CN204462322U - A kind of warning system for chip testing - Google Patents
A kind of warning system for chip testing Download PDFInfo
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- CN204462322U CN204462322U CN201520041407.9U CN201520041407U CN204462322U CN 204462322 U CN204462322 U CN 204462322U CN 201520041407 U CN201520041407 U CN 201520041407U CN 204462322 U CN204462322 U CN 204462322U
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- warning system
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- chip microcomputer
- chip
- chip testing
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Abstract
The utility model discloses a kind of warning system for chip testing, comprise single-chip microcomputer, and optical coupling isolation circuit, display circuit, warning circuit, indicating circuit, control relay circuit, toggle switch and the continuation Test Switchboard to be connected with single-chip microcomputer, the described warning system for chip testing is connected between probe station TTL interface and test macro main frame TTL interface, probe station is input to single-chip microcomputer after relevant actuating signal being isolated by optical coupling isolation circuit, and single-chip microcomputer is judged as " FAIL " signal still " PASS " shown by display circuit.Warning system for chip testing described in the utility model, achieve after EG2001X TTL communication interface is surveyed and get continuously useless warning function ready, compensate for the monitoring deficiency of test process quality, reduce the false failure rate of test, reduce chip to stab, probe breaks rate.And whole warning system structure is simple, easy to operate, cost is low.
Description
Technical field
The utility model relates to a kind of warning system for chip testing, belongs to chip testing technology field.
Background technology
The kind tube core of nowadays semiconductor company's design is more and more less, and conventional " getting pattern ready in real time " cannot realize the daily test of this type of little tube core kind, can only adopt " getting pattern ready after survey ".EG2001X is as main probe equipment, and tenure of use is excessively of a specified duration, also there is more defects.Such as, the monitoring function that there will not be continuous fail to report to the police under getting pattern after survey ready.Therefore once occur surveying and not by Timeliness coverage, easily causing variety and quality problem by mistake, make up if cannot do over again, the complaint of client will be faced, even claim damages.
In view of this, the present inventor studies this, and develop a kind of warning system for chip testing specially, this case produces thus.
Utility model content
Survey phenomenon by mistake to reduce in semiconductor test process and reduce because of the quantity that equipment or personnel cause test dies to damage in test process, of the present utility modelly provide a kind of warning system for chip testing.
To achieve these goals, solution of the present utility model is:
A kind of warning system for chip testing, comprise single-chip microcomputer, and optical coupling isolation circuit, display circuit, warning circuit, indicating circuit, control relay circuit, toggle switch and the continuation Test Switchboard to be connected with single-chip microcomputer, the described warning system for chip testing is connected between probe station (prober) TTL interface and test macro main frame TTL interface, probe station is input to single-chip microcomputer after relevant actuating signal being isolated by optical coupling isolation circuit, and single-chip microcomputer is judged as " FAIL " signal still " PASS " shown by display circuit.
As preferably, described Control electrical equipment comprises the relay be connected between probe station and test macro main frame, and the triode be connected between relay and single-chip microcomputer, control relay circuit is mainly used in the interruption controlling probe station and test macro main-machine communication.
As preferably, described optical coupling isolation circuit comprises the optocoupler that model is PC817, and the resistance be connected with optocoupler, and the test signal that probe station sends arrives single-chip microcomputer respectively through after respective optical coupling isolation circuit.
As preferably, AT89C52 series monolithic selected by described single-chip microcomputer.
As preferably, described toggle switch comprises 3 gears, can realize 8 kinds of combinations at the most, and then can realize the warning numerical value of 8 kinds of different sizes.
As preferably, described display circuit comprises 3 digital display tubes, be respectively used to show, ten, the displayed value of hundred.
As preferably, described warning circuit comprises hummer, and the triode be connected with hummer and resistance, when multiple " FAIL " signal arrives toggle switch settings to microprocessor detect continuously, send alerting signal by warning circuit, prompting staff processes.
As preferably, described indicating circuit comprises 3 light emitting diodes, is respectively used to the different operating state of indication warning system.
The above-mentioned warning system principle of work for chip testing: first by between described warning system series connection access probe station TTL interface and test macro main frame TTL interface, the warning numerical value of toggle switch is set as requested, then turn on the power switch, wait for that probe station sends test massage; After single-chip microcomputer receives the test signal that each signal wire sends over, process by analysis, if " FAIL " signal is directly shown by digital display tube, now, red light emitting diodes lights; If " PASS " signal, the numeral of numeral method does not superpose, and green LED lights; When single-chip microcomputer receives multiple " FAIL " signal continuously, and number reach toggle switch arrange warning numerical value time, single-chip microcomputer sends alerting signal by hummer, prompting staff processes, and pilot relay is opened simultaneously, and probe station and test macro main-machine communication are interrupted, stop test, after process terminates, press continuation Test Switchboard, warning system continues test.
Warning system for chip testing described in the utility model, achieve after EG2001X TTL communication interface is surveyed and get continuously useless warning function ready, compensate for the monitoring deficiency of test process quality, reduce the false failure rate of test, the on-stream pressure of operating personnel can be reduced simultaneously, reduce chip to stab, probe breaks rate.And whole warning system structure is simple, easy to operate, cost is low.
Below in conjunction with drawings and the specific embodiments, the utility model is described in further detail.
Accompanying drawing explanation
Fig. 1 is the alarm system circuit schematic diagram for chip testing of the present embodiment.
Embodiment
As shown in Figure 1, a kind of warning system for chip testing, comprise single-chip microcomputer, and the optical coupling isolation circuit to be connected with single-chip microcomputer, display circuit, warning circuit, indicating circuit, control relay circuit, toggle switch K1, reset circuit, crystal oscillating circuit and continuation Test Switchboard K2, described warning system is connected between probe station (prober) TTL interface and test macro main frame TTL interface, described Control electrical equipment comprises the relay K 8 be connected between probe station and test macro main frame, and the triode Q1 be connected between relay K 8 and single-chip microcomputer, control relay circuit is mainly used in the interruption controlling probe station and test macro main-machine communication.Described warning circuit comprises hummer, and the triode Q2 to be connected with hummer and resistance, when microprocessor detect is to multiple " FAIL " signal continuously, and when arriving toggle switch K1 settings, send alerting signal by warning circuit, prompting staff processes.Relay K 8 and hummer use pnp triode 9012, can increase driving force.
Described optical coupling isolation circuit comprises the optocoupler that model is PC817, and the resistance be connected with optocoupler, and the test signal that probe station sends arrives single-chip microcomputer respectively through after respective optical coupling isolation circuit.
Described toggle switch K1 comprises 3 gears, can realize 8 kinds of combinations at the most, and then can realize the warning numerical value of 8 kinds of different sizes.Set different value to report to the police by dial-up, to adapt to different cultivars.
Described display circuit comprises 3 digital display tubes, be respectively used to show a position, the displayed value of ten, hundred, described indicating circuit comprises 3 light emitting diodes, be respectively red light emitting diodes D1, green LED D2 and yellow light-emitting diode D3, be used to indicate the different operating state of warning system, the red light emitting diodes D1 signal that represents that warning system receives " FAIL " in the present embodiment, green LED D2 represents that warning system receives " PASS " signal, yellow light-emitting diode D3 represents that warning system is in test mode.
In the present embodiment, described single-chip microcomputer selection model is the single-chip microcomputer of AT89C52 series.
The above-mentioned warning system principle of work for chip testing: first by between warning system series connection access probe station TTL interface and test macro main frame TTL interface, the warning numerical value of toggle switch K1 is set as requested, then turn on the power switch K3, wait for that probe station sends test massage; After single-chip microcomputer receives the test signal that each signal wire sends over, process by analysis, if " FAIL " signal, then shown by digital display tube, now, red light emitting diode D1 lights, if " PASS " signal, the numeral of numeral method does not superpose, and green LED D2 lights; When single-chip microcomputer receives multiple " FAIL " signal, and when number reaches the warning numerical value of toggle switch K1 setting, single-chip microcomputer sends alerting signal by hummer; Prompting staff processes, and pilot relay K8 opens simultaneously, and probe station and test macro main-machine communication are interrupted, stops test, after process terminates, press and continue Test Switchboard K2, warning system continues test.When single-chip microcomputer occurs abnormal, press reset switch K4, reset circuit resets, and eliminates abnormal.
Above-described embodiment and graphic and non-limiting product form of the present utility model and style, any person of an ordinary skill in the technical field, to its suitable change done or modification, all should be considered as not departing from patent category of the present utility model.
Claims (8)
1. the warning system for chip testing, it is characterized in that: comprise single-chip microcomputer, and optical coupling isolation circuit, display circuit, warning circuit, indicating circuit, control relay circuit, toggle switch and the continuation Test Switchboard to be connected with single-chip microcomputer, the described warning system for chip testing is connected between probe station TTL interface and test macro main frame TTL interface, probe station is input to single-chip microcomputer after relevant actuating signal being isolated by optical coupling isolation circuit, and single-chip microcomputer is judged as " FAIL " signal still " PASS " shown by display circuit.
2. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: described Control electrical equipment comprises the relay be connected between probe station and test macro main frame, and is connected to the triode between relay and single-chip microcomputer.
3. a kind of warning system for chip testing as claimed in claim 1, it is characterized in that: described optical coupling isolation circuit comprises the optocoupler that model is PC817, and the resistance to be connected with optocoupler, the test signal that probe station sends arrives single-chip microcomputer respectively through after respective optical coupling isolation circuit.
4. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: AT89C52 series monolithic selected by described single-chip microcomputer.
5. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: described toggle switch comprises 3 gears.
6. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: described display circuit comprises 3 digital display tubes, be respectively used to show, ten, the displayed value of hundred.
7. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: described warning circuit comprises hummer, and the triode be connected with hummer and resistance.
8. a kind of warning system for chip testing as claimed in claim 1, is characterized in that: described indicating circuit comprises 3 light emitting diodes, is respectively used to the different operating state of indication warning system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520041407.9U CN204462322U (en) | 2015-01-21 | 2015-01-21 | A kind of warning system for chip testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520041407.9U CN204462322U (en) | 2015-01-21 | 2015-01-21 | A kind of warning system for chip testing |
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| Publication Number | Publication Date |
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| CN204462322U true CN204462322U (en) | 2015-07-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201520041407.9U Expired - Fee Related CN204462322U (en) | 2015-01-21 | 2015-01-21 | A kind of warning system for chip testing |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526458A (en) * | 2016-12-21 | 2017-03-22 | 珠海市中芯集成电路有限公司 | Communication detection device and detection method used for wafer test |
| CN108766915A (en) * | 2018-08-06 | 2018-11-06 | 江阴佳泰电子科技有限公司 | One kind being used for the anti-fragmentation alarm system of wafer |
-
2015
- 2015-01-21 CN CN201520041407.9U patent/CN204462322U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526458A (en) * | 2016-12-21 | 2017-03-22 | 珠海市中芯集成电路有限公司 | Communication detection device and detection method used for wafer test |
| CN108766915A (en) * | 2018-08-06 | 2018-11-06 | 江阴佳泰电子科技有限公司 | One kind being used for the anti-fragmentation alarm system of wafer |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150708 Termination date: 20190121 |