CN204286368U - A kind of rotary target material measurer for thickness - Google Patents

A kind of rotary target material measurer for thickness Download PDF

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Publication number
CN204286368U
CN204286368U CN201420842648.9U CN201420842648U CN204286368U CN 204286368 U CN204286368 U CN 204286368U CN 201420842648 U CN201420842648 U CN 201420842648U CN 204286368 U CN204286368 U CN 204286368U
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CN
China
Prior art keywords
thickness
infrared detector
target
measurer
target material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201420842648.9U
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Chinese (zh)
Inventor
王志强
曾墩风
罗文富
曾青云
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XIAMEN YINGRI NEW MATERIAL TECHNOLOGY Co Ltd
Original Assignee
XIAMEN YINGRI NEW MATERIAL TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by XIAMEN YINGRI NEW MATERIAL TECHNOLOGY Co Ltd filed Critical XIAMEN YINGRI NEW MATERIAL TECHNOLOGY Co Ltd
Priority to CN201420842648.9U priority Critical patent/CN204286368U/en
Application granted granted Critical
Publication of CN204286368U publication Critical patent/CN204286368U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Coating By Spraying Or Casting (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The utility model discloses a kind of rotary target material measurer for thickness, and this measurer for thickness comprises the infrared detector being positioned at target vacuum tank, and is positioned at the outer and control box be electrically connected with infrared detector of target vacuum tank; Described infrared detector is fixed in target low-voltage vacuum thermal spray tank and it is positioned at spray gun side, thus forms distance test structure between described infrared detector to penstock.The utility model utilizes to be measured infrared detector and to support or oppose the spacing determination reference value of tube-surface, and then aforementioned basic value reduces in spraying process thereupon, and the data reduced are the thickness of target spraying, thus realize spraying rotary target material overall process tracking its thickness, accurately control spray time and cost.

Description

A kind of rotary target material measurer for thickness
Technical field
The utility model relates to a kind of rotary target material measurer for thickness, divides belong to target manufacturing technology field by International Patent Classification (IPC) (IPC).
Background technology
In low-voltage variation thermal spray target process, its thickness needs to shut down storehouse door opening and could measure, and in the especially latter stage of spraying process, sprays thick, causes cost to waste, and needs, grinding machine polishing on its thickness, to have sprayed thin not meet use needs.
Thus, the present inventor considers to improve the measurement mechanism of its thickness, and this case produces thus.
Utility model content
For the deficiencies in the prior art, the utility model provides a kind of rotary target material measurer for thickness, utilize and measure infrared detector and to support or oppose the spacing determination reference value of tube-surface, and then aforementioned basic value reduces in spraying process thereupon, and the data reduced are the thickness of target spraying.
For achieving the above object, the utility model is achieved through the following technical solutions:
A kind of rotary target material measurer for thickness, this measurer for thickness comprises the infrared detector being positioned at target vacuum tank, and is positioned at the outer and control box be electrically connected with infrared detector of target vacuum tank; Described infrared detector is fixed in target low-voltage vacuum thermal spray tank and it is positioned at spray gun side, thus forms distance test structure between described infrared detector to penstock.
Further, described infrared detector is infrared transmitter, and its sidewall being fixed on target vacuum tank is positioned at spray gun side.
Further, described control box is that inside is provided with the casing of PLC or cabinet or housing.
Further, described target vacuum tank inner bottom part has penstock seat in rotary moving, this penstock seat in rotary moving is placed with the stainless steel penstock of surface spraying target.
Compared with prior art, advantage of the present utility model:
The utility model utilizes to be measured infrared detector and to support or oppose the spacing determination reference value of tube-surface, and then aforementioned basic value reduces in spraying process thereupon, and the data reduced are the thickness of target spraying, thus realize spraying rotary target material overall process tracking its thickness, accurately control spray time and cost.
Accompanying drawing explanation
Fig. 1 is the utility model structural representation (saving control box).
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further detail:
Embodiment: refer to shown in Fig. 1, a kind of rotary target material measurer for thickness, it mainly comprises the infrared detector 1 being positioned at target vacuum tank A, and this infrared detector 1 to be fixedly mounted on target vacuum tank A sidewall and to be positioned at spray gun side, and described spray gun is then fixed in target; Be provided with penstock seat A1 in rotary moving bottom described target vacuum tank A, this penstock seat A1 in rotary moving be placed with the stainless steel penstock B of surface spraying target; And described infrared detector 1 is infrared transmitter, this distance to the spacing of penstock, and is set as reference value by this infrared transmitter energy test emitter.
Refer to shown in Fig. 1, described a kind of rotary target material measurer for thickness also comprises and is positioned at the outer and control box be electrically connected with infrared detector of target vacuum tank, this control box is that inside is provided with the casing of PLC or cabinet or housing, and it also can record data by signal of sending of receiving infrared-ray detection instrument 1; The carrying out of the spraying of target in aforementioned infrared detector 1 keyed penstock, coating thickness (i.e. its thickness) increases thereupon, and standard value reduces, the value reduced is expressed as target coating thickness, when reaching setting its thickness, transmit signals to PLC control unit, automatic powered-down.
Above, be only the embodiment utilizing this origination techniques content, the modification that any those skilled in the art use this creation to do, change, all belong to the scope of the claims that this creation is advocated, and be not limited to those disclosed embodiments.

Claims (3)

1. a rotary target material measurer for thickness, is characterized in that: this measurer for thickness comprises the infrared detector being positioned at target vacuum tank, and is positioned at the outer and control box be electrically connected with infrared detector of target vacuum tank; Described infrared detector is fixed in target low-voltage vacuum thermal spray tank and it is positioned at spray gun side, thus forms distance test structure between described infrared detector to penstock.
2. a kind of rotary target material measurer for thickness according to claim 1, is characterized in that: described infrared detector is infrared transmitter, and its sidewall being fixed on target vacuum tank is positioned at spray gun side.
3. a kind of rotary target material measurer for thickness according to claim 1, is characterized in that: described control box is that inside is provided with the casing of PLC or cabinet or housing.
CN201420842648.9U 2014-12-26 2014-12-26 A kind of rotary target material measurer for thickness Expired - Fee Related CN204286368U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420842648.9U CN204286368U (en) 2014-12-26 2014-12-26 A kind of rotary target material measurer for thickness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420842648.9U CN204286368U (en) 2014-12-26 2014-12-26 A kind of rotary target material measurer for thickness

Publications (1)

Publication Number Publication Date
CN204286368U true CN204286368U (en) 2015-04-22

Family

ID=52869519

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201420842648.9U Expired - Fee Related CN204286368U (en) 2014-12-26 2014-12-26 A kind of rotary target material measurer for thickness

Country Status (1)

Country Link
CN (1) CN204286368U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105651192A (en) * 2016-04-12 2016-06-08 广州市尤特新材料有限公司 Detection method and system of surface thickness and planeness of rotary target
CN108180814A (en) * 2018-01-03 2018-06-19 京东方科技集团股份有限公司 A kind of target etches measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105651192A (en) * 2016-04-12 2016-06-08 广州市尤特新材料有限公司 Detection method and system of surface thickness and planeness of rotary target
CN108180814A (en) * 2018-01-03 2018-06-19 京东方科技集团股份有限公司 A kind of target etches measuring device
CN108180814B (en) * 2018-01-03 2020-01-03 京东方科技集团股份有限公司 Target etching amount measuring device

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Legal Events

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GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150422

Termination date: 20161226

CF01 Termination of patent right due to non-payment of annual fee