismatic single crystal silicon print all cannot be tested, and have certain limitation; Two is easily make print contaminated in device process and fixing not firm.Therefore be necessary to propose to improve.
Utility model content
The technical matters that the utility model solves: a kind of specimen holder carrying out monocrystalline silicon test for infrared spectrometer is provided, one end of spring leaf is connected with underframe by boss, because spring leaf has elasticity and restorability, the print that can clamp difformity and size between the elliptical aperture and the circular hole of underframe of the spring leaf other end carries out infrared spectrometer test, solve the fixing confinement problems that former stainless steel specimen holder exists, and print is not polluted in device process, fixed.
The technical solution adopted in the utility model: the specimen holder carrying out monocrystalline silicon test for infrared spectrometer, comprise underframe and spring leaf, the side, upper surface of described underframe is provided with boss, the upper surface opposite side of described underframe is shaped with circular hole, described spring leaf is the ear type structure be made up of arc tips and flat end, described flat end is shaped with elliptical aperture, the end of described arc tips is connected with the upper surface of boss, the lower surface of described flat end and the upper surface parallel registration of underframe also make the center of elliptical aperture and circular hole just right, the elliptical aperture of described flat end and the circular hole centre of underframe clamp print and carry out infrared spectrometer detection.
Wherein, the end of described arc tips is fixedly connected with by screw with boss.
Further, described underframe is rectangle structure, and the corner of described underframe is set to fillet.
The utility model beneficial effect compared with prior art:
1, one end of spring leaf is connected with underframe by boss, because spring leaf has elasticity and restorability, print clamps and carry out infrared spectrometer test on underframe by the other end of spring leaf, the utility model can be greater than to diameter 10mm is less than 30mm, thickness is 1 ~ 3mm circular print or length and the rectangle print of width between 10mm ~ 30mm all can carry out infrared spectrometer test, solves the fixing confinement problems that former stainless steel specimen holder exists;
2, be shaped with elliptical aperture in the flat end of spring leaf, underframe is shaped with circular hole, print is clamped and tests between holes, make sample not vulnerable to pollution;
3, the utility model structure is simple, flexible operation, and easy to use, cost of manufacture is low, practical reliable.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model;
Fig. 2 is front view of the present utility model;
Fig. 3 is the A-A cut-open view of Fig. 2.
Embodiment
Below in conjunction with accompanying drawing 1-3, a kind of embodiment of the present utility model is described.
The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer, comprise underframe 1 and spring leaf 2, described underframe 1 is rectangle structure, the corner of described underframe 1 is set to fillet 12, preferably, and the long 120mm of described underframe 1, wide 50mm, thick 2mm, the material of described underframe is stainless steel, the side, upper surface of described underframe 1 is provided with boss 4, and the upper surface opposite side of described underframe 1 is shaped with circular hole 11, and wherein the diameter of circular hole 11 is preferably 10mm, described spring leaf 2 is the ear type structures be made up of arc tips 21 and flat end 22, in order to adaptive with underframe 1, spring leaf 2 preferred size is long 100mm, wide 30mm, described flat end 22 is shaped with elliptical aperture 23, preferably, the major radius of elliptical aperture 23 is 7mm, short radius is 5mm, the end of described arc tips 21 is connected with the upper surface of boss 4, concrete, the end of described arc tips 21 is fixedly connected with by screw 3 with boss 4, the lower surface of described flat end 22 and the upper surface parallel registration of underframe 1 also make elliptical aperture 23 just right with the center of circular hole 11, specimen holder is not contacted when ensureing that print 5 clamps between holes, thus make print 5 not contaminated.
The utility model carries out infrared spectrometer detection by being clamped by print 5 in the middle of the elliptical aperture 23 of spring leaf 2 and the circular hole 11 of underframe 1, because spring leaf has elasticity and restorability, so this specimen holder can be greater than to diameter the multiple print 5 such as circular print or length and the rectangle print of width between 10mm ~ 30mm that 10mm is less than 30mm, thickness is 1 ~ 3mm carry out infrared spectrometer test, the size solving the existence of former stainless steel specimen holder fixes the defect of requirement, have and clamp the advantages such as firm, practical, cost is low, structure is simple, easy to operate.
Above-described embodiment, just preferred embodiment of the present utility model, is not used for limiting the utility model practical range, therefore all equivalence changes done with content described in the utility model claim, all should be included within the utility model right.
Claims (3)
1. the specimen holder of monocrystalline silicon test is carried out for infrared spectrometer, it is characterized in that: comprise underframe (1) and spring leaf (2), the side, upper surface of described underframe (1) is provided with boss (4), the upper surface opposite side of described underframe (1) is shaped with circular hole (11), described spring leaf (2) is the ear type structure be made up of arc tips (21) and flat end (22), described flat end (22) is shaped with elliptical aperture (23), the end of described arc tips (21) is connected with the upper surface of boss (4), the lower surface of described flat end (22) and the upper surface parallel registration of underframe (1) also make elliptical aperture (23) just right with the center of circular hole (11), the elliptical aperture (23) of described flat end (22) clamps print (5) with circular hole (11) centre of underframe (1) and carries out infrared spectrometer detection.
2. the specimen holder carrying out monocrystalline silicon test for infrared spectrometer according to claim 1, is characterized in that: the end of described arc tips (21) is fixedly connected with by screw (3) with boss (4).
3. the specimen holder carrying out monocrystalline silicon test for infrared spectrometer according to claim 1 and 2, is characterized in that: described underframe (1) is rectangle structure, and the corner of described underframe (1) is set to fillet (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520230653.9U CN204495705U (en) | 2015-04-15 | 2015-04-15 | The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520230653.9U CN204495705U (en) | 2015-04-15 | 2015-04-15 | The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204495705U true CN204495705U (en) | 2015-07-22 |
Family
ID=53575010
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520230653.9U Expired - Fee Related CN204495705U (en) | 2015-04-15 | 2015-04-15 | The specimen holder of monocrystalline silicon test is carried out for infrared spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204495705U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596035A (en) * | 2019-09-10 | 2019-12-20 | 成都青洋电子材料有限公司 | Monocrystalline silicon finished product detection device and detection method |
-
2015
- 2015-04-15 CN CN201520230653.9U patent/CN204495705U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596035A (en) * | 2019-09-10 | 2019-12-20 | 成都青洋电子材料有限公司 | Monocrystalline silicon finished product detection device and detection method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP02 | Change in the address of a patent holder |
Address after: 712038 Xianyang city of Shaanxi province Zhengyang town Weicheng District East Road Embankment Patentee after: Shaanxi Tianhong Silicon Material Co., Ltd. Address before: High road high tech Zone of Xi'an City, Shaanxi province 710006 Xianyang City No. 51 Gaoxin building 6 floor Patentee before: Shaanxi Tianhong Silicon Material Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150722 Termination date: 20200415 |