CN203798927U - Aging test system of photoelectric coupler - Google Patents
Aging test system of photoelectric coupler Download PDFInfo
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- CN203798927U CN203798927U CN201420151197.4U CN201420151197U CN203798927U CN 203798927 U CN203798927 U CN 203798927U CN 201420151197 U CN201420151197 U CN 201420151197U CN 203798927 U CN203798927 U CN 203798927U
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Abstract
The utility model provides an aging test system of a photoelectric coupler. The system includes a data acquisition module, a constant current source, a state monitoring unit and an aging box; a tested optocoupler group is arranged in the aging box, so that the aging box can provide temperature for the tested optocoupler group; the data acquisition module is used for regularly acquiring test current and output voltage of a photoelectric coupler loop, and calculating collector current and current transfer ratios of photoelectric couplers according to the test current and the output voltage, and stopping the testing of the optocoupler group and acquiring the lasting time of an accelerated aging test process of the optocoupler group when determining the current transfer ratios of all photoelectric couplers achieve a cut-off condition according to feedback signals; the constant current source is used for providing constant test current; the state monitoring unit is used for monitoring the current transfer ratios of the photoelectric couplers of the tested optocoupler group real time, and transmitting the feedback signals to the data acquisition module when monitoring the current transfer ratios achieve the cut-off condition, wherein the feedback signals indicate that the current transfer ratios of the photoelectric couplers achieve the cut-off condition.
Description
Technical field
The utility model belongs to photoelectric device technical field of measurement and test, and relating in particular to the aging of a kind of photoelectrical coupler is pilot system.
Background technology
Photoelectrical coupler (abbreviation optocoupler) is a kind of electronic devices and components of light as media transmission electric signal of take.Photoelectrical coupler is used widely because of features such as its good electrical isolation capabilities and antijamming capabilities.In use, due to the impact of self-operating condition and external environment, inevitably there is aging degradation in photoelectrical coupler, and its reliability and serviceable life are affected.
But because photoelectrical coupler is often assembled on circuit-board card, it is operated on off state, so the aging difficult discovery of photoelectrical coupler.Once and photoelectrical coupler generation ageing failure, the function of whole circuit will be had a strong impact on.Therefore be necessary the agine mechaism of photoelectrical coupler to study, even the life-span of photoelectrical coupler predicted.
In prior art, the method for photoelectrical coupler test is mainly concentrated on the delivery test of pattern test and manufacturer, for example inspection to outward appearance, size, Electro Magnetic Compatibility inspection, the test of current transfer ratio CTR, megger test, capacity measurement, test switching time etc.But in actual use, user is more concerned about current state and the predicting residual useful life that how to judge optocoupler, and the demand of this respect cannot be met in existing method of testing.
Summary of the invention
Given this, the utility model embodiment aims to provide a kind of aging test system of photoelectrical coupler, for current state judgement and the life prediction of photoelectrical coupler provides basic.
For achieving the above object, the utility model embodiment provides a kind of aging test system of photoelectrical coupler, for the ageing process of the photocoupler set that comprises at least one photoelectrical coupler is tested, comprise data acquisition module, constant current source, Condition Monitoring Unit and ageing oven;
Wherein, in described ageing oven, place tested photocoupler set;
Described data acquisition module is for controlling the temperature of described ageing oven, regularly gather the test current in photoelectrical coupler loop and the output voltage of each photoelectrical coupler, according to described test current and described output voltage, calculate collector current and the current transfer ratio of photoelectrical coupler described in each, and when the feedback signal sending according to Condition Monitoring Unit determines that the current transfer ratio of all photoelectrical couplers reaches cut-off condition, stop the test of this photocoupler set and obtain the accelerated aging test process duration of described photocoupler set;
Described constant current source is used to the photoelectrical coupler of described photocoupler set that constant test current is provided;
Described Condition Monitoring Unit is for the current transfer ratio of the photoelectrical coupler of the tested photocoupler set of Real-Time Monitoring, and when the current transfer ratio that monitors photoelectrical coupler reaches cut-off condition, to the current transfer ratio of described data acquisition module transmission pilot light electric coupler, reach the feedback signal of cut-off condition.
In a preferred embodiment, described accelerated aging test system also comprises: model parameter determination module, for calculate the parameters of optocoupler Ageing Model according to the accelerated aging test process duration of described photocoupler set, thereby determine optocoupler Ageing Model.
In a preferred embodiment, described optocoupler Ageing Model is: ln τ=lnA+Ea/ (RT), and wherein, A is proportionality constant; Ea is the energy of activation of chemical reaction; R is the graceful constant of bohr thatch, and T is junction temperature; τ represents the mission life of product when junction temperature is T;
Model parameter determination module, for the photocoupler set of organizing same type is carried out to accelerated aging test process more under condition of different temperatures, and collect the accelerated aging test process duration of corresponding optocoupler junction temperature and each photocoupler set, the reliability theory of application based on Weibull distribution and average order computing method assessed, and obtains the average duration of each photocoupler set;
Utilize least square method, calculate Ea and the proportionality constant A of the photoelectrical coupler material of described type, thereby determine optocoupler Ageing Model.
In a preferred embodiment, described accelerated aging test system also comprises photoelectrical coupler junction temperature acquiring unit, for obtaining the junction temperature of photoelectrical coupler to be predicted;
Life prediction unit, for calculating the residual life of described photoelectrical coupler to be predicted according to the junction temperature of described photoelectrical coupler to be predicted and described optocoupler Ageing Model.
In a preferred embodiment, described accelerated aging test system also comprises performance element;
When described data acquisition module also reaches the feedback signal of cut-off condition for the current transfer ratio receiving the pilot light electric coupler being fed back by Condition Monitoring Unit, control described performance element and current transfer ratio is reached to the photoelectrical coupler short circuit of cut-off condition.
In a preferred embodiment, described accelerated aging test system also comprises:
Human-computer interaction module, for carrying out alternately with described data acquisition module, setting data collection period and described cut-off condition.
In a preferred embodiment, this accelerated aging test system also comprises:
Display module, for showing the test figure of process of the test.
In a preferred embodiment, described accelerated aging test system also comprises:
Memory module, for storing the test figure of process of the test.
In a preferred embodiment, the current transfer ratio that described cut-off condition is photoelectrical coupler drops to 50% of initial value.
In a preferred embodiment, described data acquisition module comprises: current/voltage sample circuit and divider; Described current/voltage sample circuit is for gathering the test current in photoelectrical coupler loop and the output voltage of each photoelectrical coupler; Described divider is for calculating current transfer ratio according to experiment electric current and collector current.
The utility model embodiment can carry out comprehensive aging test to photoelectrical coupler, for current state judgement and the life prediction of photoelectrical coupler provides basic.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is embodiment more of the present utility model, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
The schematic diagram of the aging test system of a kind of photoelectrical coupler that Fig. 1 provides for the utility model embodiment mono-;
Fig. 2 is the schematic diagram of a kind of test circuit of single photoelectrical coupler;
Fig. 3 is the process flow diagram of accelerated aging test process in the utility model embodiment bis-.
Embodiment
For making object, technical scheme and the advantage of the utility model embodiment clearer, below in conjunction with the accompanying drawing in the utility model embodiment, technical scheme in the utility model embodiment is clearly and completely described, obviously, described embodiment is the utility model part embodiment, rather than whole embodiment.Embodiment based in the utility model, those of ordinary skills are not making the every other embodiment obtaining under creative work prerequisite, all belong to the scope of the utility model protection.
Embodiment mono-
Fig. 1 shows the schematic diagram of the aging test system of a kind of photoelectrical coupler that the utility model embodiment mono-provides, as shown in Figure 1, the aging test system of this photoelectrical coupler is for testing the ageing process of at least one photoelectrical coupler, and this accelerated aging test system comprises data acquisition module 11, constant current source 12, Condition Monitoring Unit 13, storage unit 15 and ageing oven 14.
Wherein, place a tested photocoupler set 2 in ageing oven 14, ageing oven 14 provides required test environment, for example temperature for tested photoelectrical coupler 2.
Data acquisition module 11 is for regularly gathering the test current in loop and the output voltage of each photoelectrical coupler of each photoelectrical coupler of tested photocoupler set, according to described test current and described output voltage, calculate collector current and the current transfer ratio of photoelectrical coupler described in each, the current transfer ratio of the photoelectrical coupler that Condition Monitoring Unit 13 Real-Time Monitorings are tested (CTR), and test result is stored in storage unit 15.
In the utility model, data acquisition module can be comprised of current/voltage sample circuit and divider.Wherein current/voltage sample circuit is used for gathering electric current, magnitude of voltage, and divider is for calculating current transfer ratio according to experiment electric current and collector current.Wherein, the accelerated aging test process duration that obtains this photocoupler set can obtain by relevant clock signal.Signal between itself and other module can utilize existing communication unit to realize alternately.Concrete, above-mentioned several circuit can integrate composition data acquisition module.
The schematic diagram of a kind of test circuit of single photoelectrical coupler 2 shown in Fig. 2, in Fig. 2, IF is the test current of photoelectrical coupler (being specially photodiode in Fig. 2) of flowing through, Vout is the output voltage of photoelectrical coupler 2, I
ccollector current for the photoelectrical coupler of flowing through.In scheme in Fig. 2, definition CTR=I
c/ I
f.
In addition, the current transfer ratio that data acquisition module 11 also receives the photoelectrical coupler 2 in the indication photocoupler set of being fed back by Condition Monitoring Unit 13 reaches the feedback signal of cut-off condition, until receive the current transfer ratio of 2 all photoelectrical couplers of photocoupler set while reaching the feedback signal of cut-off condition, stop test.Current transfer ratio reaches cut-off condition and represents ageing failure of this photoelectrical coupler.
In practice, although photocoupler set 2 models tested in ageing oven 14 are elected as identical as far as possible, but may be because the minute differences of performance causes reaching the asynchronism(-nization) of cut-off condition separately, in every case the current transfer ratio that runs into a photoelectrical coupler reaches cut-off condition, the feedback signal that Condition Monitoring Unit 13 all can reach the current transfer ratio of this photoelectric coupling 2 cut-off condition sends to data acquisition module 11, when data acquisition module 11 receives this current transfer ratio of organizing all photoelectrical couplers while reaching the feedback signal of cut-off condition, stop the test of this photocoupler set 2.
In the utility model, Condition Monitoring Unit 13 is specifically as follows comparer.The magnitude relationship of the current transfer ratio of the photoelectrical coupler relatively obtaining and cut-off condition (if current transfer ratio is 50%), represents judged result by low and high level.
In addition, when certain or some photoelectrical couplers in one group of tested photoelectrical coupler reach cut-off condition, mean that this photoelectrical coupler is close to or ageing failure, so need to be by this photoelectrical coupler short circuit from series loop of ageing failure, to guarantee other stable power-supplyings of the tested photoelectrical coupler of ageing failure not yet.Based on this, when the current transfer ratio that receives the pilot light electric coupler being fed back by Condition Monitoring Unit 13 at data acquisition module 11 reaches the feedback signal of cut-off condition, control a performance element and current transfer ratio is reached to the short circuit of the photoelectrical coupler of cut-off condition as switch.
In practice, above-mentioned data acquisition module 11 can be programmable logic controller (PLC) (PLC).
Constant current source 12 provides constant test current for tested photoelectrical coupler, Condition Monitoring Unit 13 is for the current transfer ratio of the tested photoelectrical coupler of Real-Time Monitoring, while also reaching cut-off condition for the current transfer ratio photoelectrical coupler being detected, to the current transfer ratio of data acquisition module 11 feedback pilot light electric couplers, reach the feedback signal of cut-off condition.The current transfer ratio that the cut-off condition here can be defined as photoelectrical coupler drops to 50% of initial value.
In addition, as shown in Figure 1, in accelerated aging test system, human-computer interaction module 17 can also be set, to reach the object of free setting parameter, for example can carry out alternately by human-computer interaction module 17 and data acquisition module 11 setting data collection period and above-mentioned cut-off condition.
In accelerated aging test system, can also comprise display module 16, for showing test figure that storage unit 15 is stored and intermediate data and the result data of experimentation.
Above-described embodiment provides a kind of aging test system, and this embodiment can judge for the current state of photoelectrical coupler and the prediction of residual life provides basis:
In another embodiment of the utility model, accelerated aging test system also comprises: model parameter determination module, for calculate the parameters of optocoupler Ageing Model according to the accelerated aging test process duration of photocoupler set, thereby determine optocoupler Ageing Model.
In the utility model, a kind of concrete optocoupler Ageing Model is: ln τ=lnA+Ea/ (RT), and wherein, A is proportionality constant; Ea is the energy of activation of chemical reaction; R is the graceful constant of bohr thatch, and T is junction temperature; τ represents the mission life of product when junction temperature is T;
Its model parameter determination module, specifically for the photocoupler set of organizing same type is carried out to accelerated aging test process more under condition of different temperatures, and collect the accelerated aging test process duration of corresponding optocoupler junction temperature and each photocoupler set, the reliability theory of application based on Weibull distribution and average order computing method assessed, and obtains the average duration of each photocoupler set; Utilize least square method, calculate Ea and the proportionality constant A of the photoelectrical coupler material of described type, thereby determine optocoupler Ageing Model.
In the utility model, model parameter determination module determines that according to the experimental data of having collected the process of model parameter is identical with the parameter deterministic process principle of other models in prior art.
Based on this, when the residual life of photoelectrical coupler to be predicted is predicted, can utilize photoelectrical coupler junction temperature acquiring unit, obtain the junction temperature of photoelectrical coupler to be predicted; Then by life prediction unit, according to the residual life of the junction temperature of described photoelectrical coupler to be predicted and the described photoelectrical coupler to be predicted of described optocoupler Ageing Model calculating.
Embodiment bis-
The utility model embodiment bis-provides a kind of aging testing method of photoelectrical coupler, and the method comprises the process of accelerated aging test, and Fig. 3 shows the flow process of this accelerated aging test process, and the process of this accelerated aging test comprises the steps:
S301: at least one photoelectrical coupler is put into ageing oven as one group of tested photoelectrical coupler;
S302: control the temperature of ageing oven, regularly gather the tested test current in photoelectrical coupler loop and the output voltage of each photoelectrical coupler;
S303: the electric current output ratio of the photoelectrical coupler that Real-Time Monitoring is tested, and test result is stored;
S304: the current transfer ratio that receives pilot light electric coupler reaches the feedback signal of cut-off condition, until receive the current transfer ratio of all photoelectrical couplers while reaching the feedback signal of cut-off condition, stops the accelerated aging test process of this group photoelectrical coupler.
Current transfer ratio reaches cut-off condition and represents ageing failure of this photoelectrical coupler.
In practice, although one group of photoelectrical coupler model tested in ageing oven is elected as identical as far as possible, but may be because the minute differences of performance causes reaching the asynchronism(-nization) of cut-off condition separately, in every case the current transfer ratio that runs into a photoelectrical coupler reaches cut-off condition, the current transfer ratio that capital receives this photoelectrical coupler reaches the feedback signal of cut-off condition, when receiving this current transfer ratio of organizing all photoelectrical couplers 2 while reaching the feedback signal of cut-off condition, represent that this organizes all ageing failures of tested photoelectrical coupler, stop the test of this group photoelectrical coupler 2.
In addition, when certain or some photoelectrical couplers 2 in one group of tested photoelectrical coupler 2 reach cut-off condition, mean that this photoelectrical coupler 2 is close to or ageing failure, so need to be by this photoelectrical coupler 2 short circuit from series loop of ageing failure, to guarantee other stable power-supplyings of the tested photoelectrical coupler of ageing failure not yet.Based on this, when the current transfer ratio that receives pilot light electric coupler reaches the feedback signal of cut-off condition, the photoelectrical coupler that current transfer ratio is reached to cut-off condition is made as short circuit.
In order more to set degree of freedom to user, above-mentioned accelerated deterioration process can also comprise: setting data collection period and cut-off condition.
In practice, different according to the standard of ageing failure definition, above-mentioned cut-off condition is also different, and the current transfer ratio that for example cut-off condition can be defined as to photoelectrical coupler drops to 50% of initial value.
By above-mentioned steps S201-204, can complete the accelerated deterioration process of one group of photoelectrical coupler, for current state judgement and the life prediction of the photoelectrical coupler of same model provides basic.
Above-described embodiment provides a kind of aging testing method, and this embodiment can judge for the current state of photoelectrical coupler and the prediction of residual life provides basis:
In another embodiment of the utility model, accelerated aging test method also comprises: according to the accelerated aging test process duration of photocoupler set, calculate the parameters in optocoupler Ageing Model, thereby determine optocoupler Ageing Model.
In the utility model, a kind of concrete optocoupler Ageing Model is: ln τ=lnA-Ea/ (RT), and wherein, A is proportionality constant; Ea is the energy of activation of chemical reaction; R is the graceful constant of bohr thatch, and T is junction temperature; τ represents the mission life of product when junction temperature is T;
According to the accelerated aging test process duration of photocoupler set, calculate the parameters in optocoupler Ageing Model, thereby determine that optocoupler Ageing Model specifically comprises the steps:
The photocoupler set of many groups of (the utility model embodiment is three groups) same types is carried out to accelerated aging test process under condition of different temperatures, and collect the data that accelerated aging test process obtains, as the accelerated aging test process duration of corresponding optocoupler junction temperature and each photocoupler set, the reliability theory of application based on Weibull distribution and average order computing method assessed, and obtains the average duration τ of each photocoupler set
i, specifically comprise the steps 1) and-3):
1) adopt average rank technique to calculate experience fault distribution function, computing method are as follows:
A
k=A
k-1+ΔA
k （2）
R(t)=1-F(t
k) （4）
Wherein, A
kfor exiting the mean rank order of sample; K is the serial number that exits sample; Δ A
kfor mean rank order increment; I is that pressing of all samples exited time sequencing arrangement number first; t
kbe exiting front working time (h) of k sample.According to the post-set time of each optocoupler sample, utilize formula (1)～formula (4) to calculate dependability of experience index.
2) adopt Two-parameter Weibull Distribution model to carry out dependability parameter estimation, the crash rate function lambda (t) of this distribution is as follows with the expression formula of Reliability Function R (t):
3) reliability index rule of thumb, by graphing method, carries out fitting a straight line, can draw two parameter alpha of Two-parameter Weibull Distribution
jwith β
jthereby, obtain the crash rate function lambda of formula (5) and formula (6)
j(t) with Reliability Function R
j(t) be the working time that reaching test cut-off condition that, final through type (7) obtains accelerating under stress:
Wherein,
For gamma function.
Then according to three groups of Ti and τ i, utilize least square method, calculate activation energy Ea and the proportionality constant A of this model optocoupler material, thereby determine optocoupler Ageing Model.
Based on this, when the residual life of photoelectrical coupler to be predicted is predicted, can first obtain the junction temperature of photoelectrical coupler to be predicted; Then according to the residual life of the junction temperature of described photoelectrical coupler to be predicted and the described photoelectrical coupler to be predicted of described optocoupler Ageing Model calculating.
The above is only preferred implementation of the present utility model; it should be pointed out that for those skilled in the art, do not departing under the prerequisite of the utility model principle; can also make some improvements and modifications, these improvements and modifications also should be considered as protection domain of the present utility model.
Claims (10)
1. an aging test system for photoelectrical coupler, for the ageing process of the photocoupler set that comprises at least one photoelectrical coupler is tested, is characterized in that, comprises data acquisition module, constant current source, Condition Monitoring Unit and ageing oven;
Wherein, in described ageing oven, place tested photocoupler set;
Described data acquisition module is for regularly gathering the test current in photoelectrical coupler loop and the output voltage of each photoelectrical coupler, according to described test current and described output voltage, calculate collector current and the current transfer ratio of photoelectrical coupler described in each, and when the feedback signal sending according to Condition Monitoring Unit determines that the current transfer ratio of all photoelectrical couplers reaches cut-off condition, stop the test of this photocoupler set and obtain the accelerated aging test process duration of described photocoupler set;
Described constant current source is used to the photoelectrical coupler of described photocoupler set that constant test current is provided;
Described Condition Monitoring Unit is for the current transfer ratio of the photoelectrical coupler of the tested photocoupler set of Real-Time Monitoring, and when the current transfer ratio that monitors photoelectrical coupler reaches cut-off condition, to the current transfer ratio of described data acquisition module transmission pilot light electric coupler, reach the feedback signal of cut-off condition.
2. system according to claim 1, it is characterized in that, described system also comprises: model parameter determination module, for calculate the parameters of optocoupler Ageing Model according to the accelerated aging test process duration of described photocoupler set, thereby determine optocoupler Ageing Model.
3. system according to claim 2, is characterized in that, described optocoupler Ageing Model is:
, wherein,
afor proportionality constant;
eaenergy of activation for chemical reaction;
rfor the graceful constant of bohr thatch,
tfor junction temperature;
represent that product in junction temperature is
ttime mission life;
Model parameter determination module, for the photocoupler set of organizing same type is carried out to accelerated aging test process more under condition of different temperatures, and collect the accelerated aging test process duration of corresponding optocoupler junction temperature and each photocoupler set, the reliability theory of application based on Weibull distribution and average order computing method assessed, and obtains the average duration of each photocoupler set;
Utilize least square method, calculate the photoelectrical coupler material of described type
eaand proportionality constant
athereby, determine optocoupler Ageing Model.
4. system according to claim 3, is characterized in that, described system also comprises photoelectrical coupler junction temperature acquiring unit, for obtaining the junction temperature of photoelectrical coupler to be predicted;
Life prediction unit, for calculating the residual life of described photoelectrical coupler to be predicted according to the junction temperature of described photoelectrical coupler to be predicted and described optocoupler Ageing Model.
5. system according to claim 1, is characterized in that, described system also comprises performance element;
When described data acquisition module also reaches the feedback signal of cut-off condition for the current transfer ratio receiving the pilot light electric coupler being fed back by Condition Monitoring Unit, control described performance element and current transfer ratio is reached to the photoelectrical coupler short circuit of cut-off condition.
6. system according to claim 1, is characterized in that, described system also comprises:
Human-computer interaction module, for carrying out alternately with described data acquisition module, setting data collection period and described cut-off condition.
7. system according to claim 1, is characterized in that, this system also comprises:
Display module, for showing the test figure of process of the test.
8. system according to claim 1, is characterized in that, described system also comprises:
Memory module, for storing the test figure of process of the test.
9. system according to claim 1, is characterized in that, the current transfer ratio that described cut-off condition is photoelectrical coupler drops to 50% of initial value.
10. system according to claim 1, is characterized in that, described data acquisition module comprises: current/voltage sample circuit and divider;
Described current/voltage sample circuit is for gathering the test current in photoelectrical coupler loop and the output voltage of each photoelectrical coupler;
Described divider is for calculating current transfer ratio according to experiment electric current and collector current.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103884942A (en) * | 2014-03-31 | 2014-06-25 | 苏州热工研究院有限公司 | Aging test system and method for photoelectric couplers |
| CN105223408A (en) * | 2015-10-21 | 2016-01-06 | 珠海格力电器股份有限公司 | Optocoupler current transfer ration testing device and electronic equipment |
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
| CN111025184A (en) * | 2019-12-09 | 2020-04-17 | 珠海格力电器股份有限公司 | Method and device for detecting short circuit of coupler of electric kettle, storage medium and processor |
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| CN113406427A (en) * | 2021-07-23 | 2021-09-17 | 中国振华集团永光电子有限公司（国营第八七三厂） | Constant-power aging circuit for output end of photoelectric coupler |
| CN113533898A (en) * | 2021-07-23 | 2021-10-22 | 中国振华集团永光电子有限公司（国营第八七三厂） | Batch photoelectric coupler aging circuit |
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2014
- 2014-03-31 CN CN201420151197.4U patent/CN203798927U/en not_active Withdrawn - After Issue
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| CN103884942A (en) * | 2014-03-31 | 2014-06-25 | 苏州热工研究院有限公司 | Aging test system and method for photoelectric couplers |
| CN103884942B (en) * | 2014-03-31 | 2016-08-31 | 苏州热工研究院有限公司 | A kind of degradation system and method for photoelectrical coupler |
| CN105223408A (en) * | 2015-10-21 | 2016-01-06 | 珠海格力电器股份有限公司 | Optocoupler current transfer ration testing device and electronic equipment |
| CN109946581A (en) * | 2019-04-14 | 2019-06-28 | 苏州科技大学 | A kind of LED test automatic control system |
| CN111025184A (en) * | 2019-12-09 | 2020-04-17 | 珠海格力电器股份有限公司 | Method and device for detecting short circuit of coupler of electric kettle, storage medium and processor |
| CN111025184B (en) * | 2019-12-09 | 2020-12-11 | 珠海格力电器股份有限公司 | Method and device for detecting short circuit of coupler of electric kettle, storage medium and processor |
| CN113406432A (en) * | 2021-06-16 | 2021-09-17 | 深圳群芯微电子有限责任公司 | Method, device and equipment for detecting defect of silica gel at light-emitting side leakage point of optical coupler |
| CN113406427A (en) * | 2021-07-23 | 2021-09-17 | 中国振华集团永光电子有限公司（国营第八七三厂） | Constant-power aging circuit for output end of photoelectric coupler |
| CN113533898A (en) * | 2021-07-23 | 2021-10-22 | 中国振华集团永光电子有限公司（国营第八七三厂） | Batch photoelectric coupler aging circuit |
| CN113533898B (en) * | 2021-07-23 | 2023-07-14 | 中国振华集团永光电子有限公司（国营第八七三厂） | Aging circuit of batch photoelectric coupler |
| CN113406427B (en) * | 2021-07-23 | 2024-04-26 | 中国振华集团永光电子有限公司（国营第八七三厂） | Constant-power aging circuit for output end of photoelectric coupler |
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