CN203414423U

CN203414423U - Sample dust prevention device for X fluorescence spectrophotometer

Info

Publication number: CN203414423U
Application number: CN201320401820.2U
Authority: CN
Inventors: 李莉; 柳亚玲; 韩亚鹏; 李明; 杨文�
Original assignee: QINGDAO QIAOTOU ALUMINIUM & POWER Co Ltd
Current assignee: QINGDAO QIAOTOU ALUMINIUM & POWER Co Ltd
Priority date: 2013-07-01
Filing date: 2013-07-01
Publication date: 2014-01-29
Anticipated expiration: 2023-07-01

Abstract

The utility model relates to a sample dust prevention device for an X fluorescence spectrophotometer. The sample dust prevention device comprises a sample box housing, a spring seat and an anti-dust disk which is arranged between the sample box housing and the spring seat, wherein the anti-dust disk comprises a disk body and a disk handle; one side of the disk body and the disk handle are connected in a T-shaped manner; the spring seat comprises a seat, a sample tray and a spring which is arranged between the seat and the sample tray; a central hole is formed in the sample tray; and a concave table is formed on the other side of the disk body, which is not connected with the disk handle. The device can reduce the internal space of the sample box, avoid the test section from shaking, reduce the space for the sample dust, effectively reduce the problem that during the analyzing process the dust may contaminate the inside of the apparatus, and improve the reliability of the analysis detecting result.

Description

A kind of sample dust guard of X-fluorescence spectrometer

Technical field

The utility model relates to the sample dust guard of a kind of optical spectrometer sample box, particularly a kind of X-fluorescence spectrometer.

Background technology

The ARL9800/9900 series of X fluorescence spectrophotometer that U.S.'s thermoelectricity (Themo Fisher) company manufactures is widely used in China's metallurgy industry, in particularly aluminium electroloysis industry of nonferrous metallurgy, be widely used in aspect electrolyte analysis, because bath sample fluorescence analysis is mainly used powder pressing method to carry out early stage to sample to process, the test piece preparing is in analytic process, while particularly adding the instrument internal of vacuum state, sample box inner space is large, easily cause the cleaning of sample dust unclean, thereby pollute the optical precision parts of instrument internal, cause apparatus measures error and equipment failure, meanwhile, also directly impact analysis detects the accurate reliability of data.

Therefore, be necessary to design a kind of sample dust guard of novel X-fluorescence spectrometer, to overcome above-mentioned defect.

Summary of the invention

The purpose of this utility model aims to provide a kind of sample dust guard of X-fluorescence spectrometer, to reduce sample box inner space, avoid test piece to rock, reduce the space that sample dust exists, effectively reduce the problem that in analytic process, dust pollutes instrument internal, also for the accurate reliability of analyzing and testing result is offered help.

The purpose of this utility model is achieved in that the sample dust guard of this X-fluorescence spectrometer comprises sample box housing, spring pedestal and is located at the dust pan between sample box housing and spring pedestal, dust pan has disk and dish handle, and the one side of disk and dish handle are interconnected to T-shaped; Spring pedestal there is base, sample pallet and be located at base and sample pallet between spring, and there is center pit on sample pallet.

Preferably, in the one side not being connected with dish handle of disk, also can there is concave station.

The utility model is owing to adopting technique scheme, and tool has the following advantages.

1, can determine fast sample tram, avoid sample to move friction and produce sample dust, reduce sample box inner space.

2, avoided when testing sample is put into sample box, because sample box spring pedestal easily makes sample, slided, caused in testing process, X ray cannot be irradiated to the inaccurate drawback of analysis detecting data that cause on the surface of sample to be tested stable homogeneous.

Accompanying drawing explanation

Fig. 1 is three-dimensional structure diagram of the present utility model.

Fig. 2 (a) is the front elevation of sample box housing 1.

Fig. 2 (b) is that the A-A of Fig. 2 (a) is to cut-open view.

Fig. 2 (c) is the top view of sample box housing 1.

Fig. 3 (a) is the cut-open view of dust pan 2.

Fig. 3 (b) is the backplan of dust pan 2.

Fig. 4 (a) is the front elevation of spring pedestal 3.

Fig. 4 (b) is the top view of spring pedestal 3.

In figure: 1-sample box housing; 2-dust pan; 21-disk; 22-coils handle; 23-concave station; 3-spring pedestal; 31-base; 32-spring; 33-sample pallet; 34-center pit; 4-sample.

Embodiment

Below in conjunction with the embodiment in accompanying drawing, the utility model is described in further detail.

As shown in Figure 1, a kind of sample dust guard of X-fluorescence spectrometer, comprise sample box housing 1, spring pedestal 3 and be located at sample box housing 1 and spring pedestal 3 between dust pan 2, dust pan 2 has disk 21 and dish handle 22, the one side of disk 21 and dish handle 22 are interconnected to T-shaped; Spring pedestal 3 there is base 31, sample pallet 33 and be located at base 31 and sample pallet 33 between spring 32, and on sample pallet 33, there is center pit 34.

In the one side not being connected with dish handle 22 of disk 21, also can there is concave station 23.

Consideration based on to test piece precision of analysis, and require the device of made not destroy the sample box of equipment itself, so the external diameter of the dish of dust pan 2 circle 21 need be less than sample box internal diameter; For ease of handling, dust pan 2 is a T-shaped device, has the direct interventional instrument of a dish handle 22 to carry in the center pit 34 on the inner sample pallet 33 of sample box.Increase these parts and first played fast definite sample tram, avoid sample to move friction and produce sample dust, reduce the direct effect of sample box inner space.

Adopt this device, also fundamentally avoided when testing sample is put into sample box, owing to carrying sample box spring pedestal, easily make sample slide, cause in testing process, X ray cannot be irradiated to the inaccurate drawback of analysis detecting data that cause on the surface of sample to be tested stable homogeneous.For this reason, this dust guard processes a concave station 23 of placing test piece on dust pan 2, consistent with X ray entry position on sample box to guarantee sample to be tested center surface.

Taking into full account and guaranteeing that dust guard does not produce the harmful effects such as magnetic field, corrosion to the inner accurate electronic devices and components of ARL9800/9900 series of X fluorescence spectrophotometer, treat analytical sample and do not produce matrix interference, analyzing and testing result is accurately and reliably on basis, as long as meet material, possesses certain physical strength, easily processing, this dust guard can be used any materials such as metallic aluminium, iron and steel, stainless steel, teflon.

With way of example, the utility model is illustrated above, but the utility model is not limited to above-mentioned specific embodiment, all any changes of doing based on the utility model or modification all belong to the claimed scope of the utility model.

Claims

1. the sample dust guard of an X-fluorescence spectrometer, it is characterized in that, comprise sample box housing (1), spring pedestal (3) and be located at described sample box housing (1) and spring pedestal (3) between dust pan (2), described dust pan (2) has disk (21) and dish handle (22), and the one side of described disk (21) and described dish handle (22) are interconnected to T-shaped; Described spring pedestal (3) there is base (31), sample pallet (33) and be located at described base (31) and sample pallet (33) between spring (32), and on described sample pallet (33), there is center pit (34).

2. the sample dust guard of a kind of X-fluorescence spectrometer according to claim 1, is characterized in that, in the one side not being connected with described dish handle (22) of described disk (21), also has concave station (23).