CN203824652U - Measurement device for femtosecond laser pulse width - Google Patents
Measurement device for femtosecond laser pulse width Download PDFInfo
- Publication number
- CN203824652U CN203824652U CN201420097390.4U CN201420097390U CN203824652U CN 203824652 U CN203824652 U CN 203824652U CN 201420097390 U CN201420097390 U CN 201420097390U CN 203824652 U CN203824652 U CN 203824652U
- Authority
- CN
- China
- Prior art keywords
- light beam
- reflection mirror
- laser pulse
- high reflection
- femtosecond laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Spectrometry And Color Measurement (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The utility model discloses a measurement device for a femtosecond laser pulse width, wherein a beam splitting sheet is arranged on the same horizontal surface opposite to a femtosecond laser pulse light beam emission source; a femtosecond laser pulse light beam forms two light beam channels after passing through the beam splitting sheet; the first light beam channel is sequentially provided with a planar high-reflective mirror A, a planar high-reflective mirror B and a planar high-reflective mirror C along the forward motion direction of a light beam; the second light beam channel is sequentially provided with a planar high-reflective mirror D, a planar high-reflective mirror E and a planar high-reflective mirror F along the forward motion direction of the light beam; the femtosecond laser pulse light beam passing through the planar high-reflective mirror C in the first light beam channel and the femtosecond laser pulse light beam passing through the planar high-reflective mirror F in the second light beam channel are accurately superposed in a photoelectric diode detector after passing through a beam combining sheet. The measurement device is simple and practical, convenient to adjust, rapid in data acquisition and data processing, and adaptive to measurement and real-time monitoring for the widths and shapes of femtosecond laser pulses with different pulse widths and wavelengths.
Description
Technical field
The utility model relates to a kind of femto-second laser pulse measurement mechanism, is specifically related to a kind of femtosecond laser pulse width measuring instrument.
Background technology
The research of femtosecond laser and corresponding femtosecond laser technology is along with femto-second laser pulse develops rapidly with going deep in the expansion of the application of the social every field such as scientific research, biology, medical treatment, processing, communication, national defence.The application of one of them importance is to utilize femto-second laser pulse and Femtosecond laser spectroscopy method to carry out the ultrafast dynamics in the various types of materials such as Study on Protein, nano material, semiconductor.Such as, can adopt Study on Protein Structural Dynamics, semiconductor and the nano material charge carrier dynamics such as femtosecond pumping-detection technology and femtosecond stimulated Raman scattering technology.On the other hand, the pulse shape of femtosecond laser and pulse width are important optical parameters in femto-second laser pulse application, and the measurement to it or Real-Time Monitoring are very necessary in a lot of experiment and applications.At present, two of impulsive measurement important method are frequency discrimination photoswitch (Frequency-resolved optical grating is called for short FROG) method and self-reference spectral interference (self-referenced spectral interferometry is called for short SRSI) method.
Summary of the invention
The technical matters that the utility model solves has been to provide a kind of simple and practical, easy to adjust, data acquisition and data processing femtosecond laser pulse width measuring instrument rapidly, this device can utilize based on interference of light effect and measure complicated femto-second laser pulse, also can adapt to the femtosecond laser pulse width of different pulse widths and different wave length and the measurement of pulse shape and Real-Time Monitoring.
The technical solution of the utility model is: a kind of femtosecond laser pulse width measuring instrument, comprise femto-second laser pulse radiation beam source, it is characterized in that: the same level relative with femto-second laser pulse radiation beam source is provided with beam splitting chip, femto-second laser pulse light beam forms twice beam channel after beam splitting chip, wherein the first beam channel is provided with plane high reflection mirror A successively along light beam working direction, plane high reflection mirror B and plane high reflection mirror C, the second beam channel is provided with plane high reflection mirror D successively along light beam working direction, plane high reflection mirror E and plane high reflection mirror F, by the femto-second laser pulse light beam of the first beam channel midplane high reflection mirror C and the femto-second laser pulse light beam by the second beam channel midplane high reflection mirror F after closing bundle sheet at photodiode detector inregister, described plane high reflection mirror B and plane high reflection mirror C are arranged at and on high-precision electric translation stage, form high-precision optical and postpone platform, plane high reflection mirror B and plane high reflection mirror C carry out high precision operation under the drive of high-precision electric translation stage before and after beam direction.
The utility model utilizes Labview realization to carry out robotization control to the signal of high-precision electric translation stage and photodiode detector input capture card.
The utlity model has following beneficial effect: 1, utilize and measure complicated femtosecond laser pulse width based on interference of light effect, can realize the measurement of deep ultraviolet being arrived to the laser pulse of hundreds of femtosecond to the cycle magnitude of middle infrared excess broadband spectral scope; 2, the utility model is simple in structure, only utilizes several plane high reflection mirrors just can carry out impulsive measurement and carry out pump probe experiment, has reduced the stability influence that optical element brings, and has improved the reliability and stability of system; 3, compared with previous device, device laser of the present utility model is by any dispersion element and the optical element to spectrum sensitive, therefore improved significantly spectrum that femto-second laser pulse measures and the accommodation of pulse width.
Brief description of the drawings
Fig. 1 is light channel structure schematic diagram of the present utility model, and Fig. 2 is the experimental result picture of the utility model 800 nm centre wavelength approximately 50 fs laser pulses.
Drawing explanation: 1, femto-second laser pulse radiation beam source, 2, beam splitting chip, 3, plane high reflection mirror A, 4, plane high reflection mirror B, 5, plane high reflection mirror C, 6, high-precision electric translation stage, 7, plane high reflection mirror D, 8, plane high reflection mirror E, 9, plane high reflection mirror F, 10, close bundle sheet, 11, photodiode detector.
Embodiment
Describe by reference to the accompanying drawings embodiment in detail.A kind of femtosecond laser pulse width measuring instrument, comprise femto-second laser pulse radiation beam source 1, the same level relative with femto-second laser pulse radiation beam source 1 is provided with beam splitting chip 2, femto-second laser pulse light beam forms twice beam channel after beam splitting chip 2, wherein the first beam channel is provided with plane high reflection mirror A 3 successively along light beam working direction, plane high reflection mirror B 4 and plane high reflection mirror C 5, the second beam channel is provided with plane high reflection mirror D 7 successively along light beam working direction, plane high reflection mirror E 8 and plane high reflection mirror F 9, by the femto-second laser pulse light beam of the first beam channel midplane high reflection mirror C 5 and the femto-second laser pulse light beam by the second beam channel midplane high reflection mirror F 9 after closing bundle sheet 10 at photodiode detector 11 inregisters, described plane high reflection mirror B 4 and plane high reflection mirror C 5 are arranged at and on high-precision electric translation stage 6, form high-precision optical and postpone platform, plane high reflection mirror B 4 and plane high reflection mirror C 5 carry out high precision operation under the drive of high-precision electric translation stage 6 before and after beam direction, accurately to control or to scan the femto-second laser pulse light beam reflecting through plane high reflection mirror C 5 with respect to the time delay between the femto-second laser pulse light beam reflecting through plane high reflection mirror F 9.This measurement mechanism utilizes Labview to realize the signal that high-precision electric translation stage 6 and photodiode detector 11 are inputted to capture card to carry out robotization control.
Measure 800 nm centre wavelength approximately 50 fs laser pulses with this measurement mechanism, its measurement result as shown in Figure 2, can realize the measurement of deep ultraviolet being arrived to the laser pulse of hundreds of femtosecond to the cycle magnitude of middle infrared excess broadband spectral scope by this device thus.
More than show and described ultimate principle of the present utility model; principal character and advantage; do not departing under the prerequisite of the utility model spirit and scope, the utility model also has various changes and modifications, and these changes and improvements all fall into claimed scope of the present utility model.
Claims (1)
1. a femtosecond laser pulse width measuring instrument, comprise femto-second laser pulse radiation beam source, it is characterized in that: the same level relative with femto-second laser pulse radiation beam source is provided with beam splitting chip, femto-second laser pulse light beam forms twice beam channel after beam splitting chip, wherein the first beam channel is provided with plane high reflection mirror A successively along light beam working direction, plane high reflection mirror B and plane high reflection mirror C, the second beam channel is provided with plane high reflection mirror D successively along light beam working direction, plane high reflection mirror E and plane high reflection mirror F, by the femto-second laser pulse light beam of the first beam channel midplane high reflection mirror C and the femto-second laser pulse light beam by the second beam channel midplane high reflection mirror F after closing bundle sheet at photodiode detector inregister, described plane high reflection mirror B and plane high reflection mirror C are arranged at and on high-precision electric translation stage, form high-precision optical and postpone platform, plane high reflection mirror B and plane high reflection mirror C carry out high precision operation under the drive of high-precision electric translation stage before and after beam direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201420097390.4U CN203824652U (en) | 2014-03-05 | 2014-03-05 | Measurement device for femtosecond laser pulse width |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201420097390.4U CN203824652U (en) | 2014-03-05 | 2014-03-05 | Measurement device for femtosecond laser pulse width |
Publications (1)
Publication Number | Publication Date |
---|---|
CN203824652U true CN203824652U (en) | 2014-09-10 |
Family
ID=51480137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201420097390.4U Expired - Fee Related CN203824652U (en) | 2014-03-05 | 2014-03-05 | Measurement device for femtosecond laser pulse width |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN203824652U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103808417A (en) * | 2014-03-05 | 2014-05-21 | 河南师范大学 | Measurement device for femtosecond laser pulse width |
CN106017698A (en) * | 2016-05-13 | 2016-10-12 | 中国科学院上海光学精密机械研究所 | Ultra-short pulse width measuring device and method |
-
2014
- 2014-03-05 CN CN201420097390.4U patent/CN203824652U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103808417A (en) * | 2014-03-05 | 2014-05-21 | 河南师范大学 | Measurement device for femtosecond laser pulse width |
CN106017698A (en) * | 2016-05-13 | 2016-10-12 | 中国科学院上海光学精密机械研究所 | Ultra-short pulse width measuring device and method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103808417A (en) | Measurement device for femtosecond laser pulse width | |
Coello et al. | Interference without an interferometer: a different approach to measuring, compressing, and shaping ultrashort laser pulses | |
CN103162941B (en) | A kind of optical thin film and photoelectric device surface laser device for measuring damage threshold | |
CN105021588B (en) | A kind of single light source CARS gas-detecting devices and method | |
US11320309B2 (en) | Far-infrared spectroscopy device | |
CN104833650B (en) | The pulse terahertz time-domain spectroscopy system and detection method of monochromatic light lead antenna | |
CN106442378B (en) | The device of spectral absorption accurate testing degree is improved based on Terahertz light comb | |
US20190145892A1 (en) | Far-Infrared Imaging Device and Far-Infrared Imaging Method | |
JP2016114523A5 (en) | ||
CN203824652U (en) | Measurement device for femtosecond laser pulse width | |
US8446587B2 (en) | Flash photolysis system | |
WO2014129611A3 (en) | Acoustic wave acquiring apparatus and control method therefor | |
CN105203222A (en) | Device for measuring temperature of flame through one-dimensional scanning on basis of Fresnel lens and CARS | |
CN103868604A (en) | Femtosecond laser pulse width measuring device based on molecule ionization detection | |
CN107764764B (en) | A kind of visible excitation-broadband infrared detection Ultrafast spectrum device | |
CN203824653U (en) | Femtosecond laser pulse width measuring instrument based on molecular ionization detection | |
CN102944313A (en) | Multifunctional femtosecond laser pulse measuring device | |
Dimitrov et al. | Pulse front tilt measurement of femtosecond laser pulses | |
US20230023430A1 (en) | A light source | |
JP2017067613A (en) | Inspection device and inspection method | |
CN106895911A (en) | A kind of high-rate laser power measurement instruments | |
CN104501974B (en) | A kind of simple femto-second pulse duration measuring system | |
CN104515754B (en) | Laser plasma spectrometry device | |
CN103969033B (en) | Nonlinear coefficient measuring device and method based on noise small-scale self-focusing growth | |
Alonso et al. | Self-calibrating d-scan: a versatile technique for measuring ultrashort laser pulses using an arbitrary pulse compressor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140910 Termination date: 20150305 |
|
EXPY | Termination of patent right or utility model |