CN204462903U - A kind of memory test is heated lid - Google Patents
A kind of memory test is heated lid Download PDFInfo
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- CN204462903U CN204462903U CN201520117577.0U CN201520117577U CN204462903U CN 204462903 U CN204462903 U CN 204462903U CN 201520117577 U CN201520117577 U CN 201520117577U CN 204462903 U CN204462903 U CN 204462903U
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- main body
- lid
- lid main
- temperature sensor
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Abstract
The utility model discloses a kind of memory test to heat lid, it is characterized in that including the lid main body that heat-barrier material is made, described lid main body is the rectangular parallelepiped of an opening, lid main body is provided with air ejector fan, lid main body inner wall is provided with and adds electrothermal module, also comprises temperature sensor and master control borad, and described temperature sensor is arranged in lid main body, described master control borad is arranged on outside lid main body, described air ejector fan, adds electrothermal module and temperature sensor is all electrically connected with master control borad.Can independently treat test memory by adopting lid of heating to heat separately, other parts on server master board are not affected, and overall use flexibly, energy consumption is low, adopt multiple lid of heating can meet different internal memory to be tested simultaneously and carry out different heatproof testing requirements, greatly improve testing efficiency and reduce testing cost.
Description
Technical field
The utility model relates to electronic equipment manufacturing field, is specifically related to memory test equipment.
Background technology
Field is manufactured at internal memory, in prior art, manufacturing plant is all generally carry out in high hot house and high temperature cabinet to the heat protocol that internal memory product quality test verification uses, it is huge that such production test equipment throws in expense, and cannot different temperature be adopted to carry out test verification to different product simultaneously; And this kind of firing equipment, under testing host entirety is in the hot environment of high hot house and high temperature cabinet together for a long time, will causes the accelerated deterioration of mainboard or other structural member like this, decrease the serviceable life of complete machine to a great extent.The energy loss of this kind of firing equipment is also huge simultaneously, even if only need test a machine also will start whole high hot house and high temperature cabinet, there is huge energy dissipation, also improves operation easier and the risk of tester under this hot environment simultaneously.
Utility model content
The technical problems to be solved in the utility model is, how to provide a kind of can realization flexibly only to carry out to the internal memory to be measured on mainboard the testing apparatus that spot heating realizes carrying out internal memory to be measured separately high temperature ageing.
In order to solve the problems of the technologies described above, the utility model devises a kind of memory test and to heat lid, it is characterized in that including the lid main body that heat-barrier material is made, described lid main body is the rectangular parallelepiped of an opening, lid main body is provided with air ejector fan, lid main body inner wall is provided with and adds electrothermal module, also comprise temperature sensor and master control borad, described temperature sensor is arranged in lid main body, described master control borad is arranged on outside lid main body, described air ejector fan, adds electrothermal module and temperature sensor is all electrically connected with master control borad.
Described memory test is heated lid, it is characterized in that the unsettled center be arranged in lid main body of described temperature sensor.
Described memory test is heated lid, it is characterized in that master control borad being also provided with buzzer alarm circuit and Temperature displaying panel.
Described memory test is heated lid, and characterized by further comprising adaptive bottom, described adaptive bottom is match with the opening of lid main body, can install over said opening, described adaptive bottom is also provided with adaptive mouth internal memory to be tested can inserted in lid main body.
Implement the utility model and there is following beneficial effect: can independently treat test memory by adopting lid of heating and heat separately, other parts on server master board are not affected, and overall use flexibly, energy consumption is low, adopt multiple lid of heating can meet different internal memory to be tested simultaneously and carry out different heatproof tests, greatly improve testing efficiency and reduce testing cost.
Accompanying drawing explanation
Fig. 1 be memory test heat lid structural representation;
The memory test that Fig. 2 is the increase in adaptive bottom is heated the structural representation of lid.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, be clearly and completely described the technical scheme in the utility model embodiment, obviously, described embodiment is only the utility model part embodiment, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
Fig. 1 be memory test heat lid structural representation, include the lid main body 5 that heat-barrier material is made, described lid main body 5 is the rectangular parallelepiped of an opening, also can be other cassette shapes with cavity, lid main body 5 is provided with air ejector fan 2, lid main body 5 inwall is provided with and adds electrothermal module 1, also comprise temperature sensor 3 and master control borad 4, the unsettled center be arranged in lid main body 5 of described temperature sensor 3, described master control borad 5 is arranged on outside lid main body 5, described air ejector fan 2, adds electrothermal module 1 and temperature sensor 3 is all electrically connected with master control borad 4.Memory test lid of heating covers on mainboard 7 to be tested, and it is inner that internal memory 6 to be tested just extend into lid main body 5 by the opening of lid main body.
The memory test that Fig. 2 is the increase in adaptive bottom is heated the structural representation of lid, in order to improve further memory test heat lid on different mainboard, varying number is installed, the testing requirement of the internal memory of different size, increase and be provided with adaptive bottom 8, the adaptive bottom 8 of the adaptive mouth of multiple difference 9 can be set according to different motherboard type.
During specific works, select suitable memory test to heat lid, memory test heats lid by internal memory cover to be tested in lid main body, sets the temperature required for current test by the panel of master control borad; Detect current probe temperature by temperature sensor, if it is determined that to Current Temperatures lower than set temperature, then control to add electrothermal module heating operation, when detecting that Current Temperatures reaches the temperature of setting, then control to add electrothermal module and stop heating operation; When detecting that Current Temperatures exceedes the temperature of setting, then controlling air ejector fan, carrying out air draft cooling operation, when the temperature of Current Temperatures lower than setting being detected, then control air ejector fan and stop air draft operation.
Above disclosedly be only a kind of embodiment of the utility model, certainly the interest field of the utility model can not be limited with this, one of ordinary skill in the art will appreciate that all or part of flow process realizing above-described embodiment, and according to the equivalent variations that the utility model claim is done, still belong to the scope that utility model contains.
Claims (4)
1. a memory test is heated lid, it is characterized in that including the lid main body that heat-barrier material is made, described lid main body is the rectangular parallelepiped of an opening, lid main body is provided with air ejector fan, lid main body inner wall is provided with and adds electrothermal module, also comprises temperature sensor and master control borad, and described temperature sensor is arranged in lid main body, described master control borad is arranged on outside lid main body, described air ejector fan, adds electrothermal module and temperature sensor is all electrically connected with master control borad.
2. memory test according to claim 1 is heated lid, it is characterized in that the unsettled center be arranged in lid main body of described temperature sensor.
3. memory test according to claim 2 is heated lid, it is characterized in that master control borad being also provided with buzzer alarm circuit and Temperature displaying panel.
4. memory test according to claim 3 is heated lid, characterized by further comprising adaptive bottom, described adaptive bottom is match with the opening of lid main body, can install over said opening, described adaptive bottom is also provided with adaptive mouth internal memory to be tested can inserted in lid main body.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520117577.0U CN204462903U (en) | 2015-02-27 | 2015-02-27 | A kind of memory test is heated lid |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520117577.0U CN204462903U (en) | 2015-02-27 | 2015-02-27 | A kind of memory test is heated lid |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204462903U true CN204462903U (en) | 2015-07-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201520117577.0U Active CN204462903U (en) | 2015-02-27 | 2015-02-27 | A kind of memory test is heated lid |
Country Status (1)
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| CN (1) | CN204462903U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459633A (en) * | 2017-02-20 | 2018-08-28 | 中兴通讯股份有限公司 | A kind of temperature control frame and the method for realizing hot environment test |
| CN109885441A (en) * | 2019-03-20 | 2019-06-14 | 苏州浪潮智能科技有限公司 | A kind of memory bar heating device |
| CN111315047A (en) * | 2020-03-25 | 2020-06-19 | 中航锂电（洛阳）有限公司 | Heating cover and heating device with same |
| CN114420193A (en) * | 2021-12-23 | 2022-04-29 | 苏州浪潮智能科技有限公司 | Integrated memory aging test device |
-
2015
- 2015-02-27 CN CN201520117577.0U patent/CN204462903U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108459633A (en) * | 2017-02-20 | 2018-08-28 | 中兴通讯股份有限公司 | A kind of temperature control frame and the method for realizing hot environment test |
| CN108459633B (en) * | 2017-02-20 | 2021-11-23 | 中兴通讯股份有限公司 | Temperature control frame and method for realizing high-temperature environment test |
| CN109885441A (en) * | 2019-03-20 | 2019-06-14 | 苏州浪潮智能科技有限公司 | A kind of memory bar heating device |
| CN111315047A (en) * | 2020-03-25 | 2020-06-19 | 中航锂电（洛阳）有限公司 | Heating cover and heating device with same |
| CN111315047B (en) * | 2020-03-25 | 2022-06-17 | 中航锂电（洛阳）有限公司 | Heating cover and heating device with same |
| CN114420193A (en) * | 2021-12-23 | 2022-04-29 | 苏州浪潮智能科技有限公司 | Integrated memory aging test device |
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| C14 | Grant of patent or utility model | ||
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