CN204203396U - Testing circuit - Google Patents

Testing circuit Download PDF

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Publication number
CN204203396U
CN204203396U CN201420646152.4U CN201420646152U CN204203396U CN 204203396 U CN204203396 U CN 204203396U CN 201420646152 U CN201420646152 U CN 201420646152U CN 204203396 U CN204203396 U CN 204203396U
Authority
CN
China
Prior art keywords
resistance
electric capacity
circuit module
testing circuit
connection terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201420646152.4U
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Chinese (zh)
Inventor
杨小华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Yihua Computer Co Ltd
Shenzhen Yihua Time Technology Co Ltd
Shenzhen Yihua Financial Intelligent Research Institute
Original Assignee
Shenzhen Yihua Computer Co Ltd
Shenzhen Yihua Time Technology Co Ltd
Shenzhen Yihua Financial Intelligent Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Yihua Computer Co Ltd, Shenzhen Yihua Time Technology Co Ltd, Shenzhen Yihua Financial Intelligent Research Institute filed Critical Shenzhen Yihua Computer Co Ltd
Priority to CN201420646152.4U priority Critical patent/CN204203396U/en
Application granted granted Critical
Publication of CN204203396U publication Critical patent/CN204203396U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

A kind of testing circuit (200), comprises the first resistance (R1), the second resistance (R2), the 3rd resistance (R3), the first electric capacity (C1), the second electric capacity (C2) and triode (Q1); The first end of described first resistance (R1) is connected to a detection signal, and the first end of the second end and described second resistance (R2), the first electric capacity (C1) and the second electric capacity (C2) is connected; Second end ground connection of described second resistance (R2), the first electric capacity (C1) and the second electric capacity (C2); The base stage (b) of described triode (Q1) is connected with the first end of described second electric capacity (C2), emitter-base bandgap grading (e) ground connection of described triode (Q1), the collector (c) of described triode (Q1) is connected with the first end of the 3rd resistance (R3), and the second end of described 3rd resistance (R3) is connected to operating voltage.Utilize the utility model can detect the connectivity whether abnormal and abnormal terminal position that is located by connecting of multiple circuit module.

Description

Testing circuit
Technical field
The utility model relates to a kind of testing circuit, the connection detection circuit particularly in a kind of removal circuit.
Background technology
Existing Circuits System is tending towards maximizing, complicated, the connection between circuit module connects with terminal usually, at the applied environment of complexity with for a long time in operation, is difficult to the reliability avoiding these terminals to connect.The terminal do not connected to be located abnormal difficult in the Circuits System of complexity, add the difficulty of work to maintainer.
Utility model content
In view of above content, the utility model proposes a kind of testing circuit, be arranged in the connection terminal of circuit module, for detecting the connectivity whether abnormal and abnormal terminal position that is located by connecting of multiple circuit module.
Described testing circuit (200) comprises the first resistance (R1), the second resistance (R2), the 3rd resistance (R3), the first electric capacity (C1), the second electric capacity (C2) and triode (Q1);
The first end of described first resistance (R1) is connected to a detection signal, and the second end of described first resistance (R1) is connected with the first end of the first end of described second resistance (R2), the first end of described first electric capacity (C1) and described second electric capacity (C2);
Second end ground connection of the second end of described second resistance (R2), the second end of described first electric capacity (C1) and described second electric capacity (C2);
The base stage (b) of described triode (Q1) is connected with the first end of described second electric capacity (C2), emitter-base bandgap grading (e) ground connection of described triode (Q1), the collector (c) of described triode (Q1) is connected with the first end of the 3rd resistance (R3), and the second end of described 3rd resistance (R3) is connected to operating voltage.
Further, described testing circuit (200) is arranged in second connection terminal (20) of second circuit module (2), and described second connection terminal (20) is connected with first connection terminal (10) of the first circuit module (1).
Further, described detection signal is by second connection terminal (20) exporting described second circuit module (2) to of first connection terminal (10) of described first circuit module (1).
Further, described operating voltage is the operating voltage of described second circuit module (2).
Further, the resistance size of described first resistance (R1) is 10 kilo-ohms, and the resistance size of described second resistance (R2) is 20 kilo-ohms, and the resistance size of described 3rd resistance (R3) is 10 kilo-ohms.
Further, described first electric capacity (C1) is polarity free capacitor, and described second electric capacity (C2) is for there being polar capacitor.
Further, and the first end of described second electric capacity (C2) is positive terminal, and the second end of described second electric capacity (C2) is negative pole end.
Further, the amount of capacity of described first electric capacity (C1) is 0.1 microfarad, and the amount of capacity of described second electric capacity (C2) is 100 microfarads.
Further, when first connection terminal (10) of described first circuit module (1) and second connection terminal (20) of second circuit module (2) have connection, the collector (c) of described triode (Q1) exports the first logical value; When first connection terminal (10) of described first circuit module (1) is not connected with second connection terminal (20) of second circuit module (2), the collector (c) of described triode (Q1) exports the second logical value.
Further, described first logical value is logical zero, and described second logical value is logical one.
Compared to prior art, testing circuit described in the utility model, be arranged in the connection terminal of circuit module, for detecting the connectivity whether abnormal and abnormal terminal position that is located by connecting of multiple circuit module, and export information when occurring connecting abnormal, maintenance personal accurately can locate the position of the connection terminal do not connected by this information, enhance the maintainability of circuit module.
Accompanying drawing explanation
Fig. 1 is the applied environment figure of the utility model testing circuit;
Fig. 2 is the physical circuit figure of the utility model testing circuit.
Embodiment
Consulting shown in Fig. 1, is the applied environment figure of the utility model testing circuit.In the present embodiment, described testing circuit 200 is arranged in the connection terminal of circuit module.Typically, multiple circuit module is connected by connection terminal, and such as, the first connection terminal 10 of the first circuit module 1 is connected with the second connection terminal 20 of second circuit module 2.
In the present embodiment, be described for the testing circuit 200 in the second connection terminal 20.It is pointed out that described testing circuit 200 can be arranged in the first connection terminal 10 of the first circuit module 1 equally.
Consult shown in Fig. 2, in the present embodiment, described testing circuit 200 includes, but not limited to the first resistance R1, the second resistance R2, the 3rd resistance R3, the first electric capacity C1, the second electric capacity C2 and triode Q1.Wherein, the first end of described first resistance R1 is connected to the detection signal (CONNECT_SIGNAL) of the first connection terminal 10 output, and second end of described first resistance R1 is connected with the first end of the first end of described second resistance R2, described first electric capacity C1 and the first end of described second electric capacity C2.
Further, the second end ground connection of second end of described second resistance R2, second end of described first electric capacity C1 and described second electric capacity C2.The base stage b of described triode Q1 is connected with the first end of described second electric capacity C2, the emitter-base bandgap grading e ground connection of described triode Q1, the collector c of described triode Q1 is connected with the first end of the 3rd resistance R3, and second end of described 3rd resistance R3 is connected to the operating voltage VDD of second circuit module 2.
In the present embodiment, the resistance size of described first resistance R1 is 10 kilo-ohms (k Ω), and the resistance size of described second resistance R2 is 20 kilo-ohms, and the resistance size of described 3rd resistance R3 is 10 kilo-ohms.Described first electric capacity C1 is polarity free capacitor, and described second electric capacity C2 is for there being polar capacitor, and the first end of described second electric capacity C2 is positive terminal, and second end of described second electric capacity C2 is negative pole end.The amount of capacity of described first electric capacity C1 is 0.1 microfarad (uF), and the amount of capacity of described second electric capacity C2 is 100 microfarads.Described triode Q1 can adopt S9013 triode.
In the present embodiment, the first resistance R1(10K in described testing circuit 200) and the second resistance R2(20K) effect is biasing resistor, object makes the voltage of the base stage b arriving triode Q1 in its bias voltage ranges.Described first electric capacity C1(0.1uF) and the second electric capacity C2(100uF) effect be filtering.
Below illustrate the principle of work of above-mentioned testing circuit 200, suppose that the testing circuit 200 in Fig. 2 is arranged in second circuit module 2.
When the first connection terminal 10 of the first circuit module 1 and the second connection terminal 20 of second circuit module 2 have connection, described first circuit module 1 can give second circuit module 2 one detection signal (CONNECT_SIGNAL by the first connection terminal 10,3.3V or 5V), triode Q1 conducting, the logical signal (CONNECT_CHK) that collector c exports is pulled down to GND(logical zero, the first logical value).When this logical signal is logical zero, the control circuit (not shown) in described second circuit module 2 judges that the connection between described first circuit module 1 and second circuit module 2 is normal.
When the first connection terminal 10 of the first circuit module 1 is not connected with the second connection terminal 20 of second circuit module 2, the detection signal (CONNECT_SIGNAL) being arranged on the testing circuit 200 in second circuit module 2 is unsettled, triode Q1 ends, the logical signal (CONNECT_CHK) that collector c exports is pulled upward to VDD(logical one, the second logical value).When this logical signal is logical one, the control circuit in described second circuit module 2 judges that the connection between described first circuit module 1 and second circuit module 2 is abnormal.
Further, when described second circuit module 2 judges the connection exception between described first circuit module 1 and second circuit module 2, information is exported by other circuit, such as, pointed out by LED flicker, maintenance personal accurately can locate the position of the connection terminal do not connected by this information, enhance the maintainability of circuit module.The circuit that described information exports can adopt conventional circuit design, does not repeat them here.
It should be noted that, Fig. 2 is only the exemplary illustration to the testing circuit 200 in second circuit module 2, those skilled in the art can understand, described testing circuit 200 can also be arranged in the first circuit module 1 or other circuit module be connected with second circuit module 2, method is identical with second circuit module 2, does not repeat them here.
Above content is the detailed description done the utility model in conjunction with concrete preferred implementation, can not assert that concrete enforcement is confined to these explanations.For person of an ordinary skill in the technical field, without departing from the concept of the premise utility, some simple deduction or replace can also be made, all should be considered as belonging to protection domain of the present utility model.

Claims (10)

1. a testing circuit (200), is characterized in that, this testing circuit (200) comprises the first resistance (R1), the second resistance (R2), the 3rd resistance (R3), the first electric capacity (C1), the second electric capacity (C2) and triode (Q1);
The first end of described first resistance (R1) is connected to a detection signal, and the second end of described first resistance (R1) is connected with the first end of the first end of described second resistance (R2), the first end of described first electric capacity (C1) and described second electric capacity (C2);
Second end ground connection of the second end of described second resistance (R2), the second end of described first electric capacity (C1) and described second electric capacity (C2); And
The base stage (b) of described triode (Q1) is connected with the first end of described second electric capacity (C2), emitter-base bandgap grading (e) ground connection of described triode (Q1), the collector (c) of described triode (Q1) is connected with the first end of the 3rd resistance (R3), and the second end of described 3rd resistance (R3) is connected to operating voltage.
2. testing circuit according to claim 1, it is characterized in that, described testing circuit (200) is arranged in second connection terminal (20) of second circuit module (2), and described second connection terminal (20) is connected with first connection terminal (10) of the first circuit module (1).
3. testing circuit according to claim 2, is characterized in that, described detection signal is by second connection terminal (20) exporting described second circuit module (2) to of first connection terminal (10) of described first circuit module (1).
4. testing circuit according to claim 2, is characterized in that, described operating voltage is the operating voltage of described second circuit module (2).
5. testing circuit according to claim 1, is characterized in that, the resistance size of described first resistance (R1) is 10 kilo-ohms, and the resistance size of described second resistance (R2) is 20 kilo-ohms, and the resistance size of described 3rd resistance (R3) is 10 kilo-ohms.
6. testing circuit according to claim 1, is characterized in that, described first electric capacity (C1) is polarity free capacitor, and described second electric capacity (C2) is for there being polar capacitor.
7. testing circuit according to claim 6, is characterized in that, and the first end of described second electric capacity (C2) is positive terminal, and the second end of described second electric capacity (C2) is negative pole end.
8. testing circuit according to claim 7, is characterized in that, the amount of capacity of described first electric capacity (C1) is 0.1 microfarad, and the amount of capacity of described second electric capacity (C2) is 100 microfarads.
9. the testing circuit according to claim 1 to 8 any one, it is characterized in that, when first connection terminal (10) of described first circuit module (1) and second connection terminal (20) of second circuit module (2) have connection, the collector (c) of described triode (Q1) exports the first logical value; And
When first connection terminal (10) of described first circuit module (1) is not connected with second connection terminal (20) of second circuit module (2), the collector (c) of described triode (Q1) exports the second logical value.
10. testing circuit according to claim 9, is characterized in that, described first logical value is logical zero, and described second logical value is logical one.
CN201420646152.4U 2014-10-31 2014-10-31 Testing circuit Expired - Fee Related CN204203396U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420646152.4U CN204203396U (en) 2014-10-31 2014-10-31 Testing circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420646152.4U CN204203396U (en) 2014-10-31 2014-10-31 Testing circuit

Publications (1)

Publication Number Publication Date
CN204203396U true CN204203396U (en) 2015-03-11

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201420646152.4U Expired - Fee Related CN204203396U (en) 2014-10-31 2014-10-31 Testing circuit

Country Status (1)

Country Link
CN (1) CN204203396U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104360213A (en) * 2014-10-31 2015-02-18 深圳怡化电脑股份有限公司 Detection circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104360213A (en) * 2014-10-31 2015-02-18 深圳怡化电脑股份有限公司 Detection circuit

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150311

Termination date: 20211031