CN204116980U - A kind of test probe pressure regulation device - Google Patents
A kind of test probe pressure regulation device Download PDFInfo
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- CN204116980U CN204116980U CN201420557627.2U CN201420557627U CN204116980U CN 204116980 U CN204116980 U CN 204116980U CN 201420557627 U CN201420557627 U CN 201420557627U CN 204116980 U CN204116980 U CN 204116980U
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Abstract
The utility model relates to sensor technical field, discloses a kind of test probe pressure regulation device.The displacement of this pressure regulation device real-time detection test probe is also converted into the magnitude of current, working sensor and analog voltage output circuit receive the magnitude of current exported from photoelectric acquisition sensor, and convert it into analog voltage, export to analog voltage comparison module; Analog voltage comparison module is compared to the analog voltage received respectively, generates high or low IO level signal, exports to microprocessor; Described IO level signal is also exported to display circuit and is shown by analog voltage comparison module; Microprocessor, according to the digital signal of described IO level signal and generation, obtains the working pressure of test probe; If the working pressure of described test probe changes, in real time the working pressure of adjustment test probe makes it and prior to store the parameter instruction comprising pressure identical.The pressure change of the utility model Real-Time Monitoring test probe, and can automatically regulate its pressure.
Description
Technical field
The utility model relates to sensor technical field, in particular, and particularly a kind of test probe pressure regulation device.
Background technology
Flying probe tester drives probe mechanism to realize test motion by stepper motor.The carrier of test probe is plastics spring, can avoid hard landing on pcb board of popping one's head in, and is also to load certain preload pressure to continue after probes touch pcb board, makes probe contact well with the measuring point of pcb board, ensures that detected PCB can not be out of shape.The Stress control of test probe is a gordian technique, and outstanding test probe Pressure Control Technology can avoid the measuring point damaging detected PCB, reduces the impact noise of test probe and pcb board.Superior test probe Pressure Control Technology also as the attraction of flying probe tester, can increase its competitive power.At present, the test probe pressure of the flying probe tester on market be control step motor until syringe needle acquisition sensor triggers and realizes, need the position of manual adjustments sensor-triggered; Manual adjustment needs to lean on experience to feel, uses very inconvenient, and can not automatically detect and tackle probe in testing because testing the pressure change of fatigue, damage generation.These all give test operation, maintenance is made troubles.In addition, as in test process, probing needle force changes, probe likely can occur to miss the bad phenomenon surveyed because of loose contact.
Summary of the invention
The purpose of this utility model is the technical matters existed for prior art, a kind of test probe pressure regulation device is provided, can the pressure change of Real-Time Monitoring test probe, and can automatically regulate its pressure, overcome the problem that the adjustment of existing probe pressure is inconvenient, it is convenient and reliable.
In order to solve problem set forth above, the technical solution adopted in the utility model is:
A kind of test probe pressure regulation device, this pressure regulation device comprise photoelectric acquisition sensor, working sensor and analog voltage output circuit, microprocessor, D/A converter module, analog voltage comparison module, host computer and and display module;
The displacement of described photoelectric acquisition sensor real-time detection test probe, and described displacement is converted into the magnitude of current, the magnitude of current according to photoelectric acquisition sensor calculates the pressure obtaining test probe;
Described working sensor and analog voltage output circuit receive the magnitude of current exported from photoelectric acquisition sensor, and convert it into analog voltage, export to analog voltage comparison module;
The parameter instruction arranging or revise test probe pressure is handed down to microprocessor by described host computer;
Described microprocessor stores the parameter instruction from host computer, and generates digital signal and export to D/A converter module;
The digital signal received converts to reference to analog voltage signal by described D/A converter module, and exports to analog voltage comparison module;
Described analog voltage comparison module, to comparing from the analog voltage of working sensor and analog voltage output circuit and D/A converter module output respectively, generates high or low IO level signal, exports to microprocessor; Described IO level signal is also exported to display circuit and is shown by analog voltage comparison module;
Microprocessor, according to the digital signal of described IO level signal and generation, obtains the working pressure of test probe; If the working pressure of described test probe and microprocessor storage comprise the parameter instruction of pressure different time, then microprocessor regenerates digital controlled signal, the reference analog voltage signal that adjustment D/A converter module exports, and then the working pressure of adjustment test probe; If the working pressure of described test probe reaches microprocessor storage when comprising the parameter instruction of pressure, then microprocessor exports IO control signal, controls test probe stop lower needle movement by external movement control system.
Described display circuit shows IO level signal in real time, learns by described IO level signal the analog voltage situation that working sensor and analog voltage output circuit and D/A converter module export.
Described photoelectric acquisition sensor adopts correlation type or reflective photoelectric sensor, adopts reflective photoelectric sensor to need on test probe, arrange a reflecting piece.
Described photoelectric acquisition sensor adopts U-shaped correlation type photoelectric sensor.
Described microprocessor adopts FPGA, CPLD or other logical device to substitute.
Compared with prior art, the beneficial effects of the utility model are:
The pressure of photoelectric acquisition sensor probing test probe is adopted in the utility model, microprocessor obtains the level signal that analog voltage comparison module compares output in real time, and then the working pressure of known test probe whether issue the pressure of setting with host computer identical, if microprocessor monitors is different to its pressure, then regenerate the reference analog voltage that digital controlled signal adjustment digital-to-analogue conversion module exports, thus the working pressure of adjustment test probe, namely manual adjustments is not needed, handled easily, use and maintenance; In addition, also can realize the pressure change that automatic detector probe produces because of factors such as fatigue, faults in testing, and automatically adjust in set pressure limit, promote stability and the reliability of test further.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the utility model test probe pressure regulation device.
Wherein, 1-photoelectric acquisition sensor, 2-working sensor and analog voltage output circuit, 3-microprocessor, 4-D/A converter module, 5-analog voltage comparison module, 6-display circuit, 7-IO control signal, 8-test probe, 9-host computer
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, the utility model is described more fully.Preferred embodiment of the present utility model is given in accompanying drawing.But the utility model can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make the understanding of disclosure of the present utility model more comprehensively thorough.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present utility model understand usually.The object of the term used in instructions of the present utility model herein just in order to describe specific embodiment, is not intended to be restriction the utility model.
Consult shown in Fig. 1, a kind of test probe pressure regulation device that the utility model provides, this pressure regulation device comprises photoelectric acquisition sensor 1, working sensor and analog voltage output circuit 2, microprocessor 3, D/A converter module 4, analog voltage comparison module 5, display circuit 6 and host computer 9.
Wherein, described photoelectric acquisition sensor 1 adopts U-shaped correlation type photoelectric sensor, and it is arranged on test probe 8 can be transformed into the displacement real-time detecting test probe 8 magnitude of current that it exports collector.Photoelectric acquisition sensor 1 has following characteristic: the luminous flux that its light receiving window receives emitter window with flow through its electric current exporting collector there is linear relationship, and have the light receiving window of certain length.After test probe 8 contacts detected PCB, test probe 8 continues lower pin and will be subjected to displacement, and changes the luminous flux of photoelectric acquisition sensor 1 light receiving window, thus the collector current causing it to export change.
Described working sensor and analog voltage output circuit 2 ensure that photoelectric acquisition sensor 1 normally works and the electric current that photoelectric acquisition sensor 1 exports is converted to analog voltage, and export analog voltage comparison module to, and it mainly uses resistor to realize.
Described D/A converter module 4 mainly realizes the module that digital signal converts reference analog voltage signal to; It receives the digital command of microprocessor 3, and converts the corresponding voltage signal of output to.Its chief component is by DAC chip, resistor, capacitor etc.
Described analog voltage comparison module 5 major function is that the voltage signal that the voltage signal that exports working sensor and analog voltage output circuit 2 and D/A converter module 4 export contrasts, and exports high or low IO level signal.It is primarily of compositions such as comparer or integrated transporting discharging, resistor, capacitors; The voltage that the voltage that analog voltage comparison module 5 has a positive input terminal is not less than negative input end just exports high IO level signal function, and vice versa.
Described host computer 9 is mainly used in the pressure arranging and revise test probe 8, and the parameter signal being arranged or revise transfers to microprocessor 3, allow microprocessor 3 Lookup protocol pressure, between host computer 9 and microprocessor 3, carry out connecting communication by USB or Ethernet etc.
In above-mentioned, the pressure of test probe 8 directly calculates according to the magnitude of current that photoelectric acquisition sensor 1 exports and gets, be specially: when test probe 8 is subjected to displacement, the luminous flux of photoelectric acquisition sensor 1 light receiving window changes, then the magnitude of current that its operating circuit exports also changes.So, the magnitude of current by gathering photoelectric acquisition sensor 1 draws the displacement of test probe 8 indirectly; And the spring constant of test probe 8 is known, indirectly can calculate the pressure of test probe 8 pairs of pcb boards according to elastic force formula F=k*x, therefore need to set the pressure size of test probe 8, then instead to calculate.
Described microprocessor 3 mainly realizes Stress control management, automatically detects, adjusts pressure, and its reception comprises the parameter signal of pressure from host computer 9 and stores, and generates digital signal and exports to D/A converter module 4; Also receive the IO level signal exported from analog voltage comparison module 5.
Described microprocessor 3 can obtain the initial voltage U0 of photoelectric acquisition sensor 1 output and the pressure of test probe 8 according to described IO level signal, is specially:
When work opened by microprocessor 3, control D/A converter module 4 and export 0V voltage, and little by little increase output voltage values continuously; Monitor the IO level signal of analog voltage comparison module 5 simultaneously; Just can know that when IO level signal overturns initial voltage U0 that photoelectric acquisition sensor 1 exports is with now voltage instruction voltage is equal.According to the force value of the initial voltage U0 obtained and setting, by known photoelectric acquisition sensor 1 displacement and elastic force formula, calculate the reference analog voltage signal size that the force value of setting test probe 8 is corresponding, output digit signals controls D/A converter module 4 and exports described with reference to analog voltage.
In addition, microprocessor 3 can detect, adjust the pressure of test probe 8 automatically.In testing, the test action that the high speed continued comes and goes, can there is tired phenomenon in test probe 8, cause its initial position to change, microprocessor 3 obtains the initial voltage that photoelectric acquisition sensor 1 exports in real time, and then obtain the working pressure of test probe 8, if the initial voltage that photoelectric acquisition sensor 1 exports changes, namely the working pressure of test probe 8 changes, and time different from the parameter instruction comprising pressure that microprocessor 3 stores in advance, then on original setting value basis, again can detect its initial voltage fast, and regenerate the reference analog voltage signal of digital controlled signal adjustment D/A converter module 4 output, and then the working pressure of adjustment test probe 8, thus realize the pressure automatically detecting and adjust test probe 8.
Microprocessor 3 exports IO control signal: in test job, the IO level signal that microprocessor 3 meeting Real-Time Monitoring analog voltage comparison module 5 exports, and digital filtering process in addition, guarantee the reliability of signal, store when comprising the parameter instruction of pressure if the working pressure of described test probe 8 reaches microprocessor 3, then microprocessor 3 exports corresponding IO control signal, makes test probe 8 stop lower needle movement, realize the control of test probe 8 pressure by external movement control system.
Described display circuit 6 is mainly used for the IO level signal that display simulation voltage comparator circuit 5 exports, the analog voltage situation that working sensor and analog voltage output circuit 2 and D/A converter module 4 export can be learnt by observing this IO level signal, by display circuit 6 can direct vision test probe 8 work time working pressure or manually apply pressure to test probe time whether reach setting value, use resistor and emitting led realization.
In above-mentioned, photoelectric acquisition sensor 1 can adopt reflective photoelectric sensor to substitute, and adopts reflective photoelectric sensor to need on test probe, arrange a reflecting piece.
In above-mentioned, microprocessor 3 also can adopt FPGA, CPLD or other logical device to substitute.
Above-described embodiment is the utility model preferably embodiment; but embodiment of the present utility model is not restricted to the described embodiments; change, the modification done under other any does not deviate from Spirit Essence of the present utility model and principle, substitute, combine, simplify; all should be the substitute mode of equivalence, be included within protection domain of the present utility model.
Claims (5)
1. a test probe pressure regulation device, is characterized in that: this pressure regulation device comprises photoelectric acquisition sensor (1), working sensor and analog voltage output circuit (2), microprocessor (3), D/A converter module (4), analog voltage comparison module (5), display circuit (6) and host computer (9);
The displacement of described photoelectric acquisition sensor (1) real-time detection test probe (8), and described displacement is converted into the magnitude of current, the magnitude of current according to photoelectric acquisition sensor (1) calculates the pressure obtaining test probe (8);
Described working sensor and analog voltage output circuit (2) receive the magnitude of current exported from photoelectric acquisition sensor (1), and convert it into analog voltage, export to analog voltage comparison module (5);
The parameter instruction arranging or revise test probe (8) pressure is handed down to microprocessor (3) by described host computer (9);
Described microprocessor (3) stores from the parameter instruction of host computer (9), and generates digital signal and export to D/A converter module (4);
The digital signal received converts to reference to analog voltage signal by described D/A converter module (4), and exports to analog voltage comparison module (5);
Described analog voltage comparison module (5) is compared to the analog voltage exported from working sensor and analog voltage output circuit (2) and D/A converter module (4) respectively, generate high or low IO level signal, export to microprocessor (3); Described IO level signal is also exported to display circuit (6) and is shown by analog voltage comparison module (5);
Microprocessor (3), according to the digital signal of described IO level signal and generation, obtains the working pressure of test probe (8); If the working pressure of described test probe (8) and microprocessor (3) store the parameter instruction comprising pressure different time, then microprocessor (3) regenerates digital controlled signal, the reference analog voltage signal that adjustment D/A converter module (4) exports, and then the working pressure of adjustment test probe (8); Store when comprising the parameter instruction of pressure if the working pressure of described test probe (8) reaches microprocessor (3), then microprocessor (3) exports IO control signal, controls test probe (8) stop lower needle movement by external movement control system.
2. test probe pressure regulation device according to claim 1, it is characterized in that: described display circuit (6) is display IO level signal in real time, learns by described IO level signal the analog voltage situation that working sensor and analog voltage output circuit (2) and D/A converter module (4) export.
3. test probe pressure regulation device according to claim 1, it is characterized in that: described photoelectric acquisition sensor (1) adopts correlation type or reflective photoelectric sensor, adopt reflective photoelectric sensor to need on test probe, arrange a reflecting piece.
4. test probe pressure regulation device according to claim 1, is characterized in that: described photoelectric acquisition sensor (1) adopts U-shaped correlation type photoelectric sensor.
5. test probe pressure regulation device according to claim 1, is characterized in that: described microprocessor (3) adopts FPGA, CPLD or other logical device to substitute.
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| CN201420557627.2U CN204116980U (en) | 2014-09-26 | 2014-09-26 | A kind of test probe pressure regulation device |
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| CN201420557627.2U CN204116980U (en) | 2014-09-26 | 2014-09-26 | A kind of test probe pressure regulation device |
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| CN204116980U true CN204116980U (en) | 2015-01-21 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105165560A (en) * | 2015-10-12 | 2015-12-23 | 江苏鑫泰丰农业装备有限公司 | Winch sprinkling irrigation machine capable of realizing intelligent sprinkling irrigation according to soil humidity |
| CN107732402A (en) * | 2017-10-11 | 2018-02-23 | 北京亦庄材料基因研究院有限公司 | A kind of continuous automatically controlled resonator and its control system |
| CN109887454A (en) * | 2019-04-09 | 2019-06-14 | 苏州精濑光电有限公司 | A kind of impedance detection equipment |
| WO2020052003A1 (en) * | 2018-09-14 | 2020-03-19 | 重庆惠科金渝光电科技有限公司 | Test assembly and test equipment |
| US11016139B2 (en) | 2018-09-14 | 2021-05-25 | Chongqing Hkc Optoelectronics Technology Co., Ltd. | Test assembly and test device |
-
2014
- 2014-09-26 CN CN201420557627.2U patent/CN204116980U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105165560A (en) * | 2015-10-12 | 2015-12-23 | 江苏鑫泰丰农业装备有限公司 | Winch sprinkling irrigation machine capable of realizing intelligent sprinkling irrigation according to soil humidity |
| CN107732402A (en) * | 2017-10-11 | 2018-02-23 | 北京亦庄材料基因研究院有限公司 | A kind of continuous automatically controlled resonator and its control system |
| WO2020052003A1 (en) * | 2018-09-14 | 2020-03-19 | 重庆惠科金渝光电科技有限公司 | Test assembly and test equipment |
| US11016139B2 (en) | 2018-09-14 | 2021-05-25 | Chongqing Hkc Optoelectronics Technology Co., Ltd. | Test assembly and test device |
| CN109887454A (en) * | 2019-04-09 | 2019-06-14 | 苏州精濑光电有限公司 | A kind of impedance detection equipment |
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| C14 | Grant of patent or utility model | ||
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Owner name: HAN'S LASER TECHNOLOGY INDUSTRY GROUP CO., LTD. Free format text: FORMER NAME: DAZU LASER SCI. + TECH. CO., LTD., SHENZHEN |
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| CP01 | Change in the name or title of a patent holder |
Address after: 518000 Shenzhen Province, Nanshan District high tech park, North West New Road, No. 9 Patentee after: HANS LASER TECHNOLOGY INDUSTRY GROUP CO., LTD. Patentee after: Shenzhen Dazu Digital Control Science & Technology Co., Ltd. Address before: 518000 Shenzhen Province, Nanshan District high tech park, North West New Road, No. 9 Patentee before: Dazu Laser Sci. & Tech. Co., Ltd., Shenzhen Patentee before: Shenzhen Dazu Digital Control Science & Technology Co., Ltd. |
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Effective date of registration: 20200624 Address after: 518000 workshop 5 / F, 1 / 2 / F, 14 / F, 17 / F, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Address before: 518000 No. 9 West West Road, Nanshan District hi tech park, Shenzhen, Guangdong Co-patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. Patentee before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |