CN204374239U - Test machine signal wire switching device - Google Patents
Test machine signal wire switching device Download PDFInfo
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- CN204374239U CN204374239U CN201420836877.XU CN201420836877U CN204374239U CN 204374239 U CN204374239 U CN 204374239U CN 201420836877 U CN201420836877 U CN 201420836877U CN 204374239 U CN204374239 U CN 204374239U
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- 238000012360 testing method Methods 0.000 title claims abstract description 66
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 239000004606 Fillers/Extenders Substances 0.000 abstract 2
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明涉及一种测试机信号线转接装置,用于对半导体封装结构进行信号检测。属于半导体封装技术领域。 The invention relates to a tester signal line switching device, which is used for signal detection of semiconductor packaging structures. It belongs to the technical field of semiconductor packaging.
背景技术 Background technique
现有的T2000测试机的测试头内RF信号线通过测试母板、测试子板最终引出到测试DUT板,参见图1,即路径分为三段:“测试头---测试母板”,“测试母板---测试子板”,“测试子板---测试DUT板”。 The RF signal line in the test head of the existing T2000 testing machine is finally led to the test DUT board through the test motherboard and the test sub-board, see Figure 1, that is, the path is divided into three sections: "test head --- test motherboard", "Test motherboard --- test daughter board", "test daughter board --- test DUT board".
此种走线方法缺点有: The disadvantages of this routing method are:
一、测试子板布局过于紧凑,RF信号线之间间距过小,降低了拆装效率。 1. The layout of the test sub-board is too compact, and the distance between the RF signal lines is too small, which reduces the efficiency of disassembly and assembly.
二、测试子板下方空间过小,RF信号线受空间限制反复弯折会损坏。 2. The space under the test sub-board is too small, and the RF signal line will be damaged due to repeated bending due to space constraints.
三、改机时必须先将母板拆下,然后根据生产需求重新排列子板上的RF线,降低了改机效率。 3. When modifying the machine, the motherboard must be removed first, and then the RF lines on the daughter board must be rearranged according to production requirements, which reduces the efficiency of machine modification.
四、测试子板上没有RF信号线名称的明确标识(机台内部引出的RF信号线共有32根),会导致接错线。 4. There is no clear identification of the name of the RF signal line on the test sub-board (there are 32 RF signal lines leading out of the machine), which will lead to wrong wiring.
发明内容 Contents of the invention
本发明的目的在于克服上述不足,提供一种测试机信号线转接装置,扩大RF信号线之间的间距,提高拆装和改机效率,同时降低RF信号线的损坏率和错接率,提高测试准确率。 The purpose of the present invention is to overcome the above-mentioned deficiencies, provide a tester signal line switching device, expand the distance between RF signal lines, improve the efficiency of disassembly and modification, and reduce the damage rate and misconnection rate of RF signal lines at the same time, Improve test accuracy.
本发明的目的是这样实现的:一种测试机信号线转接装置,包括测试头、RF信号线以及自下而上依次安装于测试头上的测试母板和测试子板,在所述测试母板外围的测试头表面开设有凹槽,其特征在于在所述凹槽上方盖有转接板,在所述转接板上穿插固定有信号线连接器,所述RF信号线的两端分别与测试DUT板和测试机内部的板卡相连,中间通过连接器相连。 The purpose of the present invention is achieved in this way: a test machine signal line adapter device, including test head, RF signal line and test motherboard and test sub-board installed on the test head in sequence from bottom to top, in the test The surface of the test head on the periphery of the motherboard is provided with a groove, which is characterized in that an adapter plate is covered above the groove, and a signal line connector is inserted and fixed on the adapter plate, and the two ends of the RF signal line They are respectively connected to the test DUT board and the board card inside the tester, and are connected through a connector in the middle.
所述RF信号线分为两段,其中一段的一端与测试机内部的板卡相连,另一端与连接器的下端相连,另一段RF信号线的一端与测试DUT板相连,另一端与连接器的上端相连。 The RF signal line is divided into two sections, one end of one section is connected to the board inside the testing machine, the other end is connected to the lower end of the connector, and one end of the other section of the RF signal line is connected to the test DUT board, and the other end is connected to the connector connected to the upper end.
与现有技术相比,本发明具有以下有益效果: Compared with the prior art, the present invention has the following beneficial effects:
1、通过自制转接板,使得布局宽裕,RF信号线拆装操作方便; 1. Through the self-made adapter board, the layout is generous, and the RF signal line is easy to disassemble and operate;
2、由于RF信号线不经过测试母板内部,不受空间限制同时不受挤压,RF信号线不容易损坏; 2. Since the RF signal line does not pass through the inside of the test motherboard, it is not limited by space and is not squeezed, so the RF signal line is not easy to be damaged;
3、因改机时不需要拆装母板,使得改机效率提升; 3. Since there is no need to disassemble and assemble the motherboard when modifying the machine, the efficiency of the machine modification is improved;
4、接线次数减少,接错线的概率大大降低。 4. The number of wiring is reduced, and the probability of wrong wiring is greatly reduced.
附图说明 Description of drawings
图1为传统RF信号线的转接结构示意图。 FIG. 1 is a schematic diagram of a transfer structure of a traditional RF signal line.
图2为本实用新型的结构示意图。 Fig. 2 is a structural schematic diagram of the utility model.
图3为图2中A处的放大示意图。 FIG. 3 is an enlarged schematic view of point A in FIG. 2 .
其中: in:
测试头1 test head 1
测试母板2 Test motherboard 2
测试子板3 Test daughter board 3
RF信号线4 RF signal line 4
凹槽5 Groove 5
转接板6 Adapter board 6
连接器7 Connector 7
测试DUT板8。 Test DUT board8.
具体实施方式 Detailed ways
参见图2—图3,本发明涉及一种测试机信号线转接装置,包括测试头1、测试母板2、测试子板3和RF信号线4,所述测试母板2安装于测试头1上表面,所述测试子板3安装于测试母板2上表面,在所述测试母板2外围的测试头1表面开设有凹槽5,在所述凹槽5上方盖有转接板6,所述转接板6通过固定螺丝与测试头1相固定,在所述转接板6上穿插固定有信号线连接器7,所述RF信号线4分为两段,其中一段的一端与测试机内部的板卡相连,另一端与连接器7的下端相连,另一段RF信号线4的一端与测试DUT板8相连,另一端与连接器7的上端相连,使RF信号线引出到测试DUT板引出路径减少为两段,减少RF信号线因路径复杂而损坏,同时给每一根RF信号线增加明确的名称。 Referring to Fig. 2-Fig. 3, the present invention relates to a kind of testing machine signal line conversion device, comprises test head 1, test motherboard 2, test sub-board 3 and RF signal line 4, and described test motherboard 2 is installed on test head 1 upper surface, the test sub-board 3 is installed on the upper surface of the test motherboard 2, a groove 5 is opened on the surface of the test head 1 on the periphery of the test motherboard 2, and an adapter plate is covered above the groove 5 6. The adapter plate 6 is fixed to the test head 1 by fixing screws, and a signal line connector 7 is interspersed and fixed on the adapter plate 6. The RF signal line 4 is divided into two sections, and one end of one section It is connected with the board inside the testing machine, the other end is connected with the lower end of the connector 7, one end of another RF signal line 4 is connected with the test DUT board 8, and the other end is connected with the upper end of the connector 7, so that the RF signal line is led out to The lead-out path of the test DUT board is reduced to two sections, reducing the damage of the RF signal line due to the complicated path, and adding a clear name to each RF signal line.
使用该转接装置联接RF信号线的走线方法: The routing method of connecting the RF signal line with this adapter device:
1、将测试头上表面两侧凹槽处的原配挡板拆除。 1. Remove the original baffles at the grooves on both sides of the upper surface of the test head.
2、将测试头内部32根RF信号线从测试母板上拆除,并转引至凹槽处。 2. Remove the 32 RF signal lines inside the test head from the test motherboard and transfer them to the groove.
3、将32根RF信号线与自制转接板背面32个连接器对应联接,信号线名称与转接板RF口名称一一对应联接。 3. Connect the 32 RF signal lines to the 32 connectors on the back of the self-made adapter board. The names of the signal lines correspond to the names of the RF ports on the adapter board.
4、使用固定螺丝将自制转接板固定在凹槽处。 4. Use fixing screws to fix the self-made adapter plate in the groove.
5、使用RF信号线将“测试DUT板”与自制转接板正面的连接器联接。 5. Use the RF signal line to connect the "test DUT board" with the connector on the front of the self-made adapter board.
Claims (2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420836877.XU CN204374239U (en) | 2014-12-25 | 2014-12-25 | Test machine signal wire switching device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420836877.XU CN204374239U (en) | 2014-12-25 | 2014-12-25 | Test machine signal wire switching device |
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| Publication Number | Publication Date |
|---|---|
| CN204374239U true CN204374239U (en) | 2015-06-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420836877.XU Expired - Lifetime CN204374239U (en) | 2014-12-25 | 2014-12-25 | Test machine signal wire switching device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113504468A (en) * | 2021-09-13 | 2021-10-15 | 苏州华兴源创科技股份有限公司 | Detection equipment for key assembly |
-
2014
- 2014-12-25 CN CN201420836877.XU patent/CN204374239U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113504468A (en) * | 2021-09-13 | 2021-10-15 | 苏州华兴源创科技股份有限公司 | Detection equipment for key assembly |
| CN113504468B (en) * | 2021-09-13 | 2022-02-08 | 苏州华兴源创科技股份有限公司 | Detection equipment for key assembly |
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Granted publication date: 20150603 |
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| CX01 | Expiry of patent term |