CN204044186U - Contact pin type filters to test adapter - Google Patents

Contact pin type filters to test adapter Download PDF

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Publication number
CN204044186U
CN204044186U CN201420403286.3U CN201420403286U CN204044186U CN 204044186 U CN204044186 U CN 204044186U CN 201420403286 U CN201420403286 U CN 201420403286U CN 204044186 U CN204044186 U CN 204044186U
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China
Prior art keywords
wave filter
adapter
docking section
instrument
contact pin
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CN201420403286.3U
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Chinese (zh)
Inventor
张一治
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CASIC Defense Technology Research and Test Center
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CASIC Defense Technology Research and Test Center
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Priority to CN201420403286.3U priority Critical patent/CN204044186U/en
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Abstract

The utility model discloses a kind of contact pin type filters to test adapter, comprise test board, adapter; The middle part of beta version is provided with the through hole run through.Adapter one end is provided with instrument butt junction, and the other end is provided with wave filter butt junction.Adapter is cylindricality, comprises the outer conductor, insulator, the inner wire that mutually fit tightly from skin to internal layer successively.Inner wire comprises instrument docking section, center section part, wave filter docking section; One end of center section part is provided with instrument docking section, the other end is provided with wave filter docking section; Instrument docking section is arranged on instrument butt junction one end of adapter, and wave filter docking section is arranged on wave filter butt junction one end of adapter.The utility model is applicable to the contact pin type wave filter of various model, and the housing of wave filter can be fitted tightly with test board, no matter the contact pin length of wave filter can both be tried out, substantially increases testing efficiency with this.

Description

Contact pin type filters to test adapter
Technical field
The utility model relates to electronic technology field, refers to a kind of contact pin type filters to test adapter especially.
Background technology
For the most frequently used test mode of contact pin class wave filter, be test being fixed on test board by ring flange after conventional SMA adapter punching, this test mode is not easy to dismounting.In the prior art, test adapter Many times needs for a certain model carries out custom-made, and wave filter inputs, output terminal is different in size, does not have versatility, is unfavorable for the batch testing of number of different types contact pin type wave filter.
Utility model content
In view of this, the purpose of this utility model is to propose a kind of contact pin type filters to test adapter, and this adapter can meet the test of various contact pin type wave filter.
Based on a kind of contact pin type filters to test adapter that above-mentioned purpose the utility model provides, comprise test board ground plate, adapter; The middle part of described beta version is provided with the through hole run through; Described adapter one end is provided with instrument butt junction, and the other end is provided with wave filter butt junction;
Described adapter is cylindricality, comprises the outer conductor, insulator, the inner wire that mutually fit tightly from skin to internal layer successively; Described inner wire comprises instrument docking section, center section part, wave filter docking section; One end of described center section part is provided with instrument docking section, the other end is provided with wave filter docking section; Described instrument docking section is arranged on instrument butt junction one end of adapter, and wave filter docking section is arranged on wave filter butt junction one end of adapter.
Optionally, during test, wave filter butt junction one end of described adapter is placed in through hole; The measuring head of instrument and wave filter are placed in test board both sides respectively, and wave filter contact pin inserts in adapter from wave filter butt junction one end, and housing and the test board outer wall of wave filter are adjacent to mutually, and the contact pin of instrument inserts in adapter from instrument butt junction one end.
Optionally, the insulator end face of described instrument butt junction place is concordant with inner wire end face, and described outer conductor end face protrudes from the end face of insulator and inner wire;
The outer conductor end face of described wave filter butt junction place is concordant mutually with inner wire end face with insulator end face.
Optionally, described through-hole wall is provided with internal thread, and the outer conductor outer wall of described adapter is provided with external thread;
Described internal thread and external thread mutually fit through spiral way and dock.
Optionally, described outer conductor and/or inner wire material are that copper is gold-plated; Described test board is the sheet metal of solid construction.
Optionally, the inner wire of described wave filter butt junction place has micro-elasticity.The inner wire diameter of described wave filter butt junction place is slightly less than the diameter of the inner wire of described adapter inside.
Optionally, described adapter is provided with at least one glue filling opening; Described glue filling opening is through outer conductor and insulator, and bottom surface connects with inner wire sidewall.
Optionally, instrument docking section, center section part, wave filter docking section are the split-type structural be connected between two; Or instrument docking section, center section part, wave filter docking section are integral type structure.
Optionally, described center section part is solid construction; Described instrument docking section and/or wave filter docking section are hollow structure; Or described instrument docking section and/or wave filter docking section are that one end is closed, other end hatch frame; Described opening is outside inner wire.
Optionally, described center section part two ends are respectively equipped with the first cancave cambered surface and the second cancave cambered surface; Instrument docking section blind end is provided with micro-the first outstanding convex globoidal to center section part direction; The blind end of wave filter docking section is provided with micro-the second outstanding convex globoidal to center section part direction; The first described cancave cambered surface mates mutually with the first convex globoidal radian, and the second cancave cambered surface and the second convex globoidal radian match.
As can be seen from above, the contact pin type filters to test adapter that the utility model provides, in the through hole of wave filter butt junction one end built-in test plate of adapter, the measuring head of instrument and wave filter are placed in test board both sides respectively, wave filter contact pin inserts in adapter from wave filter butt junction one end, housing and the test board outer wall of wave filter are adjacent to mutually, and the contact pin of instrument inserts in adapter from instrument butt junction one end.The utility model is applicable to the contact pin type wave filter of various model, and the method for testing that this device uses can make the housing of wave filter and test board fit tightly.Due between adapter with test board for spiral docks, no matter the contact pin length of wave filter can both be suitable for, also save the cost into the independent custom fitting device of each wave filter, thus reach the object reduced costs, substantially increase testing efficiency with this.
Accompanying drawing explanation
Fig. 1 is the utility model embodiment pin type filters to test adapter one-piece construction schematic diagram;
Fig. 2 is the utility model embodiment pin type filters to test adapter adapter cross-sectional view;
Fig. 3 is the utility model embodiment pin type filters to test adapter inner wire cross-sectional view;
Fig. 4 is the schematic diagram that the contact pin of the utility model embodiment pin type filters to test adapter is positioned at wave filter both sides;
Fig. 5 is that the contact pin of the utility model embodiment pin type filters to test adapter is positioned at wave filter both sides and connects test adapter schematic diagram when testing.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with specific embodiment, and with reference to accompanying drawing, the utility model is further described.
Shown in Figure 1, the utility model provides a kind of contact pin type filters to test adapter, comprises test board 1, adapter 2; The middle part of described beta version is provided with the through hole 3 run through; Described adapter one end is provided with instrument butt junction 5, and the other end is provided with wave filter butt junction 4;
During test, wave filter butt junction 4 one end of described adapter 2 is placed in through hole 3; The measuring head of instrument and wave filter 10 are placed in test board 1 both sides respectively, wave filter contact pin inserts in adapter 2 from wave filter butt junction 4 one end, housing and test board 1 outer wall of wave filter 10 are adjacent to mutually, and the measuring head of instrument inserts in adapter 2 from instrument butt junction 5 one end.In order to ensure good stability when testing, the depth adjustable joint of adapter 2 in through hole 3, wave filter 10 housing parts must fit tightly with test board 1 outer wall.
Shown in Figure 2, as an embodiment, described adapter is cylindricality, comprises the outer conductor 6, insulator 7, the inner wire 8 that mutually fit tightly from skin to internal layer successively; As an embodiment, described adapter can be a kind of SMA adapter.Described outer conductor diameter scope is 4.08-4.12mm, and the diameter range of described inner wire is 1.25-1.29mm.
Described inner wire 8 comprises instrument docking section 81, center section part 82, wave filter docking section 83; One end of described center section part 82 is provided with instrument docking section 81, the other end is provided with wave filter docking section 83;
Described instrument docking section 81 is arranged on instrument butt junction 5 one end of adapter 2, and wave filter docking section 83 is arranged on wave filter butt junction 4 one end of adapter 2.
As an embodiment, insulator 7 end face at described instrument butt junction 5 place is concordant with inner wire 8 end face, and described outer conductor 6 end face protrudes from the end face of insulator 7 and inner wire 8;
Outer conductor 6 end face at described wave filter butt junction 4 place is concordant mutually with inner wire 8 end face with insulator 7 end face.
As an embodiment, described through hole 3 inwall is provided with internal thread, and outer conductor 7 outer wall of described adapter 2 is provided with external thread; Described internal thread and external thread mutually fit through spiral way and dock.The mode of spiral docking is a preferred embodiment, and adapter 2 and test board 1 can be made when testing, and relative position ensures fixing, there will not be the phenomenons such as sideslip disengaging.
As an embodiment, described outer conductor 7 and/or inner wire 8 material are that copper is gold-plated; Described copper gilding can make the conduction of outer conductor 7 and/or inner wire 8 pairs of signals stronger.
Described test board 1 is the sheet metal of solid construction.Concrete, described test board 1 can be a kind of hard aluminum, because copper product is oxidizable, uses aluminum to increase the service life.
As an embodiment, the inner wire 8 at described wave filter butt junction 5 place has micro-elasticity.Inner wire 8 diameter at described wave filter butt junction 5 place is slightly less than the diameter of the inner wire of described adapter 2 inside.Concrete, the inner wire 8 at wave filter butt junction 5 place can do by heat treated mode closed process of closing up, and during to ensure that wave filter contact pin is thinner, inner wire 8 and wave filter contact pin still can fit tightly mutually, and contact is good
As an embodiment, described adapter 2 is provided with at least one glue filling opening 9; Described glue filling opening 9 is through outer conductor 6 and insulator 7, and bottom connects with inner wire 8 sidewall.
Preferably, two symmetrical glue filling openings 9 can be set in inner wire 8 both sides of adapter 2.In glue filling opening 9, the colloidal materials of perfusion is also a kind of insulator, colloid pours into from the tapping of outer conductor 6, the colloid of flowing is finally set between inner wire 8 and insulator 7, and between insulator 7 and outer conductor 6, play adhesive effect, make outer conductor 6, insulator 7, inner wire 8 three is bonded together mutually.
Shown in Figure 3, as an embodiment, instrument docking section 81, center section part 82, wave filter docking section are 83 split-type structurals be connected between two;
Or instrument docking section 81, center section part 82, wave filter docking section 83 are integral type structure.
As an embodiment, described center section part 82 is solid construction; Solid construction is to ensure that test signal can be conducted better.
Described instrument docking section 81 and/or wave filter docking section 83 are hollow structure; Or described instrument docking section 81 and/or wave filter docking section 83 are for closing one end, other end hatch frame; Described opening is outside inner wire.The length range of instrument docking section 81 is 2.5-3mm, and the length range of wave filter docking section 83 is 4-6mm.The contact pin inserting instrument docking section 81 of instrument, wave filter contact pin inserts wave filter docking section 83.
As an embodiment, described center section part 82 two ends are respectively equipped with the first cancave cambered surface 8201 and the second cancave cambered surface 8202;
Instrument docking section 81 blind end is provided with micro-the first outstanding convex globoidal 8101 to center section part 82 direction; The blind end of wave filter docking section 83 is provided with micro-the second outstanding convex globoidal 8301 to center section part 82 direction;
The first described cancave cambered surface 8201 mates mutually with the first convex globoidal 8101 radian, and the second cancave cambered surface 8202 and the second convex globoidal 8301 radian match.By mutually mating the setting of cambered surface, in split-type structural, instrument docking section 81 and center section part 82 can fit tightly, and wave filter docking section 83 and center section part 82 can fit tightly.Be located at first cancave cambered surface 8201 at center section part 82 two ends and the second cancave cambered surface 8202 to be respectively equivalent to two and to accept base, the first cancave cambered surface 8201 place accepts cancave cambered surface 8202 place, instrument docking section 81, second and accepts wave filter docking section 83.
Shown in Figure 4, in certain embodiments, two contact pins of some wave filter 10 lay respectively at the both sides of wave filter 10 housing.Shown in Figure 5, connection is now, two contact pins of wave filter 10 insert in two adapters 2 from wave filter docking section 83 respectively, two adapters 2 are inserted in the through hole 3 of one piece of test board 1 separately, wave filter 10 housing and two pieces of test boards 1 fit tightly, two measuring heads of instrument dock with the instrument docking section 81 of two adapters 2 respectively, one of them adapter 2 connects the signal input port of instrument by instrument test head, another adapter 2 connects the signal output port of instrument by instrument test head; After instrument energising, the test of wave filter can be completed.
In sum, the utility model contact pin type filters to test adapter makes contact pin type wave filter more easy in use, is easy to operation, the conduction that test signal can be more good.
Those of ordinary skill in the field are to be understood that: the foregoing is only specific embodiment of the utility model; be not limited to the utility model; all within spirit of the present utility model and principle; any amendment of making, equivalent replacement, improvement etc., all should be included within protection domain of the present utility model.

Claims (10)

1. a contact pin type filters to test adapter, is characterized in that, comprises test board, adapter;
The middle part of described beta version is provided with the through hole run through; Described adapter one end is provided with instrument butt junction, and the other end is provided with wave filter butt junction;
Described adapter is cylindricality, comprises the outer conductor, insulator, the inner wire that mutually fit tightly from skin to internal layer successively;
Described inner wire comprises instrument docking section, center section part, wave filter docking section; One end of described center section part is provided with instrument docking section, the other end is provided with wave filter docking section;
Described instrument docking section is arranged on instrument butt junction one end of adapter, and wave filter docking section is arranged on wave filter butt junction one end of adapter.
2. contact pin type filters to test adapter according to claim 1, is characterized in that, during test, wave filter butt junction one end of described adapter is placed in through hole; The measuring head of instrument and wave filter are placed in test board both sides respectively, and wave filter contact pin inserts in adapter from wave filter butt junction one end, and housing and the test board outer wall of wave filter are adjacent to mutually, and the contact pin of instrument inserts in adapter from instrument butt junction one end.
3. contact pin type filters to test adapter according to claim 1 and 2, is characterized in that, the insulator end face of described instrument butt junction place is concordant with inner wire end face, and described outer conductor end face protrudes from the end face of insulator and inner wire;
The outer conductor end face of described wave filter butt junction place is concordant mutually with inner wire end face with insulator end face.
4. contact pin type filters to test adapter according to claim 1 and 2, it is characterized in that, described through-hole wall is provided with internal thread, and the outer conductor outer wall of described adapter is provided with external thread; Described internal thread and external thread mutually fit through spiral way and dock.
5. contact pin type filters to test adapter according to claim 1 and 2, is characterized in that, described outer conductor and/or inner wire material are that copper is gold-plated; Described test board is the sheet metal of solid construction.
6. contact pin type filters to test adapter according to claim 1 and 2, is characterized in that, the inner wire of described wave filter butt junction place has micro-elasticity;
The inner wire diameter of described wave filter butt junction place is slightly less than the diameter of the inner wire of described adapter inside.
7. pin type filters to test adapter according to claim 1 and 2, it is characterized in that, described adapter is provided with at least one glue filling opening; Described glue filling opening is through outer conductor and insulator, and bottom surface connects with inner wire sidewall.
8. contact pin type filters to test adapter according to claim 1 and 2, is characterized in that, instrument docking section, center section part, wave filter docking section are the split-type structural be connected between two;
Or instrument docking section, center section part, wave filter docking section are integral type structure.
9. contact pin type filters to test adapter according to claim 1 and 2, is characterized in that, described center section part is solid construction;
Described instrument docking section and/or wave filter docking section are hollow structure; Or described instrument docking section and/or wave filter docking section are that one end is closed, other end hatch frame; Described opening is outside inner wire.
10. contact pin type filters to test adapter according to claim 9, is characterized in that, described center section part two ends are respectively equipped with the first cancave cambered surface and the second cancave cambered surface; Instrument docking section blind end is provided with micro-the first outstanding convex globoidal to center section part direction; The blind end of wave filter docking section is provided with micro-the second outstanding convex globoidal to center section part direction;
The first described cancave cambered surface mates mutually with the first convex globoidal radian, and the second cancave cambered surface and the second convex globoidal radian match.
CN201420403286.3U 2014-07-21 2014-07-21 Contact pin type filters to test adapter Active CN204044186U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420403286.3U CN204044186U (en) 2014-07-21 2014-07-21 Contact pin type filters to test adapter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420403286.3U CN204044186U (en) 2014-07-21 2014-07-21 Contact pin type filters to test adapter

Publications (1)

Publication Number Publication Date
CN204044186U true CN204044186U (en) 2014-12-24

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111596105A (en) * 2020-06-30 2020-08-28 瑞声精密制造科技(常州)有限公司 Test fixture of dielectric waveguide filter

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111596105A (en) * 2020-06-30 2020-08-28 瑞声精密制造科技(常州)有限公司 Test fixture of dielectric waveguide filter
WO2022000701A1 (en) * 2020-06-30 2022-01-06 瑞声声学科技(深圳)有限公司 Testing fixture of dielectric waveguide filter

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