CN202997244U

CN202997244U - Transfer foot seat for detection of mainboard

Info

Publication number: CN202997244U
Application number: CN 201220572845
Authority: CN
Inventors: 黄贤雄
Original assignee: JIAJIE INDUSTRIAL Co Ltd
Current assignee: JIAJIE INDUSTRIAL Co Ltd
Priority date: 2012-11-01
Filing date: 2012-11-01
Publication date: 2013-06-12
Anticipated expiration: 2022-11-01

Abstract

The utility model relates to a transfer foot seat for detection of a mainboard. The basic portion of the transfer foot seat is provided with a transfer slot, a plurality of transfer terminals are arranged in the transfer slot in a penetrating mode, the transfer slot can be utilized to enable a preset storage module to be inserted, and the plurality of transfer terminals are electrically connected with a transfer circuit board. The surfaces of the other two sides of the transfer circuit board are provided with a plurality of metal contacts, and the transfer circuit board is provided with chamfered edges on two sides of the plurality of metal contacts and respectively towards two outer side edges of the transfer circuit board. The transfer circuit board can be utilized to be inserted into the sliding groove of the inserting foot seat of the mainboard, the chamfered edges of the two sides of the plurality of metal contacts respectively abut against the push plates of the pull bodies on two sides of the inserting foot seat, the aim of fast separating the foot seat from the preset mainboard after the detection is achieved, and the mainboard is protected from being damaged due to the inserting of testing operation.

Description

The switching runners that host board testing is used

Technical field

The switching runners that the utility model provides a kind of host board testing to use, espespecially for the switching runners that separates fast with default motherboard after test jobs, utilize the switching circuit board both sides of switching runners to be respectively equipped with bevelled edge, can pull on the push plate of body for the slot both sides that are resisted against the grafting runners, and the purpose of separating fast after test.

Background technology

computer technology is fast-developing to make rapid progress now, and desktop or notebook computer have been prevalent in upper each corner of society, the development trend of its computer is also strong towards calculation function, speed reaches soon the little direction of volume and strides forward, the connector that makes computer inside also with significantly dwindle, with the development trend in response to computer, and for the matching computer operational function constantly promotes, progressive, the motherboard of computer must expand more application function, operational paradigm, and by increasing memory module, interface card or functional cards etc., operational capacity upgrading with motherboard, more grafting runners also to be set for various memory module on motherboard, interface card or functional cards electric mortiser connect, but and signal transmission, and location structure must be set on the grafting runners, for fixing various memory module, interface card or functional cards, be about to various memory module, interface card or functional cards firmly are plugged in the slot of grafting runners, yet install at motherboard, before use, must be through the functional test of motherboard, to confirm the running of motherboard, execution etc. are all normal, see also Fig. 8, shown in Figure 9, memory module B2 on general motherboard A is plugged on grafting runners A1, and the structure of grafting runners A1 and memory module B2 regulation has certain standard, when memory module B2 is plugged in the slot A10 of grafting runners A1, corner, memory module B2 both sides is rectangular shape respectively, be pressed on the push plate A22 that pulls body A2, and the clip A21 of body A2 is pulled in drive, buckle is in the draw-in groove B20 of memory module B2 both sides respectively, but strong fix is difficult for rocking, so usually when carrying out the test jobs of motherboard A, all by the grafting runners A1 on motherboard A, connect for the testing circuit board B1 electric mortiser below test jack B with slot A10, electric mortiser meets memory module B2 in the test socket B0 of test jack B again, can test for the running of motherboard A, take the various application functions of Test Host plate A whether as normal, after motherboard A test, when testing circuit board B1 is withdrawed from the slot A10 of grafting runners A1, pull when pressing grafting runners A1 both sides to pull the pressing plate A23 of body A2, it is outside that pressing plate A23 synchronously drives clip A21, push plate A22 moves up, make testing circuit board B1 withdraw from the slot A10 of grafting runners A1, but because signal transmission rate is more and more faster now, because of between test jack B and grafting runners A1, separation distance more motherboard A when carrying out test jobs, the disappearance that detection signal postpones easily occurs, more affect the speed that on motherboard A, system carries out slack-off, cause motherboard A test jobs not smooth, test result is deviation to some extent.

it is the distance of improving test jack B and grafting runners A1 that the dealer is arranged, the height of the testing circuit board B 1 of test jack B is reduced, both sides need not arrange clamping slot B10 and hold for the clip A21 that pulls body A2, but when causing testing circuit board B1 in the slot A10 that inserts grafting runners A1, because the both sides right-angle side supports two push plate A22 that pull body A2, be subject to holding of two push plate A22, causing both sides to pull body A2 rotates to relative inner respectively, and clasp is in the slot A10 both sides of grafting socket A1 respectively, can't insert slot A10 and cause testing circuit board B1, test jack B can not insert for memory module B2, can't carry out the test of memory module B2, in practical application, during enforcement, still there are inconvenience and puzzlement.

there is again the dealer to pull body A2 and rotate to relative inner respectively for improving both sides, and clasp is in the slot A10 both sides of grafting socket A1 respectively, can't insert slot A10 and cause testing circuit board B1, see also shown in Figure 10, right angle, testing circuit board B1 both sides is excised, be formed with unfilled corner B12, when being plugged in grafting socket A1, testing circuit board B1 both sides can not support two push plate A22 that pull body A2, causing both sides to pull body A2 rotates to relative inner respectively, but due to after test completes, must directly pull out the testing circuit board B1 that is plugged on motherboard A, easily cause the damage of motherboard A when pulling out, cause the increase of cost.

Be with, how to solve between grafting runners that present host board testing uses, test runners the height distance because of testing circuit board, cause built on the sand and signal transmission delay, the slack-off problem of system's execution speed, and when causing test jack to be inserted in the grafting runners, cause the damage of motherboard A, cause the increase of cost, must be improved, the relevant manufacturer that is the inventor and is engaged in the industry desires most ardently the direction place that research improves.

The utility model content

The inventor is because above-mentioned problem and disappearance, so collection related data, via in many ways assessing and considering, and to engage in the many years of experience of the industry accumulation, via constantly studying and revising, beginning to design this kind can insert switching circuit board in the slot of grafting runners really, and utilizes the both sides bevelled edge to pull body for two to be easy to pull and to push away, facilitate switching circuit board to recess the structure improved new patent birth of switching runners of the host board testing of plug socket.

main purpose of the present utility model is the base portion of this switching runners, wear a plurality of conversion terminals in the internal forwarding slot, and a plurality of conversion terminals are electrically connected on the switching circuit board of plug socket opposite side, and be respectively equipped with a plurality of metallic contacts in the another both side surface of switching circuit board, and in a plurality of metallic contacts both sides, be provided with respectively the bevelled edge of outward-dipping extension towards two outer side edges of switching circuit board, can utilize switching circuit board to insert in the slot of the grafting runners of presetting motherboard, be resisted against respectively on the push plate of pulling body of grafting runners both sides with the both sides bevelled edge again, really insert in the slot of grafting runners for switching circuit board, after default host board testing operation is completed, pull the body of pulling of grafting runners both sides, to reach the default motherboard purpose of separating fast after runners and test, minimizing causes the damage of default motherboard because of the plug of test jobs.

For reaching above-mentioned purpose, the switching runners that the utility model provides a kind of host board testing to use, comprise base portion and switching circuit board, this base interior has the switching slot for default memory module grafting, and wear a plurality of conversion terminals in the switching slot, a plurality of conversion terminals are electrically connected on a side of switching circuit board, and two surfaces of switching circuit board opposite side are respectively equipped with a plurality of metallic contacts in the slot of the grafting runners that inserts default motherboard, wherein:

This switching circuit board is in a plurality of metallic contacts both sides, be provided with oblique extension and in the slot that inserts default grafting runners, pushing tow both sides pulling body to the bevelled edge at relative inner turn one angle of inclination towards two outer side edges of switching circuit board respectively, and the angle of inclination of both sides bevelled edge is less than 45 °.

The runners that described host board testing is used, wherein: this switching circuit board in a plurality of metallic contacts both sides, be respectively equipped with the bevelled edge of outward-dipping rising, and utilize the both sides bevelled edge respectively the default grafting runners of pushing tow both sides pull body, the described body of pulling is respectively to the angle of 5 ° ~ 15 ° of relative inner turns.

The runners that described host board testing is used, wherein: two outermost metallic contacts are respectively to the distance between switching circuit board two outer side edges, greater than switching circuit board two outer side edges respectively to the distance on base.

The runners that described host board testing is used, wherein: these two outside metallic contacts are 3.8mm ~ 4.2mm to the distance between switching circuit board two outer side edges.

The runners that described host board testing is used, wherein: these two outside metallic contact to the distances between switching circuit board two outer side edges are 4mm.

The runners that described host board testing is used, wherein: these switching circuit board two outer side edges are 0.8mm ~ 1.2mm respectively to the distance on base.

The runners that described host board testing is used, wherein: these switching circuit board two outer side edges respectively to the distance on base be 1mm.

The structural improvement of the switching runners that above-mentioned host board testing of the present utility model is used has following advantage when reality is used:

(1) the set switching circuit board of base portion one side, be respectively equipped with the bevelled edge of outwards tiltedly stretching in two outsides of a plurality of metallic contacts, base portion utilizes switching circuit board, insert in the slot of the grafting runners of presetting motherboard to be tested, utilize the both sides bevelled edge to be resisted against the push plate that body is pulled in slot both sides, and for a plurality of metallic contacts that connect the road plate, respectively with slot in a plurality of terminals electrically contact, carry out stable test signal transmission, insert at the grafting runners for switching circuit board, extract, minimizing causes the damage of default motherboard to be tested and reduces costs because of the plug of test jobs, and body is pulled in default grafting runners both sides, be resisted against respectively base portion both sides, and unlikely switching slot two outer space that affect base portion, memory module can not be subject to both sides and pull stopping of body, the grafting operation is smooth.

(2) the set switching circuit board of base portion one side, reduce the design of height, in the time of can inserting the grafting runners of default motherboard to be tested for switching circuit board, shorten the distance between base portion and grafting connecting seat, can reduce the disappearance of test signal delay, also accelerate for system's execution speed of default motherboard to be tested, help the test jobs of presetting motherboard to be tested and carry out smoothly.

Description of drawings

Fig. 1 is stereo appearance figure of the present utility model;

Fig. 2 is end view of the present utility model;

Fig. 3 is the partial enlarged drawing of the A part of the utility model Fig. 2;

Fig. 4 is the three-dimensional exploded view of the utility model preferred embodiment;

Fig. 5 is the end view before the utility model switching runners is pegged graft;

Fig. 6 is the end view after the utility model switching runners is pegged graft;

Fig. 7 is the end view of the utility model switching runners when withdrawing from;

Fig. 8 is the three-dimensional exploded view of existing host board testing socket;

End view when Fig. 9 pegs graft for existing host board testing socket;

End view when Figure 10 is another existing host board testing socket grafting.

Description of reference numerals: 1-base portion; The 10-slot of transferring; The 101-terminal; The 11-switching circuit board; The 111-metallic contact; 112-outside metallic contact; The 12-outer side edges; The 13-bevelled edge; The 2-memory module; The 21-terminal connections; The 3-motherboard; 31-grafting runners; The 310-slot; The 311-inserting terminal; 32-pulls body; The 321-push plate; The 322-clip; The 323-press section; The A-motherboard; A1-grafting runners; The A10-slot; A2-pulls body; The A21-clip; The A22-push plate; The A23-pressing plate; The B-test jack; The B0-test socket; The B1-testing circuit board; The B10-clamping slot; The B11-metallic contact; The B12-unfilled corner; The B2-memory module; The B20-draw-in groove.

Embodiment

For reaching above-mentioned purpose and effect, the technology used in the present invention means and execution mode thereof, hereby drawing illustrates in detail that with regard to preferred embodiment of the present invention its features and functions is as follows, in order to understanding fully.

See also Fig. 1, Fig. 2, shown in Figure 3, for the A partial enlarged drawing partly of stereo appearance figure of the present utility model, end view, Fig. 2, find out the switching runners that host board testing of the present utility model is used by knowing shown in figure, comprise base portion 1, two switching circuit boards 11, wherein:

This base portion 1 has switching slot 10 in inside, and be equipped with a plurality of terminals 101 in switching slot 10, and a plurality of terminals 101 are electrically connected on respectively the switching circuit board 11 of opposite side, and be provided with a plurality of metallic contacts 111 in switching circuit board 11 opposite side surfaces, and a plurality of metallic contacts 111 comprise two outside metallic contacts 112, in two outside metallic contacts 112 towards 11 liang of switching circuit boards outer side edges, 12 places, be respectively equipped with the bevelled edge 13 of outward-dipping extension, can consist of switching runners of the present utility model by 11 groups of base portions 1, switching circuit board.

And the switching circuit board 11 that above-mentioned base portion 1 bottom outwards protrudes out, two outside metallic contacts 112 in switching circuit board 11, outward-dipping rising edge is provided with bevelled edge 13 respectively, and the horizontal direction distance of both sides bevelled edge 13, by the distance of two outside metallic contacts 112 to 12 of 11 liang of outer side edges of switching circuit board, can be 3.8mm ~ 4.2mm, and better distance can be 4mm; As for the vertical direction distance of two bevelled edges 13, be 11 liang of outer side edges 12 of switching circuit board to the distance on base, can be 0.8mm ~ 1.2mm, and better distance can be 1mm; And both sides bevelled edge 13 is respectively by switching circuit board 11 both sides, the level angle that tilts of top laterally, and the angle that tilts of two bevelled edges 13 can be less than 45 °.

see also Fig. 1, Fig. 4, Fig. 5, shown in Figure 6, be stereo appearance figure of the present utility model, the three-dimensional exploded view of preferred embodiment, end view before the switching runners is pegged graft, end view after the switching runners is pegged graft, find out by knowing shown in figure, switching runners of the present utility model is when using, utilize the slot 10 of base portion 1 to insert for memory module 2, utilize a plurality of terminal connections 21 of memory module 2 to be electrically connected on each interior terminal 101 of slot 10, the switching circuit board 11 of recycling base portion 1 below, electric mortiser is connected in the slot 310 of the grafting runners 31 on default motherboard 3 to be tested, and utilize the bevelled edge 13 of switching circuit board 11 both sides, being resisted against respectively slot 310 both sides pulls on the push plate 321 of body 32, and pushing both sides pulls body 32 and revolves to relative inner respectively and move, and with two clips 322 of pulling body 32, be held in respectively the dual-side of memory module 2, insert fully for switching circuit board 11 in the slot 310 of grafting runners 31, and utilize switching circuit board 11 both sides bevelled edges 13, the push plate 321 of body 32 is pulled in pushing tow slot 310 both sides respectively, be respectively to the relative inner turn and pull body 32 for both sides, be about the predetermined angular of 5 ° ~ 15 °, and two clips 322 of pulling body 32, can be towards relative inner turn wide-angle too, can not stretch into the interval of slot 310 tops of grafting runners 31, in the field, also be difficult for forming buckle, situation about stopping, can for a plurality of metallic contacts 111 respectively with inserting terminal 311, the contact of formation stable electrical, can not produce and contact not exclusively or the situation of loose contact, and in the grafting process, the push plate 321 of body 32 is pulled in both sides, clip 322, can not produce interactional resistance, carry out smoothly for the grafting operation, and the default grafting runners of confession 31 both sides are pulled body 32 and are skewed, be resisted against respectively base portion 1 both sides, and unlikely 10 two outer space of switching slot that affect base portion 1, can not produce and stop or disturb, can peg graft smoothly for memory module 2 by switching slot 10, and supply memory module 2 and preset 3 of motherboards to be tested, stable transmission electronic signal, the height because of switching circuit board 11 reduces, shorten the distance between base portion 1 and grafting runners 31, and can reduce the disappearance that test signal postpones, and the speed of carrying out for system on default motherboard 3 to be tested accelerates, can test more accurately the operation performance of default motherboard 3 to be tested, implementation effect.

see also Fig. 1, Fig. 5, Fig. 6, shown in Figure 7, be stereo appearance figure of the present utility model, end view before the switching runners is pegged graft, end view after the switching runners is pegged graft, end view when the switching runners withdraws from, find out by knowing shown in figure, switching runners of the present utility model is when using, after the test jobs of default motherboard 3 to be tested is completed, to the transfer base portion 1 of runners of wish, switching circuit board 11 is withdrawed from by the grafting runners 31 of default motherboard 3 to be tested, can utilize the press section of pulling body 32 323 of grafting runners 31 both sides, outwards the application of force is pressed respectively, namely utilize two push plate 321 of pulling body 32, the switching circuit board 11 both sides bevelled edges 13 of difference pushing tow base portion 1, switching circuit board 11 is pushed away out outside the slot 310 of grafting runners 31, and the clip 322 of body 32 is pulled in both sides, when both sides push plate 321 pushing tow switching circuit board 11, can't form and keep out the resistance that memory module 2 is pegged graft, and can be for the base portion 1 of switching runners, switching circuit board 11 withdraws from grafting runners 31 smoothly, suffered stopping or disturb when inserting switching slot 10 to reduce memory module 2.

be with, the above is only preferred embodiment of the present utility model, non-so limit to the scope of the claims of the present utility model, the switching runners of the utility model motherboard 3 test use default to be tested, switching slot 10 opposite sides in base portion 1, be provided with the switching circuit board 11 that reduces height, and switching circuit board 11 is provided with a plurality of metallic contacts 111 in the opposite side surface, and in two outermost metallic contacts 112, two outer side edges 12 towards switching circuit board are provided with tilting bevelled edge 13 respectively, base portion 1 utilizes switching circuit board 11, insert in the slot 310 of the grafting runners 31 of presetting motherboard 3 to be tested, namely utilize switching circuit board 11 both sides bevelled edges 13, support respectively slot 310 both sides and pull the push plate 321 of body 32, can reach and pull body 32 for default grafting runners 31 both sides and be skewed, be resisted against respectively base portion 1 both sides, and unlikely 10 liang of outer space of switching slot that affect base portion 1, can not produce and stop or disturb, memory module 2 can be plugged in smoothly in switching slot 10, be not subjected to both sides to pull the purpose that body 32 stops, and for the stable grafting runners 31 that is plugged on of switching circuit board 11, and switching circuit board 11 reduces height, shorten the distance between base portion 1 and grafting runners 31, can reduce the test signal late effect of default motherboard 3 to be tested, and the effect of the speed carried out of raising system, the test jobs that also improves default motherboard 3 to be tested carries out smoothly, accuracy promotes, therefore such as can reach the structure of aforementioned effect, device is contained by the utility model all should, the simple and easy modification of this kind and equivalent structure change, all should in like manner be contained in the scope of the claims of the present utility model, close and give Chen Ming.

The structural improvement of the switching runners that above-mentioned host board testing of the present utility model is used has following advantage when reality is used, as:

(1) the set switching circuit board 11 of base portion 1 one sides, be respectively equipped with the bevelled edge 13 of outwards tiltedly stretching in two outsides of a plurality of metallic contacts 111, base portion 1 utilizes switching circuit board 11, insert in the slot 310 of the grafting runners 31 of presetting motherboard 3 to be tested, utilize both sides bevelled edge 13 to be resisted against the push plate 321 that body 32 is pulled in slot 310 both sides, and for a plurality of metallic contacts 111 that connect road plate 11, respectively with slot 310 in a plurality of terminals 311 electrically contact, carry out stable test signal transmission, insert at grafting runners 31 for switching circuit board 11, extract, minimizing causes the damage of default motherboard 3 to be tested and reduces costs because of the plug of test jobs, and body 32 is pulled in default grafting runners 31 both sides, be resisted against respectively base portion 1 both sides, and unlikely 10 liang of outer space of switching slot that affect base portion 1, memory module 2 can not be subject to both sides and pull stopping of body 32, the grafting operation is smooth.

(2) the set switching circuit board 11 of base portion 1 one sides, reduce the design of height, in the time of can inserting the grafting runners 31 of default motherboard 3 to be tested for switching circuit board 11, shorten the distance of 31 of base portion 1 and grafting connecting seats, can reduce the disappearance of test signal delay, also accelerate for system's execution speed of default motherboard 3 to be tested, help the test jobs of presetting motherboard 3 to be tested and carry out smoothly.

therefore, the switching runners that the utility model is used mainly for host board testing designs, to be provided with the switching circuit board of reduction height by the slot opposite side of base portion, and a plurality of metallic contacts both sides of switching circuit board, be respectively equipped with outward-dipping bevelled edge, the switching slot of base portion is recalled the module electric mortiser for pre-design and is connect, recycling switching circuit board electric mortiser is connected to the slot of the grafting runners of default motherboard to be tested, namely by switching circuit board both sides bevelled edge, be resisted against respectively slot both sides and pull the push plate of body, reach base portion, switching circuit board firmly is inserted in the grafting runners of default motherboard to be tested, insert or extract the damage that all can not cause default motherboard to be tested, and when memory module is plugged to the switching slot of base portion, be not subject to pegging graft runners both sides are pulled body resistance shelves or are disturbed and are main key protection point, and base portion one side built-up circuit plate height reduces, can shorten the distance between pedestal and grafting runners, when default motherboard to be tested is tested, reducing test postpones, accelerate the advantage of system's execution speed of default motherboard to be tested, and the contact stabilization that when using, electric mortiser connects, can carry out fast for the test jobs of default motherboard to be tested, yet, the above is only preferred embodiment of the present utility model, non-so namely limit to the scope of the claims of the present utility model, therefore such as use simple and easy modification and the equivalent structure that the utility model specification and graphic content are done to change, all should in like manner be contained in the scope of the claims of the present utility model, close and give Chen Ming.

In sum, the structural improvement of the switching runners that the above-mentioned host board testing of the utility model is used is in enforcement, when using, for really reaching its effect and purpose, therefore the utility model is really the research and development of a practicality excellence, for meeting the application important document of utility model patent, filing an application in the whence in accordance with the law, expects that examining committee grants accurate the utility model early, with the arduous research and development that ensure the inventor, found, if an ancient unit of weight office examine committee have any check doubtful, the indication of please writing to us without sparing, settled the doing one's utmost of inventor coordinates, and the true feeling moral is just.

Claims

1. switching runners that host board testing is used, comprise base portion and switching circuit board, this base interior has the switching slot for default memory module grafting, and wear a plurality of conversion terminals in the switching slot, a plurality of conversion terminals are electrically connected on a side of switching circuit board, and two surfaces of switching circuit board opposite side are respectively equipped with the interior a plurality of metallic contacts of slot of the grafting runners that inserts default motherboard, it is characterized in that:

2. the switching runners used of host board testing as claimed in claim 1, it is characterized in that: this switching circuit board in a plurality of metallic contacts both sides, be respectively equipped with the bevelled edge of outward-dipping rising, and utilize the both sides bevelled edge respectively the default grafting runners of pushing tow both sides pull body, the described body of pulling is respectively to the angle of 5 ° ~ 15 ° of relative inner turns.

3. the switching runners used of host board testing as claimed in claim 1 is characterized in that: two outermost metallic contacts are respectively to the distance between switching circuit board two outer side edges, greater than switching circuit board two outer side edges respectively to the distance on base.

4. the switching runners used of host board testing as claimed in claim 3, it is characterized in that: these two outside metallic contacts are 3.8mm ~ 4.2mm to the distance between switching circuit board two outer side edges.

5. the switching runners used of host board testing as claimed in claim 4, it is characterized in that: these two outside metallic contact to the distances between switching circuit board two outer side edges are 4mm.

6. the switching runners used of host board testing as claimed in claim 3, it is characterized in that: these switching circuit board two outer side edges are 0.8mm ~ 1.2mm respectively to the distance on base.

7. the switching runners used of host board testing as claimed in claim 6 is characterized in that: these switching circuit board two outer side edges respectively to the distance on base be 1mm.