CN203894183U - Hemispherical emittance tester based on balanced-state heat meter measurement method - Google Patents
Hemispherical emittance tester based on balanced-state heat meter measurement method Download PDFInfo
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- CN203894183U CN203894183U CN201420188794.4U CN201420188794U CN203894183U CN 203894183 U CN203894183 U CN 203894183U CN 201420188794 U CN201420188794 U CN 201420188794U CN 203894183 U CN203894183 U CN 203894183U
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- 238000012545 processing Methods 0.000 claims abstract description 28
- 238000000034 method Methods 0.000 claims abstract description 20
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 16
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- 229910052757 nitrogen Inorganic materials 0.000 claims description 8
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- 238000010521 absorption reaction Methods 0.000 description 1
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- 239000011248 coating agent Substances 0.000 description 1
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Abstract
The utility model discloses a hemispherical emittance tester based on a balanced-state heat meter measurement method. The hemispherical emittance tester based on the balanced-state heat meter measurement method comprises a vacuum chamber, a test specimen heating component, a vacuumizing device, a constant-temperature cooling device and a data measuring and processing device; the vacuum chamber comprises a vacuum cover and a heat sink covering the inner wall of the vacuum cover; the test specimen heating component is arranged in the vacuum chamber for heating a test specimen, and comprises a main heater; the vacuumizing device is communicated with a vacuum testing space of the vacuum chamber; the constant-temperature cooling device is communicated with a cooling medium of the vacuum chamber; and the data measuring and processing device collects the temperature of the test specimen, the temperature of the heat sink, the vacuum degree in the vacuum chamber and the power of the main heater, and calculates the semispherical emittance of the test specimen. The rigor requirement for the material heat conduction coefficient and the specific heat capacity by the test process is overcome; and the hemispherical emittance tester is high in test precision and wide in test temperature interval, and can test the semispherical emittance of the material at different temperature conditions, especially at a low temperature. By utilizing the test result of the tester, the semispherical emittance of the material can be calculated conveniently, and the tester is simple to test and calculate.
Description
Technical Field
The utility model belongs to the technical field of hemisphere emissivity tester and specifically relates to a steady state calorimeter method hemisphere emissivity tester.
Background
Hemispherical emissivity is an important physical property parameter of solid materials, which characterizes the ability of a material to radiate against a black body at a particular temperature. The method for testing the hemispherical emissivity of the material comprises a kaimeter method and an optical method. Which in turn include transient and steady state calorimeters (steady state calorimeters). The transient kaimeter method can continuously measure the emissivity of the sample under different temperature conditions in a short time, but requires the sample to have good thermal conductivity in the test so as to ensure that no temperature gradient exists in the sample in the cooling process. Thus, it is difficult to measure the hemispherical emissivity of low thermal conductivity materials. In addition, the specific heat capacity of the material at different temperatures needs to be obtained by adopting the transient kaimetry, however, thermodynamic parameters of many novel functional material thermal control materials are very lacking, and the application of the transient kaimetry is also limited.
SUMMERY OF THE UTILITY MODEL
In order to satisfy the measurement requirement of thermal emissivity of thermal radiation material especially thermal-insulated coating under different temperature conditions especially low temperature, the utility model discloses a rational design hemisphere emissivity tester based on steady state calorimetry method.
In order to achieve the above purpose, the utility model adopts the following technical scheme: a steady-state calorimeter hemisphere emissivity tester comprises a vacuum chamber, a sample heating assembly, a vacuumizing device, a constant-temperature cooling device and a data measuring and processing device;
the vacuum chamber comprises a vacuum cover and a heat sink which is fixedly arranged on the inner wall of the vacuum cover and is in a semi-surrounding shape; the inward side of the heat sink forms a vacuum test space, and a cooling medium channel is reserved between the outward side and the inner wall of the vacuum cover; a cooling medium inlet and a cooling medium outlet are arranged in the cooling medium channel;
the sample heating assembly is arranged in a vacuum test space of the vacuum chamber to heat a sample and comprises a main heater; the main heater, a standard resistor and a direct current power supply form a series circuit;
the vacuum pumping device is communicated with the vacuum test space of the vacuum chamber through a pipeline;
the constant-temperature cooling device is communicated with a cooling medium inlet and a cooling medium outlet of the cooling medium channel through pipelines respectively;
the data measuring and processing deviceCollecting the temperature of a sample, the temperature of a heat sink, the vacuum degree in a vacuum chamber and the power of a main heater; when the data measuring and processing device detects that the pressure in the vacuum chamber reaches 1.0X10-3Pa below, and when the temperature of the sample reaches the set temperature, the data measuring and processing device calculates the hemispherical emissivity of the sample according to the temperature of the sample, the temperature of the heat sink, the power of the main heater and the radiation surface area of the sample.
Compared with the prior art, the utility model discloses a steady state calorimetry method hemisphere emissivity tester includes real empty room, constant temperature cooling device, sample heating element, evacuating device and data measurement and processing apparatus, through the steady state calorimetry method, has overcome the harsh requirement of test procedure to material coefficient of heat conductivity and specific heat capacity, and the measuring accuracy is higher, and the test warm area is wide, uses comparatively extensively, can test the hemisphere emissivity of material especially at low temperature under the different temperature conditions. The testing result of the testing device can be used for conveniently calculating the hemispherical emissivity of the material, and the testing and calculation are simple.
Further, the data measuring and processing device comprises a first temperature measuring unit, a second temperature measuring unit, a third temperature measuring unit, a fourth temperature measuring unit, a first voltmeter, a second voltmeter and a processing unit; the first temperature measuring unit is arranged on the sample and is used for measuring the temperature of the sample; the second temperature measuring unit is arranged on the heat sink; the third temperature measuring unit is arranged at a cooling medium inlet; the fourth temperature measuring unit is arranged at the cooling medium outlet; the first voltmeter is connected with the main heater in parallel and used for measuring the voltage of the main heater; the second voltmeter is connected in parallel to the standard resistor and used for measuring the voltage of the standard resistor; and the processing unit calculates the power of the main heater according to the values of the first voltmeter and the second voltmeter and the resistance value of the standard resistor.
Further, the vacuumizing device comprises an oil diffusion pump, a gas storage tank and a mechanical pump; the vacuum chamber, the oil diffusion pump, the gas storage tank and the mechanical pump are communicated in sequence through pipelines; a high vacuum valve is arranged on a pipeline between the vacuum chamber and the oil diffusion pump.
Further, the vacuum pumping device also comprises a three-way valve; the three-way valve comprises a main port and two selection ports; the main port is communicated with the mechanical pump through a pipeline; one of the selection ports is communicated with the gas storage tank through a pipeline, and the other selection port is directly communicated with the vacuum chamber through a pipeline; the data measuring and processing device also comprises a high vacuum gauge, a first low vacuum gauge and a second low vacuum gauge; the high vacuum gauge is arranged on a pipeline between the high vacuum valve and the oil diffusion pump; the first low vacuum gauge is arranged on a pipeline between the three-way valve and the mechanical pump; the second low vacuum gauge is arranged on a pipeline between the three-way valve and the vacuum chamber. The high vacuum mechanism and the low vacuum mechanism share one mechanical pump and can be switched by a three-way valve, so that the pipeline connection is simplified, and the cost is saved.
Further, the sample heating assembly includes a main heater and an auxiliary heater; the auxiliary heater is in a semi-surrounding shape, and the main heater is arranged in a semi-surrounding space of the auxiliary heater. The auxiliary heater is used for compensating the temperature of the sample.
Further, the sample heating assembly further comprises a vapor chamber disposed on the main heater. The sample was heated uniformly.
And the vacuum hood is fixedly connected with the vacuum hood, the vacuum hood is provided with a lifting pin shaft, the lifting pin shaft is provided with a power unit and a control button electrically connected with the power unit, and the power unit drives the lifting pin shaft to move up and down. The lifting pin shaft is controlled to move up and down through the control button, the vacuum cover is driven to be opened or closed, and labor efficiency is improved.
Further, the constant-temperature cooling device is a circulating cooling water device or a liquid nitrogen tank.
Further, the side of the heat sink facing the vacuum test space is coated with a matt black paint.
Further, the tester also comprises a test host; the test host comprises a display screen, a vacuum pressure gauge, a temperature display instrument and a control panel; the vacuum pressure gauge displays the values measured by the first low vacuum gauge, the second low vacuum gauge and the high vacuum gauge; the temperature display instrument displays the measured values of the first temperature measurement unit and the second temperature measurement unit; and a plurality of control buttons are arranged on the control panel.
Drawings
FIG. 1 is a connection diagram of a hemisphere emissivity tester by a steady-state calorimeter method
FIG. 2 is a schematic view showing the internal structure of the vacuum chamber 1 in FIG. 1
FIG. 3 is a circuit diagram of the main heater 31 and the auxiliary heater 32 in FIG. 2
The invention will be further described with reference to the drawings and the specific embodiments.
Detailed Description
The principle of measuring the hemispherical emissivity of the material by adopting a steady-state kaometer method is as follows: assuming hemispherical emissivity ε of the sampleHEqual to the hemispherical absorption, when the sample temperature T reaches thermal equilibrium, the following relationship:
wherein sigma is Stefan-Boltzmann constant; a is the surface area of the sample; t and T0Respectively the temperature of the sample and the inner wall of the test chamber; q is the heating power of the heater; qwHeat loss through the lead for the sample; qgHeat loss caused by residual gas in the test chamber; qrThe energy absorbed by the sample is reflected multiple times by the sample and the inner wall of the test chamber.
During testing, a high vacuum is maintained in the test chamber, and the surface area within the test chamber is much greater than the surface area of the sample, thus, QgAnd QrCan be ignored; as the adopted heating wires and the lead wires have thinner diameters, the heat loss Q of the lead wires can be ignoredw. I.e. formula (1) is equivalent to
Therefore, the heating power Q of the heating device, the sample temperature T and the inner wall temperature T of the test chamber are measured0And the surface area A of the sample, namely the hemispherical emissivity epsilon of the sample can be calculatedH。
Referring to fig. 1 and 2, fig. 1 is a connection diagram of a hemisphere emissivity tester by a steady-state calorimeter method according to the present invention, and fig. 2 is a diagram of fig. 1The internal structure of the middle vacuum chamber 1 is schematically shown. The utility model discloses a hemisphere emissivity tester of steady state calorimetry, including real empty room 1, constant temperature cooling device 2, sample heating element 3, evacuating device 4, data measurement and processing apparatus 5 and test host computer. The vacuum chamber 1 comprises a vacuum cover 11, a flange 12 arranged at the bottom of the vacuum cover and a heat sink 13 which is fixedly arranged on the inner wall of the vacuum cover 11 and is in a semi-surrounding shape; the inward surface of the heat sink 13 and the flange 12 form a vacuum test space, and a cooling medium channel 14 is reserved between the outward surface and the inner wall of the vacuum cover 11. The constant temperature cooling device 2 is communicated with a cooling medium channel 14 of the vacuum chamber 1 through a pipeline, and generates a cooling medium and exchanges heat with the heat sink to keep the temperature of the heat sink constant. The sample heating unit 3 is disposed in the vacuum chamber 1, and a sample to be tested is placed on the sample heating unit 3 and heated by the sample heating unit 3. The vacuum extractor 4 is connected to the vacuum test space of the vacuum chamber 1, and is used for vacuum-extracting the vacuum chamber 1. The data measuring and processing device 5 is used for measuring the running data of the tester, and when the temperature T of the sample reaches the preset temperature and the vacuum chamber 1 is in a thermal stable state, the hemispherical emissivity epsilon of the sample is calculatedH。
A lifting pin shaft 15 is fixed on the outer wall of the vacuum cover 11, the lifting pin shaft 15 is connected with a power unit, and the power unit is respectively and electrically connected with a lifting button and a descending button; an operator controls the lifting pin shaft 15 by controlling the lifting button or the descending button, so that the vacuum cover 11 is controlled to move up and down, and the labor efficiency is improved; the power unit is preferably an electric motor. The inwardly facing side of the heat sink 13 is coated with a matt black paint. A cooling medium inlet 16 and a cooling medium outlet 17 are provided in the cooling medium passage 14. The cooling medium inlet 16 and the cooling medium outlet 17 are respectively communicated with the constant-temperature cooling device 2 through pipelines; after being generated from the thermostatic cooling device 2, the cooling medium enters the cooling medium channel 14 through the cooling medium inlet 16, exchanges heat with the heat sink 13 to maintain the temperature of the heat sink 13, and returns to the thermostatic cooling device 2 through the cooling medium outlet 17 to refrigerate again.
The constant temperature cooling device 2 is a circulating cooling water device or a liquid nitrogen tank.
The sample heating unit 3 includes a main heater 31, an auxiliary heater 32, and a soaking plate 33. The main heater 31 is used to heat the sample a to a predetermined temperature. As shown in fig. 3, it is a circuit diagram of the main heater 31 and the auxiliary heater 32 in fig. 2. The main heater 31 is connected in series with a standard resistor and a DC power supply to form a main heating loop. The soaking plate 33 is placed on the main heater 31. The sample A is placed on the soaking plate 33 so that the sample A is uniformly heated. The auxiliary heater 32 is formed in a semi-surrounding shape, the sample a, the soaking plate 33 and the main heater 31 are placed in the auxiliary heater 32, and a gap between the sample a and the auxiliary heater 32 is sealed by a cover plate 34, so that the heat generated by the main heater 31 is entirely supplied to the sample a. The auxiliary heater 32 has a coil built therein, and the coil generates heat by receiving an alternating current. The auxiliary heater 32 supplies all of the heat generated by the main heater 31 to the sample a as compensation heating, and keeps the sample temperature constant.
The vacuum pumping device 4 comprises a three-way valve 41, an oil stopper 42, an oil diffusion pump 43, an air storage tank 44 and a mechanical pump 45; the three-way valve 41 includes a main port, a first selection port and a second selection port. The main port is communicated with the mechanical pump 45 through a pipeline, and the pipeline is provided with an electromagnetic valve 46; the electromagnetic valve 46 is linked to the mechanical pump 45, and when the mechanical pump 45 is opened, the electromagnetic valve 46 is opened, and the mechanical pump 45 and the three-way valve 41 are opened and closed. The first selection port communicates with the vacuum chamber 1 through a pipe. The vacuum chamber 1, the oil stopper 42, the oil diffusion pump 43, the air storage tank 44 and the second selection port are communicated in sequence through pipelines; a high vacuum valve 47 is provided on a pipe between the oil diffusion pump 43 and the vacuum chamber 1. The three-way valve 41 is provided with a handle which can be pulled out to the dead-centre position or pushed in to the dead-centre position. When the three-way valve 41 is in the pushed-in to dead-center position, the second selection port communicates with the main port; when the three-way valve 41 is in the pulled-out to dead-center position, the first selection port communicates with the main port. The three-way valve 41 functions as a selector to select the line in which the mechanical pump 45 operates.
The data measuring and processing device 5 comprises a first temperature measuring unit, a second temperature measuring unit, a third temperature measuring unit, a fourth temperature measuring unit, a first voltmeter, a second voltmeter, a high vacuum gauge 51, a first low vacuum gauge 52, a second low vacuum gauge 53 and a processing unit. The first temperature measuring unit is arranged on the sample and measures the temperature T of the sample. The second temperature measuring unit is arranged on the heat sink and used for measuring the temperature T of the heat sink0. The third temperature measuring unit is provided at the cooling medium inlet 16. The fourth temperature measuring unit is provided at the cooling medium outlet 17. The first voltmeter is connected in parallel to the main heater 31, and measures a terminal voltage V of the main heater 31. The second voltmeter is connected in parallel to the standard resistor, and measures the voltage V1 of the standard resistor. The high vacuum gauge 51 is disposed between the high vacuum valve 47 and the oil deflector 42. The first low vacuum gauge 52 is disposed between the three-way valve 41 and the solenoid valve 46. The second low vacuum gauge 53 is disposed between the three-way valve 41 and the vacuum chamber 1. And the processing unit calculates the power Q of the main heater according to the values of the first voltmeter and the second voltmeter and the resistance R of the standard resistor. And, if the circulating cooling water is adopted as the constant temperature device, the heat sink temperature T0The average value of the detection values of the third and fourth temperature measurement units, namely the average temperature value of the cooling medium inlet 16 and the cooling medium outlet 17; if liquid nitrogen is adopted as a constant temperature device, the heat sink temperature T0Is the temperature value detected by the second unit.
When the sample temperature T reaches the preset temperature and the vacuum chamber 1 is in a thermal stable state, the data measuring and processing device 5 measures the sample temperature T and the heat sink temperature T0Calculating the hemispherical emissivity epsilon of the sample by the power Q of the main heater and the radiation surface area S of the sampleH. Wherein, <math>
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the test host comprises a display screen, a vacuum pressure gauge, a temperature display instrument and a control panel; the vacuum gauge indicates the values measured by the first low vacuum gauge 52, the second low vacuum gauge 53 and the high vacuum gauge 51. The temperature display instrument displays the measured numerical values of the first temperature measurement unit, the second temperature measurement unit, the third temperature measurement unit and the fourth temperature measurement unit. The control panel is provided with a test host power button, a display screen power button, a temperature display instrument power button, a mechanical pump switch button, a constant temperature cooling device switch button, a cooling water switch button, a vacuum cover ascending button, a vacuum cover descending button, a main heater switch button and an auxiliary heater switch button.
Furthermore, the vacuum chamber 1 is also communicated with an inflator pump through a pipeline, and an inflation valve is arranged between the vacuum chamber 1 and the inflator pump.
The utility model discloses a measurement principle of steady state calorimetry hemisphere emissivity tester: a sample to be tested is placed in a vacuum chamber 1, only radiation heat exchange is carried out between the surface of the sample and the vacuum chamber 1, and the heat radiation emitted by the sample is totally projected onto the surface of a heat sink of the vacuum chamber 1. The sample is heated to the measured temperature by providing a continuous heating power in an electric heating mode, and the sample exchanges heat with the cooling blackbody cavity through heat radiation. When the heat balance between the sample and the environment is achieved, the heater temperature T and the heat sink temperature T are collected by the data measuring and processing device 50The terminal voltage V of the main heater and the terminal voltage V1 of the standard resistor, and then according to the surface area S of the sample, the computer software directly calculates the hemispherical emissivity epsilon of the sampleH。
The utility model discloses a concrete operation flow of steady state calorimetry method hemisphere emissivity tester as follows:
pressing a vacuum cover lifting button, lifting the vacuum cover 11 to a proper height through a lifting pin shaft, fixing the prepared sample to be tested on a soaking plate 33 of the vacuum chamber 1 by using heat-conducting silicone grease, pressing the sample to be tested by using a pressing plate 34, pressing a vacuum cover descending button, and lowering the vacuum cover 11 to the lowest position to enable the vacuum cover 11 and a sealing ring of a bottom flange to be pressed in a negative pressure mode. Firstly, pre-vacuumizing a vacuum chamber 1 to be in low vacuum: the three-way valve 41 is pulled out to the dead point position and the closed state of the high vacuum valve 47 is maintained. The following buttons are turned on the control panel: the test system comprises a test host power button, a display screen power button, a temperature display instrument power button and a mechanical pump switch button. When the pressure of the vacuum chamber 1 is less than or equal to 10Pa, the oil stopper 42 and the oil diffusion pump 43 are vacuumized: pushing the handle of the three-way valve 41 inwards to the dead point position, keeping the high vacuum valve 47 in a closed state, opening a cooling water switch button to switch on the cooling water of the oil diffusion pump 43 when the pressure of the oil diffusion pump 43 reaches below about 6Pa, heating the oil diffusion pump 43, and starting constant temperature water or liquid nitrogen, if liquid nitrogen is used, directly unscrewing a pressure reducing valve of a liquid nitrogen bottle to control the pressure of the liquid nitrogen bottle to be 0.05-0.1 MPa. After heating the oil diffusion pump 43 for 40min, the three-way valve 41 is pulled outwards to the dead point position, and the vacuum chamber 1 is pumped down to below 10Pa again: the three-way valve 41 is pushed inward to the dead-center position, the high vacuum valve 47 is opened, and the following buttons are pressed on the control panel: the main heater switch button and the auxiliary heater switch button start heating and warming the sample. When the sample temperature T reaches the preset temperature and the vacuum chamber 1 is in a thermal stable state (within 20min, the sample temperature fluctuation is not more than 0.1 ℃), the sample temperature T and the heat sink temperature T are continuously measured for 3 times0A terminal voltage V of the main heater 31 and a terminal voltage V1 of the standard resistor; wherein the heat sink temperature T0Is an average value of the temperatures of the cooling medium inlet 15 and the cooling medium outlet 16 when the sample temperature T reaches the detected temperature. Data acquisition is carried out through a data measuring and processing device 5, and then the hemispherical emissivity epsilon of the sample is directly calculated by computer software according to the surface area S of the sampleH。
After the test is completed, the power supply for vacuum measurement is turned off, the heating of the oil diffusion pump 43 is stopped, and the high vacuum valve is closed. The inflation valve is opened to inflate the vacuum enclosure 11. And (3) lifting the vacuum cover 11, taking out the sample, then lowering the vacuum cover 11, closing the inflation valve after closing, pulling the three-way valve 41 to a dead point, and vacuumizing the vacuum cover 11 for 3-5 min. When the oil diffusion pump 43 is cooled to room temperature, the mechanical pump 45 is stopped to ensure that the oil diffusion pump 43 is kept vacuum. The cooling water and power supply of the oil diffusion pump 43 are turned off, and the entire operation is completed.
In the testing process, after a vacuum container is sealed, low vacuum must be pumped firstly, and a high vacuum valve is opened after the vacuum is pumped to 6Pa, so that direct high vacuum pumping is not allowed, and the phenomenon that the oil of the working diffusion pump is oxidized due to the fact that the oil is contacted with the atmosphere and the performance of the diffusion pump is damaged is avoided. When the vacuum operation is finished, the vacuum measurement is cut off firstly, then the high vacuum valve is closed, then the inflation valve is opened, the high vacuum measurement is not cut off and the inflation is carried out, then the lamp filament of the ionization tube is burnt out immediately, the high vacuum valve is not closed and the inflation is carried out, then the diffusion pump oil is oxidized, and the diffusion pump can not work normally. During the working process, whether the cooling water is smooth or not and whether the water temperature and the flow are normal or not are often noticed. If power is suddenly cut off, the vacuum measurement is immediately cut off, the vacuum valve is closed, the three-way valve 41 is pulled outwards to a dead point (cooling water cannot be cut off), after a power supply is powered on, the three-way valve 41 is pushed inwards to the dead point after the mechanical pump 45 works for 2-3 minutes, the normal work is continued, and if the power supply cannot be repaired within 30 minutes, the diffusion pump is required to be heated and cooled as quickly as possible.
Compared with the prior art, the utility model discloses a steady state calorimetry method hemisphere emissivity tester includes real empty room 1, constant temperature cooling device 2, sample heating element 3, evacuating device 4 and data measurement and processing apparatus 5, through steady state calorimetry method, has overcome the harsh requirement of test procedure to material coefficient of heat conductivity and specific heat capacity, and the measuring accuracy is higher, and the test warm area is wide, uses comparatively extensively, can test the hemisphere emissivity of material especially at low temperature under the different temperature conditions. The testing result of the testing device can be used for conveniently calculating the hemispherical emissivity of the material, and the testing and calculation are simple.
The above is only a preferred embodiment of the present invention, and it should be noted that the above preferred embodiment should not be considered as limiting the present invention, and the protection scope of the present invention should be subject to the scope defined by the claims. It will be apparent to those skilled in the art that various modifications and enhancements can be made without departing from the spirit and scope of the invention, and such modifications and enhancements are intended to be within the scope of the invention.
Claims (10)
1. The utility model provides a hemisphere emissivity tester of steady state calorimetry method which characterized in that: comprises a vacuum chamber, a sample heating component, a vacuumizing device, a constant-temperature cooling device and a data measuring and processing device;
the vacuum chamber comprises a vacuum cover and a heat sink which is fixedly arranged on the inner wall of the vacuum cover and is in a semi-surrounding shape; the inward side of the heat sink forms a vacuum test space, and a cooling medium channel is reserved between the outward side and the inner wall of the vacuum cover; a cooling medium inlet and a cooling medium outlet are arranged in the cooling medium channel;
the sample heating assembly is arranged in a vacuum test space of the vacuum chamber to heat a sample and comprises a main heater; the main heater, a standard resistor and a direct current power supply form a series circuit;
the vacuum pumping device is communicated with the vacuum test space of the vacuum chamber through a pipeline;
the constant-temperature cooling device is communicated with a cooling medium inlet and a cooling medium outlet of the cooling medium channel through pipelines respectively;
the data measuring and processing device collects the temperature of a sample, the temperature of a heat sink, the vacuum degree in the vacuum chamber and the power of the main heater; when the data measuring and processing device detects that the pressure in the vacuum chamber reaches 1.0X10-3Pa below, and when the temperature of the sample reaches the set temperature, the data measuring and processing device calculates the hemispherical emissivity of the sample according to the temperature of the sample, the temperature of the heat sink, the power of the main heater and the radiation surface area of the sample.
2. The steady-state calorimeter hemispherical emissivity tester of claim 1, wherein: the data measuring and processing device comprises a first temperature measuring unit, a second temperature measuring unit, a third temperature measuring unit, a fourth temperature measuring unit, a first voltmeter, a second voltmeter and a processing unit; the first temperature measuring unit is arranged on the sample and is used for measuring the temperature of the sample; the second temperature measuring unit is arranged on the heat sink; the third temperature measuring unit is arranged at a cooling medium inlet; the fourth temperature measuring unit is arranged at the cooling medium outlet; the first voltmeter is connected with the main heater in parallel and used for measuring the voltage of the main heater; the second voltmeter is connected in parallel to the standard resistor and used for measuring the voltage of the standard resistor; and the processing unit calculates the power of the main heater according to the values of the first voltmeter and the second voltmeter and the resistance value of the standard resistor.
3. The steady-state calorimeter hemispherical emissivity tester of claim 2, wherein: the vacuumizing device comprises an oil diffusion pump, a gas storage tank and a mechanical pump; the vacuum chamber, the oil diffusion pump, the gas storage tank and the mechanical pump are communicated in sequence through pipelines; a high vacuum valve is arranged on a pipeline between the vacuum chamber and the oil diffusion pump.
4. The steady-state calorimeter hemispherical emissivity tester of claim 3, wherein: the vacuum-pumping device also comprises a three-way valve; the three-way valve comprises a main port and two selection ports; the main port is communicated with the mechanical pump through a pipeline; one of the selection ports is communicated with the gas storage tank through a pipeline, and the other selection port is directly communicated with the vacuum chamber through a pipeline; the data measuring and processing device also comprises a high vacuum gauge, a first low vacuum gauge and a second low vacuum gauge; the high vacuum gauge is arranged on a pipeline between the high vacuum valve and the oil diffusion pump; the first low vacuum gauge is arranged on a pipeline between the three-way valve and the mechanical pump; the second low vacuum gauge is arranged on a pipeline between the three-way valve and the vacuum chamber.
5. The steady-state calorimeter hemispherical emissivity tester of claim 4, wherein: the sample heating assembly comprises a main heater and an auxiliary heater; the auxiliary heater is in a semi-surrounding shape, and the main heater is arranged in a semi-surrounding space of the auxiliary heater.
6. The steady-state calorimeter hemispherical emissivity tester of claim 5, wherein: the sample heating assembly also includes a vapor chamber disposed above the primary heater.
7. The steady-state calorimeter hemispherical emissivity tester of claim 6, wherein: the vacuum cover is fixedly connected with the vacuum cover, the lifting pin shaft is provided with a power unit and a control button electrically connected with the power unit, and the power unit drives the lifting pin shaft to move up and down.
8. The steady-state calorimeter hemispherical emissivity tester of claim 7, wherein: the constant temperature cooling device is a circulating cooling water device or a liquid nitrogen tank.
9. The steady-state calorimeter hemispherical emissivity tester of claim 8, wherein: the side of the heat sink facing the vacuum test space is coated with a matt black paint.
10. The steady-state calorimeter hemispherical emissivity tester of claim 9, wherein: the tester also comprises a test host; the test host comprises a display screen, a vacuum pressure gauge, a temperature display instrument and a control panel; the vacuum pressure gauge displays the values measured by the first low vacuum gauge, the second low vacuum gauge and the high vacuum gauge; the temperature display instrument displays the measured numerical values of the first temperature measuring unit, the second temperature measuring unit, the third temperature measuring unit and the fourth temperature measuring unit; and a plurality of control buttons are arranged on the control panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420188794.4U CN203894183U (en) | 2014-04-17 | 2014-04-17 | Hemispherical emittance tester based on balanced-state heat meter measurement method |
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| CN201420188794.4U CN203894183U (en) | 2014-04-17 | 2014-04-17 | Hemispherical emittance tester based on balanced-state heat meter measurement method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969291A (en) * | 2014-04-17 | 2014-08-06 | 广州特种承压设备检测研究院 | Test instrument for hemispherical emissivity adopting homeostasis calorimeter method |
| CN115993379A (en) * | 2023-02-17 | 2023-04-21 | 北京中科科仪股份有限公司 | Coating heat dissipation testing device and testing method |
-
2014
- 2014-04-17 CN CN201420188794.4U patent/CN203894183U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969291A (en) * | 2014-04-17 | 2014-08-06 | 广州特种承压设备检测研究院 | Test instrument for hemispherical emissivity adopting homeostasis calorimeter method |
| CN103969291B (en) * | 2014-04-17 | 2016-09-07 | 广州特种承压设备检测研究院 | A kind of stable state calorimeter method hemispherical emissivity tester |
| CN115993379A (en) * | 2023-02-17 | 2023-04-21 | 北京中科科仪股份有限公司 | Coating heat dissipation testing device and testing method |
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