CN203732664U - Cable type fault indicator probe - Google Patents
Cable type fault indicator probe Download PDFInfo
- Publication number
- CN203732664U CN203732664U CN201420061529.XU CN201420061529U CN203732664U CN 203732664 U CN203732664 U CN 203732664U CN 201420061529 U CN201420061529 U CN 201420061529U CN 203732664 U CN203732664 U CN 203732664U
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- China
- Prior art keywords
- probe
- type fault
- mcu
- cable
- test data
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- Expired - Fee Related
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- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The utility model discloses a cable type fault indicator probe. The cable type fault indicator probe is respectively in communication connection with a communication terminal and an indicating panel through a fiber, the probe is provided with a film button used for realizing control for sending test data to the communication terminal and the indicating panel and a fiber access port for fiber signal access, the probe internally comprises a MCU, and the MCU comprises an external interruption I/O pin used for triggering external interruption according to the sent test data. According to the cable type fault indicator probe, the external interruption I/O pin of the probe MCU is triggered through controlling a switch of the film button, and the test data can be sent to the indicating panel and the communication terminal. In a field open circuit mounting process, the cable type fault indicator probe can rapidly detect a fiber communication connection state and effectively eliminates a communication fault caused by improper connection of the fiber, and thereby mounting reliability of a fault indicator is improved.
Description
Technical field
The utility model relates to indicating fault field, relates in particular to a kind of cable-type fault detector probe.
Background technology
Cable-type fault detector is fault detect and the FLU Fault Location Unit of generally applying in current distribution field.It responds to the electric current on cable by the probe being fixed in ring main unit inner cable, thereby then the variation of electric current is judged and monitor and information is sent to indication panel and communicating terminal and reach monitoring and the fault judgement location to electric current on cable.
Current existing product is all not charged installations in actual field installation process, does not possess communication detection function in the situation that there is no electric current, whether normal cannot detect its communication after connection.In addition, it is absolute 100% that any product can not reach qualification rate in practice, whether normally therefore in the situation that of charged installation not, cannot detect product work.
Utility model content
The technical problems to be solved in the utility model is, cannot detect the whether normal defect of product work for prior art the charged installation not in the situation that, a kind of cable-type fault detector probe is provided, this technical scheme can be opened a way in installation process at the scene, fast detecting optical-fibre communications connection state, effectively gets rid of because optical fiber connects the incorrect communication failure causing.
The utility model solves the technical scheme that its technical matters adopts: a kind of cable-type fault detector probe is provided, it communicates to connect with communicating terminal and indication panel respectively by optical fiber, described probe is provided with for controlling to described communicating terminal and described indication panel and sends the film key of test data and the optical fiber access port of incoming fiber optic signal, in described probe, comprise MCU, wherein, described MCU comprises the external interrupt I/O pin for trigger external interrupt according to sent test data.
Preferably, described film key is conductive foil.
Preferably, described film key is made up of thin film circuit and the circuit board of surperficial keycap and described keycap below.
Preferably, described thin film circuit comprises external interrupt I/O pin, resistance R 1 and the power supply VCC of K switch 1, MCU; Wherein, one end of K switch 1 is connected with external interrupt I/O pin and the ground of MCU respectively, and the other end of described K switch 1 connects power supply VCC by resistance R 1.
Preferably, described circuit board is PCB wiring board or FPC wiring board.
Implement the technical solution of the utility model, there is following beneficial effect: by controlling the external interrupt I/O pin of switch triggering probe MCU of film key, can send test data to indication panel and communicating terminal.This technical scheme can be opened a way in installation process at the scene, and fast detecting optical-fibre communications connection state is effectively got rid of because optical fiber connects the incorrect communication failure causing, thereby improves the reliability that fault detector is installed.
Brief description of the drawings
Below in conjunction with drawings and Examples, the utility model is described in further detail, in accompanying drawing:
Fig. 1 is the schematic appearance of the utility model cable-type fault detector probe;
Fig. 2 is the connection diagram of the utility model cable-type fault detector probe;
Fig. 3 is the circuit diagram of the utility model thin film circuit.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein is only in order to explain the utility model, and be not used in restriction the utility model.
Refer to Fig. 1, Fig. 1 is the schematic appearance of the utility model cable-type fault detector probe, and as shown in Figure 1, this probe 100 is provided with film key 101 and optical fiber access port 102, comprises that MCU(figure does not show in described probe 100).
Incorporated by reference to consulting Fig. 2, Fig. 2 is the connection diagram of the utility model cable-type fault detector probe, as shown in Figure 2, this probe 100 communicates to connect with communicating terminal 202 and indication panel 203 respectively by optical fiber, wherein, film key 101 sends test data for controlling to described communicating terminal and described indication panel, and optical fiber access port 102 is for incoming fiber optic signal.Described MCU comprises the external interrupt I/O pin for trigger external interrupt according to sent test data.
Should be noted that, if probe 100 is connected normally with the optical fiber of indication panel 203 and communicating terminal 202, and 100 inner MCU are working properly for probe, communicating terminal 202 can demonstrate test data, for example can read on backstage the test data of this probe 100 by serial line interface, 203 of indication panels can be made corresponding actions, and for example test lamp extinguished after flicker a period of time.If the optical fiber malunion of probe 100 is normal or probe 100 operation irregularities, communicating terminal 202 and indication panel 203 can not receive test data, can not make the test action of response yet.That is to say, when indication panel 203 and communicating terminal 202 receive test data, to represent that optical-fibre communications connects normal, and it is working properly to pop one's head in, otherwise need to check that optical fiber connects or considers to change probe.
In the present embodiment, described film key is conductive foil, this film key is waterproof, film key relatively has feature, it is different from the principle of work of traditional silica gel push-button, and it is to connect by being covered with metal dots on conductive film, in the time that button moves downward, conducting resinl material below button or metal clips have just just in time been fallen above metal dots, reach the effect of connection.Be approximately the serviceable life of film key more than 1,000,000 times, and it is much higher that this obtains mean lifetime 200,000 times than common silica gel push-button.It should be noted that film key plays switches conductive effect in button product, described film key is made up of thin film circuit and the circuit board of surperficial keycap and described keycap below.Incorporated by reference to consulting Fig. 3, Fig. 3 is the circuit diagram of the utility model thin film circuit, and described thin film circuit comprises external interrupt I/O pin, resistance R 1 and the power supply VCC of K switch 1, MCU; Wherein, one end of K switch 1 is connected with external interrupt I/O pin and the ground of MCU respectively, and the other end of described K switch 1 connects power supply VCC by resistance R 1.Wherein, described circuit board is PCB wiring board or FPC(Flexible Printed Circuit, flexible print circuit) wiring board.In Fig. 3, K1 is film key switch, and this switch normality is for disconnecting, in coupled probe, under MCU external interrupt I/O pin normal condition, connect low level, R1 is pull-up resistor, plays metering function, excessive and cause MCU internal module to damage mainly for preventing from filling with electric current.After film key is pressed, generation high level triggers external interrupt and enters interrupt service routine, at this moment pops one's head in and sends test data by optical fiber to communicating terminal and indication panel.In the time that film key is not pressed, the external interrupt I/O pin input state of MCU is low level, now without down trigger, does not repeat them here.
It should be noted that, the various piece of above-mentioned probe is independently device structure, does not repeat them here.
Compared to prior art, by controlling the external interrupt I/O pin of switch triggering probe MCU of film key, can send test data to indication panel and communicating terminal.This technical scheme can be opened a way in installation process at the scene, and fast detecting optical-fibre communications connection state is effectively got rid of because optical fiber connects the incorrect communication failure causing, thereby improves the reliability that fault detector is installed.
The foregoing is only preferred embodiment of the present utility model, be not limited to the utility model, for a person skilled in the art, the utility model can have various modifications and variations.All within spirit of the present utility model and principle, any amendment of doing, be equal to replacement, improvement etc., within all should being included in claim scope of the present utility model.
Claims (5)
1. a cable-type fault detector probe, it is characterized in that, it communicates to connect with communicating terminal and indication panel respectively by optical fiber, described probe is provided with for controlling to described communicating terminal and described indication panel and sends the film key of test data and the optical fiber access port of incoming fiber optic signal, in described probe, comprise MCU, wherein, described MCU comprises the external interrupt I/O pin for trigger external interrupt according to sent test data.
2. cable-type fault detector probe according to claim 1, is characterized in that, described film key is conductive foil.
3. cable-type fault detector probe according to claim 2, is characterized in that, described film key is made up of thin film circuit and the circuit board of surperficial keycap and described keycap below.
4. cable-type fault detector probe according to claim 3, is characterized in that, described thin film circuit comprises external interrupt I/O pin, resistance R 1 and the power supply VCC of K switch 1, MCU; Wherein, one end of K switch 1 is connected with external interrupt I/O pin and the ground of MCU respectively, and the other end of described K switch 1 connects power supply VCC by resistance R 1.
5. cable-type fault detector probe according to claim 3, is characterized in that, described circuit board is PCB wiring board or FPC wiring board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420061529.XU CN203732664U (en) | 2014-02-11 | 2014-02-11 | Cable type fault indicator probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420061529.XU CN203732664U (en) | 2014-02-11 | 2014-02-11 | Cable type fault indicator probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203732664U true CN203732664U (en) | 2014-07-23 |
Family
ID=51202726
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420061529.XU Expired - Fee Related CN203732664U (en) | 2014-02-11 | 2014-02-11 | Cable type fault indicator probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203732664U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20240159622A1 (en) * | 2022-11-11 | 2024-05-16 | Te Connectivity Solutions Gmbh | Test probe for expanded beam connector |
-
2014
- 2014-02-11 CN CN201420061529.XU patent/CN203732664U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20240159622A1 (en) * | 2022-11-11 | 2024-05-16 | Te Connectivity Solutions Gmbh | Test probe for expanded beam connector |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140723 Termination date: 20200211 |