CN204421825U - Nano-grade size measurement mechanism - Google Patents
Nano-grade size measurement mechanism Download PDFInfo
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- CN204421825U CN204421825U CN201520086678.6U CN201520086678U CN204421825U CN 204421825 U CN204421825 U CN 204421825U CN 201520086678 U CN201520086678 U CN 201520086678U CN 204421825 U CN204421825 U CN 204421825U
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Abstract
The utility model discloses a kind of nano-grade size measurement mechanism, this device comprises: size induction module, be connected with control module and driver module, for moving to measurand and respond to measurand under the drive of driver module, and send induced signal when sensing measurand to described control module; Helical orbit resistance, is connected with driver module and control module, moves to change output resistance under the driving of driver module; Control module, is connected with driver module, drives size induction module and the motion of helical orbit resistance for controlling driver module; And receive induced signal and output resistance; Slowdown module, is connected with driver module, for reducing the rotating speed that driver module rotates.According to the size of the corresponding relation determination measurand of the output resistance of helical orbit resistance and the positional value of size induction module, achieve the high-acruracy survey of the size to measurand.
Description
Technical field
The utility model relates to life and health technical field, particularly relates to a kind of nano-grade size measurement mechanism.
Background technology
At present, the application of variohm widely, such as, can change the characteristic of signal generator, make lights dim, actuating motor or control its rotating speed etc., and it generally includes resistive element, movable contact flat and three pins.Wherein two fixing pin connecting resistance body two ends, another pin (center tap) is taken over a job movable contact spring, movable contact flat along resistive element rectilinear motion, to change the resistance at resistive element two ends.In precise hard_drawn tuhes and field of precision measurement, existing variohm is difficult to the demand meeting its precision; And the measurement of size for measurand, usual adopted method also just measuring method intuitively, or measured by survey instruments such as slide calliper rule, but a little measuring method does not reach the high-precision measurement requirement in precise hard_drawn tuhes and field of precision measurement.
Utility model content
Fundamental purpose of the present utility model is to provide a kind of nano-grade size measurement mechanism, can reach the high-precision measurement requirement in precise hard_drawn tuhes and field of precision measurement.
For achieving the above object, the utility model provides a kind of nano-grade size measurement mechanism, and described nano-grade size measurement mechanism comprises size induction module, control module, driver module and helical orbit resistance and slowdown module:
Described size induction module, is connected with described control module and driver module, for moving to measurand and respond to measurand under the drive of described driver module, and sends induced signal when sensing described measurand to described control module;
Described helical orbit resistance, is connected with described driver module and control module, moves to change output resistance under the driving of described driver module;
Described control module, is connected with described driver module, drives described size induction module and the motion of helical orbit resistance for controlling described driver module; And receive described induced signal and described output resistance;
Described slowdown module, is connected with described driver module, for reducing the rotating speed that described driver module rotates.
Preferably, described size induction module comprises stiff end and induction end, and described stiff end is fastened on one end of described measurand, and described induction end is connected with described driver module, moves to the other end of measurand and engage under the drive of driver module.
Preferably, described helical orbit resistance comprises resistor main body, resistance ligand and resistive:
Described resistor main body surface is provided with the first screw thread; Described resistance ligand is set in described resistor main body, and described resistance ligand is provided with the second screw thread with described first threaded adapter; The first end of described resistive is fixed on described resistance ligand, the second end of described resistive and the surface contact of described first screw thread;
Described resistor main body is connected with described driver module, under the driving of described driver module, drive described resistance ligand to move, described resistance ligand drives described resistive to move along the surface of described first screw thread, to change the output resistance of described helical orbit resistance;
The induction end of described size induction module is connected with described resistance ligand, and described resistor main body drives described resistance ligand to move under the driving of described driver module, moves to drive the induction end of described size induction module.
Preferably, described nano-grade size measurement mechanism also comprises pressure transducer, the side that the stiff end that described pressure transducer is arranged on described size induction module contacts with measurand with induction end, for responding to the force value of described measurand feedback, and described force value is sent to described control module;
Described control module also for when described force value is in the range of pressure values preset, controls described driver module and quits work.
Preferably, described slowdown module is first stage decelerator or multi-stage speed reducer.
Preferably, described nano-grade size measurement mechanism also comprises signal processing module, the output terminal of described helical orbit resistance is electrically connected with the input end of described signal processing module, the output terminal of described signal processing module is electrically connected with described control module, and described signal processing module is used for carrying out signal conversion to described output resistance, signal amplifies and A/D conversion.
Preferably, described signal processing module comprises the resistive voltage signal conversion unit for being converted to voltage signal to described output resistance, the amplifying unit for amplifying the described voltage signal after conversion, and the described voltage signal after amplification is carried out to the A/D converting unit of A/D conversion.
The utility model controls driver module by control module and drives size induction module to respond to the size of measurand, drive the motion of helical orbit resistance to change output resistance simultaneously, size induction module sends induced signal when sensing measurand to control module, control module is according to the present position values of the corresponding relation determination size induction module of the position of the positional value of the output resistance of helical orbit resistance and size induction module, then according to present position values and the initial position value of size induction module, the size of measurand is calculated.According to the size of the corresponding relation determination measurand of the output resistance of helical orbit resistance and the positional value of size induction module, achieve the high-acruracy survey of the size to measurand, and the high-precision measurement requirement in precise hard_drawn tuhes and field of precision measurement can be reached.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model nano-grade size measurement mechanism first embodiment;
Fig. 2 is the structural representation of helical orbit resistance in Fig. 1;
The structural representation of the preferred implementation that the resistor main body of Fig. 3 to be Fig. 2 be middle helical orbit resistance and resistance ligand coordinate;
Fig. 4 is the structural representation of the preferred implementation of the utility model nano-grade size measurement mechanism first embodiment;
Fig. 5 is the structural representation of the utility model nano-grade size measurement mechanism second embodiment;
Fig. 6 is the structural representation of the utility model nano-grade size measurement mechanism the 3rd embodiment.
The realization of the utility model object, functional characteristics and advantage will in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
Should be appreciated that specific embodiment described herein only in order to explain the utility model, and be not used in restriction the utility model.
The utility model provides a kind of nano-grade size measurement mechanism, by the size of the output resistance determination measurand of helical orbit resistance, to realize the high-acruracy survey of the size to measurand.
With reference to the structural representation that Fig. 1, Fig. 1 are the utility model nano-grade size measurement mechanism first embodiment.
In one embodiment, as shown in Figure 1, nano-grade size measurement mechanism comprises: size induction module 10, control module 20, driver module 30, helical orbit resistance 40 and slowdown module 60, wherein:
Size induction module 10, is connected with control module 20 and driver module 30, for moving to measurand and respond to measurand under the drive of driver module 30, and sends induced signal when sensing measurand to control module 30;
Helical orbit resistance 40, is connected with driver module 30 and control module 20, moves to change output resistance under the driving of driver module 30;
Control module 20, is connected with driver module 30, drives size induction module 10 and the motion of helical orbit 40 resistance for controlling driver module 30; And when receiving induced signal, according to the size of the change calculations measurand of the output resistance of helical orbit resistance 40;
Slowdown module 60, this slowdown module 60 is connected with driver module 30, for reducing the rotating speed that driver module 30 rotates.
Size induction module 10 is for responding to measurand, when measuring the size of measurand, size induction module 10 moves to measurand under the driving of driver module 30, after sensing measurand, this measurand is fixed, and induced signal corresponding for its size is converted into corresponding electric signal, then the electric signal after conversion is sent to control module 20, the precision that this size induction module 10 can be measured is higher, can respond to the size of small items.
Driver module 30 moves for driving helical orbit resistance 40, and this driver module 30 may be selected to be motor, and be preferably stepper motor in the present embodiment, the step-length of this stepper motor is less, and measuring accuracy is higher.The requirement of the measuring precision should be considered when designing.In the present embodiment, the step-length of stepper motor can be selected to be 0.5 ° or 0.75 °, to ensure the precision measurement of the size to small measurand.
In the present embodiment, slowdown module 60 can be arranged on the output terminal of driver module 30, can be one or more levels speed reduction unit; When driver module 30 works, reduced the rotating speed of driver module 30 by slowdown module 60, thus reduce the torque of driver module 30, measuring accuracy is improved, thus meet measurement demand measuring accuracy being required to higher measuring system.
In the present embodiment, the first initial position value of label size induction module 10, the output resistance of now corresponding helical orbit resistance 40 is initial resistivity value.When measuring the size of measurand, control module 20 generates control signal, control driver module 30 to work, size induction module 10 is driven to move to measurand, the size of measurand is responded to fixing measurand, driver module 30 drives helical orbit resistance 40 to move to change the resistance of helical orbit resistance 40 simultaneously, helical orbit resistance 40 its output resistance when moving can change, and the output resistance of helical orbit resistance 40 and the positional value of size induction module 10 have certain corresponding relation; Be fixed after size induction module 10 senses measurand, and induced signal corresponding for the size of measurand is converted into electric signal is sent to control module 20, control module 20 controls driver module 30 and stops, according to the output resistance of helical orbit resistance 40, and the corresponding relation of the position of the positional value of output resistance and size induction module 10, determine the present position values of size induction module 10, then according to the present position values of size induction module 10 and the initial position value of size induction module 10, the size of measurand can be calculated.
Particularly, after size induction module 10 senses measurand, control module 20 obtains the initial resistivity value of the initial position value of size induction module 10 and helical orbit resistance 40 output of correspondence, according to the corresponding relation of the output resistance of helical orbit resistance 40 and the positional value of size induction module, this pass is a linear relationship, because the current output resistance of helical orbit resistance 40 is known, the present position values of size induction module 10 thus can be determined; Then, according to the difference between the present position values size of size induction module 10 and the initial position value of induction module 10, the size of measurand can be calculated.
The present embodiment controls driver module 30 by control module 20 and drives size induction module 10 to respond to the size of measurand, drive helical orbit resistance 40 to move to change output resistance simultaneously, size induction module 10 sends induced signal when sensing measurand to control module 30, control module 20 is according to the present position values of the corresponding relation determination size induction module 10 of the position of the positional value of the output resistance of helical orbit resistance 40 and size induction module 10, then according to present position values and the initial position value of size induction module 10, calculate the size of measurand.According to the size of the corresponding relation determination measurand of the output resistance of helical orbit resistance 40 and the positional value of size induction module 10, achieve the high-acruracy survey of the size to measurand, and the high-precision measurement requirement in precise hard_drawn tuhes and field of precision measurement can be reached.
In the utility model one preferred embodiment, size induction module 10 comprises stiff end and induction end, stiff end is fastened on one end of measurand, and induction end is connected with driver module 30, moves to the other end of measurand and engage under the drive of driver module 30.
When measuring the size of measurand, stiff end is fixed on one end of measurand to be measured, induction end is movable end, first the initial position value of induction end is marked, can learn the initial distance between induction end and stiff end, now the output resistance of helical orbit resistance 40 is initial resistivity value; Control module 20 generates control signal control driver module 30 and drives induction end to move to measurand, the other end of measurand is moved under the drive of driver module 30, when induction end touches the other end of measurand, measurand is engaged, now can generate an induced signal, this induced signal is sent to control module 20 by induction end, control module 20 controls driver module 30 and stops, size induction module 10 and helical orbit resistance 40 stop motion; Control module 20 is according to the linear corresponding relation of the current output resistance of helical orbit resistance 40 and the positional value of induction end, just the present position values of induction end can be determined, thus the current distance between induction end and stiff end can be learnt, control module 20 according to the difference of the initial distance between induction end and stiff end and the current distance between induction end and stiff end, can determine the size of measurand further.
With reference to the structural representation that Fig. 2 and Fig. 3, Fig. 2 are helical orbit resistance in Fig. 1; The structural representation of the preferred implementation that the resistor main body of Fig. 3 to be Fig. 2 be middle helical orbit resistance and resistance ligand coordinate.
In the above-described embodiments, helical orbit resistance 40 comprises resistor main body 401, resistance ligand 402 and resistive 403, wherein:
Resistor main body 401 surface is provided with the first screw thread 4011; Resistance ligand 402 is set in resistor main body 401, and resistance ligand 402 is provided with the second screw thread 4021 with the first screw thread 4011 adaptation; The first end 4031 of resistive 403 is fixed on resistance ligand 402, the second end 4032 of resistive 403 and the surface contact of the first screw thread 4011.
Resistor main body 401 and resistance ligand 402 cooperatively interact, resistance ligand 402 is set in resistor main body 401, resistor main body 401 is set to screw-rod structure, resistor main body 401 surface is provided with the first screw thread 4011, resistance ligand 402 is set to nut structure, the inside surface of resistance ligand 402 is provided with and engages with the second screw thread 4021 with the second screw thread 4021, first screw thread 4011 of the first screw thread 4011 adaptation; The first end 4031 of resistive 403 and the surface contact of the first screw thread 4011 of resistor main body 401, the second end 4032 of resistive 403 is fixed on resistance ligand 402, specifically can be arranged on the second screw thread 4021.
It is the structural representation of the preferred implementation of the utility model nano-grade size measurement mechanism first embodiment with further reference to Fig. 4, Fig. 4.
As shown in Figure 4, in the utility model one preferred embodiment, resistor main body 401 is connected with driver module 30, when helical orbit resistance 40 works, resistor main body 401 is driven to rotate by driver module 30, the rotation of resistor main body 401 can drive resistance ligand 402 to move in the horizontal direction, thus drives resistive 403 to move along the surface of the first screw thread 4011, to change the output resistance of helical orbit resistance 40.In other embodiments of the present utility model, also resistance ligand 402 can be connected with driver module 30, when helical orbit resistance 40 works, rotated by driver module 30 Direct driver resistance ligand 402 and move in the horizontal direction, rotate to drive resistor main body 401, thus drive resistive 403 to move along the surface of the first screw thread 4011, to change the output resistance of helical orbit resistance 40.
The resistor main body 401 and resistance ligand 402 of helical orbit resistance 40 arrange the first screw thread 4011 and the second screw thread 4021 cooperatively interacted, resistance ligand 402 is made to drive resistive 403 to move on the surface of resistance along the first screw thread 4011, thus change the output resistance of helical orbit resistance 40, in contrast to resistive of the prior art to move along resistor main body rectilinear direction, the utility model embodiment improves the precision of the output resistance of helical orbit resistance 40, meets further in precise hard_drawn tuhes and field of precision measurement the requirement of system accuracy.
With reference to the structural representation that Fig. 5, Fig. 5 are the utility model nano-grade size measurement mechanism second embodiment.
Based on above-mentioned the utility model first embodiment, in a second embodiment, nano-grade size measurement mechanism also comprises:
Pressure transducer 50, the side that the stiff end that this pressure transducer 50 is arranged on size induction module 10 contacts with measurand with induction end, for responding to the force value of measurand feedback, and is sent to control module 20 by force value.
In the present embodiment, in the side that the stiff end of size induction module 10 contacts with measurand with induction end, be respectively arranged with pressure transducer 50, when measuring the size of measurand, the stiff end of size induction module 10 is fastened on one end of measurand, when the induction end of size induction module 10 moves to the other end touching measurand, responded to the force value of measurand feedback by pressure transducer 50, and the force value sensed is sent to control module 20.Control module 20 compares the size of this force value and default force value, because the size of measured measurand is comparatively small, and stiff end and the size of induction end to measurand institute applied pressure very likely have influence on the result of dimensional measurement, therefore one force value preset is set, to ensure that stiff end and induction end can not to have influence on the result of dimensional measurement in this range of pressure values preset to measurand institute applied pressure; When control module 20 judges that force value that pressure transducer 50 sends is in the range of pressure values preset, control driver module 30 to quit work, by the difference of the initial distance between the induction end that now calculates and stiff end and the current distance between induction end and stiff end, as the full-size(d) value of measurand.
When the induction end of size induction module 10 touches measurand, the force value of measurand feedback is responded to by pressure transducer 50, control driver module 30 when force value is in the range of pressure values preset and drive induction end stop motion, measure the size of measurand in this case, avoid the impact of pressure on the accuracy of measurement result, thus furthermore achieved that the high-acruracy survey of the size to measurand.
With reference to the structural representation that Fig. 6, Fig. 6 are the utility model nano-grade size measurement mechanism the 3rd embodiment.
Based on above-mentioned the utility model first embodiment, in the third embodiment, nano-grade size measurement mechanism also comprises:
Signal processing module 70, the output terminal of helical orbit resistance 40 is electrically connected with the input end of signal processing module 70, the output terminal of signal processing module 70 is electrically connected with control module 20, and signal processing module 70 is for carrying out signal conversion, signal amplification and A/D conversion to the output resistance of helical orbit resistance 40.
In the present embodiment, signal processing module 70 specifically comprises resistive voltage signal conversion unit, signal amplification unit and A/D converting unit: resistive voltage signal conversion unit is used for the output resistance of helical orbit resistance 40 to be converted to corresponding magnitude of voltage; Signal amplification unit is used for the magnitude of voltage after to conversion and amplifies, enlargement factor determines the precision of whole system, in signal amplification unit, the enlargement factor of amplifier wants more than 500 times, is designed to multiple-stage filtering and amplification, and the linearity of amplifier interval adopted in the present embodiment is 0.7v ~ 3.6v; A/D converting unit adopts digital to analog converter, and for carrying out analog-to-digital conversion to the magnitude of voltage after amplification, wherein the figure place of digital to analog converter is higher, and measuring accuracy is higher, and the present embodiment selects the digital to analog converter of 24.Concrete circuit connecting relation, those skilled in the art are by the description to this part, then the electric circuit knowledge that combination is grasped can draw, is not repeated herein.
These are only preferred embodiment of the present utility model; not thereby the scope of the claims of the present utility model is limited; every utilize the utility model instructions and accompanying drawing content to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present utility model.
Claims (7)
1. a nano-grade size measurement mechanism, is characterized in that, described nano-grade size measurement mechanism comprises size induction module, control module, driver module and helical orbit resistance and slowdown module:
Described size induction module, is connected with described control module and driver module, for moving to measurand and respond to measurand under the drive of described driver module, and sends induced signal when sensing described measurand to described control module;
Described helical orbit resistance, is connected with described driver module and control module, moves to change output resistance under the driving of described driver module;
Described control module, is connected with described driver module, drives described size induction module and the motion of helical orbit resistance for controlling described driver module; And receive described induced signal and described output resistance;
Described slowdown module, is connected with described driver module, for reducing the rotating speed that described driver module rotates.
2. nano-grade size measurement mechanism as claimed in claim 1, it is characterized in that, described size induction module comprises stiff end and induction end, described stiff end is fastened on one end of described measurand, described induction end is connected with described driver module, moves to the other end of measurand and engage under the drive of driver module.
3. nano-grade size measurement mechanism as claimed in claim 1 or 2, it is characterized in that, described helical orbit resistance comprises resistor main body, resistance ligand and resistive:
Described resistor main body surface is provided with the first screw thread; Described resistance ligand is set in described resistor main body, and described resistance ligand is provided with the second screw thread with described first threaded adapter; The first end of described resistive is fixed on described resistance ligand, the second end of described resistive and the surface contact of described first screw thread;
Described resistor main body is connected with described driver module, under the driving of described driver module, drive described resistance ligand to move, described resistance ligand drives described resistive to move along the surface of described first screw thread, to change the output resistance of described helical orbit resistance;
The induction end of described size induction module is connected with described resistance ligand, and described resistor main body drives described resistance ligand to move under the driving of described driver module, moves to drive the induction end of described size induction module.
4. nano-grade size measurement mechanism as claimed in claim 1, it is characterized in that, described nano-grade size measurement mechanism also comprises pressure transducer, the side that the stiff end that described pressure transducer is arranged on described size induction module contacts with measurand with induction end, for responding to the force value of described measurand feedback, and described force value is sent to described control module;
Described control module also for when described force value is in the range of pressure values preset, controls described driver module and quits work.
5. nano-grade size measurement mechanism as claimed in claim 1, it is characterized in that, described slowdown module is first stage decelerator or multi-stage speed reducer.
6. nano-grade size measurement mechanism as claimed in claim 1, it is characterized in that, described nano-grade size measurement mechanism also comprises signal processing module, the output terminal of described helical orbit resistance is electrically connected with the input end of described signal processing module, the output terminal of described signal processing module is electrically connected with described control module, and described signal processing module is used for carrying out signal conversion to described output resistance, signal amplifies and A/D conversion.
7. nano-grade size measurement mechanism as claimed in claim 6, it is characterized in that, described signal processing module comprises the resistive voltage signal conversion unit for being converted to voltage signal to described output resistance, the amplifying unit for amplifying the described voltage signal after conversion, and the described voltage signal after amplification is carried out to the A/D converting unit of A/D conversion.
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| CN201520086678.6U CN204421825U (en) | 2015-02-06 | 2015-02-06 | Nano-grade size measurement mechanism |
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| CN201520086678.6U CN204421825U (en) | 2015-02-06 | 2015-02-06 | Nano-grade size measurement mechanism |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016123835A1 (en) * | 2015-02-06 | 2016-08-11 | 深圳市前海安测信息技术有限公司 | Dimension measurement device and method based on spiral resistor |
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2015
- 2015-02-06 CN CN201520086678.6U patent/CN204421825U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016123835A1 (en) * | 2015-02-06 | 2016-08-11 | 深圳市前海安测信息技术有限公司 | Dimension measurement device and method based on spiral resistor |
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Granted publication date: 20150624 Termination date: 20210206 |