CN202956684U - Refrigeration temperature control device for atomic force microscope - Google Patents
Refrigeration temperature control device for atomic force microscope Download PDFInfo
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- CN202956684U CN202956684U CN 201220675447 CN201220675447U CN202956684U CN 202956684 U CN202956684 U CN 202956684U CN 201220675447 CN201220675447 CN 201220675447 CN 201220675447 U CN201220675447 U CN 201220675447U CN 202956684 U CN202956684 U CN 202956684U
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- control device
- temperature control
- atomic force
- force microscope
- refrigeration
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Abstract
The utility model discloses a refrigeration temperature control device for an atomic force microscope. The refrigeration temperature control device comprises a bottom plate which is fixed to a base, a sample table, two independent semiconductor refrigeration modules, two independent temperature sensors, two temperature controls, a circulating water pump and two cooling water modules, wherein the sample table is arranged in the center of the bottom plate; the two semiconductor refrigeration modules are connected with the temperature controllers by a cable respectively; the two temperature sensors are connected with the temperature controllers by the cable; the circulating water pump is connected with the cooling water modules by a water inlet pipeline; and the cooling water module and a water outlet pipeline are connected with the circulating water pump. According to the refrigeration temperature control device, the defects of noise, vibration and the like in the prior art are overcome, so that stable temperature control is realized under the permissive condition of the atomic force microscope; and the refrigeration temperature control device is small in vibration and high in refrigerating efficiency.
Description
Technical field
The utility model relates to the atomic force microscope technology application, particularly, relates to a kind of atomic force microscope refrigeration temperature control device.
Background technology
Atomic force microscope is to have the high-resolution new instrument of atom level, be widely used in, in the fields such as research experiment of the various nanometer related disciplines of semiconductor, nano-functional material, biology, chemical industry, food, medical research and scientific research institutions, becoming the basic tool of nano science research.
The atomic force microscope work characteristics is that perform region is narrow and small, to noise, and vibration sensing.And, in existing refrigeration plant, use the refrigeration plant volume of compressor, condenser pipe larger, and refrigerating efficiency is low, the noise vibration sensitivity.Semiconductor refrigerating utilizes the Peltier effect of semiconductor material, when galvanic couple that direct current is connected into by two kinds of different semiconductor materials, can absorb respectively heat at the two ends of galvanic couple and emit heat, can realize the purpose of refrigeration.Advantage is there is no moving component, and refrigerating efficiency is high.Semiconductor refrigerating requires heat delivery surface to be connected with heating radiator, is generally recirculated water, and the noise of the vibration that current cause and controller radiator fan is that the atomic force microscope working environment is unallowed.
The utility model is narrow and small for the atomic force microscope perform region, affected significantly by noise and vibration and designs, to realize that equilibrium temperature is controlled under atomic force microscope enabled condition.
The utility model content
The technical problems to be solved in the utility model is to overcome existing defect, proposes a kind of atomic force microscope refrigeration temperature control device, with the advantage that realizes that volume is little, vibration reduces.
In order to solve the problems of the technologies described above, the technical solution adopted in the utility model is:
A kind of atomic force microscope refrigeration temperature control device, comprise independently independently temperature sensor, two temperature controllers, water circulating pump, two chilled water modules of semiconductor refrigerating module, two of the base plate that is fixed in base, sample stage, two, described base plate center is provided with sample stage, two described semiconductor refrigerating modules are connected with temperature controller by cable respectively, and two described temperature sensors are connected with temperature controller by cable respectively; Described water circulating pump is connected with the chilled water module by inlet channel, and described chilled water module is connected with water circulating pump with outlet conduit.
Further, the described base plate back side is inlaid with at least one magnet.
Further, described inlet channel is provided with reinforcement, and inlet channel length is greater than 10m.
Further, described temperature controller is provided with the storage module of storing measurement data.
Compared with prior art, the utlity model has following beneficial effect:
1, base plate back side embedded magnet, can firmly be connected with atomic force microscope irony base, reduces vibration, and be easy to dismounting.
2, inlet channel arranges reinforcement, increases its rigidity and eliminates himself aerial vibration; Inlet channel length is greater than 10m, by longer tube wall, eliminates water flow vibration.
3, adopt the semiconductor refrigerating module, can accomplish small size, refrigerating efficiency is high.
4, adopt two groups of independently semiconductor refrigerating module and temperature sensors, not only can realize homogeneous temperature field, can also realize the gradient temperature field.
The accompanying drawing explanation
Fig. 1 is the structural representation of the utility model atomic force microscope with the refrigeration temperature control device.
Fig. 2 is the schematic diagram of the utility model atomic force microscope with the base plate of refrigeration temperature control device.
Embodiment
Below in conjunction with accompanying drawing, preferred embodiment of the present utility model is described, should be appreciated that preferred embodiment described herein is only for description and interpretation the utility model, and be not used in restriction the utility model.
As shown in Figure 1 and Figure 2, a kind of atomic force microscope refrigeration temperature control device, comprise the base plate 1 that is fixed in base, sample stage 2, two independently temperature sensor 4, two temperature controllers 5, water circulating pump 6, two chilled water modules 7 of semiconductor refrigerating module 3, two independently, base plate 1 center is provided with sample stage 2, base plate 1 back side is inlaid with a magnet 11, this example is three magnet, can firmly be connected with atomic force microscope irony base.Two semiconductor refrigerating modules 3 are connected with temperature controller 5 by cable 8 respectively, and two temperature sensors 4 are connected with temperature controller 5 by cable 8 respectively; Temperature controller 5 is provided with the memory module of storing measurement data.Water circulating pump 6 is connected with chilled water module 7 by inlet channel 9, and inlet channel 9 is provided with reinforcement, and inlet channel 9 length are greater than 10m.Chilled water module 7 is connected with water circulating pump 6 by outlet conduit 10.
The utility model is narrow and small for the atomic force microscope perform region, affected significantly by noise and vibration and designs, and can overcome the defect such as noise, vibration in prior art, to realize that equilibrium temperature is controlled under atomic force microscope enabled condition.
Finally it should be noted that: the foregoing is only preferred embodiment of the present utility model, be not limited to the utility model, although with reference to previous embodiment, the utility model is had been described in detail, for a person skilled in the art, its technical scheme that still can put down in writing aforementioned each embodiment is modified, or part technical characterictic wherein is equal to replacement.All within spirit of the present utility model and principle, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection domain of the present utility model.
Claims (4)
1. an atomic force microscope refrigeration temperature control device, comprise independently independently temperature sensor, two temperature controllers, water circulating pump, two chilled water modules of semiconductor refrigerating module, two of the base plate that is fixed in base, sample stage, two, it is characterized in that, described base plate center is provided with sample stage, two described semiconductor refrigerating modules are connected with temperature controller by cable respectively, and two described temperature sensors are connected with temperature controller by cable respectively; Described water circulating pump is connected with the chilled water module by inlet channel, and described chilled water module is connected with water circulating pump with outlet conduit.
2. atomic force microscope according to claim 1 refrigeration temperature control device, is characterized in that, the described base plate back side is inlaid with at least one magnet.
3. atomic force microscope according to claim 1 refrigeration temperature control device, is characterized in that, described inlet channel is provided with reinforcement, and inlet channel length is greater than 10m.
4. atomic force microscope according to claim 1 refrigeration temperature control device, is characterized in that, described temperature controller is provided with the storage module of storage of measurement data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220675447 CN202956684U (en) | 2012-12-10 | 2012-12-10 | Refrigeration temperature control device for atomic force microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220675447 CN202956684U (en) | 2012-12-10 | 2012-12-10 | Refrigeration temperature control device for atomic force microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202956684U true CN202956684U (en) | 2013-05-29 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220675447 Expired - Fee Related CN202956684U (en) | 2012-12-10 | 2012-12-10 | Refrigeration temperature control device for atomic force microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202956684U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103019271A (en) * | 2012-12-10 | 2013-04-03 | 兰州大学 | Refrigeration and temperature control device for atomic force microscope |
| CN106443075A (en) * | 2016-12-09 | 2017-02-22 | 南京大学 | Temperature control system and temperature control sample stage for atomic force microscope |
-
2012
- 2012-12-10 CN CN 201220675447 patent/CN202956684U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103019271A (en) * | 2012-12-10 | 2013-04-03 | 兰州大学 | Refrigeration and temperature control device for atomic force microscope |
| CN103019271B (en) * | 2012-12-10 | 2015-08-19 | 兰州大学 | A kind of atomic force microscope refrigeration temperature control device |
| CN106443075A (en) * | 2016-12-09 | 2017-02-22 | 南京大学 | Temperature control system and temperature control sample stage for atomic force microscope |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130529 Termination date: 20131210 |