CN204347079U - Pcb board proving installation and test probe thereof - Google Patents
Pcb board proving installation and test probe thereof Download PDFInfo
- Publication number
- CN204347079U CN204347079U CN201420836636.5U CN201420836636U CN204347079U CN 204347079 U CN204347079 U CN 204347079U CN 201420836636 U CN201420836636 U CN 201420836636U CN 204347079 U CN204347079 U CN 204347079U
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- probe
- test
- pcb board
- contact
- hole pin
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Abstract
The utility model relates to a kind of test probe, comprises probe body portion, probe, through hole pin and test contact; Described probe is arranged at the one end in described probe body portion; Through hole pin for remove detected PCB hole in tamper, one end of described through hole pin is arranged on described probe; Described test contact is located at the outside of described through hole pin, and described test contact is connected with described probe.Additionally provide a kind of pcb board proving installation using above-mentioned test probe simultaneously; Above-mentioned pcb board proving installation and test probe thereof, by installing through hole pin additional on probe, can when testing detected PCB, hole in detected PCB is dredged, prevent the hole plug in detected PCB, and then simplify the test technology of pcb board, enhance productivity, shorten the Production Time of pcb board, save manpower and materials.
Description
Technical field
The utility model relates to pcb board production technology, particularly relates to a kind of pcb board proving installation and test probe thereof.
Background technology
After pcb board, particularly composite base or paper substrate pcb board complete, due to this type of material pcb board self character, generally after pcb board punching, it can cause residual dust or particle can block the problem of punching after punching press.And this problem can cause in follow-up pcb board production run and normally can cannot insert components and parts because of blocking in hole.
In order to prevent pcb board plug-hole, traditional way is, does separately a through hole process, and then carry out pcb board functional test when pcb board makes.Each block pcb board all needs the process of specialize through hole, and after removing the tamper in hole, then carry out the test of next process, this just causes the decline of production efficiency, wastes manpower and materials.
Utility model content
Based on this, be necessary to provide a kind of pcb board proving installation that can enhance productivity and test probe thereof.
A kind of test probe, comprising:
Probe body portion;
Probe, is arranged at the one end in described probe body portion;
For remove detected PCB hole in the through hole pin of tamper, one end of described through hole pin is arranged on described probe; And
Test contact, be located at the outside of described through hole pin, and described test contact is connected with described probe.
Wherein in an embodiment, described probe body portion comprises probe casing and the probe connecting rod of hollow, and described probe shaft portion is contained in described probe casing, and described probe is arranged at described probe connecting rod and exposes to the one end outside described probe casing.
Wherein in an embodiment, also comprise the back-moving spring for making described probe connecting rod reset, described back-moving spring is contained in described probe casing, and one end of described back-moving spring is fixed to bottom described probe casing, and the other end is fixed on the end face of described probe connecting rod.
Wherein in an embodiment, described test contact comprises the contact of multiple sheet, and multiple described contact is set around the outside of one end that described through hole pin is connected with described probe.
Wherein in an embodiment, described test contact inwardly tightens up away from one end of described probe, offers fixed orifice in the middle part of described test contact, and described through hole pin wears described fixed orifice, is set around described through hole pin to make described test contact.
Wherein in an embodiment, described test contact is corner taper or round table-like.
A kind of pcb board proving installation, comprising:
Above-mentioned test probe;
Base plate;
Pillar, one end is arranged on described base plate; And
Test board, is arranged at the other end of described pillar, and to be arranged on described base plate by described pillar, described test probe is vertically installed on described test board.
Wherein in an embodiment, also comprise positioning guide column, described positioning guide column is vertically installed on described base plate.
Wherein in an embodiment, the top of described positioning guide column is cone-shaped structure.
Wherein in an embodiment, also comprise test winding displacement port and wire, described test probe is connected with described test winding displacement port communication by described wire.
Above-mentioned pcb board proving installation and test probe thereof, by installing through hole pin additional on probe, can when testing detected PCB, hole in detected PCB is dredged, prevent the hole plug in detected PCB, and then simplify the test technology of pcb board, enhance productivity, shorten the Production Time of pcb board, save manpower and materials.
Accompanying drawing explanation
Fig. 1 is the structural drawing of pcb board proving installation in the utility model one embodiment;
Fig. 2 is the structural representation of detected PCB;
Fig. 3 is the concrete structure figure of test probe in the proving installation of pcb board shown in Fig. 1;
Fig. 4 is the concrete structure figure of the test probe of another embodiment.
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, the utility model is described more fully.Better embodiment of the present utility model is given in accompanying drawing.But the utility model can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make to disclosure of the present utility model understand more thorough comprehensively.
It should be noted that, when element is called as " being fixed on " another element, directly can there is element placed in the middle in it on another element or also.When an element is considered to " connection " another element, it can be directly connected to another element or may there is centering elements simultaneously.Term as used herein " vertical ", " level ", "left", "right" and similar statement just for illustrative purposes, do not represent it is unique embodiment.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present utility model understand usually.The object of the term used in instructions of the present utility model herein just in order to describe concrete embodiment, is not intended to be restriction the utility model.Term as used herein " and/or " comprise arbitrary and all combinations of one or more relevant Listed Items.
Refer to Fig. 1, the pcb board proving installation 100 in the utility model one embodiment, comprise base plate 110, pillar 120, test board 130 and test probe 140.
Base plate 110 can be made up of Ya Like material.The length and width equidimension of base plate 110 can change with the size of detected PCB, and thickness is approximately 5mm.
Pillar 120 can be multiple.One end of pillar 120 is arranged on base plate 110, and the other end is fixed to test board 130, fixes this test board 120 on base plate 110 to support.Test probe 140 is vertically installed on test board 130.
See also Fig. 2, detected PCB 200 is provided with pad 210, pad 210 is provided with fairlead 250.During test, test probe 140 contacts with pad 210, to test the function of detected PCB 200.
Concrete, pillar 120 for cross section be orthohexagonal iron prop, its surface is through anti-corrosive technology process.The height of pillar 120 is about 50mm.Test board 130 can be Ya Like material and makes, and it is drilled with mounting hole (not shown), and test probe 140 is arranged in mounting hole.The length and width equidimension of test board 130 can change with the size of detected PCB 200, and thickness is approximately 10mm.Test probe 140 can be multiple, its quantity and distributing position corresponding with the quantity and position detected PCB 200 needing tested fairlead 250.
Pcb board proving installation 100 also comprises positioning guide column 150, and positioning guide column 150 is vertically installed on base plate 110.The top of positioning guide column 150 is cone-shaped structure.Positioning guide column 150 is for guiding and fixing tested pcb board.Concrete the diameter of positioning guide column 150 is about 5mm, is highly about 15mm in the present embodiment, and the pilot hole on its corresponding pcb board in position on base plate 110 is arranged.
See also Fig. 3, test probe 140 comprises probe body portion 141, probe 143, through hole pin 145 and test contact 147, and wherein said probe body portion 141, probe 143, through hole pin 145 superpose and coaxial setting successively.
Test probe 140 is fixed on base plate 110 by probe body portion 141, and probe 143 is arranged at the one end in probe body portion 141.Specifically in the present embodiment, probe body portion 141 comprises probe casing 141a and the probe connecting rod 141b of hollow, and probe connecting rod 141b is partially housed in probe casing 141a.Probe 143 is arranged at probe connecting rod 141b and exposes to the one end outside probe casing 141a.
Concrete, test probe 140 also comprises the back-moving spring 149 for making probe connecting rod 141b reset, back-moving spring 149 is contained in probe casing 141a, and one end of back-moving spring 149 is fixed to the bottom of probe casing 141a, and the other end is fixed on the end face of probe connecting rod 141b.Back-moving spring 149 resets for making probe connecting rod 141b after detected PCB 200 is removed.
Through hole pin 145 for remove detected PCB 200 hole in tamper, one end of through hole pin 145 is arranged on probe 143.Test contact 147 is located at the outside of through hole pin 145, and test contact 147 is connected with probe 143.
Specifically when carrying out test job, through hole pin 145 inserts in the fairlead 250 in pad 210, and to dredge fairlead 250, and test contact 147 contacts with the copper sheet of pad 210 near fairlead 250, to obtain open circuit or the path signal of detected PCB 200.
Pcb board proving installation 100 also comprises test winding displacement port one 60 and wire 170.Test probe 140 is communicated to connect by wire 170 and test winding displacement port one 60.Signal is connected with extraneous test macro by wire 170 and test winding displacement port one 60, so that test gained open circuit or path signal are transferred to extraneous test macro by test probe 140.
The diameter of through hole pin 145 is less than probe 143.Concrete through hole pin 145 diameter is 0.6mm, and through hole pin 145 protrudes test contact 147 in the present embodiment, specifically can be and protrudes 2mm.
Specifically in the present embodiment, test contact 147 comprises the contact 147a of multiple sheet, and multiple contact 147a are set around the outside of one end that through hole pin 145 is connected with probe 143, roughly forms petal-like structure to make test contact 147.Concrete, the bottom of multiple contact 147a is connected on probe 143, and the top of multiple contact 147a extends towards the axis direction of test probe 140, inwardly tightens up to make the top of contact 147a.When testing, through hole pin 145 inserts in the fairlead 250 in the pad 210 of detected PCB 200, and the lateral surface of contact 147a contacts with the copper sheet of pad 210 near fairlead 250.
It is to be noted, test contact 147 is not limited to said structure, see also Fig. 4, test contact 147 inwardly tightens up away from one end of probe 143, fixed orifice (not shown) is offered in the middle part of test contact 147, through hole pin 145 wears fixed orifice, is set around through hole pin 145 to make test contact 147.
Concrete, as shown in Figure 4, test contact 147 can be round table-like, and test contact 147 inwardly tightens up away from one end of probe 143.During test, through hole pin 145 inserts in the fairlead 250 in the pad 210 of detected PCB 200, and the lateral surface of test contact 147 contacts with the copper sheet of pad 210 near fairlead 250.
Be appreciated that test contact 147 can be corner taper, when testing, the seamed edge of the test contact 147 of corner taper contacts with the copper sheet of pad 210 near fairlead 250.
Above-mentioned pcb board proving installation 100 and test probe 140 thereof, by installing through hole pin 145 additional on probe 143, can when testing detected PCB 200, hole in detected PCB 200 is dredged, prevent the hole plug in detected PCB 200, and then simplify the test technology of pcb board, enhance productivity, shorten the Production Time of pcb board, save manpower and materials.
In addition, pcb board proving installation 100 structure is comparatively simple, and cost of manufacture is also lower.
The above embodiment only have expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the utility model the scope of the claims.It should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (10)
1. a test probe, is characterized in that, comprising:
Probe body portion;
Probe, is arranged at the one end in described probe body portion;
For remove detected PCB hole in the through hole pin of tamper, one end of described through hole pin is arranged on described probe; And
Test contact, be located at the outside of described through hole pin, and described test contact is connected with described probe.
2. test probe according to claim 1, it is characterized in that, described probe body portion comprises probe casing and the probe connecting rod of hollow, and described probe shaft portion is contained in described probe casing, and described probe is arranged at described probe connecting rod and exposes to the one end outside described probe casing.
3. test probe according to claim 2, it is characterized in that, also comprise the back-moving spring for making described probe connecting rod reset, described back-moving spring is contained in described probe casing, one end of described back-moving spring is fixed to bottom described probe casing, and the other end is fixed on the end face of described probe connecting rod.
4. test probe according to claim 1, is characterized in that, described test contact comprises the contact of multiple sheet, and multiple described contact is set around the outside of one end that described through hole pin is connected with described probe.
5. test probe according to claim 1, it is characterized in that, described test contact inwardly tightens up away from one end of described probe, offers fixed orifice in the middle part of described test contact, described through hole pin wears described fixed orifice, is set around described through hole pin to make described test contact.
6. test probe according to claim 5, is characterized in that, described test contact is corner taper or round table-like.
7. a pcb board proving installation, is characterized in that, comprising:
Test probe described in claim 1 to claim 6 any one;
Base plate;
Pillar, one end is arranged on described base plate; And
Test board, is arranged at the other end of described pillar, and to be arranged on described base plate by described pillar, described test probe is vertically installed on described test board.
8. pcb board proving installation according to claim 7, is characterized in that, also comprise positioning guide column, and described positioning guide column is vertically installed on described base plate.
9. pcb board proving installation according to claim 8, is characterized in that, the top of described positioning guide column is cone-shaped structure.
10. pcb board proving installation according to claim 7, is characterized in that, also comprise test winding displacement port and wire, described test probe is connected with described test winding displacement port communication by described wire.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420836636.5U CN204347079U (en) | 2014-12-22 | 2014-12-22 | Pcb board proving installation and test probe thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420836636.5U CN204347079U (en) | 2014-12-22 | 2014-12-22 | Pcb board proving installation and test probe thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204347079U true CN204347079U (en) | 2015-05-20 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420836636.5U Expired - Fee Related CN204347079U (en) | 2014-12-22 | 2014-12-22 | Pcb board proving installation and test probe thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204347079U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107121608A (en) * | 2017-05-05 | 2017-09-01 | 航天恒星科技有限公司 | Crystal oscillator testing device |
| CN107148575A (en) * | 2014-11-07 | 2017-09-08 | 株式会社村田制作所 | Probe |
| CN107765169A (en) * | 2017-10-25 | 2018-03-06 | 上海御渡半导体科技有限公司 | A kind of remote control operation has the circuit board detection device and method of punching function |
| WO2018209901A1 (en) * | 2017-05-18 | 2018-11-22 | 苏州韬盛电子科技有限公司 | Vertical probe card |
| CN110235008A (en) * | 2017-01-17 | 2019-09-13 | 斯贝亚股份有限公司 | Flight probe electronic board tester and testing method thereof |
| CN113597104A (en) * | 2021-07-19 | 2021-11-02 | 佛山市国立光电科技有限公司 | PCB production process |
-
2014
- 2014-12-22 CN CN201420836636.5U patent/CN204347079U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107148575A (en) * | 2014-11-07 | 2017-09-08 | 株式会社村田制作所 | Probe |
| CN107148575B (en) * | 2014-11-07 | 2021-03-12 | 株式会社村田制作所 | Probe needle |
| CN110235008A (en) * | 2017-01-17 | 2019-09-13 | 斯贝亚股份有限公司 | Flight probe electronic board tester and testing method thereof |
| CN107121608A (en) * | 2017-05-05 | 2017-09-01 | 航天恒星科技有限公司 | Crystal oscillator testing device |
| WO2018209901A1 (en) * | 2017-05-18 | 2018-11-22 | 苏州韬盛电子科技有限公司 | Vertical probe card |
| US10884026B2 (en) | 2017-05-18 | 2021-01-05 | Twinsolution Technology (Suzhou) Ltd | Vertical probe card |
| CN107765169A (en) * | 2017-10-25 | 2018-03-06 | 上海御渡半导体科技有限公司 | A kind of remote control operation has the circuit board detection device and method of punching function |
| CN113597104A (en) * | 2021-07-19 | 2021-11-02 | 佛山市国立光电科技有限公司 | PCB production process |
| CN113597104B (en) * | 2021-07-19 | 2024-06-14 | 佛山市国立光电科技有限公司 | PCB production process |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150520 Termination date: 20191222 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |