CN203275821U - System for measuring quality of liquid crystal glass substrate - Google Patents
System for measuring quality of liquid crystal glass substrate Download PDFInfo
- Publication number
- CN203275821U CN203275821U CN 201320296262 CN201320296262U CN203275821U CN 203275821 U CN203275821 U CN 203275821U CN 201320296262 CN201320296262 CN 201320296262 CN 201320296262 U CN201320296262 U CN 201320296262U CN 203275821 U CN203275821 U CN 203275821U
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- liquid crystal
- crystal glass
- quality
- glass substrate
- processing unit
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Abstract
The utility model relates to the technical field of liquid crystal glass substrates, in particular to a system for measuring the quality of a liquid crystal glass substrate. The system for measuring the quality of the liquid crystal glass substrate comprises a central controller, a measurement machine table, a panel quality data processing unit and a plurality of processing machine tables, wherein the central controller is connected with the measurement machine table, the panel quality data processing unit and the processing machine tables.
Description
Technical field
The utility model relates to the liquid crystal glass base technical field, relates in particular to a kind of quality measurement system of liquid crystal glass base.
Background technology
Liquid crystal glass base is the important component part of liquid crystal flat panel display, has very vast potential for future development.Glass substrate is a basic element of character that consists of liquid crystal display device, is the extremely smooth float process thin glass sheet in a kind of surface.
Prior art generally adopts infusion process and spray to send the glass substrate of processing and manufacturing liquid crystal display, and wherein, the advantage that infusion process is simple due to equipment and cost is low is widely used in the glass substrate processing and manufacturing of liquid crystal display.In the etching process of glass substrate, need counter plate to carry out prediction of quality, yet prior art can't meet this requirement.
Summary of the invention
The purpose of this utility model is for the deficiencies in the prior art, and a kind of quality measurement system of liquid crystal glass base is provided, and can carry out prediction of quality to various panel, reduces the frequency that sampling measures, and alleviates the complexity of prediction model.
For achieving the above object, the utility model is achieved through the following technical solutions: a kind of quality measurement system of liquid crystal glass base, comprise central controller, measurement platform, panel quality data processing unit and some process work bench, described central controller connects described measurement platform, panel quality data processing unit and some process work bench.
Be connected for the CAN bus communication between described central controller and measurement platform, panel quality data processing unit and some process work bench.
The quantity of described process work bench is 3 to 6.
The utility model beneficial effect is: the quality measurement system of a kind of liquid crystal glass base described in the utility model, can carry out prediction of quality to various panel, and reduce the frequency that sampling measures, alleviate the complexity of prediction model.
Description of drawings
Fig. 1 is theory diagram of the present utility model.
Embodiment
Below in conjunction with accompanying drawing, the utility model is further described.
As shown in Figure 1, a kind of quality measurement system of liquid crystal glass base, a kind of quality measurement system of liquid crystal glass base, also comprise central controller 1, measurement platform 3, panel quality data processing unit 4 and some process work bench 5, described central controller 1 connects described measurement platform 3, panel quality data processing unit 4 and some process work bench 5.Be connected for the CAN bus communication between described central controller 1 and measurement platform 3, panel quality data processing unit 4 and some process work bench 5.Preferably, the quantity of described process work bench 5 is 3 to 6.
During work, central controller 1 obtains the process parameter data value of at least one process work bench 5, measurement platform 3 obtains the panel quality measuring value, panel quality data processing unit 4 carries out computing with the panel quality measuring value of sampling, set up initial prediction model, can be to same process recipe but the various panel of different size carries out prediction of quality, reduce the frequency that sampling measures, alleviate the complexity of prediction model.
Above content is only preferred embodiment of the present utility model, for those of ordinary skill in the art, according to thought of the present utility model, all will change in specific embodiments and applications, this description should not be construed as restriction of the present utility model.
Claims (3)
1. the quality measurement system of a liquid crystal glass base, it is characterized in that: it comprises central controller (1), measurement platform (3), panel quality data processing unit (4) and some process work bench (5), and described central controller (1) connects described measurement platform (3), panel quality data processing unit (4) and some process work bench (5).
2. the quality measurement system of a kind of liquid crystal glass base according to claim 1 is characterized in that: be connected for the CAN bus communication between described central controller (1) and measurement platform (3), panel quality data processing unit (4) and some process work bench (5).
3. the quality measurement system of a kind of liquid crystal glass base according to claim 2, it is characterized in that: the quantity of described process work bench (5) is 3 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320296262 CN203275821U (en) | 2013-05-28 | 2013-05-28 | System for measuring quality of liquid crystal glass substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320296262 CN203275821U (en) | 2013-05-28 | 2013-05-28 | System for measuring quality of liquid crystal glass substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203275821U true CN203275821U (en) | 2013-11-06 |
Family
ID=49506196
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320296262 Expired - Fee Related CN203275821U (en) | 2013-05-28 | 2013-05-28 | System for measuring quality of liquid crystal glass substrate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203275821U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107082279A (en) * | 2017-05-22 | 2017-08-22 | 昆山国显光电有限公司 | Process work bench and the panel conveying device with it |
-
2013
- 2013-05-28 CN CN 201320296262 patent/CN203275821U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107082279A (en) * | 2017-05-22 | 2017-08-22 | 昆山国显光电有限公司 | Process work bench and the panel conveying device with it |
| CN107082279B (en) * | 2017-05-22 | 2020-01-03 | 昆山国显光电有限公司 | Panel carrying device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee |
Owner name: HUBEI UNITECH OPTRONICS TECHNOLOGY CO., LTD. Free format text: FORMER NAME: HUBEI UNITECH OPTRONICS TECHNOLOGY LTD. |
|
| CP03 | Change of name, title or address |
Address after: The North Industrial Park of Xiaogan city in 432500 Hubei County of Yunmeng province Hubei optoelectronic technology Limited by Share Ltd Unocal Patentee after: UNITECH OPTRONICS TECHNOLOGY (HUBEI) CO., LTD. Address before: The North Industrial Park of Xiaogan city in 432500 Hubei County of Yunmeng province Hubei youniko Photoelectric Technology Co Ltd Patentee before: Unitech Optronics Technology (Hubei) Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131106 Termination date: 20160528 |