CN203811788U - Magnetic parameter batched test system of magnetic chip - Google Patents
Magnetic parameter batched test system of magnetic chip Download PDFInfo
- Publication number
- CN203811788U CN203811788U CN201420042144.9U CN201420042144U CN203811788U CN 203811788 U CN203811788 U CN 203811788U CN 201420042144 U CN201420042144 U CN 201420042144U CN 203811788 U CN203811788 U CN 203811788U
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- magnetic
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- processor device
- field generator
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Abstract
Disclosed is a magnetic parameter batched test system of magnetic chips. The test system includes a magnetic field generating device and a test bench which is arranged at a magnetic field area of the magnetic field generating device. A chip being tested is arranged on the test bench. The magnetic field generating device is connected to a power supply and a voltage regulator and is connected to a processor device through a control circuit module. The chip being tested is connected to the processor device through a data acquisition module. The utility model provides the magnetic parameter batched test system of the magnetic chips. The test system can test magnetic performance of the magnetic chips in a batch, quick and damage-free manner.
Description
Technical field
A kind of magnetic chip magnetic parameter of the utility model mass test macro, relates to magnetic parameter field of non destructive testing.
Background technology
Magnetic Sensor at magnetic field sensing, approach many sensory fields such as sensing, slewing rate sensing, linear sensing, current sense and angle, navigation, the detection of magnetic anomaly state, displacement or position and be widely used.The core component of Magnetic Sensor is magnetic chip, existing magnetic chip is mainly based on Hall effect, giant magnetoresistance effect and magnetic tunnel-junction effect three types, the magnetic property of magnetic chip directly determines application and the scope of Magnetic Sensor, therefore before dispatching from the factory, magnetic chip must make detection to the magnetic property of chip, to judge whether to reach its technical requirement.Existing chip detecting equipment is chip and equipment connection, detects one by one, and efficiency is extremely low, complicated operation, and in connection procedure easy defective chip, can not realize mass, the Non-Destructive Testing of chip.
Summary of the invention
For solving the problems of the technologies described above, the utility model provides a kind of magnetic chip magnetic parameter mass test macro, can to the magnetic property of chip carry out in batches, fast, harmless detection.
The technical scheme that the utility model is taked is: magnetic chip magnetic parameter mass test macro, comprise field generator for magnetic, be positioned at the test platform of field generator for magnetic field region, chip under test is placed on test platform, field generator for magnetic connects power supply and pressure regulator, and field generator for magnetic connects processor device by control circuit module; Chip under test connects processor device by data acquisition module.
Described test platform inwall is provided with multilayer cutting, in every layer of cutting, is provided with circuit board, is placed with multiple chip under test on each circuit board.
Described field generator for magnetic is Helmholtz coils.
Described processor device connects graphic display terminal, printing terminal.
Described processor device is computing machine.
The utility model magnetic chip magnetic parameter mass test macro, technique effect is as follows:
By the size of computer controlled automatic exciting current, and then the value in adjusting magnetic field, without manual operation.Magnetic field is produced by Helmholtz coils, and homogeneity range is large, lays test platform at the homogeneity range in magnetic field, the inwall of test platform is provided with multilayer cutting, every layer circuit board can be in cutting free pull, cutting plays fixing and turning circuit plate, on every layer circuit board, can place multiple chips simultaneously.Under the effect in magnetic field, the magnetic property of each chip can be presented on graphic display terminal after data collecting module collected and computing machine processing, and provide each magnetic chip and whether reach technical indicator, simple to operate, can to the magnetic property of magnetic chip carry out in batches, fast, harmless detection.
Brief description of the drawings
Fig. 1 is test platform of the present utility model and placement location schematic diagram;
Fig. 2 is the utility model module connection diagram.
Embodiment
As shown in Figure 1 and Figure 2, magnetic chip magnetic parameter mass test macro, comprise field generator for magnetic, be positioned at the test platform 2 of field generator for magnetic field region, chip under test is placed on test platform 2, field generator for magnetic connects power supply 4 and pressure regulator 3, and field generator for magnetic connects processor device 1 by control circuit module 5; Chip under test connects processor device 1 by data acquisition module 6.Described test platform 2 inwalls are provided with multilayer cutting, are provided with circuit board 2.1 in every layer of cutting, every layer circuit board 2.1 can be in cutting free pull, cutting plays fixing and turning circuit plate 2.1.On each circuit board 2.1, be placed with multiple chip under test.Described field generator for magnetic is Helmholtz coils 7.Described processor device 1 connects graphic display terminal 8, printing terminal 9.Described processor device 1 is computing machine.
The alternating current of Helmholtz coils 7 external 220V, after the processing of pressure regulator 3 and control circuit module 5, alternating current changes into direct current that can linear output, and direct current is received on Helmholtz coils 7, under galvanic effect, Helmholtz coils 7 produces the magnetic field of linear change.By regulating the size of driving source electric current and then the size in adjusting magnetic field, the homogeneity range in the magnetic field of Helmholtz coils 7 is large, and stability is strong and highly sensitive.
Homogeneity range in magnetic field is placed test platform 2, and user can lay multiple chip under test on test platform 2.Control circuit module 5 mainly comprises magnetic field control section, signal acquisition process part.Control circuit module 5 regulates the size in magnetic field, measures the magnetic property of each chip under test.Under the effect in magnetic field, Voltage-output and the parameter of each chip change, data acquisition module 6 gathers the signal of each chip, computing machine is processed collected signal, judgement and Display control computer on each chip under test magnetic property and whether reach technical indicator, qualified and underproof chip is all marked at correspondence position.The magnetic data of chip under test can also be printed by printing terminal 9 in addition; Or its electronic document is copied out.
Claims (2)
1. magnetic chip magnetic parameter mass test macro, comprise field generator for magnetic, be positioned at the test platform (2) of field generator for magnetic field region, chip under test is placed on test platform (2), it is characterized in that, field generator for magnetic connects power supply (4) and pressure regulator (3), and field generator for magnetic connects processor device (1) by control circuit module (5); Chip under test connects processor device (1) by data acquisition module (6);
Described test platform (2) inwall is provided with multilayer cutting, is provided with circuit board (2.1) in every layer of cutting, and each circuit board is placed with multiple chip under test on (2.1);
Described field generator for magnetic is Helmholtz coils (7);
Described processor device (1) is computing machine.
2. magnetic chip magnetic parameter mass test macro according to claim 1, is characterized in that, described processor device (1) connects graphic display terminal (8), printing terminal (9).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420042144.9U CN203811788U (en) | 2014-01-17 | 2014-01-17 | Magnetic parameter batched test system of magnetic chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420042144.9U CN203811788U (en) | 2014-01-17 | 2014-01-17 | Magnetic parameter batched test system of magnetic chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203811788U true CN203811788U (en) | 2014-09-03 |
Family
ID=51450521
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420042144.9U Expired - Fee Related CN203811788U (en) | 2014-01-17 | 2014-01-17 | Magnetic parameter batched test system of magnetic chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203811788U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109283241A (en) * | 2018-11-08 | 2019-01-29 | 国网山西省电力公司晋中供电公司 | A kind of gas sensor aging equipment that environmental magnetic field is controllable |
| CN116047382A (en) * | 2023-03-23 | 2023-05-02 | 浙江工业大学 | Cold atom chip magnetic field signal detection device and detection method |
-
2014
- 2014-01-17 CN CN201420042144.9U patent/CN203811788U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109283241A (en) * | 2018-11-08 | 2019-01-29 | 国网山西省电力公司晋中供电公司 | A kind of gas sensor aging equipment that environmental magnetic field is controllable |
| CN116047382A (en) * | 2023-03-23 | 2023-05-02 | 浙江工业大学 | Cold atom chip magnetic field signal detection device and detection method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140903 Termination date: 20170117 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |