CN203172163U - Antidrip dotting device for diode bare chip particle test machine - Google Patents
Antidrip dotting device for diode bare chip particle test machine Download PDFInfo
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- CN203172163U CN203172163U CN 201320172422 CN201320172422U CN203172163U CN 203172163 U CN203172163 U CN 203172163U CN 201320172422 CN201320172422 CN 201320172422 CN 201320172422 U CN201320172422 U CN 201320172422U CN 203172163 U CN203172163 U CN 203172163U
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- ink
- ink cartridge
- bracing frame
- antidrip
- test machine
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Abstract
The utility model discloses an antidrip dotting device for a diode bare chip particle test machine, comprising a bracing frame. The upper end of the bracing frame is connected with a support block; the lower ends of the support block and the bracing frame are respectively provided with an ink box and a guide seat; an ink lead connected with the output terminal of an electromagnet passes through the ink box and the guide seat in sequence; one side of the ink box is connected with a vacuum pipe connected with a generator; the ink box with an increased size is equipped with a seal cover; an isolation sleeve with a center aperture is arranged in the ink box; a cavity is formed in the ink box between the isolation sleeve and the seal cover; the cavity of the ink box is communicated with the vacuum pipe externally connected with a vacuum generator; and the vacuum pipe is provided with a throttle valve. The problem of obstruction caused by volatilization and solidification of ink is solved, dismounting and cleaning the ink box are easy, ink dropping phenomenon in dotting process is prevented, and repeated ink addition and dropped ink cleaning are minimized.
Description
Technical field
The utility model is used for the semiconductor equipment manufacture industry, is applied on the naked core grain diode chip for backlight unit sorting test machine, is a kind of naked core grain diode test machine specifically with antidrip black tapper device.And the naked core grain diode core grain after test finished marks.
Background technology
After the sorting test machine is tested naked core grain diode chip for backlight unit; according to test request; to the naked core grain that do not satisfy test request or there is the naked core grain of classificating requirement to carry out the ink dot mark; deposit according to the sorting chips of mark ink dot mark again behind the EOT, so the tapper used of the diode Test handler device that is absolutely necessary.
The tapper that uses on the present disclosed diode sorting test machine, mainly comprise bracing frame, this bracing frame is equipped with electromagnet, ink cartridge and guide seat from top to bottom respectively, reach the line of ink marker that draws that is connected with the electromagnet output and pass ink cartridge and guide seat successively, also be included in ink cartridge one side and connect a vacuum pipeline that is connected with generator.During use, electromagnet begins action, and drive is drawn the line of ink marker and moved up and down along the guide seat inwall, finishes and gets action ready.In actual applications, because ink cartridge is very little, be again to adopt open ink cartridge, make it the ink highly volatile and solidify, need constantly to replenish ink.In addition, said apparatus is the size of the core grain size adjustment ink droplet of mark as required, and the core grain that different size requires need customize and draw the line of ink marker and guide seat accordingly.In addition; China ink in use appears dripping easily; in case ink drips to crystal column surface; need to shut down at once, stop test, will put in order Zhang Jingyuan and take off and clean; again test again after cleaning; this also just requires the workman ceaselessly to observe and the pre-ink that drips of wiping, has not only increased manipulation strength and has got operation ready, has also reduced operating efficiency simultaneously.
Summary of the invention
In view of above-mentioned present situation, the utility model provides a kind of naked core grain diode test machine with antidrip black tapper device.Substituted the mode of existing open ink cartridge; and cause need constantly to replenish ink because of ink volatilization; and when shutting down by dismounting ink cartridge, the cleaning that guide seat brings that result in blockage of solidifying of ink; fundamentally solved in getting process ready and to occur dripping a black phenomenon, reduced in the test process problem that repeatedly ink and wiping drip China ink greatly.
The technical solution of the utility model is: a kind of naked core grain diode test machine is with antidrip black tapper device, comprise bracing frame, and the tray of upper end connection, at tray and bracing frame lower end electromagnet, ink cartridge and guide seat are housed respectively, reach the line of ink marker that draws that is connected with the electromagnet output and pass ink cartridge and guide seat successively, connect a vacuum pipeline that is connected with generator in ink cartridge one side; Wherein the ink cartridge behind described increase volume is equipped with seal cover, reach the spacer that is provided with centre bore in ink cartridge inside, formed a cavity by the ink cartridge between spacer and the seal cover, the re-entrant portion of this ink cartridge is connected with the vacuum pipeline of external vacuum generator, is provided with choke valve at described vacuum pipeline.Like this, not only prevented from volatilizing and solidifying, also avoided the ink in the ink cartridge under the gravity effect, along drawing line of ink marker drippage.Also can regulate the size of ink droplet quantity simultaneously as requested.
In this was novel, wherein bracing frame was the L type, and sidewall has the V-type groove.
In this was novel, described guide seat was the T type.
In this was novel, described spacer was a convex tube.
The ink cartridge of this novel indication is nylon material.
The good effect that the utlity model has is: by improving open ink cartridge structure; can solve and have the continuous ink that causes because of the ink volatilization now; ink frozen plug guide seat very easily during shutdown; need the dismounting ink cartridge to clear up; fundamentally solved and black phenomenon in getting process ready, occurred dripping; reduced greatly in the test process repeatedly that ink and wiping drip China ink, simultaneously by regulating choke valve, can increase or reduce the droplet volume to different core grains marks.This novel mark of getting ready that is not only applicable to naked core grain diode core grain can also be used for the mark of getting ready after integrated circuit, triode, controllable silicon and the sensing element sorting test, and basis is novel also to be the requisite device of testing, sorting equipment.
Description of drawings
Fig. 1 is this novel schematic diagram;
Fig. 2 is the partial sectional view of Fig. 1.
The specific embodiment
Be further described below in conjunction with the utility model of accompanying drawing embodiment.
See that Fig. 1, a kind of naked core grain diode test machine shown in Figure 2 with antidrip black tapper device, comprise mount pad 14, and the bracing frame 3 that is connected with mount pad 14, fixedly connected by locking knob 15.In described bracing frame 3 upper ends electromagnet installing rack 11 is housed, on this electromagnet installing rack 11 by the electromagnet 12 that is threaded, ink cartridge 4 is equipped with in bracing frame 3 lower ends at present embodiment, have pouring ink hole and be provided with in described ink cartridge 4 one sides and add inky cap 5, after adding China ink by pouring ink hole, utilize to add inky cap 5 and seal.Upper and lower side at ink cartridge 4 is respectively equipped with seal cover 6 and guide seat 2.Be connected with bracing frame 3 by the screw thread on the guide seat 2.In the present embodiment, the upper space in ink cartridge 4 is equipped with the spacer 16 that has centre bore, makes the cavity of ink cartridge 4 inner formation between spacer 16 and the seal cover 6, is used for solving the black problem of dripping.An end that draws the line of ink marker 1 of present embodiment and holder fast 13 are connected the back with pressing plate 10 fixing by screw 9, utilizes and ask fast 13 to be connected with electromagnet 12 outputs; The other end that draws the line of ink marker 1 passes seal cover 6, ink cartridge 4, spacer 16 and guide seat 2 respectively, and draws guide seat 2.Connect a vacuum pipeline 8 on the described seal cover 6 of present embodiment, this vacuum pipeline 8 is connected with external vacuum generator (not illustrated), is provided with choke valve 7 at described vacuum pipeline 8, controls to adjust and drips a black size of measuring.
In the present embodiment, bracing frame 3 integral body are L type shape, and bracing frame 3 a wherein sidewall has the V-type groove.V-type groove by bracing frame 3 one sides and mount pad 14 movable installations are regulated and are located by the locking knob 15 of its matching part setting.
The seal cover 6 of present embodiment radially be provided with internal thread hole, be connected with the external screw thread of ink cartridge 4 ports.
During ink, screw off and add inky cap 5 and add inks, add ink, screw and add inky cap 5.During use, electromagnet 12 begins action, the tray 13 that drive is fixed on its output moves up and down along axis direction, drawing the line of ink marker 1 moves up and down along guide seat 2 axis under the driving of holder fast 13, ink begins to get ready mark under the motion of drawing the line of ink marker 1, electromagnet 12 power on/off are once finished and once got mark ready.
Implementing this novel key is: the one, increased seal cover and ink cartridge inside has increased spacer at the openend of ink cartridge; so both can prevent the continuous ink that the ink volatilization causes; or the easy frozen plug guide seat of ink when shutting down; simultaneously also prevented the ink in the ink cartridge under the gravity effect, along the generation of drawing line of ink marker drippage problem.The 2nd, be provided with choke valve 7 at vacuum pipeline 8, the size of China ink amount is dripped in control.
Claims (4)
1. a naked core grain diode test machine is with antidrip black tapper device, comprise bracing frame, and the tray of upper end connection, at tray and bracing frame lower end electromagnet, ink cartridge and guide seat are housed respectively, reach the line of ink marker that draws that is connected with the electromagnet output and pass ink cartridge and guide seat successively, connect a vacuum pipeline that is connected with generator in ink cartridge one side; It is characterized in that, ink cartridge (4) behind described increase volume is equipped with seal cover (6), reach the spacer (16) that is provided with centre bore in ink cartridge (4) inside, formed a cavity by the ink cartridge between spacer (16) and the seal cover (6), the re-entrant portion of this ink cartridge (4) is connected with the vacuum pipeline (8) of external vacuum generator, is provided with choke valve (7) at described vacuum pipeline (8).
2. require 1 described a kind of naked core grain diode test machine with antidrip black tapper device according to profit, it is characterized in that wherein bracing frame (3) is the L type, sidewall has the V-type groove.
3. require 1 described a kind of naked core grain diode test machine with antidrip black tapper device according to profit, it is characterized in that described guide seat (2) is the T type.
4. require 1 described a kind of naked core grain diode test machine with antidrip black tapper device according to profit, it is characterized in that described spacer is a convex tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320172422 CN203172163U (en) | 2013-04-09 | 2013-04-09 | Antidrip dotting device for diode bare chip particle test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320172422 CN203172163U (en) | 2013-04-09 | 2013-04-09 | Antidrip dotting device for diode bare chip particle test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203172163U true CN203172163U (en) | 2013-09-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320172422 Expired - Lifetime CN203172163U (en) | 2013-04-09 | 2013-04-09 | Antidrip dotting device for diode bare chip particle test machine |
Country Status (1)
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| CN (1) | CN203172163U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372532A (en) * | 2015-11-26 | 2016-03-02 | 中国电子科技集团公司第四十五研究所 | Flying probe is with test and mechanism of dotting |
| CN106560911A (en) * | 2015-10-29 | 2017-04-12 | 安徽超元半导体有限公司 | Wafer ink printing device |
| CN109935535A (en) * | 2017-12-19 | 2019-06-25 | 北京确安科技股份有限公司 | A kind of wafer device for dotting |
-
2013
- 2013-04-09 CN CN 201320172422 patent/CN203172163U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106560911A (en) * | 2015-10-29 | 2017-04-12 | 安徽超元半导体有限公司 | Wafer ink printing device |
| CN105372532A (en) * | 2015-11-26 | 2016-03-02 | 中国电子科技集团公司第四十五研究所 | Flying probe is with test and mechanism of dotting |
| CN109935535A (en) * | 2017-12-19 | 2019-06-25 | 北京确安科技股份有限公司 | A kind of wafer device for dotting |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee after: Qinhuangdao audio-visual Machinery Research Institute Co.,Ltd. Address before: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee before: QINHUANGDAO AUDIO-VISUAL MACHINERY Research Institute |
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| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130904 |