CN203688737U - Model for simulating defects of free conductive particles in GIS equipment - Google Patents
Model for simulating defects of free conductive particles in GIS equipment Download PDFInfo
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- CN203688737U CN203688737U CN201320870998.1U CN201320870998U CN203688737U CN 203688737 U CN203688737 U CN 203688737U CN 201320870998 U CN201320870998 U CN 201320870998U CN 203688737 U CN203688737 U CN 203688737U
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- 239000002245 particle Substances 0.000 title claims abstract description 43
- 230000007547 defect Effects 0.000 title claims abstract description 40
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 28
- 230000004888 barrier function Effects 0.000 claims description 2
- 230000005684 electric field Effects 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 238000009413 insulation Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000013528 metallic particle Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
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Abstract
The utility model provides a model for simulating inside free conductive particle defect of GIS equipment, include: the device comprises an air chamber, a high-voltage electrode base, a high-voltage electrode extension rod, a ball electrode, a bowl electrode, a ground electrode and free conductive particles; the high-voltage electrode base adjusts the distance between the ball electrode and the bowl electrode; the free conductive particles are adsorbed on the inner wall of the bowl electrode. Implement the utility model discloses, can produce stable partial discharge signal, the measuring result of its discharge characteristic and gas composition characteristic all shows the characteristic of more obvious free conductive particle defect, and defect identifiability is high.
Description
Technical field
The utility model relates to power technology field, relates in particular to a kind of model for Simulated GlS device interior free conducting particle defect.
Background technology
Closed gas insulation in combined electric appliance (GIS) is using the SF6 gas with high electric strength and good physicochemical property as insulating medium, have spatial volume little, be not affected by the external environment, many advantages such as safe and reliable to operation, flexible configuration, time between overhauls(TBO) are long, therefore substantially replaced traditional open type switchyard.But although the fault of GIS equipment is few, once break down, consequence is very serious.The reasons such as the vibration causing in GIS equipment operation installation process may be introduced and comprise the free conducting particle such as powder, metallic particles in air chamber, and they may obtain electric charge and beated or displacement by the effect of electric field force under electric field action.If electric field is enough strong, the energy that electrically conductive particles obtains is enough large, also likely crosses the gap between shell and high-pressure conductor or moves to the place that damages insulation.Therefore, free conducting particle insulation defect, is modal insulation defect in GIS equipment, is one of major reason causing its insulation fault.Be necessary to design a kind of model that can simulate the electric discharge of entity GIS internal freedom electrically conductive particles defect, do deep research comprehensively with the flash-over characteristic to this defect type and gas resolution characteristic.
Utility model content
For solving the problems of the technologies described above, the utility model provides a kind of model for Simulated GlS device interior free conducting particle defect, comprising: air chamber, high-field electrode pedestal, high-field electrode extension rod, ball electrode, bowl electrode, ground electrode and free conducting particle;
Described air chamber inwall is coated with barrier coat, and its downside inwall is provided with the threaded hole for changing Different electrodes; The lower end of described high-field electrode pedestal is provided with the threaded hole for connecting described high-field electrode extension rod; High-field electrode pedestal regulates the spacing between described ball electrode and described bowl electrode; Its one end of described high-field electrode extension rod is with the external thread for being connected with described high-field electrode pedestal, in addition one end with axial for connecting the external thread of described ball electrode; Described ball electrode is hemisphere, and its planar central place is provided with the threaded hole being connected with described high-field electrode extension rod; Described bowl electrode lower end is with the external thread being connected with described ground electrode; Described ground electrode is right cylinder, and its one end is with the external thread being connected with the threaded hole of the downside inwall of described air chamber, and one end is with the threaded hole being connected with the external thread of described bowl electrode in addition; Described free conducting particle is adsorbed in described bowl electrode inner wall.
Wherein, the volume of described air chamber is 90L.
Wherein, the opening upwards of the threaded hole that the downside inwall of described air chamber arranges, its external diameter is 8mm, the degree of depth is 10mm.
Wherein, the diameter of described high-field electrode pedestal is 16mm, and length is 40mm.
Wherein, the external diameter of the threaded hole that the lower end of described high-field electrode pedestal arranges is 5mm, and length is 15mm.
Wherein, the diameter of described high-field electrode extension rod is 13mm, and length is 50mm.
Wherein, the externally threaded external diameter that described high-field electrode extension rod is connected with described high-field electrode pedestal is 5mm, and length is 10mm, and the externally threaded external diameter being connected with described ball electrode that its other one end arranges is 6mm, and length is 25mm.
Wherein, the radius of described ball electrode is 15mm, and the external diameter of the threaded hole that its planar central place arranges is 5mm, and the degree of depth is 5mm.
Wherein, the diameter of described bowl electrode is 80mm, and external diameter is 90mm, is highly 45mm, its lower end with externally threaded external diameter be 6mm, length is 20mm.
Wherein, the diameter of described ground electrode is 20mm, and length is 70mm, its one end with the externally threaded external diameter that is connected of the threaded hole with air chamber downside inwall be 8mm, length is 10mm, in addition one end with the external diameter of the threaded hole being connected with described bowl electrode be 6mm, the degree of depth is 25mm.
Implement the utility model, there is following beneficial effect:
It is a kind of that the utility model provides a kind of model for Simulated GlS device interior free conducting particle defect to set up, and can simulate the free conducting particle defect that 110kVGIS inside may occur.Under pressurization service condition, this defect model can produce stable local discharge signal, and the measurement result of its flash-over characteristic and gas component characteristic all shows the feature of more obvious free conducting particle defect, and defect identification degree is high.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, to the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described below, apparently, accompanying drawing in the following describes is only embodiment more of the present utility model, for those of ordinary skills, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 provides a kind of structural representation of the model for Simulated GlS device interior free conducting particle defect for the utility model;
Fig. 2 provides a kind of structural representation of high-field electrode pedestal of the model for Simulated GlS device interior free conducting particle defect for the utility model;
Fig. 3 provides a kind of structural representation of high-field electrode extension rod of the model for Simulated GlS device interior free conducting particle defect for the utility model;
Fig. 4 provides a kind of structural representation of ball electrode of the model for Simulated GlS device interior free conducting particle defect for the utility model;
Fig. 5 for the utility model provide a kind of model for Simulated GlS device interior free conducting particle defect bowl electrode structural representation;
Fig. 6 provides a kind of structural representation of ground electrode of the model for Simulated GlS device interior free conducting particle defect for the utility model.
Embodiment
The utility model is intended to set up a kind of model for Simulated GlS device interior free conducting particle defect, can Reality simulation equipment in the shelf depreciation that causes of free conducting particle.Consider true GIS be concentric cylinder body structure its inner be non-uniform electric field slightly, the utility model has designed a kind of ball-bowl electrode, the ball of connection high-field electrode be connected ground electrode bowl diameter ratio be about 1:2.7, its electric field meets slightly non-uniform electric field.This defect model can be for the impact of factor on its flash-over characteristic and gas resolution characteristic such as research particulate form, distances.
Referring to Fig. 1, the utility model provides a kind of model for Simulated GlS device interior free conducting particle defect, comprising: air chamber 1, high-field electrode pedestal 2, high-field electrode extension rod 3, ball electrode 4, bowl electrode 5, ground electrode 6 and free conducting particle 7;
Wherein, air chamber 1 is a part for 110kV electric pressure GIS air chamber, the good and inner wall belt coating of its impermeability, and this coating can prevent in pressure process that the moisture in wall and micro-oxygen infiltrate in air chamber.The volume of air chamber 1 is 90L, and its highest pressure that bears is 1MPa, and specified charge pressure is 0.4MPa.The top of air chamber 1 is also provided with bus bar (invisible in figure), this bus bar is with Open Side Down, the threaded hole of external diameter 10mm, degree of depth 40mm, the relative position of the downside inwall of air chamber 1, with the threaded hole of opening upwards, external diameter 8mm, degree of depth 10mm, can be used for changing the electrode of different size.
The lower end of described high-field electrode pedestal 2 is provided with the threaded hole for connecting described high-field electrode extension rod 3; High-field electrode pedestal 2 regulates the spacing between described ball electrode 4 and described bowl electrode 5; Described high-field electrode extension rod 3 its one end are with the external thread for being connected with described high-field electrode pedestal 2, in addition one end with axial for connecting the external thread of described ball electrode 4; Described ball electrode 4 is hemisphere, and its planar central place is provided with the threaded hole being connected with described high-field electrode extension rod 3; Described bowl electrode 5 lower ends are with the external thread being connected with described ground electrode 6; Described ground electrode 6 is right cylinder, and its one end is with the external thread being connected with the threaded hole of the downside inwall of described air chamber 1, and one end is with the threaded hole being connected with the external thread of described bowl electrode 5 in addition; Described free conducting particle 7 is adsorbed in described bowl electrode 5 inwalls.
Referring to Fig. 2, high-field electrode pedestal 2 uses stainless steel material, and its diameter is that 16mm, length are 40mm.Its pedestal upper end is the external thread that 10mm, length are 30mm with external diameter, so that be connected with bus bar threaded hole; It is the threaded hole that 5mm, length are 15mm that its lower end is provided with external diameter, can connect a high pressure extension rod 3 to be electrically connected with ball electrode 4.Can regulate the spacing between ball electrode 4 and bowl electrode 5 by high-field electrode pedestal 2.
Referring to Fig. 3, the diameter of high pressure extension rod 3 is 13mm, and length is 50mm.Its one end is the external thread that 5mm, length are 10mm with external diameter, is connected with high-field electrode pedestal 2; One end is that 5mm, the length external thread that is 8mm is to connect ball electrode 4 with axial external diameter in addition.
Referring to Fig. 4, the radius of described ball electrode 4 is 15mm, and the external diameter of the threaded hole that its planar central place arranges is 5mm, and the degree of depth is 5mm.
Referring to Fig. 5, the diameter of described bowl electrode 5 is 80mm, and external diameter is 90mm, is highly 45mm, its lower end with externally threaded external diameter be 6mm, length is 20mm.
Referring to Fig. 6, the diameter of described ground electrode 6 is 20mm, and length is 70mm, its one end with the externally threaded external diameter that is connected of the threaded hole with air chamber 1 downside inwall be 8mm, length is 10mm, in addition one end with the external diameter of the threaded hole being connected with described bowl electrode 5 be 6mm, the degree of depth is 25mm.
Implement the utility model, there is following beneficial effect:
It is a kind of that the utility model provides a kind of model for Simulated GlS device interior free conducting particle defect to set up, and can simulate the free conducting particle defect that 110kVGIS inside may occur.Under pressurization service condition, this defect model produces can produce stable local discharge signal, and the measurement result of its flash-over characteristic and gas component characteristic all shows the feature of more obvious free conducting particle defect, and defect identification degree is high.
Above content is in conjunction with concrete preferred implementation further detailed description of the utility model, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field, without departing from the concept of the premise utility, can also make some simple deduction or replace, all should be considered as belonging to protection domain of the present utility model.
Claims (10)
1. the model for Simulated GlS device interior free conducting particle defect, it is characterized in that, comprising: air chamber (1), high-field electrode pedestal (2), high-field electrode extension rod (3), ball electrode (4), bowl electrode (5), ground electrode (6) and free conducting particle (7);
Described air chamber (1) inwall is coated with barrier coat, and its downside inwall is provided with the threaded hole for changing Different electrodes; The lower end of described high-field electrode pedestal (2) is provided with the threaded hole for connecting described high-field electrode extension rod (3); High-field electrode pedestal (2) regulates the spacing between described ball electrode (4) and described bowl electrode (5); Its one end of described high-field electrode extension rod (3) is with the external thread for being connected with described high-field electrode pedestal (2), in addition one end with axial for connecting the external thread of described ball electrode (4); Described ball electrode (4) is hemisphere, and its planar central place is provided with the threaded hole being connected with described high-field electrode extension rod (3); Described bowl electrode (5) lower end is with the external thread being connected with described ground electrode (6); Described ground electrode (6) is right cylinder, and its one end is with the external thread being connected with the threaded hole of the downside inwall of described air chamber (1), and one end is with the threaded hole being connected with the external thread of described bowl electrode (5) in addition; Described free conducting particle (7) is adsorbed in described bowl electrode (5) inwall.
2. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 1, is characterized in that, the volume of described air chamber (1) is 90L.
3. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 2, is characterized in that, the opening upwards of the threaded hole that the downside inwall of described air chamber (1) arranges, and its external diameter is 8mm, the degree of depth is 10mm.
4. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 3, is characterized in that, the diameter of described high-field electrode pedestal (2) is 16mm, and length is 40mm.
5. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 4, is characterized in that, the external diameter of the threaded hole that the lower end of described high-field electrode pedestal (2) arranges is 5mm, and length is 15mm.
6. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 5, is characterized in that, the diameter of described high-field electrode extension rod (3) is 13mm, and length is 50mm.
7. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 6, it is characterized in that, the externally threaded external diameter that described high-field electrode extension rod (3) is connected with described high-field electrode pedestal (2) is 5mm, length is 10mm, the externally threaded external diameter being connected with described ball electrode (4) that its other one end arranges is 6mm, and length is 25mm.
8. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 7, is characterized in that, the radius of described ball electrode (4) is 15mm, and the external diameter of the threaded hole that its planar central place arranges is 5mm, and the degree of depth is 5mm.
9. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 8, is characterized in that, the diameter of described bowl electrode (5) is 80mm, external diameter is 90mm, be highly 45mm, its lower end with externally threaded external diameter be 6mm, length is 20mm.
10. the model for Simulated GlS device interior free conducting particle defect as claimed in claim 9, it is characterized in that, the diameter of described ground electrode (6) is 20mm, length is 70mm, its one end with the externally threaded external diameter that is connected of the threaded hole with air chamber (1) downside inwall be 8mm, length is 10mm, in addition one end with the external diameter of the threaded hole being connected with described bowl electrode (5) be 6mm, the degree of depth is 25mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320870998.1U CN203688737U (en) | 2013-12-27 | 2013-12-27 | Model for simulating defects of free conductive particles in GIS equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320870998.1U CN203688737U (en) | 2013-12-27 | 2013-12-27 | Model for simulating defects of free conductive particles in GIS equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203688737U true CN203688737U (en) | 2014-07-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320870998.1U Expired - Lifetime CN203688737U (en) | 2013-12-27 | 2013-12-27 | Model for simulating defects of free conductive particles in GIS equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203688737U (en) |
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2013
- 2013-12-27 CN CN201320870998.1U patent/CN203688737U/en not_active Expired - Lifetime
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140702 |
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| CX01 | Expiry of patent term |