CN204422714U - Common multimeter test controllable silicon expanding unit - Google Patents
Common multimeter test controllable silicon expanding unit Download PDFInfo
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- CN204422714U CN204422714U CN201520098617.1U CN201520098617U CN204422714U CN 204422714 U CN204422714 U CN 204422714U CN 201520098617 U CN201520098617 U CN 201520098617U CN 204422714 U CN204422714 U CN 204422714U
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- controllable silicon
- multimeter
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- expanding unit
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Abstract
The utility model relates to the expansion of multimeter New function, silicon controlled problem cannot be directly tested for solving common multimeter (no matter being digital multimeter or pointer multimeter), scheme is a kind of common multimeter test controllable silicon expanding unit, comprises two-supply circuit, operational amplification circuit, display circuit and trigger circuit; For operational amplification circuit provides the ± dual power supply of 4.5V after described two-supply circuit is connected with the 9V power supply of multimeter; For controllable silicon to be measured provides two-way admittance signal after described operational amplification circuit is connected with display circuit with two-supply circuit respectively; Described display circuit is connected with trigger circuit, for test circuit provides conducting to show; For controllable silicon to be measured provides trigger pip after described trigger circuit are connected with controllable silicon to be measured.Common multimeter can directly be measured silicon controlled multi-function multimeter by this programme after repacking, and repacking cost is low and easy to use.
Description
Technical field
The utility model relates to the expansion of multimeter New function, particularly relates to one and can directly test silicon controlled device by common multimeter.
Background technology
Controllable silicon is also known as thyristor, and it has triggering and conducting, the characteristic that voltage zero-cross automatically shuts down, and is widely used in various electronic product and automatic control equipment.Controllable silicon is divided into one-way SCR and bidirectional triode thyristor, and one-way SCR is generally used for controlled rectification circuit, overcurrent/overvoltage crowbar; Bidirectional triode thyristor is generally used for AC regulating circuit, as the AC power control etc. in lamp dimmer, speed-regulating fan.
The method of current test controllable silicon performance roughly has two kinds: one to be adopt controllable silicon tester to test, and two is test by multimeter according to the simple and easy controllable silicon method of testing that textbook is introduced.Controllable silicon tester is expensive.Easily-testing method, method of testing is more numerous and diverse, is unfavorable for that beginner grasps.Multimeter in the teaching, experiment of most schools, no matter be pointer multimeter, or digimer can only realize the test of basic voltage, electric current and resistance, all cannot realize directly testing controllable silicon, if buying specialized equipment, instruction cost will certainly be increased, if increase this expansion module on existing multimeter, can reach namely cost-saving, extend again the object of function of multimeter.
Summary of the invention
For the deficiencies in the prior art, the utility model provides the device directly can testing controllable silicon characteristic with common multimeter.
To achieve these goals, the technical solution adopted in the utility model is: a kind of common multimeter test controllable silicon expanding unit, comprises two-supply circuit, operational amplification circuit, display circuit and trigger circuit.For operational amplification circuit provides the ± dual power supply of 4.5V after described two-supply circuit is connected with the 9V power supply of multimeter; For expanding unit provides two-way admittance signal after described operational amplification circuit is connected with display circuit with two-supply circuit respectively; Described display circuit is connected with trigger circuit, for test circuit provides conducting to show; For controllable silicon to be measured provides trigger pip after described trigger circuit are connected with controllable silicon to be measured.
Adopting after the technical solution of the utility model, is ± the dual power supply of 4.5V by the 9V cells convert of multimeter inside by this device, for integrated transporting discharging is powered.Integrated transporting discharging forms diphasic pulse signal source, for controllable silicon provides two-way AC signal, this signal is added on the light emitting diode of reverse parallel connection, indicates silicon controlled conducting state by the bright dark change of light emitting diode, and meter head of universal meter indicates the size of trigger current simultaneously.The utility model structure is simple, easy to use, is realized by common multimeter directly measuring silicon controlled multi-function multimeter after repacking.(1) extending common multimeter and use field, measuring silicon controlled specialized equipment without the need to buying.(2) by integrated transporting discharging chip, electric capacity, resistance, light emitting diode and socket composition test circuit, realize the test to controllable silicon characteristic, repacking cost is lower.
Further improvement, is provided with current-limiting resistance R4 between described operational amplification circuit and display circuit.
Further improvement, described two-supply circuit comprises electric capacity C1 and electric capacity C2; Described electric capacity C1 and electric capacity C2 divides the positive and negative electrode place being located at 9V power supply.
Further improvement, described operational amplification circuit comprises operational amplifier U1A, resistance R1, R2, R3 and electric capacity C3; The positive feeder ear of described operational amplifier U1A is connected with positive 4.5V power supply; The negative feeder ear of described operational amplifier U1A is connected with negative 4.5V power supply; Described resistance R1 is connected with output terminal with the inverting input of operational amplifier U1A respectively; Described resistance R2 is connected with ground with the in-phase input end of operational amplifier U1A respectively; Described resistance R3 is connected with output terminal with the in-phase input end of operational amplifier U1A respectively; Described electric capacity C3 holds with ground with the inverting input of U1A respectively and is connected.
Further improvement, described display circuit comprises light emitting diode D1 and light emitting diode D2; Described light emitting diode D1 and light emitting diode D2 is connected in reverse parallel between operational amplification circuit and trigger circuit.
Further improvement, described trigger circuit comprise gear change-over switch AN, socket Q and resistance R5; Described gear change-over switch AN one end is connected with display circuit, and the other end is connected with resistance R5; The other end of described resistance R5 is connected with a pin of socket Q; Other one, two pin of described socket Q are connected with display circuit, and one is connected to the ground.
Accompanying drawing explanation
Fig. 1 is the circuit theory diagrams of common multimeter test thyristor installation.
Fig. 2 is the structural representation be fixed on after the repacking of common multimeter on multimeter panel.
Wherein: 1, light emitting diode, 2, socket Q, 3, gear change-over switch AN.
Embodiment
Below in conjunction with Fig. 1 and Fig. 2, the preferred scheme of the utility model is further elaborated:
As described in Figure 1, a kind of common multimeter test thyristor installation: comprise two-supply circuit, operational amplification circuit, display circuit and trigger circuit.
Two-supply circuit comprises electric capacity C1 and electric capacity C2; Described electric capacity C1 positive terminal is connected with the positive pole of 9V power supply, and C1 positive terminal forms positive 4.5V power supply with ground; Electric capacity C2 negative pole end is connected with the negative pole of 9V power supply, and negative pole end and the ground of C2 form negative 4.5V power supply, for transport amplifying circuit provides the dual power supply of positive and negative 4.5V.
Operational amplification circuit comprises operational amplifier U1A, resistance R1, R2, R3 and electric capacity C3.The positive feeder ear of described operational amplifier U1A is connected with positive 4.5V power supply; The negative feeder ear of described operational amplifier U1A is connected with negative 4.5V power supply; Described resistance R1 is connected with output terminal with the inverting input of operational amplifier U1A respectively; Described resistance R2 is connected with ground with the in-phase input end of operational amplifier U1A respectively; Described resistance R3 is connected with output terminal with the in-phase input end of operational amplifier U1A respectively; Described electric capacity C3 holds with ground with the inverting input of U1A respectively and is connected.Integrated transporting discharging U1A forms diphasic pulse signal source, and for controllable silicon provides two-way AC signal, wherein R1, C3 determine the frequency of pulse signal source.
Display circuit comprises two light emitting diodes 1, is respectively light emitting diode D1 and light emitting diode D2; Light emitting diode D1 and light emitting diode D2 is connected in reverse parallel between operational amplification circuit and trigger circuit, and light emitting diode 1 provides display for controlled silicon conducting to be measured; Current-limiting resistance R4 is provided with between operational amplification circuit and display circuit.
Trigger circuit comprise gear change-over switch AN, socket Q and resistance R5; Described gear change-over switch one end is connected with display circuit, and the other end is connected with resistance R5; The other end of described resistance R5 is connected with a pin of socket Q; Other one, two pin of described socket Q are connected with display circuit, and one is connected to the ground; Described trigger circuit are connected with controllable silicon to be measured, for controllable silicon to be measured provides trigger pip.
As shown in Figure 2, structure of the present utility model is: be arranged on by whole expanded circuit on one piece of circuit board, be then fixed on multimeter inside; Two light emitting diodes D1, D2 of display circuit and socket Q are fixed on the appropriate location of multimeter panel; Gear change-over switch AN(3) be former function of multimeter selector switch, original gear increases a controllable silicon and measures gear.When needs are tested controllable silicon, only need controllable silicon to be measured to insert socket Q, the gear change-over switch AN(3 of conversion multimeter) measure gear to controllable silicon, determine silicon controlled performance to be measured according to the bright dark situation of light emitting diode D1, D2.
The test of trigger current:
Common multimeter extend testing controllable silicon function, the former functional select switch of multimeter increases controllable silicon test function gear, when being switched to this gear, connect by silicon controlled trigger circuit, and multimeter is in the state measuring electric current, and sealing in the circuit of resistance R5, the current value of gauge outfit display is silicon controlled trigger current to be measured.Resistance R5 can replace with potentiometer, changes the size of resistance R5 in test, and the electric current when light emitting diode is lighted is the minimum trigger current of silicon controlled.
The test of one-way SCR:
Controllable silicon three pin are inserted in a, b, c tri-pin of socket Q respectively.When Triggerless, if light emitting diode D1, D2 are not luminous, represent controllable silicon not conducting, illustrate that controllable silicon does not have punch-through.Select gear change-over switch AN(3) make to be in controllable silicon measurement gear, trigger pip is applied to controllable silicon, if only light emitting diode D1 is luminous, represent that controllable silicon can be triggered conducting, and be one-way SCR, what three pin a, b, c of socket Q inserted respectively is anode, three pin controlling pole, negative electrode, and multimeter indicated value is silicon controlled trigger current simultaneously.
The test of bidirectional triode thyristor:
Silicon controlled three pin are inserted in a, b, c tri-pin of socket Q respectively.When Triggerless, if light emitting diode D1, D2 are not luminous, represent controllable silicon not conducting, illustrate that controllable silicon does not have punch-through.Select gear change-over switch AN(3) make to be in controllable silicon measurement gear, trigger pip is applied to controllable silicon, if light emitting diode D1, D2 are all luminous, illustrate that the controllable silicon tested is bidirectional triode thyristor, what three pin a, b, c of socket Q inserted respectively is second anode, three pin controlling pole, the first anode, and multimeter indicated value is silicon controlled trigger current simultaneously.
Can this device, for bidirectional triode thyristor, can measure second anode and whether the first anode punctures, be triggered, and the size of trigger current; For one-way SCR, can judge whether anode and negative electrode puncture, can be triggered and the size of trigger current.
The signal source that in patent of the present invention, operational amplifier is formed, is not limited to diphasic pulse signal, the sine wave signal of formation and to any amendment done within the spirit of this research and principle, also within this patent protection domain.
Claims (6)
1. a common multimeter test controllable silicon expanding unit; It is characterized in that: comprise two-supply circuit, operational amplification circuit, display circuit and trigger circuit; For operational amplification circuit provides the ± dual power supply of 4.5V after described two-supply circuit is connected with the 9V power supply of multimeter; For expanding unit provides two-way admittance signal after described operational amplification circuit is connected with display circuit with two-supply circuit respectively; Described display circuit is connected with trigger circuit, for test circuit provides conducting to show; For controllable silicon to be measured provides trigger pip after described trigger circuit are connected with controllable silicon to be measured.
2. common multimeter test controllable silicon expanding unit as claimed in claim 1, is characterized in that: be provided with current-limiting resistance R4 between described operational amplification circuit and display circuit.
3. common multimeter test controllable silicon expanding unit as claimed in claim 2, is characterized in that: described two-supply circuit comprises electric capacity C1 and electric capacity C2; Described electric capacity C1 and electric capacity C2 divides the positive and negative electrode place being located at 9V power supply.
4. common multimeter test controllable silicon expanding unit as claimed in claim 2, is characterized in that: described operational amplification circuit comprises operational amplifier U1A, resistance R1, R2, R3 and electric capacity C3; The positive feeder ear of described operational amplifier U1A is connected with positive 4.5V power supply; The negative feeder ear of described operational amplifier U1A is connected with negative 4.5V power supply; Described resistance R1 is connected with output terminal with the inverting input of operational amplifier U1A respectively; Described resistance R2 is connected with ground with the in-phase input end of operational amplifier U1A respectively; Described resistance R3 is connected with output terminal with the in-phase input end of operational amplifier U1A respectively; Described electric capacity C3 holds with ground with the inverting input of U1A respectively and is connected.
5. common multimeter test controllable silicon expanding unit as claimed in claim 2, is characterized in that: described display circuit comprises light emitting diode D1 and light emitting diode D2; Described light emitting diode D1 and light emitting diode D2 is connected in reverse parallel between operational amplification circuit and trigger circuit.
6. common multimeter test controllable silicon expanding unit as claimed in claim 2, is characterized in that: described trigger circuit comprise gear change-over switch AN, socket Q and resistance R5; Described gear change-over switch AN one end is connected with display circuit, and the other end is connected with resistance R5; The other end of described resistance R5 is connected with a pin of socket Q; Other one, two pin of described socket Q are connected with display circuit; One is connected to the ground.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520098617.1U CN204422714U (en) | 2015-02-12 | 2015-02-12 | Common multimeter test controllable silicon expanding unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520098617.1U CN204422714U (en) | 2015-02-12 | 2015-02-12 | Common multimeter test controllable silicon expanding unit |
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| Publication Number | Publication Date |
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| CN204422714U true CN204422714U (en) | 2015-06-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520098617.1U Expired - Fee Related CN204422714U (en) | 2015-02-12 | 2015-02-12 | Common multimeter test controllable silicon expanding unit |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104793119A (en) * | 2015-02-12 | 2015-07-22 | 皖西学院 | Extending device with common multimeter for testing controlled silicone |
-
2015
- 2015-02-12 CN CN201520098617.1U patent/CN204422714U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104793119A (en) * | 2015-02-12 | 2015-07-22 | 皖西学院 | Extending device with common multimeter for testing controlled silicone |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150624 Termination date: 20170212 |