CN204229224U - A kind of testing table for testing LCU equipment - Google Patents

A kind of testing table for testing LCU equipment Download PDF

Info

Publication number
CN204229224U
CN204229224U CN201420678375.9U CN201420678375U CN204229224U CN 204229224 U CN204229224 U CN 204229224U CN 201420678375 U CN201420678375 U CN 201420678375U CN 204229224 U CN204229224 U CN 204229224U
Authority
CN
China
Prior art keywords
lcu
resistance
equipment
tested
main control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201420678375.9U
Other languages
Chinese (zh)
Inventor
黎莎
魏伟
刘剑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Railway Institute of Mechanical and Electrical Engineering Group Co Ltd
Original Assignee
Beijing Railway Institute of Mechanical and Electrical Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Railway Institute of Mechanical and Electrical Engineering Co Ltd filed Critical Beijing Railway Institute of Mechanical and Electrical Engineering Co Ltd
Priority to CN201420678375.9U priority Critical patent/CN204229224U/en
Application granted granted Critical
Publication of CN204229224U publication Critical patent/CN204229224U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The utility model discloses a kind of testing table for testing LCU equipment, comprising main control computer, at least one IO control panel, the first communication bus and the second communication bus; Described main control computer exports to tested LCU equipment for generating test signal by described first communication bus and described IO control panel, and receives the test response signal of equipment under test feedback; Described main control computer is also by described second communication bus and described tested LCU equipment connection, and when described tested LCU equipment is LCU complete machine, described main control computer is also for simulating the LCU complete machine of the other end corresponding with described tested LCU complete machine; When described tested LCU equipment is LCU veneer, described main control computer is also for simulating the master control borad of described LCU veneer.The utility model utilizes testing table can the fault of direct-detection LCU complete machine or veneer, judges that locomotive failure is control gear problem or topworks's problem, thus greatly improves the overhaul efficiency of locomotive, shorten the locomotive inspection and repair time.

Description

A kind of testing table for testing LCU equipment
Technical field
The utility model relates to electric locomotive detection field, particularly relates to a kind of testing table for testing LCU equipment.
Background technology
LCU (Logical Control Unit) vehicle-carrying distribution logic control element is used for controlling the imput output circuit of electric locomotive 110V direct supply: the logical relation utilizing the original control circuit of software simulating, forms non-contact control circuit by Modern Power Electronic Devices and Control Technique of Microcomputer and replace traditional relay to have contact circuit.LCU is the new generation of intelligent logic control device of electric locomotive car load logic control.Vehicle-carrying distribution logic control element adopts completely independently two Redundancy Design, and configure manual change-over switch, when one group of LCU breaks down, can people for switching to another group work, thus improve the reliability of operation of LCU own, ensure that the reliability of the whole control system of locomotive.The LCU of electric locomotive in repair and repair above journey or doubtful break down time need to get off detection.In the prior art, the detection for LCU has two kinds of methods, and first method is that the way adopting brand-new spare unit to replace contrast determines that some LCU veneers or LCU complete machine break down, and then out of order LCU veneer or LCU complete machine is beamed back genuine.But this method of testing needs brand-new LCU veneer and the LCU complete machine spare unit of a large amount of different model, on locomotive, the LCU of all models needs the use and these spare unit can not be got on the bus of stock's spare unit, waste substantial contribution and inventory space take greatly, and determine that the time of fault is partially long.The second method of testing can only be detected as right LCU complete machine, namely uses external circuit analog machine turner condition, and whether the output detecting a pair LCU complete machine meets the logic of design.Detection can not be carried out to single LCU complete machine can not test single LCU veneer.Because the communications protocol of tested LCU will be needed to veneer or single system test, and LCU manufacturer holds to communications protocol, so general LCU testing apparatus can not done by the producer of production test equipment in close confidence.On the other hand, use the scheme of multiple IO board to realize computing machine to more than 100 port controlling, detection when testing a pair LCU complete machine, because the use site environment of railway equipment is also more severe than general industry spot, IO board is in use easily loose contact afterwards in several years.
Domesticly at present mainly contain 4 LCU production firms, that the auspicious Wei in Changsha, Wuhan are just far away, Chengdu is transported to and led to industry with Shenzhen respectively, the LCU circuit that Mei Jia production firm produces is all not identical with steering logic, but their working methods on locomotive are basically identical: LCU detects locomotive operating mode by input port, then main control chip program goes out the output logic of LCU according to locomotive condition calculating, by output port provide DC110V signal send instruction control locomotive fittings execute the task.
Utility model content
In view of this, the utility model embodiment provides a kind of testing table for testing LCU equipment, for realizing the detection to LCU veneer and LCU complete machine.
First aspect, a kind of testing table for testing LCU equipment, comprises main control computer, at least one IO control panel, the first communication bus and the second communication bus;
Described main control computer is connected with at least one IO control panel described by described first communication bus, the other end of described IO control panel is connected with the port of described tested LCU equipment, described main control computer exports to tested LCU equipment for generating test signal by described first communication bus and described IO control panel, and receives the test response signal of equipment under test feedback;
Described main control computer is also by described second communication bus and described tested LCU equipment connection, and when described tested LCU equipment is LCU complete machine, described main control computer is also for simulating the LCU complete machine of the other end corresponding with described tested LCU complete machine; When described tested LCU equipment is LCU veneer, described main control computer is also for simulating the master control borad of described LCU veneer.
Further, when described tested LCU equipment is LCU complete machine, described test signal is Work condition analogue signal, or when described tested LCU equipment is LCU veneer, described test signal is master control borad analog control signal.
Further, described IO control panel is provided with microcontroller, input port circuit and output port circuit, described microcontroller is for detecting test signal and detecting the test response signal of equipment under test feedback, described output port circuit is used for test signal to be converted into DC110V signal, and outputting on the port of tested LCU equipment, the DC110V signal that described input port circuit is used for the port of tested LCU equipment exports is converted into test response signal.
Further, described input port circuit comprises the first resistance, the second resistance, the 5th electric capacity, Transient Suppression Diode, Zener diode, the first photoelectrical coupler and the 3rd resistance:
The first end of described first resistance is for inputting DC110V signal, and the second end of the first resistance is connected with the first end of the second resistance, the first end of the 5th electric capacity, the negative pole of Transient Suppression Diode, the negative pole of Zener diode respectively; Second end of described second resistance, the second end of the 5th resistance, the plus earth of Transient Suppression Diode; The positive pole of described Zener diode is connected with the first end of the first photoelectrical coupler, second end ground connection of described first photoelectrical coupler, 4th end is connected with power supply, and the 3rd end is connected with microcontroller, and the 3rd end of the first photoelectrical coupler is connected with the first end of the 3rd resistance; Second end ground connection of the 3rd resistance.
Further, described output port circuit comprises: the 4th resistance, the 5th resistance, the second photoelectrical coupler, P-channel enhancement type field effect transistor and fuse:
The first end of the 5th resistance connects microcontroller, second end of the 5th resistance is connected with the first end of the second photoelectrical coupler, second end of the second photoelectrical coupler, the 3rd end ground connection, the 4th end is connected with the first end of the 4th resistance, the grid of P-channel enhancement type field effect transistor respectively; Second termination power of the 4th resistance; The source electrode of P-channel enhancement type field effect transistor connects power supply, P-channel enhancement type field effect transistor drain electrode be connected with the first end of fuse, the second end of fuse is used for output voltage.
Further, described IO control panel is the control panel supporting MODBUS control protocol, and described first communications protocol bus is RS485 bus or CAN, and described second communication bus is RS485 bus or CAN.
Further, the number of described IO control panel is 8, each IO control panel is provided with 16 input ports and 16 output ports.
A kind of testing table for testing LCU equipment that the utility model embodiment provides, the communications protocol of the LCU equipment obtained by utilizing reverse-engineering, main control computer is utilized on communication bus, to fictionalize software control system and the communication of tested LCU complete machine of a LCU complete machine according to communications protocol, utilize main control computer export DC110V signal according to the operating mode response of MODBUS-RTU protocol integrated test system multiple IO control panel simulation locomotive and this signal is input in tested LCU complete machine simultaneously, the input circuit of testing table is utilized to detect the whether reasonable corresponding logic of output of tested LCU complete machine, realize the test to LCU complete machine.Utilize master control borad and the communication of tested LCU veneer of computing machine virtual LCU veneer on communication bus, main control computer is utilized directly to export DC110V signal according to the multiple IO control panel of MODBUS-RTU protocol integrated test system, DC110V signal input LCU veneer, utilize the input circuit of testing table to detect the input of LCU veneer, whether output port is normal.The utility model LCU testing table can have the fault of LCU veneer or complete machine by direct-detection, shortens detection time, and reduces testing cost.
Accompanying drawing explanation
By reading the detailed description done non-limiting example done with reference to the following drawings, other features, objects and advantages of the present utility model will become more obvious:
Fig. 1 is a kind of process flow diagram utilizing test bed testing LCU complete machine that the utility model embodiment one provides;
Fig. 2 is a kind of process flow diagram utilizing test bed testing main control end that the utility model embodiment one provides;
Fig. 3 is that a kind of test bed testing that utilizes that the utility model embodiment one provides is from the process flow diagram of machine end;
Fig. 4 is a kind of process flow diagram utilizing the port of test bed testing LCU veneer that the utility model embodiment two provides;
Fig. 5 is a kind of process flow diagram utilizing the input port of test bed testing LCU veneer that the utility model embodiment two provides;
Fig. 6 is a kind of process flow diagram utilizing the output port of test bed testing LCU veneer that the utility model embodiment two provides;
Fig. 7 is a kind of testing table module map of testing LCU equipment that the utility model embodiment three provides;
Fig. 8 is the input port circuit diagram of a kind of testing table that the utility model embodiment three provides;
Fig. 9 is the output port circuit figure of a kind of testing table that the utility model embodiment three provides;
Embodiment
Below in conjunction with drawings and Examples, the utility model is described in further detail.Be understandable that, specific embodiment described herein only for explaining the utility model, but not to restriction of the present utility model.It also should be noted that, for convenience of description, illustrate only the part relevant to the utility model in accompanying drawing but not full content.
Embodiment one
Fig. 1 is a kind of process flow diagram utilizing test bed testing LCU complete machine that the utility model embodiment one provides, and as shown in Figure 1, operation steps comprises:
Step S111: utilize main control computer to generate test signal on the first communication bus;
In this step, test signal, concrete, DC110V signal can be converted into.
Step S112: utilize main control computer to simulate the LCU complete machine of the other end corresponding with described tested LCU complete machine on the second communication bus;
Step S113: utilize main control computer to receive the test response signal of tested LCU complete machine feedback, judges whether described test response signal meets corresponding logic.
In the prior art, a set of LCU comprises 2 complete machine casings, i.e. " one end " and " two ends ", each complete machine casing all has corresponding input, output port, by communication bus communication between two complete machine casings, one of them is as master control, be responsible for computational logic and control another complete machine, one end that the LCU of different model has is main control end, and two ends are from machine end, two ends had are main control end, and one end is from machine end.Use communication bus can be RS485 bus or CAN between two complete machine casings.
When tested LCU complete machine is as main control end, utilize testing table to detect main control end method as shown in Figure 2, Fig. 2 is a kind of process flow diagram utilizing test bed testing main control end that the utility model embodiment one provides.Operation steps comprises:
Step S121: the input port output port of tested main control end being connected this programme testing table, on the output port of input port joint test platform;
Step S122: utilize main control computer to generate Work condition analogue signal on the first communication bus;
In this step, Work condition analogue signal, concrete, DC110V signal can be converted into.
Step S123: utilize main control computer according to simulating from machine end from the communications protocol of machine end at the second communication bus;
Step S124: utilize main control computer to receive the test response signal of tested main control end feedback, judges whether test response signal meets corresponding logic.
When tested LCU complete machine is as during from machine end, utilize testing table to detect from machine end method as shown in Figure 3, Fig. 3 is that a kind of test bed testing that utilizes that the utility model embodiment one provides is from the process flow diagram of machine end.Operation steps comprises:
Step S131: the input port tested output port from machine end being connected the utility model testing table, on the output port of input port joint test platform;
Step S132: utilize main control computer to generate Work condition analogue signal on the first communication bus;
Step S133: utilize main control computer to simulate main control end according to the communications protocol of main control end on the second communication bus;
Step S134: utilize main control computer to receive the tested test response signal from machine end feedback, judge whether test response signal meets corresponding logic.
In this step, utilize the main control end of computer simulation read the tested input signal from machine end and simulation main control end send tested from machine end output signal order.
Specific embodiment two:
The utility model embodiment provides a kind of method utilizing testing table to detect LCU veneer.In the prior art, LCU complete machine is made up of multiple LCU veneer, in order to improve the reliability of system, each LCU complete machine casing have employed redundancy backup, namely the veneer that each complete machine has 2 covers the same combines, and one group has malfunction and failure to be just switched to other one group by switch, uses communication bus communication between veneer, the veneer circuit of phase same-action is identical, and address is different.
Fig. 4 is a kind of process flow diagram utilizing test bed testing LCU veneer port that the utility model embodiment two provides, and as shown in Figure 4, operation steps comprises:
Step S211: utilize main control computer to generate test signal on the first communication bus;
Step S212: utilize main control computer to simulate the master control borad of described tested LCU veneer on the second communication bus;
Step S213: utilize main control computer to receive the test response signal of tested LCU veneer feedback, judge whether described test response signal meets logic.
Fig. 5 is a kind of process flow diagram utilizing the input port of test bed testing LCU veneer that the utility model embodiment two provides.As shown in Figure 5, operation steps comprises:
Step S221: utilize main control computer to generate master control borad analog control signal on the first communication bus;
In this step, master control borad analog control signal, concrete, DC110V signal can be converted into.
Step S222: utilize main control computer to simulate the master control borad of described tested LCU veneer on the second communication bus;
In this step, master control borad is the control panel controlling tested LCU veneer;
Step S223: utilize main control computer to receive the test response signal of tested LCU veneer input port feedback, judge whether the input port of LCU veneer detects input signal.
Fig. 6 is a kind of process flow diagram utilizing the output port of test bed testing LCU veneer that the utility model embodiment two provides.As shown in Figure 6, operation steps comprises:
Step S231: utilize main control computer to generate master control borad analog control signal on the first communication bus;
Step S232: utilize main control computer to simulate the master control borad of described tested LCU veneer on the second communication bus;
Step S233: utilize main control computer to receive the test response signal of tested LCU veneer output port feedback, judge whether described test response signal meets logic.
Embodiment three
Fig. 7 is a kind of testing table module map of testing LCU equipment that the utility model embodiment three provides.As shown in Figure 7, main control computer, at least one IO control panel is comprised, the first communication bus and the second communication bus;
Main control computer is connected with at least one IO control panel by the first communication bus, the other end of IO control panel is connected with the port of tested LCU equipment, main control computer exports to tested LCU equipment for generating test signal by the first communication bus and IO control panel, and receives the test response signal of equipment under test feedback; Main control computer is also by the second communication bus and tested LCU equipment connection, and when tested LCU equipment is LCU complete machine, main control computer is also for simulating the LCU complete machine of the other end corresponding with tested LCU complete machine; When tested LCU equipment is LCU veneer, main control computer is also for simulating the master control borad of LCU veneer.First communications protocol bus is RS485 bus or CAN, and the second communication bus is RS485 bus or CAN.
When tested LCU equipment is LCU complete machine, test signal is Work condition analogue signal, or when tested LCU equipment is LCU veneer, test signal is master control borad analog control signal.
IO control panel is the control panel supporting MODBUS control protocol.Modbus is a kind of serial communication protocol, be Modicon in 1979, deliver for using programmable logic controller (PLC) (PLC).MODBUS is the industrywide standard of industrial circle communication protocol, and is the connected mode that between industrial electrical equipment, phase When is conventional now.Modbus-RTU is that of MODBUS agreement derives from mutation, and because it adopts binary representation and compact data structure, communication efficiency is higher, and Application comparison is extensive.IO control panel is provided with microcontroller, input port circuit and output port circuit, microcontroller is for detecting test signal and detecting the test response signal of equipment under test feedback, output port circuit is used for test signal to be converted into DC110V signal, and outputting on the port of tested LCU equipment, the DC110V signal that input port circuit is used for the port of tested LCU equipment exports is converted into test response signal.
LCU equipment (LCU equipment comprises LCU complete machine and LCU veneer) input port and output port many, the therefore LCU testing table DC110V output port that needs standard configuration a large amount of and input port.The number of the IO control panel of a testing table standard configuration is 8, each IO control panel is provided with 16 input ports and 16 output ports.Each IO control panel circuit is the same, arranges different addresses by wire jumper.Main control computer is controlled each IO control panel by MODBUS-RTU agreement.The port circuit of IO control panel is connected by communication bus with main control computer, contacts the circuit of reliable and all IO control panels and logic control program is consistent, is conducive to the design of IO control panel, production, debugging and after sale.On the other hand, because MODBUS-RTU agreement is that the exterior I O port status of IO control panel is mapped to register value, therefore exterior I O port is made database management model, like this when designing the testing software of main control computer, only need design a theme software, the method of testing of different model LCU equipment is made database table, the LCU equipment that disparate databases table just can test different model is directly transferred during test, MODBUS-RTU agreement is utilized to control to be conducive to the design of software to IO control panel, a kind of testing software need not be all made for the LCU equipment of often kind of model.
Fig. 8 is the input port circuit diagram of a kind of testing table that the utility model embodiment three provides.As shown in Figure 8, the input port circuit 34 of testing table comprises the first resistance R20, the second resistance R21, the 5th electric capacity C5, Transient Suppression Diode D3, Zener diode D4, the first photoelectrical coupler OC1, the 3rd resistance R22:
The first end of the first resistance R20 is for inputting DC110V signal, and second end of the first resistance R20 is connected with the first end of the second resistance R21, the first end of the 5th electric capacity C5, the negative pole of Transient Suppression Diode D3, the negative pole of Zener diode D4 respectively; Second end of the second resistance R21, second end of the 5th electric capacity C5, the plus earth of Transient Suppression Diode D3; The positive pole of Zener diode D4 is connected with the first end 1 of the first photoelectrical coupler OC1, second end 2 ground connection of the first photoelectrical coupler, 4th end 16 is connected with power supply, and the 3rd end 15 is connected with microcontroller, and the 3rd end 15 of the first photoelectrical coupler OC1 is connected with the first end of the 3rd resistance R22; The second end ground connection of the 3rd resistance R22.
Microcontroller is low-voltage device; the CMOS level of 3.3V can only be accepted; directly can not gather outside DC110V input signal; testing table needs circuit as shown in Figure 8 to process DC110V signal: the DC110V signal of the first resistance R20 and the second resistance R21 to input carries out dividing potential drop decay; Transient Suppression Diode D3, Zener diode D4 and the 5th electric capacity C5 jointly form protection circuit and suppress surge voltage; protect the first photoelectrical coupler OC1, in case by surge voltage scaling loss.DC110V signal is by protection circuit by the first photoelectrical coupler OC1 conducting, and the level on the 3rd resistance R22 becomes the high level of 3V from 0V, this level signal directly could be received by microcontroller.The first photoelectrical coupler OC1 in circuit makes the low-voltage circuit electrical isolation of high pressure DC110V signal and the microcontroller inputted come, and can effectively prevent forceful electric power signal to the interference of light current circuit.
Fig. 9 is the output port circuit figure of a kind of testing table that the utility model embodiment three provides.As shown in Figure 9, the output port circuit 33 of testing table comprises the 4th resistance R18, the 5th resistance R19, the second photoelectrical coupler OC2, P-channel enhancement type field effect transistor Q17, insurance F18:
The first end of the 5th resistance R19 connects microcontroller, second end of the 5th resistance R19 is connected with the first end 1 of the second photoelectrical coupler OC2, second end 2 of the second photoelectrical coupler OC2, the 3rd end 15 ground connection, the 4th end 16 is connected with the first end of the 4th resistance R18, the grid of P-channel enhancement type field effect transistor Q17 respectively; Second termination power of the 4th resistance R18; The source electrode of P-channel enhancement type field effect transistor Q17 connects power supply, P-channel enhancement type field effect transistor drain electrode be connected with the first end of fuse F18, second end of fuse F18 is used for output voltage.Microcontroller can not directly export DC110V signal, needs the circuit shown in Fig. 9 to realize level conversion: circuit has 3 road power supplys, and+3.3V is that microcontroller is powered, corresponding GND0, + 12V is P-channel enhancement type field effect transistor Q17 driving power, corresponding GND1, + 110V is used for exporting, corresponding GND2, the circuit of+3.3V power supply and the circuit of other two-way power supply are isolated by the second photoelectrical coupler OC2, when testing table needs to export DC110V at output port out01, the IO port PO 01 of microcontroller exports 3.3V conducting second photoelectrical coupler OC2, 5th resistance R19 is current-limiting resistance, now the grid of P-channel enhancement type field effect transistor Q17 is pulled down to GND1, due to+12V, + 110V power supply is directly connected with the source electrode of P-channel enhancement type field effect transistor Q17, the grid voltage of P-channel enhancement type field effect transistor Q17 is made to be-12V, grid voltage is less than-7V just energy conducting completely, P-channel enhancement type field effect transistor Q17 can conducting completely, 110V (corresponding GND2) is exported in drain electrode, insurance F18 be self-recoverage insurance for preventing output port accidental short circuit time scaling loss circuit.
The utility model embodiment provides a kind of testing table for testing LCU equipment, utilize communications protocol to fictionalize the operation system of software of the master control borad of LCU complete machine or LCU veneer and tested LCU complete machine, the communication of LCU veneer by main control computer, realize the test to LCU complete machine or veneer.The utility model utilizes testing table can the fault of direct-detection LCU complete machine or veneer, judge that locomotive failure is control gear problem or topworks's problem, thus greatly improve the overhaul efficiency of locomotive, shorten the locomotive inspection and repair time, also just increase the locomotive service time simultaneously.
Note, above are only preferred embodiment of the present utility model and institute's application technology principle.Skilled person in the art will appreciate that the utility model is not limited to specific embodiment described here, various obvious change can be carried out for a person skilled in the art, readjust and substitute and protection domain of the present utility model can not be departed from.Therefore, although be described in further detail the utility model by above embodiment, but the utility model is not limited only to above embodiment, when not departing from the utility model design, can also comprise other Equivalent embodiments more, and scope of the present utility model is determined by appended right.

Claims (7)

1. for testing a testing table for LCU equipment, it is characterized in that, comprising main control computer, at least one IO control panel, the first communication bus and the second communication bus;
Described main control computer is connected with at least one IO control panel described by described first communication bus, the other end of described IO control panel is connected with the port of described tested LCU equipment, described main control computer exports to tested LCU equipment for generating test signal by described first communication bus and described IO control panel, and receives the test response signal of equipment under test feedback;
Described main control computer is also by described second communication bus and described tested LCU equipment connection, and when described tested LCU equipment is LCU complete machine, described main control computer is also for simulating the LCU complete machine of the other end corresponding with described tested LCU complete machine; When described tested LCU equipment is LCU veneer, described main control computer is also for simulating the master control borad of described LCU veneer.
2. testing table according to claim 1, is characterized in that, when described tested LCU equipment is LCU complete machine, described test signal is Work condition analogue signal, or when described tested LCU equipment is LCU veneer, described test signal is master control borad analog control signal.
3. testing table according to claim 1 and 2, is characterized in that,
Described IO control panel is provided with microcontroller, input port circuit and output port circuit, described microcontroller is for detecting test signal and detecting the test response signal of equipment under test feedback, described output port circuit is used for test signal to be converted into DC110V signal, and outputting on the port of tested LCU equipment, the DC110V signal that described input port circuit is used for the port of tested LCU equipment exports is converted into test response signal.
4. testing table according to claim 3, is characterized in that, described input port circuit comprises the first resistance, the second resistance, the 5th electric capacity, Transient Suppression Diode, Zener diode, the first photoelectrical coupler and the 3rd resistance:
The first end of described first resistance is for inputting DC110V signal, and the second end of the first resistance is connected with the first end of the second resistance, the first end of the 5th electric capacity, the negative pole of Transient Suppression Diode, the negative pole of Zener diode respectively; Second end of described second resistance, the second end of the 5th resistance, the plus earth of Transient Suppression Diode; The positive pole of described Zener diode is connected with the first end of the first photoelectrical coupler, second end ground connection of described first photoelectrical coupler, 4th end is connected with power supply, and the 3rd end is connected with microcontroller, and the 3rd end of the first photoelectrical coupler is connected with the first end of the 3rd resistance; Second end ground connection of the 3rd resistance.
5. testing table according to claim 4, is characterized in that, described output port circuit comprises: the 4th resistance, the 5th resistance, the second photoelectrical coupler, P-channel enhancement type field effect transistor and fuse:
The first end of the 5th resistance connects microcontroller, second end of the 5th resistance is connected with the first end of the second photoelectrical coupler, second end of the second photoelectrical coupler, the 3rd end ground connection, the 4th end is connected with the first end of the 4th resistance, the grid of P-channel enhancement type field effect transistor respectively; Second termination power of the 4th resistance; The source electrode of P-channel enhancement type field effect transistor connects power supply, and the drain electrode of P-channel enhancement type field effect transistor is connected with the first end of fuse, and the second end of fuse is used for output voltage.
6. testing table according to claim 1 and 2, it is characterized in that, described IO control panel is the control panel supporting MODBUS control protocol, and described first communications protocol bus is RS485 bus or CAN, and described second communication bus is RS485 bus or CAN.
7. testing table according to claim 1 and 2, is characterized in that, the number of described IO control panel is 8, each IO control panel is provided with 16 input ports and 16 output ports.
CN201420678375.9U 2014-11-07 2014-11-07 A kind of testing table for testing LCU equipment Active CN204229224U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420678375.9U CN204229224U (en) 2014-11-07 2014-11-07 A kind of testing table for testing LCU equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420678375.9U CN204229224U (en) 2014-11-07 2014-11-07 A kind of testing table for testing LCU equipment

Publications (1)

Publication Number Publication Date
CN204229224U true CN204229224U (en) 2015-03-25

Family

ID=52927297

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201420678375.9U Active CN204229224U (en) 2014-11-07 2014-11-07 A kind of testing table for testing LCU equipment

Country Status (1)

Country Link
CN (1) CN204229224U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111045414A (en) * 2019-11-28 2020-04-21 北汽福田汽车股份有限公司 Control circuit and control device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111045414A (en) * 2019-11-28 2020-04-21 北汽福田汽车股份有限公司 Control circuit and control device

Similar Documents

Publication Publication Date Title
CN101504449B (en) Experiment tester for spare power automatic switching apparatus
CN105301397B (en) A kind of mimic-disconnecting switch and its analogy method of tape jam analog functuion
CN102713772B (en) Method and system for the engineering of electric substation automation system
CN104317286A (en) Test bed for testing LCU device and testing method
CN101793931A (en) High-pressure transducer testing system
CN107678356A (en) Flexible direct current power transmission system nature imitation experiment device and method based on fpga chip platform
CN103281226B (en) A kind of MVB device address configuration system and method based on TCN
CN105378587A (en) Optimized power supply architecture
CN102122811A (en) Protective device starting component for double A/D sampling of electronic transformer in digital substation
CN108595299A (en) The test system of terminal device
CN201392392Y (en) Experiment tester of pare power automatic switching device
CN204229224U (en) A kind of testing table for testing LCU equipment
CN203799242U (en) Fieldbus technology-based 6kV high-voltage electrical equipment control system
CN108732987A (en) It can customize the embedded soft PLC control system and its design method of I/O port numbers
CN205263212U (en) Select testing arrangement that closes a floodgate mutually
CN104820457B (en) Voltage adaptive Multipath digital quantity input card
CN201266352Y (en) Power source remote controller for computer
CN203224778U (en) High-safety-performance ECU architecture for electric car
CN101833291A (en) Main controller device for modularized design of high-voltage frequency converter
CN201828829U (en) World FIP network hardware-in-the-loop simulation platform system of alternating current transmission locomotive
CN201616012U (en) Main controller device used for high-voltage frequency converter modular design
CN204517786U (en) Digital output unit and digital output card
CN105182814B (en) Redundance voltage control instructions voter arrangement
CN204408027U (en) A kind of Intelligent power distribution system
CN100508365C (en) Controller for high-power, high voltage and five level frequency conversion voltage adjusting device

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: 100070 Beijing Fengtai District South Fourth Ring West Road 188 District 5 Building

Patentee after: Beijing Railway Engineering Electromechanical Technology Research Institute Limited by Share Ltd

Address before: 100070 Beijing Fengtai District South Fourth Ring West Road 188 District 5 Building

Patentee before: Beijing Railway Institute of Mechanical and Electrical Engineering Co.,Ltd.